The local adsorption of pyridine on Si(100) a combined PES and XPD study

The chemical and geometrical properties of the system pyridine on Si(100) are investigated in a combined photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) study. Synchrotron radiation was applied to achieve high spectral resolution and a high surface sensitivity. Our studies were performed at saturation coverage of pyridine on silicon. The XPS and XPD results, including diffraction patterns for all spectral resolved components, clearly show that pyridine is reacting with silicon dimer atoms of the (2 × 1)-reconstructed surface. We propose a tetra-σ-bonded structure model and provide detailed structure parameters.     

Influence of electron diffraction on measured energy-resolved momentum densities in single-crystalline silicon

Electron momentum spectroscopy is used to determine the spectral function of silicon single crystals. In these experiments 50 keV electrons impinge on a self-supporting thin silicon film and scattered and ejected electrons emerging from this sample with energies near 25 keV are detected in coincidence. Diffraction effects are present that give rise to additional structures in the measured spectral momentum densities. Spectra for a specific momentum value can be obtained at different orientations of the crystal relative to the analysers. By comparing these spectra for which the measured momentum density is the same, but the diffraction conditions of the incoming and outgoing electron trajectories differ, one can distinguish between features due to diffraction of the incoming and/or outgoing electrons, and those due to the electronic structure of the target itself.     

Time resolved spectroscopy with femtosecond soft-x-ray pulses

The most challenging application of time resolved spectroscopy is to directly observe the structural and electronic dynamics. Here we present the combination of x-ray absorption spectroscopy with laser driven x-ray sources, offering atomic spatial and temporal resolution. Our new approaches for optimization of laser driven x-ray sources resulted in the demonstration of spatially coherent sub-20 fs x-ray pulses in a range up to several keV. We excited polycrystalline silicon with an ultrashort laser pulse and characterized the collective motion of atoms with time resolved x-ray absorption spectroscopy at a temporal resolution of less than 20 fs. Finally, we have shown the feasibility of probing the dynamics of the electronic structure of silicon and carbon with near edge x-ray absorption spectroscopy.     

Silicon-based and suspended-membrane-type guided-mode resonance filters with a spectrum-modifying layer design

The concept of a spectrum-modifying layer is proposed for the design of a silicon-based guided-mode resonance filter. To realize such a novel device, a grating and waveguide structures are fabricated simultaneously in a suspended silicon nitride membrane. The cladding layer of the silicon substrate is replaced by the silicon dioxide membrane to reduce the absorption loss of the bulky substrate. Moreover, the silicon dioxide membrane plays a role in modifying the spectral response. According to the experimental results of the proposed structures, symmetrical line shapes and improved sidebands of nonresonance are demonstrated.     

A broadband grating-coupled silicon nitride waveguide for the mid-IR: characterization and sensitive measurements using an external cavity quantum cascade laser

We present the design and fabrication of a single-mode slab waveguide structure for mid-infrared spectroscopy optimized for broadband coupling. The sensor uses grating couplers for robust off-axis coupling and a silicon nitride guiding layer for mechanical robustness. An external cavity quantum cascade laser-based transmission method is introduced for characterizing the structure’s broadband coupling behavior. Light from an external cavity quantum cascade laser with a spectral range of 0.5 μm around 6 μm was coupled into the waveguide without the need for moving parts. First spectra taken with this sensor are presented.     

Time‐resolved random laser spectroscopy of inhomogeneously broadened systems

The understanding of energy transfer processes in biological systems occurring among optical centres which exhibit inhomogeneously broadened spectral bands is of paramount importance to determine time constants and spatial distribution of energy flow. A new time resolved‐spectroscopy based on the random laser generation of the optical probes is reported. As an example, the excited state relaxation of Rhodamine B molecules in an organic‐inorganic hybrid material is investigated. This kind of spectroscopy may resolve not only the spectral features of the system but also provide a high speed picture of the energy transfer and excited state relaxation of the involved optical probes. The results could be applied to other kind of efficient interacting chromophore pairs embedded in inhomogeneous scattering structures such as biological tissues.     

Specific features of the formation of ytterbium films on the Si(111) surface at room temperature

The processes accompanying the formation of ytterbium films on the Si(111) surface at room temperature are investigated by the contact potential difference method, Auger electron spectroscopy, low-energy electron diffraction, and thermal desorption spectroscopy. It is shown that the grown metal films are uniform in thickness and that Si atoms virtually do not dissolve in the films. The atoms of the silicon substrate can diffuse in limited amounts into the Yb metal film only when the surface is bombarded by high-energy primary electron beams employed in Auger electron spectroscopy. The results obtained permit the conclusion that the previously observed oscillations of the work function in Yb-Si(111) thin-film structures cannot originate from dissolution of silicon atoms in the ytterbium film.     

Oscillations of light absorption in 2D macroporous silicon structures with surface nanocoatings

We investigated the near-IR light absorption oscillations in 2D macroporous silicon structures with microporous silicon layers and CdTe, ZnO surface nanocrystals. The electro-optical effect was taken into account within the strong electric field approximation. Well-separated oscillations were observed in the spectral ranges of the surface bonds of macroporous silicon structures with surface nanocrystals. The model of the resonant electron scattering on impurity states in electric field of heterojunction “silicon-nanocoating” on macropore surface as well as realization of Wannier-Stark effect on the randomly distributed surface bonds were considered. The Wannier-Stark ladders are not broken by impurities because of the longer scattering lifetime as compared with the period of electron oscillations in an external electric field, in all spectral regions considered for macroporous silicon structures with CdTe and ZnO surface nanocrystals.     

Fast emission dynamics in droplet epitaxy GaAs ring-disk nanostructures integrated on Si

The emission dynamics in GaAs/AlGaAs coupled ring-disk (CRD) quantum structures fabricated on silicon substrates is presented. The CRD structures are self-assembled via droplet epitaxy, a growth technique which, due to its low thermal budget, is compatible with the monolithic integration of III-V devices on Si based electronic circuits. Continuous wave, time resolved photoluminescence and theoretical calculations in the effective mass approximations are presented for the assessment of the electronic and carrier properties of the CRDs. The CRDs show a fast carrier dynamics which is expected to be suitable for ultrafast optical switching applications integrated on silicon.     

Optical properties of grooved silicon microstructures: Theory and experiment

The reflection spectra of grooved silicon structures consisting of alternating silicon walls and grooves (air channels) with a period of a = 4–6 μm are studied experimentally and theoretically in the mid-IR spectral range (2–25 μm) upon irradiation of samples by normally incident light polarized along and perpendicular to silicon layers. The calculation is performed by the scattering matrix method taking into account Rayleigh scattering losses in a grooved layer by adding imaginary parts to the refractive indices of silicon and air in grooved regions. The experimental and calculated reflection spectra are in good agreement in the entire spectral range studied. The analysis of experimental and calculated spectra gave close values of the effective refractive indices and birefringence of the studied structures in the long-wavelength spectral region. The values calculated in the effective medium model in the long-wavelength approximation (λ ≫ a) gave considerably understated values. The obtained results confirm the efficiency of the scattering matrix method for describing the optical properties of silicon microstructures.     

Studies of Silicon Erosion in Plasma-Target-Interaction from Optical Emission and Absorption Spectroscopy

The densities of eroded silicon from a target in interaction with a cylindrically symmetric plasma are determined from measurements of the transverse radiance and transmittance of Doppler broadened spectral lines with high spectral resolution. The transmission distributions, branching ratios, and the spectral line shapes, which depend on the optical depths of the emitting and absorbing particles along the line of sight, are investigated for particle density and temperature determination. First results on emission and transmission measurements of the Si I resonance multiplet spectral line branching ratios and line profiles (centered at 251 and 288 nm, respectively) for silicon as the erosion product from a C/C-SiC target in a low temperature plasma jet give absorption coefficients, from which erosion rates can be deduced, which are in good agreement with the results from the emission spectroscopy and from the gravimetric measurements.     

Modification of silicon waveguide structures using ion implantation induced defects

The structure of re-crystallized silicon films is investigated using transmission electron microscopy, spectroscopic ellipsometry and positron annihilation spectroscopy. Samples were prepared via amorphization of the silicon overlayer of silicon-on-insulator substrates, and subsequent thermal annealing. For an annealing temperature of 650 °C we show that the silicon film has a poly-crystalline structure. Its refractive index measured at 1550 nm is comparable to that of crystalline silicon following re-crystallization at 750 °C. Positron measurements indicate a high concentration of open-volume point defects in the re-crystallized films. We discuss the potential importance of these structures with regard to defect engineering for silicon photonic devices.     

二硅酸钠晶体、玻璃及其熔体结构的拉曼光谱研究

采用铜蒸气脉冲激光光源和时间分辨探测技术,实现了对ＪＹＵ１０００拉曼光谱仪的高温改造,可在样品温度高至２０２３Ｋ下稳定地测谱;二硅酸钠晶体、玻璃及其熔体的测量结果表明,高温Ｒａｍａｎ光谱不仅可分辨不同的结构相、提供固－液相变信息,而且能分析具有不同桥氧数的硅氧四面体微结构单元,即聚合状况以及它们随温度的变化,因而为物质的结构研究,特别是高温状态的熔体的研究,提供了重要的手段和依据。     

Protecting TERS probes from degradation: extending mechanical and chemical stability

The detailed surface chemistry of aluminum oxide protected silver films for use specifically in surface enhanced Raman spectroscopy and tip enhanced Raman spectroscopy (TERS) was investigated. We have demonstrated that increased storage and scanning use lifetimes for silver plasmonic structures are directly connected with the elimination of chemical degradation at the plasmonic structure surface. X‐ray photoelectron spectroscopy of the metal films confirmed that a 2–3 nm thick coating of aluminum oxide prevented chemical attack of the underlying silver film for three months of storage in a desiccator, significantly increasing the storage lifetime of current probes. The scanning lifetime of a TERS probe when used to image a hard patterned silicon substrate was doubled with the addition of this protective coating. These measurements were performed without laser illumination in order to separate laser‐induced heating degradation from pure mechanical degradation of the metallized probe currently encountered during TERS data collection. Copyright © 2013 John Wiley & Sons, Ltd.     

单晶硅微纳构件加工表面性能的时变性研究

采用蒙特卡罗方法和分子动力学方法相结合, 模拟单晶硅微纳构件加工表面的时效过程, 研究其对加工表面质量和构件力学性能的影响. 模拟结果表明: 在时效过程中, 单晶硅微纳构件加工变质层的有序度显著提高, 残余应力大幅降低, 表面粗糙度略有增加, 此外还发现加工变质层中非晶硅原子在时效过程中大幅减少, 部分非晶硅出现了再结晶现象, 其中部分BCT5-Si以及金属相(Si-Ⅱ)结构原子转化为金刚石结构(Si-I). 时效作用对加工后单晶硅微纳构件表面性能具有重要的影响, 同时可以提高微纳构件的拉伸力学性能. 关键词： 蒙特卡罗方法 纳米加工 表面性能 时变性     

Crystal spectroscopy of silicon aero-gel end-caps driven by a dynamic hohlraum on Z

We present results from crystal spectroscopic analysis of silicon aero-gel foams heated by dynamic hohlraums on Z. The dynamic hohlraum on Z creates a radiation source with a 230-eV average temperature over a 2.4-mm diameter. In these experiments silicon aero-gel foams with 10-mg/cm³ densities and 1.7-mm lengths were placed on both ends of the dynamic hohlraum. Several crystal spectrometers were placed both above and below the z-pinch to diagnose the temperature of the silicon aero-gel foam using the K-shell lines of silicon. The crystal spectrometers were (1) temporally integrated and spatially resolved, (2) temporally resolved and spatially integrated, and (3) both temporally and spatially resolved. The results indicate that the dynamic hohlraum heats the silicon aero-gel to approximately 150-eV at peak power. As the dynamic hohlraum source cools after peak power the silicon aero-gel continues to heat and jets axially at an average velocity of approximately 50-cm/μs. The spectroscopy has also shown that the reason for the up/down asymmetry in radiated power on Z is that tungsten enters the line-of-sight on the bottom of the machine much more than on the top.     

Non‐invasive depth profiling by space and time‐resolved Raman spectroscopy

Time‐resolved Raman spectroscopy, spatially offset Raman spectroscopy and time‐resolved spatially offset Raman spectroscopy (TR‐SORS) have proven their capability for the non‐invasive profiling of deep layers of a sample. Recent studies have indicated that TR‐SORS exhibits an enhanced selectivity toward the deep layers of a sample. However, the enhanced depth profiling efficiency of TR‐SORS, in comparison with time‐resolved Raman spectroscopy and spatially offset Raman spectroscopy, is yet to be assessed and explained in accordance to the synergistic effects of spatial and temporal resolutions. This study provides a critical investigation of the depth profiling efficiency of the three deep Raman techniques. The study compares the efficiency of the various deep Raman spectroscopy techniques for the stand‐off detection of explosive precursors hidden in highly fluorescing packaging. The study explains for the first time the synergistic effects of spatial and temporal resolutions in the deep Raman techniques and their impact on the acquired spectral data. Copyright © 2013 John Wiley & Sons, Ltd.     

Broad‐Band Time‐Resolved Near Infrared Spectroscopy in the TJ‐II Stellarator

First experimental results on broad‐band, time‐resolved Near Infrared (NIR;here loosely defined as covering from 750 to 1650 nm) passive spectroscopy using a high sensitivity InGaAs detector are reported for the TJ‐II Stellarator. Experimental set‐up is described together with its main characteristics, the most remarkable ones being its enhanced NIR response, broadband spectrum acquisition in a single shot, and time‐resolved measurements with up to 1.8 kHz spectral rate. Prospects for future work and more extended physics studies in this newly open spectral region in TJ‐II are discussed. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Quantum mechanical repulsion of exciton levels in a disordered quantum well

Spatially resolved photoluminescence spectra of a single quantum well are recorded by near-field spectroscopy. A set of over four hundred spectra displaying sharp emission lines from localized excitons is subject to a statistical analysis of the two-energy autocorrelation function. An accurate comparison with a quantum theory of the exciton center-of-mass motion in a two-dimensional spatially correlated disordered potential reveals clear signatures of quantum mechanical energy level repulsion, giving the spatial and energetic correlations of excitons in disordered quantum systems.     

Ultrafast spin dynamics in magnetic semiconductor quantum wells studied by magnetization modulation spectroscopy

1-x Mn_xTe quantum well structures at room temperature using time-resolved magnetization modulation spectroscopy. Access to the different electron and hole spin dynamics is obtained by carefully measuring the spectroscopic changes of the magneto-optical response during the first hundreds of femtoseconds after excitation. Experimental results are discussed in the framework of a simple model for a two-dimensional band structure. The spectroscopy is shown to be intimately related to the spectral band width of the applied ultrashort laser pulses. The general potential of the method for fundamental studies on other materials and systems is addressed. Received: 20 September 1998