A setup for synchrotron‐radiation‐induced total reflection X‐ray fluorescence and X‐ray absorption near‐edge structure recently commissioned at BESSY II BAMline

An automatic sample changer chamber for total reflection X‐ray fluorescence (TXRF) and X‐ray absorption near‐edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF‐XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (<1 mg) and concentrations are low (ng ml^?1 to µg ml^?1). TXRF requires a well defined geometry regarding the reflecting surface of a sample carrier and the synchrotron beam. The newly installed chamber allows for reliable sample positioning, remote sample changing and evacuation of the fluorescence beam path. The chamber was successfully used showing accurate determination of elemental amounts in the certified reference material NIST water 1640. Low limits of detection of less than 100 fg absolute (10 pg ml^?1) for Ni were found. TXRF‐XANES on different Re species was applied. An unknown species of Re was found to be Re in the +7 oxidation state.     

Application of synchrotron‐radiation‐induced TXRF‐XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap

Synchrotron‐radiation‐induced total reflection x‐ray fluorescence (SR‐TXRF) analysis was used for x‐ray absorption near edge structure (XANES) measurements for the speciation of arsenic in cucumber (Cucumis sativus L.) xylem sap. The objective of the presented work was to exploit the advantages of the TXRF geometry for XANES analysis. Measurements were accomplished at the bending magnet beamline L of HASYLAB, Hamburg, Germany, using a Si(111) double crystal monochromator and a silicon drift detector (SDD). Experiments were performed by growing cucumber plants in hydroponics containing arsenite [As(III)] or arsenate [As(V)] in order to identify the arsenic species of the collected xylem saps by K‐edge SR‐TXRF XANES. Cucumber xylem saps, as well as nutrient solutions containing arsenic in the two above‐mentioned species, were analyzed and compared with arsenate and arsenite standard solutions. Arsenic speciation in xylem sap down to 30 ng/ml (30 ppb) was achieved, and no alteration of the oxidation state was observed during the measurements. Analysis of xylem saps showed that As(V) taken up from the nutrient solution was reduced to As(III). As(III) contained in the nutrient solutions was found to be partially oxidized to As(V). These results confirmed the preliminary measurements obtained with flow injection analysis (FIA) and high‐performance liquid chromatography‐high resolution inductively coupled plasma mass spectrometry (HPLC‐HR‐ICP‐MS) and showed the competitive capability of SR‐TXRF XANES analysis for this application. Copyright © 2007 John Wiley & Sons, Ltd.     

A total reflection X‐ray fluorescence method for the determination of chlorine at trace levels in nuclear materials without sample dissolution

A total reflection X‐ray fluorescence (TXRF) method for the determination of chlorine at trace levels in nuclear fuel samples is described. Chlorine present in trace concentrations in nuclear fuel materials such as U₃O₈, (U,Pu)C, PuO₂ and Pu‐alloys was first separated from the solid matrix by pyrohydrolysis as HCl and was collected in 5 mM NaOH solution. This solution was analyzed for chlorine by TXRF spectrometry using Cl Kα analytical line excited by W Lα. Cobalt was used as internal standard. The precision for such chlorine determination was found to be within 27% (n = 4) when the analysis was carried out in air atmosphere. This could be improved to 8% by making TXRF measurement in flowing helium atmosphere. The results obtained from TXRF determinations were also compared with those obtained from ion chromatography (IC) and were in good agreement. The collection of distillate during pyrohydrolysis in NaOH helped in counterchecking loss of chlorine during TXRF sample preparation. The average deviation of TXRF‐determined values in helium‐purged TXRF measurements with IC determined values (as chloride) was 15% at a chlorine concentration level in the range of 1–70 µg/mL. Copyright © 2012 John Wiley & Sons, Ltd.     

Total reflection x‐ray fluorescence analysis—a review

Total reflection x‐ray fluorescence analysis (TXRF) is a special energy‐dispersive x‐ray analytical technique extending XRF down to the ultra trace element range. Detection limits of picograms or nanograms per gram levels are reached with x‐ray tube excitation. Using synchrotron radiation as excitation source, femtogram levels are detectable, particularly important for Si wafer surface analysis. TXRF is specially suited for applications in which only a very small amount of sample is available, as only a few micrograms are required for the analysis. In this review, an overview of theoretical principles, advantages, instrumentation, quantification and application is given. Chemical analysis as well as surface analysis including depth profiling and thin‐film characterization is described. Special research results on extension to low‐Z elements, excitation with synchrotron radiation and x‐ray absorption spectroscopy (XAS) for chemical speciation at trace levels are reviewed. Copyright © 2007 John Wiley & Sons, Ltd.     

A comparative study on the total reflection X‐ray fluorescence determination of low Z elements using X‐ray tube and synchrotron radiation as excitation sources

Detailed total reflection X‐ray fluorescence (TXRF) studies for the detection and quantification of low atomic number elements were carried out by using a laboratory dual source TXRF spectrometer equipped with a vacuum chamber and at the International Atomic Energy Agency multi‐purpose end‐station facility, operated at the XRF beamline of Elettra Sincrotrone Trieste, Italy. Multi‐elemental standard aqueous solutions of low Z elements (F, Na, Al, S, K, Sc, and Ti) with different elemental concentrations of 2, 10, 20, and 30 µg/ml were prepared and measured in both setups. The measurements at the synchrotron setup were performed in a scanning mode across the sample residue and perpendicular to the incident beam in order to account properly for a possible non‐uniform deposition of certain elements. The accuracy and the detection limits obtained from the TXRF measurements in both setups were determined and comparatively evaluated and assessed. Significant improvement in the TXRF detection limits at the synchrotron beamline end‐station was obtained for the elements with Z ≤ 13 (Al). Copyright © 2017 John Wiley & Sons, Ltd.     

Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection x‐ray fluorescence

Conditions for the total reflection x‐ray fluorescence (TXRF) analysis of real uranium samples for low atomic number elements using vacuum chamber TXRF spectrometer were optimized. It was observed that for analysis of low atomic number elements, almost complete removal of uranium matrix is required. Two certified reference materials of uranium containing trace elements in different concentrations were dissolved in minimum amount of high purity nitric acid. The uranium matrix from these solutions was separated by solvent extraction using tri‐n‐butyl phosphate as extracting reagent. Low atomic number elements in TXRF spectrum of the aqueous phase could be seen only after six tri‐n‐butyl phosphate equilibrations in extraction. The TXRF determinations of the certified low atomic number elements Mg and Al were made in these aqueous solutions after addition of Sc as an internal standard. The TXRF determined values for Mg were in good agreement with the certified values, whereas TXRF determined Al values differed from the certified values appreciably, probably due to the interference of Al Kα peak with escape peak of U Mα and the neighboring Si Kα peak. Copyright © 2013 John Wiley & Sons, Ltd.     

Trace element determinations in uranium by total reflection X‐ray fluorescence spectrometry using polychromatic X‐ray excitation

Suitability of polychromatic X‐rays has been assessed for the total reflection X‐ray fluorescence (TXRF) trace elemental determinations in aqueous solutions as well as uranium oxide certified reference materials. The method involves total reflection of X‐rays below a certain energy level on the TXRF sample support and exciting the analytes present in ng amount on these supports, measuring the TXRF spectra, processing the spectra, and finally determining the elemental concentrations. For uranium‐based samples, the samples were dissolved, main matrix uranium was separated from these solutions using solvent extraction, and trace elements were determined using aqueous phase following above approach. The method is simple and easier to implement compared with the monochromatic excitation but has similar or in some cases better detection limits compared with those obtained using monochromatic excitation. The details of the methodology, quality of analytical results, and detection limits are described and compared with those obtained using monochromatic excitation. Copyright © 2017 John Wiley & Sons, Ltd.     

Characterization of x‐rays emerging from between reflector and sample carrier in reflector‐assisted TXRF analysis

The possible application of an Si reflector, which is placed just above the sample carrier in total reflection x‐ray fluorescence (TXRF) analysis, was investigated. The x‐rays that were emitted from an Mo tube and passed between the Si reflector and the Si sample carrier were analyzed with an Si drift detector. In our experimental setup, the angle between the reflector and the sample carrier can be changed by adjusting the inclination of the reflector. The intensity of the x‐rays that emerged from between the two Si surfaces drastically changed depending on the reflector angle. At a proper reflector angle, this intensity showed a maximum and, in addition, the Compton peak in the x‐ray spectrum was suppressed. When this x‐ray beam was used for excitation of TXRF signals, the highest intensity of x‐ray fluorescence emitted from the sample was detected, indicating that these experimental conditions are useful for the enhancement of TXRF intensities. Copyright © 2004 John Wiley & Sons, Ltd.     

Random left‐censoring: a statistical approach accounting for detection limits in x‐ray fluorescence analysis

The use of x‐ray fluorescence techniques (XRF, TXRF, µXRF) in studies of trace element concentrations is limited by the detection limits (DL) of these methods. In this work we demonstrate that concentration measurements below the DL level, the so‐called ‘non‐detects’, can be included in data analysis by using the statistical concept of ‘censoring’, which is widely used, for instance, in survival analysis. This paper describes the non‐parametric methods of analysis of censored data using the random left‐censoring formalism, which can be used to account for the detection limits in XRF analysis. In particular, the application of the Kaplan–Meier and Nelson–Aalen estimators for the estimation of concentration distributions under censoring is discussed. These approaches are compared with the ‘reconstruction method’ developed earlier in our group to correct XRF data for the effect of detection limits. By using Monte Carlo simulations, the accuracy of the Kaplan–Meier and Nelson–Aalen estimators for censored data is discussed, in particular in the context of the estimation of the mean value and median of a concentration distribution. We demonstrate that for the ‘two‐group’ comparison of left‐censored concentrations, which is a problem of great practical importance, the log‐rank test can be used. The idea of random left censoring is applied to analyse the TXRF detection limit‐censored measurements of the concentrations of trace elements in biomedical samples. Copyright © 2004 John Wiley & Sons, Ltd.     

Study of factors affecting the results of natural water analyses by total reflection X‐ray fluorescence

The study aims to choose the conditions for the direct analysis of different types of natural water samples by total reflection X‐Ray fluorescence spectrometry (TXRF). The effect of some factors on TXRF results was studied such as the surface density of dried water residue on the sample carrier, the dilution ratio of high‐mineralized samples with ultrapure water and the solution of the detergent Triton X‐100, the salt contents, the internal standard concentration, and repeated pipetting of an aliquot of fresh water. The influence of self‐absorption phenomena on quantification results was demonstrated by using brine samples. The TXRF results for natural waters of varying salinity (brines, fresh waters, and ground waters) and model solutions are presented. For a number of analytes, the data obtained by TXRF were compared to those obtained by ‘wet’ chemistry and inductively coupled plasma mass spectrometry. Copyright © 2013 John Wiley & Sons, Ltd.     

Choice of optimal conditions for X‐ray fluorescence analysis of milk products with varying fat content

The design of experiments was used to study sources of errors in the sample preparation and to choose optimal conditions for X‐ray fluorescence (XRF) analysis of milk products of varying fat content. The measurements were performed using the conventional wavelength‐dispersive XRF (WDXRF) and the total reflection XRF (TXRF) techniques. For WDXRF, the dried milk samples were pelletized, and the mathematical models were constructed, which described the dependence of XRF intensity on the pelletizing pressure, the pellet weight and the milk fat content. The effect of radiation time on the stability of pressed milk powder samples was also estimated. When applying TXRF, the sample preparation involved diluting milk samples with the ultrapure water, adding the internal standard (Ga) and drying of a sample aliquot on a quartz glass sample carrier. The mathematical models were designed, which described the dependence of the sample preparation error on the dilution ratio and sample aliquot pipetted on the carrier. A physical interpretation of the obtained mathematical models was proposed. Copyright © 2013 John Wiley & Sons, Ltd.     

X‐ray fluorescence spectrometry in Dar es Salaam

Energy‐dispersive x‐ray fluorescence (EDXRF) analysis has been established at the University of Dar es Salaam, Faculty of Science, Department of Physics. Calibration was conducted using thin films from Micromatter (USA) for secondary target XRF. We report on the performance of the spectrometer including the detection limits attained, which range from 0.01 to 10 ng cm^?2 using collimators of 6 and 8 mm diameter under excitation conditions of 50 kV, 35 mA. The accuracy of the measurements was checked using IAEA SOIL‐7 and NIST 3087a Certified Reference Materials. The experimental values differed by <5% from the certified values. The total reflection x‐ray fluorescence (TXRF) facility added as a module to the existing XRF system provides detection limits between 0.1 and 100 pg for most of the elements measured. Copyright © 2005 John Wiley & Sons, Ltd.     

The quantification of total lead in lipstick specimens by total reflection X‐ray fluorescence spectrometry

Lipstick is known to contain lead, and this has been a general area of concern. Methods of quantifying lead in lipstick currently require the use of rather harsh digestion procedures given that lipstick specimens are high in their lipid content and contain many refractory materials. A simple method of performing lead analysis in lipstick specimens based on total reflection X‐ray fluorescence spectrometry (TXRF) is presented here. Samples were prepared by melting lipstick specimens along with a non‐ionic surfactant and an yttrium internal standard followed by homogenization. Solid prepared samples were then finely streaked directly onto a quartz reflector, and TXRF measurements made for 900‐s live time. The method was found to produce a mean limit of detection for lead of 0.04μg/g. Precisions were found to be on the order of 11–38% relative standard deviation (RSD) and apparent recoveries for lead between 92% and 106% (n = 8). Although the spreading technique may result in thickness variations that may contribute to the higher than expected variances about the determined lead concentrations, the method presented in this work does show promise as a means of performing routine lead analysis in lipstick specimens without the need for harsh digestion procedures. Copyright © 2015 John Wiley & Sons, Ltd.     

Total reflection x‐ray fluorescence spectrometer with parallel primary beam

A new type of x‐ray optical device with two curved mirrors was tested experimentally for total reflection x‐ray fluorescence (TXRF). When focusing optics are used to increase the primary beam intensity at the sample position of TXRF spectrometers, it is always associated with an increase in the angular divergence, which is tolerable to only a limited extent. The possibility of improving the divergence by means of an additional curved mirror was reported in the past. One may hope that this additional mirror will correct some of the adverse characteristics of conventional x‐ray sources, such as the angular divergence and the intensity at the sample position. Copyright © 2005 John Wiley & Sons, Ltd.     

Natural water specimen preparation for TXRF analysis using a Johansson wavelength‐dispersive spectrometer

A special method of specimen preparation is described aimed at achieving a small size of the order of 50 µm. The difficulty is especially great when preparing droplet residues from natural water on a silicon wafer as a supporting material for this experiment. We report the first promising results using an HF etching method to obtain a hydrophobic silicon surface. A specimen (residue) size of ～ 80 µm was obtained on the modified silicon surface, making wavelength‐dispersive total reflection x‐ray fluorescence (WD‐TXRF) analysis possible for a standard reference sample of natural water (TMDA 53.2). Copyright © 2004 John Wiley & Sons, Ltd.     

Chemical analysis of very small‐sized samples by wavelength‐dispersive X‐ray fluorescence

The chemical characterisation of very small‐sized samples is often of major interest in forensic analysis, studies of artworks, particulate matter on filters, raw materials impurities, and so on, although it generally poses considerable problems owing to the difficulty of obtaining precise and accurate results. This study was undertaken to develop a set of methods for the chemical characterisation of very small‐sized samples by wavelength‐dispersive X‐ray fluorescence. To conduct the study, sample preparation (as beads and pellets) and measurement conditions were optimised to reach the necessary detection and quantification limits and to obtain the appropriate measurement uncertainty for characterising the types of materials involved. The measurements were validated by using reference materials. Three test methods were developed. In two methods, the samples were prepared in the form of beads (one method being for geological materials and the other for the analysis of nongeological materials such as particulate matter on filters, glasses, frits, and ceramic glazes and pigments). In the third method, the samples were prepared in the form of pellets for the analysis of volatile elements in geological materials. In the three methods, detection limits, quantification limits and measurement uncertainties were obtained similar to those found when a bead or pellet is prepared by the usual methods from 0.5 g sample. However, in this study, sample size was between 30 and 40 times smaller in the case of beads and 100 times smaller in the case of pellets, thus broadening the range of possible wavelength‐dispersive X‐ray fluorescence applications in the chemical characterisation of materials. Copyright © 2012 John Wiley & Sons, Ltd.     

Concentration‐ and temperature‐dependent conformation change of cyclohexyl isocyanide on gold nanoparticle surfaces

The conformational changes of cyclohexyl isocyanide (CHNC) on gold nanoparticle surfaces were investigated by means of concentration‐ and temperature‐dependent surface‐enhanced Raman scattering (SERS). The equatorial chair conformer appeared to be dominant at high‐bulk concentrations or low temperatures, whereas both the equatorial and axial chair conformers of CHNC were found to exist at low‐bulk concentrations or high temperatures as in the previous reports of cyclohexanethiol (CHT). Depending on concentrations and temperatures, the spectral changes of the NC stretching vibration on gold nanoparticles appeared to be more conspicuous than those of the cyclohexyl ring modes. A density functional theory (DFT) calculation was performed at the level of B3LYP/6‐31G + + (d,p) to compare the energetic stability of the various conformers of CHT and CHNC. The energy differences between the equatorial and axial chair conformers were predicted to be smaller for CHNC than for CHT by ∼3 kJ mol⁻¹ from the DFT calculation. Copyright © 2008 John Wiley & Sons, Ltd.     

Analysis of saliva and gingival crevice fluid by total reflection X‐ray fluorescence (TXRF)

The study of liquid biological samples with the use of various techniques has become a routine task nowadays. Saliva has been a study object for the correlation of chemical elements with a disorder in human body. Saliva is an aqueous hypotonic fluid and transparent and produced by various secretory glands (parotid, submandibular, sublingual, and smaller glands). This paper uses the technique of total reflection X‐ray fluorescence (TXRF) to analyze saliva samples collected in duct of the parotid gland and the gingival crevice between first (tooth 46) and second (tooth 47) grinding teeth of seven individuals. Using the TXRF technique, the main objective of this work was to assess the results obtained quali‐quantitatively. The chemical elements identified in saliva samples of the parotid gland and the gingival crevice were P, S, Cl, K, Ca, Ti, Mn, Fe, Cu, Zn, Se, Br, Rb, and Pb. Although different elements have been identified in the analyzed samples, the identified chemical elements have varied from one individual to another. Comparing the results obtained from the saliva samples of parotid gland and the gingival crevice, it could be observed in the gingival crevice other elements not found in the parotid gland. Therefore, the sampling strategy and the TXRF technique was able to differentiate chemical elements in the samples of the parotid gland and the gingival crevice. Copyright © 2016 John Wiley & Sons, Ltd.     

TXRF intensity dependence on position of dried residue on sample carrier and TXRF determination of halogen in liquid samples

Total reflection X‐ray fluorescence (TXRF) spectroscopy is an effective technique for simultaneous multi‐elemental trace analysis of a small volume of a sample placed on a flat substrate. An internal standard method is usually applied for quantitative TXRF analysis of liquid samples such as drinking water and environmental samples. However, it was difficult to determine Cl and Br because they were lost as volatile hydrogen halide compounds by adding an acid internal standard solution. Thus, we attempted to apply the traditional calibration curve method for the determination of halogens without internal standard. If internal standard method is not applied, the TXRF intensity drastically changes depending on the relative position of the dried residue to the detector. Therefore, we investigated the relationship between TXRF intensity and the position of dried residue relative to the detector. As a result, it was confirmed that TXRF intensity critically depended on the position of the dried residue on the sample carrier. The position of the droplet of the sample solution was carefully controlled by using an air blower in order to place the dried residue at the most effective position on the sample carrier. We could successfully make a calibration curve for Cl with a good relationship without internal standard. Finally, Cl in the NaCl solutions (0 –5 ppm, 10 µl) was successfully determined by the calibration curve method using a table‐top TXRF instrument. The limit of detection of Cl was 63 ppb (ng/ml). Copyright © 2016 John Wiley & Sons, Ltd.     

ED‐XRF set‐up for size‐segregated aerosol samples analysis

The knowledge of size‐segregated elemental concentrations in atmospheric particulate matter (PM) gives a useful contribution to the complete chemical characterisation; this information can be obtained by sampling with multi‐stage cascade impactors. In this work, samples were collected using a low‐pressure 12‐stage Small Deposit Impactor and a 13‐stage rotating Micro Orifice Uniform Deposit Impactor^?. Both impactors collect the aerosol in an inhomogeneous geometry, which needs a special set‐up for X‐ray analysis. This work aims at setting up an energy dispersive X‐ray fluorescence (ED‐XRF) spectrometer to analyse quantitatively size‐segregated samples obtained by these impactors. The analysis of cascade impactor samples by ED‐XRF is not customary; therefore, as additional consistency test some samples were analysed also by particle‐induced X‐ray emission (PIXE), which is more frequently applied to size‐segregated samples characterised by small PM quantities. A very good agreement between ED‐XRF and PIXE results was obtained for all the detected elements in samples collected with both impactors. The good inter‐comparability proves that our methodology is reliable for analysing size‐segregated samples by ED‐XRF technique. The advantage of this approach is that ED‐XRF is cheaper, easier to use, and more widespread than PIXE, thus promoting an intensive use of multi‐stage impactors. Copyright © 2011 John Wiley & Sons, Ltd.