Conductivity of ITO film amplified by multi‐step ion beam‐treatment on PET layers at room temperature

In this paper, we investigate poly‐crystal indium tin oxide (ITO) film produced by a multi‐step ion beam treatment on polyethylene terephthalate (PET) at room temperature. In the process of ITO film deposition by a sputtering method, we perform an ion beam treatment after some quantity of ITO deposition is complete, and this process is carried out repeatedly until the required film thickness is achieved. X‐ray diffraction indicates that the ITO film deposited by our multi‐step ion beam treatment has an almost poly‐crystal structure with a morsel of amorphous structure in the PET layers. As a supplementary measurement, a contact angle method shows that the poly‐crystal structure is due to a surface charge effect. Consequently, the electrical conductivity of the ITO film (resistivity measurement error bar < 0.7%) with the multi‐step ion beam treatment is eight times higher than that of single‐treated ITO film, due to this poly‐crystal structure. Copyright © 2012 John Wiley & Sons, Ltd.     

Preparation and resistivity study of silver nanocomposite films using spin‐assisted layer‐by‐layer assembly

Nanocomposite films [Ag/(PAH‐PSS)_nPAH]_m were fabricated on a silicon substrate using a time‐ and cost‐efficient spin‐assisted layer‐by‐layer (SA‐LbL) self‐assembly technique. A virtually monolayer‐like layer of self‐assembled silver nanoparticles was formed when deposition time increased to 30 min. It was found that polymer multilayers could effectively decrease the resistivity of silver nanoparticle monolayer, which was far higher than that of bulk silver metal; however, the resistivity of Ag/(PAH‐PSS)_nPAH multilayer films increased along with the increasing of the number of polymer bilayers. XPS investigations showed that silver nanoparticles were partially oxidized, which might be the major cause of the high resistivity of silver nanoparticle monolayer. Copyright © 2008 John Wiley & Sons, Ltd.     

Substrate temperature effects on the structural,compositional, and electrical properties of VO2 thin films deposited by pulsed laser deposition

The vanadium dioxide (VO₂) thin films were deposited on silicon (100) substrate using the pulsed laser deposition technique. The thin films were deposited at different substrate temperatures (500°C, 600°C, 700°C, and 800°C) while keeping all the other parameters constant. X‐ray diffraction confirmed the crystalline VO₂ (B) and VO₂ (M) phase formation at different substrate temperatures. X‐ray photoelectron spectroscopy analysis showed the presence of V⁴⁺ and V⁵⁺ charge states in all the deposited thin films which confirms that the deposited films mainly consist of VO₂ and V₂O₅. An increase in the VO₂/V₂O₅ ratio has been observed in the films deposited at higher substrate temperatures (700°C and 800°C). Scanning electron microscope micrographs revealed different surface morphologies of the thin films deposited at different substrate temperatures. The electrical properties showed the sharp semiconductor to metal transition behavior with approximately 2 orders of magnitude for the VO₂ thin film deposited at 800°C. The transition temperature for heating and cooling cycles as low as 46.2°C and 42°C, respectively, has been observed which is related to the smaller difference in the interplanar spacing between the as‐deposited thin film and the standard rutile VO₂ as well as to the lattice strain of approximately −1.2%.     

Transparent and soluble polyimide films containing 4,4′‐isopropylidenedicyclohexanol (Cis‐HBPA) units: Preparation,characterization, thermal,mechanical, and dielectric properties

To develop colorless and soluble polyimide films, cis‐hydrogenated bisphenol A (cis‐HBPA) was successfully separated from HBPA isomers, and two novel monomers containing cis‐HBPA unit, 4,4 ′ ‐(4,4 ′ ‐isopropenylbicyclohexyloxy) diphthalic anhydride (HBPADA) and 4,4 ′ ‐(4,4 ′ ‐isopropenylbicyclohexyloxy) dianiline (f) were designed and synthesized. PI–(1 – 5) were achieved from HBPADA and five kinds of aromatic diamines and PI – 6 from HBPADA and semiaromatic diamine f via a two‐step thermal imidization. All the polyimides could afford flexible, tough, and transparent films with transparency as high as 86% at 450 nm. Surprisingly, the polyimides containing cis‐HBPA unit exhibited excellent solubility not only in polar solvents such as N, N‐dimethylacetamide, but also in low boiling solvents such as chloroform and dichloromethane. Additionally, analogues aromatic PI – 7 derived from 4,4 ′ ‐(hexafluoroisopropylidene)‐diphthalic anhydride (6FDA) and 2,2‐bis(4‐aminophenyl)hexafluoropropane (e) was obtained for comparison with PI–(1 – 6) on aspects of thermal, mechanical, soluble, optical, electrical, and morphological properties. The structure‐property relationships of PI–(1 – 7) were investigated in detail. © 2018 Wiley Periodicals, Inc. J. Polym. Sci., Part A: Polym. Chem. 2018 , 56, 2115–2128     

Effects of gold‐induced crystallization process on the structural and electrical properties of germanium thin films

Gold‐induced (Au‐) crystallization of amorphous germanium (α‐Ge) thin films was investigated by depositing Ge on aluminum‐doped zinc oxide and glass substrates through electron beam evaporation at room temperature. The influence of the postannealing temperatures on the structural properties of the Ge thin films was investigated by employing Raman spectra, X‐ray diffraction, and scanning electron microscopy. The Raman and X‐ray diffraction results indicated that the Au‐induced crystallization of the Ge films yielded crystallization at temperature as low as 300°C for 1 hour. The amount of crystallization fraction and the film quality were improved with increasing the postannealing temperatures. The scanning electron microscopy images show that Au clusters are found on the front surface of the Ge films after the films were annealed at 500°C for 1 hour. This suggests that Au atoms move toward the surface of Ge film during annealing. The effects of annealing temperatures on the electrical conductivity of Ge films were investigated through current‐voltage measurements. The room temperature conductivity was estimated as 0.54 and 0.73 Scm⁻¹ for annealed samples grown on aluminum‐doped zinc oxide and glass substrates, respectively. These findings could be very useful to realize inexpensive Ge‐based electronic and photovoltaic applications.     

Sputter‐deposited Ni/Ti double‐bilayer thin film and the effect of intermetallics during annealing

In the present study, a double bilayer of a Ni/Ti thin film was investigated. A nanoscale NiTi thin film is deposited in a Ni–Ti–Ni–Ti manner to form a double‐bilayer structure on a Si(100) substrate. Ni and Ti depositions were carried out by using d.c. and r.f. power, respectively, in a magnetron sputtering chamber. Four types of bilayers are formed by varying the deposition time of each layer (i.e. 15, 20, 25, and 30 min). The as‐deposited amorphous thin films were annealed at 300, 400, 500, and 600 °C for 1 h to achieve the diffusion in between the layers. Microstructures were analyzed using field‐emission scanning electron microscope and high‐resolution transmission electron microscope. It was found that, with the increase in annealing temperature from 300 to 600 °C, the diffusion at the interface and atomic migration on the surface increase. Cross‐sectional micrographs exhibited the interdiffusion between the two‐layer constituents, especially at higher temperatures, which resulted in diffusion patches along the interface. Phase analyses, performed by grazing incidence X‐ray diffraction, showed the formation of intermetallic compounds with some silicide phases that enhance the mechanical properties. Nanoindentation and atomic force microscopy were carried out to know the mechanical properties and surface profiles of the films. The surface finish is better at higher annealing temperatures. It was found that for annealing temperatures varying from 300 to 600 °C, the increase in annealing temperature resulted in a gradual increase in atomic‐cluster coarsening with improved adatom mobility. Copyright © 2016 John Wiley & Sons, Ltd.     

Ion‐beam‐induced morphology on the surface of thin polymer films at low current density and high ion fluence

The effect of Xe⁺ bombardment on the surface morphology of four different polymers, polystyrene (PS), poly(phenylene oxide), polyisobutylene, and polydimethylsiloxane, was investigated in ion energy and fluence ranges of interest for secondary ion mass spectrometry depth‐profiling analysis. Atomic force microscopy (AFM) was applied to analyze the surface topography of pristine and irradiated polymers. AFM analyses of nonirradiated polymer films showed a feature‐free surface with different smoothness. We studied the influence of different Xe⁺ beam parameters, including the incidence angle, ion energy (660–4000 eV), current density (0.5 × 10² to 8.7 × 10² nA/cm²), and ion fluence (4 × 10¹⁴ to 2 × 10¹⁷ ion/cm²). Xe⁺ bombardment of PS with 3–4 keV at a high current density did not induce any change in the surface morphology. Similarly, for ion irradiation with lower energy, no surface morphology change was found with a current density higher than 2.6 × 10² nA/cm² and an ion fluence up to 4 × 10¹⁶ ion/cm². However, Xe⁺ irradiation with a lower current density and a higher ion fluence led to topography development for all of the polymers. The roughness of the polymer surface increased, and well‐defined patterns appeared. The surface roughness increased with ion irradiation fluence and with the decrease of the current density. A pattern orientation along the beam direction was visible for inclined incidence between 15° and 45° with respect to the surface normal. Orientation was not seen at normal incidence. The surface topography development could be explained on the basis of the balance between surface damage and sputtering induced by the primary ion beam and redeposition–adsorption from the gas phase. Time‐of‐flight secondary ion mass spectrometry analyses of irradiated PS showed strong surface modifications of the molecular structure and the presence of new material. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 314–325, 2001     

Stress behaviors and thermal properties of polyimide thin films depending on the different curing process

The effect of high boiling point solvent on the residual stress behaviors of semiflexible structure poly(4,4′‐oxydiphenylene pyromellitimide) (PMDA‐ODA) and pseudo‐rodlike poly(p‐phenylene biphenyltetracarboximide) (BPDA‐PDA) polyimide was investigated. As a solvent, a mixed solution of 20 wt % cyclohexyl‐2‐pyrrolidone (CHP; bp = 307 °C) and 80 wt % n‐methyl‐2‐pyrrolidone (NMP; bp = 202 °C) was used. The effects of solvent system and imidizing history on the morphological structure, as well as residual stress, were significantly high in the BPDA‐PDA having high chain rigidity, but relatively low in the semiflexible PMDA‐ODA with low chain rigidity. In addition, rapidly cured films prepared from PAA (NMP/CHP) showed higher residual stress and a lower degree of molecular anisotropy than slowly cured film imidized from PAA (NMP). This was induced by high chain mobility in polyimide thin films prepared from PAA (NMP/CHP) during the thermal cure process. Therefore, molecular anisotropy, depending on the solvent system and imidizing history, might be one of the important factors leading to low residual stress in polyimide thin films. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 38: 2879–2890, 2000     

Effect of (3‐glycidyloxypropyl)trimethoxysilane (GOPS) on the electrical properties of PEDOT:PSS films

Poly(3,4‐ethylenedioxythiophene) doped with poly(styrenesulfonate) (PEDOT:PSS) has been reported as a successful functional material in a broad variety of applications. One of the most important advantages of PEDOT:PSS is its water‐solubility, which enables simple and environmental friendly manufacturing processes. Unfortunately, this also implies that pristine PEDOT:PSS films are unsuitable for applications in aqueous environments. To reach stability in polar solvents, (3‐glycidyloxypropyl)trimethoxysilane (GOPS) is typically used to cross‐link PEDOT:PSS. Although this strategy is widely used, its mechanism and effect on PEDOT:PSS performance have not been articulated yet. Here, we present a broad study that provides a better understanding of the effect of GOPS on the electrical and electronic properties of PEDOT:PSS. We show that the GOPS reacts with the sulfonic acid group of the excess PSS, causing a change in the PEDOT:PSS film morphology, while the oxidation level of PEDOT remains unaffected. This is at the origin of the observed conductivity changes. © 2017 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2017 , 55, 814–820     

Preparation and morphological,electrical, and mechanical properties of polyimide‐grafted MWCNT/polyimide composite

Precursor of polyimide, polyamic acid has been prepared sucessfully. Acid‐modified carbon nanotube (MWCNT) was grafted with soluble polyimide then was added to the polyamic acid and heated to 300 °C to form polyimide/carbon nanotube composite via imidation. Morphology, mechanical properties and electrical resistivity of the MWCNT/polyimide composites have been studied. Transmission electron microscope microphotographs show that the diameter of soluble polyimide‐grafted MWCNT was increased from 30–60 nm to 200 nm, that is a thickness of 70–85 nm of the soluble polyimide was grafted on the MWCNT surface. PI‐g‐MWCNT was well dispersed in the polymer matrix. Percolation threshold of MWCNT/polyimide composites has been investigated. PI‐g‐MWCNT/PI composites exhibit lower electrical resistivity than that of the acid‐modified MWCNT/PI composites. The surface resistivity of 5.0 phr MWCNT/polyimide composites was 2.82 × 10⁸ Ω/cm² (PI‐g‐MWCNT) and 2.53 × 10⁹ Ω/cm² (acid‐modified MWCNT). The volume resistivity of 5.0 phr MWCNT/polyimide composites was 8.77 × 10⁶ Ω cm (PI‐g‐MWCNT) and 1.33 × 10¹³ Ω cm (acid‐modified MWCNT).Tensile strength and Young's modulus increased significantly with the increase of MWCNT content. © 2007 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 45: 3349–3358, 2007     

Power‐law scaling of structured poly(p‐xylylene) films deposited by oblique angle

This study describes the evolution and growth of structured polymers by oblique angle deposition of poly(p‐xylylene) (PPX) derivatives. The deposition of structured PPX polymers have been demonstrated recently, but the mechanism of growth has not been studied. Here, we provide experimental evidence for the growth of structured PPX polymers by an atomic force microscope, electron microscope, and a profilometer. Individual columns expand with respect to their heights according to a power‐law, d = ch^p, where d is the column diameter, c and p are constants, and h is the height of a column. Values of p for structured poly(chloro‐p‐xylylene), poly(trifloroacetly‐p‐xylylene‐co‐p‐xylylene), and poly(bromo‐p‐xylylene) films are estimated as 0.11 ± 0.01, 0.15 ± 0.01, and 0.18 ± 0.01, respectively. This result is different from the traditional oblique angle deposition processes of nonpolymeric materials where the surface diffusion is low. Further analysis with two‐dimensional power spectral density (PSD) method showed that the ordering of columns is quasi‐periodic. Additionally, the X‐ray and transmission electron microscope characterization of the columns revealed that the columns are semicrystalline. © 2008 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 46: 640–648, 2008     

Modification in structural,optical, morphological,and electrical properties of zinc oxide (ZnO) nanoparticles (NPs) by metal (Ni,Co) dopants for electronic device applications

In the present work, Zinc Oxide (ZnO) nanoparticles (NPs) were synthesized by the chemical co-precipitation method using Zinc Chloride as the initial chemical, while Nickel and Cobalt chloride as dopants. Phase identification of metal (Ni, Co) doped Zinc Oxide nanoparticles (NPs) was observed using x-ray diffraction (XRD). The small lattice distortion or phase changes appeared due to shifting of diffraction angles peaks towards larger angle in ZnO are corresponded to metal (Ni, Co) dopant. The average crystallite size appears to decrement in NP size from 7.67 nm to 6.52 nm and 5.35 nm to 5.17 nm with increasing 5 % to 80 % of metal (Ni, Co) dopant respectively. The optical characteristics, including the absorption spectra of the prepared sample were observed through UV–Vis spectroscopy, Meanwhile SEM confirmed the observation of composition change in specimen with metal (Ni, Co) dopant concentration. The bandgap value was also found decrement 5.23 eV to 5.05 eV with increment of metal (Ni, Co) dopant concentration. The functional groups were measured by Fourier transformation infrared spectroscopy (FTIR). FTIR peaks found the metal (Ni, Co) doped ZnO with the vibration mode of (Zn²⁺ –O^2?) ions due to the increment of dopant concentrations. Furthermore, electrical results show the ohmic behavior of prepared samples. These findings indicate the possibility of tuning optical, structural and electrical properties of metal (Ni, Co) doped ZnO with various dopant concentrations of Nickel and will have great potential to find application in optoelectronic devices.     

Synthesis, electrical properties, and structural features of copper-containing chalcogenide films produced by the chemical deposition method

Multicomponent copper-containing CuI-AsI₃-As₂Se₃ and CuI-Sb₃I-As₂Se₃ chalcogenide films were produced by chemical deposition from solutions of chalcogenide glasses in n-butylamine and their electrical conductivity was studied. It was shown that the electrical properties of chalcogenide glasses and films based on these glasses have the same values within experimental error. It was found sing Mossbauer spectroscopy that antimony atoms are in the Sb(III) state in the environment of three selenium atoms, and copper ions in the Cu(I) state and are surrounded by iodine atoms. The chalcogenide films can be used to fabricate ion-selective electrodes sensitive to copper cations.     

Kinetic study of low‐temperature imidization of poly(amic acid)s and preparation of colorless,transparent polyimide films

Conventional synthesis of polyimides includes high‐temperature (160–350 °C) imidization of poly(amic acid)s. In the present work, imidization has been carried out at much lower temperatures (40–160 °C). 1,2,4,5,‐cyclohexanetetracarboxylic dianhydride (HPMDA) or pyromellitic dianhydride (PMDA) was polymerized with an aromatic diamine, 4,4′‐diaminodiphenylmethane (DDPM), to give poly(amic acid)s, which were then imidized chemically. Imidization was more than 90% complete even at the very low imidization temperature of 40 °C. It was found that the imidization occurs in two steps: an initial rapid cyclization and a subsequent slower cyclization. The activation energy for the rapid process was determined to be 4.3 kJ/mol, and that of the slower process, 4.8 kJ/mol. As the imidization temperature decreases, the transmittance of the resulting polyimides tends to gradually increase, the cutoff wavelength decreases and the color becomes pale. A partially aliphatic polyimide based on HPMDA and DDPM prepared at 40 °C yielded thin films that were highly transparent and colorless, and had good flexibility, solubility and thermal stability. The polyimide films prepared in this study may be good candidates for flexible, transparent plastic substrates in the display industry. © 2015 Wiley Periodicals, Inc. J. Polym. Sci., Part A: Polym. Chem. 2016 , 54, 1593–1602     

Influence of thermal annealing on the structural and optical properties of maghemite (γ‐Fe2O3) nanoparticle thin films

In this study, maghemite (γ‐Fe₂O₃) nanoparticles were initially synthesized via chemical co‐precipitation and then deposited by spray pyrolysis as thin films on white glass substrates. The thin films were annealed for 8 h at 400, 450, 500, 550, and 600 °C in an oven. The structural studies of maghemite nanoparticles were carried out using X‐ray diffractometer. Structural properties that we investigated by X‐ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, SEM, and Energy dispersive X‐ray analysis (EDS). Optical properties of the samples were also investigated by ultraviolet‐visible (UV–vis) spectroscopy. The results showed that maghemite nanoparticles have crystalline structure with domain that increases in size with increasing annealing temperature. The optical band gap values were found to reduce from 2.9 to 2.4 eV with increase in annealing temperature. Copyright © 2015 John Wiley & Sons, Ltd.     

Poly(vinyltriethoxysilane) modified MWCNT/polyimide nanocomposites—Preparation,morphological, mechanical,and electrical properties

Multi‐walled carbon nanotube (MWCNT) modified by vinyltriethoxysilane (VTES) via free radical reaction has been prepared (poly (vinyltriethoxysilane) modified MWCNTs, PVTES‐MWCNT). Precursor of polyimide, polyamic acid has been synthesized by reacting 4,4′‐oxydianiline with 3,3′,4,4′‐benzophenone tetracarboxylic dianhydride. PVTES‐MWCNT were then mixed with polyamic acid and heated to 300 °C to form CNT/polyimide composite. During the imidization processes, the silanes on CNT surface reacted with each other and may be connected together by covalent bond (Si? O? Si). The PVTES‐MWCNT was analyzed by Fourier transform infrared and X‐ray photoelectron spectroscopy. The PVTES‐MWCNT/polyimide composites were analyzed by CP/MAS solid state ²⁹Si nuclear magnetic resonance (NMR) spectroscopy. Morphological properties of the PVTES‐MWCNT/polyimide composites were investigated by scanning electron microscope and transmission electron microscope. Electrical conductivity increased dramatically comparing to the unmodified MWCNT/polyimide composites. Mechanical properties of nanocomposite were enhanced significantly by PVTES‐MWCNT. © 2007 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 46: 803–816, 2008     

Luminescence properties of Cu‐ion‐implanted and annealed ZnO thin films deposited by chemical vapor deposition and pulsed laser deposition

Ion implantation techniques were used to study the effect of an MgO additive on the luminescence properties induced by Cu in ZnO thin films. Cu ions (accelerating voltage of 75 keV, dose of 4.5 × 10¹⁴ ions/cm²) were implanted at room temperature in nondoped and Mg‐doped ZnO thin films. After annealing, emissions in the visible region originating from Cu phosphor were observed at 510 nm in CVD‐ZnO and at 450 nm in Mg‐doped ZnO (MZO) thin films. The Cu depth profile shows distortion in the low‐concentration region of CVD‐ZnO. After the annealing, the Cu implant was homogenized in thin films, and then the Cu concentration was determined to be 1.5 × 10¹⁹ ions/cm³ in CVD‐ZnO and 5.6 × 10¹⁸ ions/cm³ in MZO thin films. Copyright © 2005 John Wiley & Sons, Ltd.     

XPS studies of Ni deposition on polymethyl methacrylate and poly(styrene‐co‐acrylonitrile)

Thin Ni layers were deposited onto clean polymethyl methacrylate (PMMA) and poly(styrene‐co‐acrylonitrile) (SAN) surfaces by a high vacuum thermal evaporation process. The resulting interfaces were studied by X‐ray photoelectron spectroscopy. The Ni deposition on PMMA changes the relative intensity of the C1s spectra associated with the O CO and C O carbon species, and modifies the shape of the O1s peak, while the Ni evaporation on SAN alters the C1s band intensity assigned to the CN moiety and gives a second N1s band at low binding energies. These observations suggest the formation of new chemical species at the interface between Ni and the PMMA ester group, and between Ni and the SAN nitrile group, which are the most reactive sites on these two polymers. Copyright © 2000 John Wiley & Sons, Ltd.     

Preparation, characterization and dielectric properties of 4,4-diphenylmethane diisocyanate (MDI) based cross-linked polyimide films

Four different types of cross-linked polyimides based on 4,4-diphenylmethane diisocyanate (MDI) were prepared by the reaction of different types of conventional poly(amic acid) intermediates with MDI as a cross-linking agent. Subsequently, they were thermally imidized in order to obtain corresponding cross-linked polyimide structure. The results of FTIR-ATR showed that MDI can effectively react with carboxylic acid groups of PAA to form cross-linked polyimide films. TGA, FTIR-ATR and SEM analyses were carried out for characterization of cross-linked polyimide (CPI) films. Moreover, the electrical properties such as dielectric breakdown strength, dielectric constant, I-V characteristics and loss factor of MDI based cross-linked polyimides have been checked. In addition, some physical properties such as water uptake, adhesion, hardness and solubility properties of the films were investigated.The results showed that all CPI films have good insulating properties such as high dielectric breakdown voltage, low loss factor (tan δ), leakage density and excellent physical properties.     

Rotation‐assisted formation of poly(3‐butylthiophene) nanowires: Morphology,microstructure, and electrical property

The phenomenon of “shear‐induced crystallization” is commonly observed for crystalline polymers. Herein, we demonstrate that this concept can be applied to promote the self‐assembly of the conductive nanowires (NWs) in dilute solution. It is found that, by a simple rotation‐assisted method, higher yield of poly(3‐butylthiophene) (P3BT) NWs in anisole solvent was obtained than the case under static condition. While the length as well as the crystal modification of the NWs is not changed. The structural analysis suggests that the P3BT NWs take the crystal modification of form I′ rather than the conventional form I, independent of the sampling condition. This conclusion is further confirmed by investigating the phase transition behavior of the NWs using synchrotron radiation wide‐angle X‐ray diffraction technique. Unexpectedly, the active layer in field‐effect transistor (FET) device fabricated by well‐shaped pure NWs network formed under the rotation field shows the comparable carrier mobility with that fabricated by the ambiguous NWs network obtained under the static condition, which implies that the amorphous part plays an important role in affecting the electrical property. © 2018 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2018 , 56, 1027–1034