Electroless plating of copper on Si(100) surfaces modified by surface‐initiated atom‐transfer radical polymerization of 4‐vinylpyridine

Surface‐initiated atom‐transfer radical polymerization (ATRP) of 4‐vinylpyridine (4VP) on a pretreated Si(100) surface was carried out. The composition and topography of the Si(100) surface modified by poly(4‐vinylpyridine) (P4VP) were characterized by XPS and atomic force microscopy (AFM), respectively. The P4VP layer on the Si(100) surface was used not only as chemisorption sites for the palladium complexes without prior sensitization by SnCl₂ solution during the electroless plating, but also as an adhesion promotion layer for the electrolessly deposited copper. The electrolessly deposited copper on the Si–P4VP surface exhibited a 180° peel adhesion strength above 6 N/cm. The adhesion strength was much higher than that of the electrolessly deposited copper to the pristine silicon surface. Copyright © 2008 John Wiley & Sons, Ltd.     

Coverage‐ and Temperature‐Dependent Metalation and Dehydrogenation of Tetraphenylporphyrin on Cu(111)

Using temperature‐programmed desorption, supported by X‐ray photoelectron spectroscopy and scanning tunneling microscopy, a comprehensive overview of the main reactions of 5,10,15,20‐tetraphenyl‐21H,23H‐porphyrin (2HTPP) on Cu(111) as a function of coverage and temperature is obtained. Three reactions were identified: metalation with Cu substrate atoms, stepwise partial dehydrogenation, and finally complete dehydrogenation. At low coverage the reactions are independent of coverage, but at higher coverage metalation becomes faster and partial dehydrogenation slower. This behavior is explained by a weaker interaction between the iminic nitrogen atoms and the Cu(111) surface in the high‐coverage checkerboard structure, leading to faster metalation, and the stabilizing effect of T‐type interactions in the CuTPP islands formed at high coverage after metalation, leading to slower dehydrogenation. Based on the amount of hydrogen released and the appearance in STM, a structure of the partially dehydrogenated molecule is suggested.     

Interlaboratory study comparing analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy data

An interlaboratory study has been conducted to determine the following: (i) the similarities and differences of film thicknesses and composition profiles obtained from analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) data by different analysts using different algorithms for data analysis, and (ii) the effects of two assumptions commonly made in data‐analysis algorithms for ARXPS on derived film thicknesses and composition profiles. The analyzed data were generated by the National Institute of Standards and Technology Database for the Simulation of Electron Spectra for Surface Analysis, (SESSA) which provides a simple way to study the influence of the aforementioned effects on compositional depth profile reconstruction. Sets of simulated ARXPS data were produced for thin films of SiO₂, SiON, HfO₂, and HfON of varying thicknesses on a Si substrate. For some HfON films, the N concentration varied with depth. Eleven groups participated in the round robin study. The majority (eight) employed a commercial ARXPS instrument in which the angular distribution is measured for a fixed sample geometry, in contrast to conventional ARXPS in which the sample is tilted for angular variation. The average deviations between the reported average depth, film thickness, and amount of material typically varied between 20% and 30% but were considerably larger, between 30% and 80%, for some cases. The average errors were generally larger for simulations that included elastic scattering and the finite analyzer‐acceptance angle (realistic conditions) than those for simulations that neglected elastic scattering and the finite analyzer‐acceptance angle (simplified conditions). The retrieved N depth profiles were quantitatively different from the true depth profiles and showed substantial variability among the group of members who used the same instrument and analysis software. Copyright © 2014 John Wiley & Sons, Ltd.     

Copper nanoparticles seeded functionalized‐PVC plastic surface for electroless nickel deposition

A novel and facile activation process for electroless nickel deposition was developed. The semi‐interpenetrating polymer network hydrogel biofilm was used to functionalize the inert poly(vinyl chloride) (PVC) surface, and then Cu nanoparticles, which can initial the subsequent electroless nickel deposition successfully seeded on the functionalized‐PVC surface. The samples were characterized by scanning electron microscopy, X‐ray photoelectron spectroscopy, X‐ray diffraction, and transmission electron microscopy. The results show that the hydrogel film provided the PVC surface with amino groups and Cu nanoparticles of 20–50 nm in size could be functioned as the catalytic nuclei for the subsequent electroless metal deposition on PVC plastic. It can be concluded that the novel Cu activation was effective for the nickel deposition on PVC surface, because of more chemisorption sites for Cu nanoparticles generated on PVC surface. Copyright © 2013 John Wiley & Sons, Ltd.     

XPS characterisation of carbon‐coated alumina support

Hybrid carbon–alumina supports, synthesised by pyrolysis of grafted 4,4′‐methylenebis‐(phenylisocyanate) moiety on the alumina surface, were characterised by X‐ray photoelectron spectroscopy. The recorded Al 2p and C 1s envelopes showed asymmetry that decreased with an increase in carbon loading. In all experimental Al 2p envelopes, the high‐energy individual components at 75.3–75.9 eV were present along with the low‐energy component at 74.0 eV typical for Al₂O₃. In the case of the C 1s envelope, the component around 284.3–284.4 eV and three high‐energy individual components at 285.9–286.0, 288.0–288.3 and 290.1–290.6 eV were observed. The presence of the high‐energy Al 2p components can be explained considering the occurrence of a steady‐state charging of the different parts of insulating alumina supports. The component around 284.3–284.4 eV in C 1s envelopes can be attributed to carbon, which constitutes the coating and, hence, ensures surface conductivity. The component around 285.9–286.0 eV is connected with carbon in carbonaceous surface species, which do not form the conducting layer on the alumina support. Carbonaceous surface species associated with C? O, C?O and O?C? O groups in carbon coating can be also identified due to the presence of corresponding components in XPS spectra at 285.9–286.0, 288.0–288.3 and 290.1–290.6 eV. Copyright © 2006 John Wiley & Sons, Ltd.     

Surface modification of a liquid‐crystalline polymer for copper metallization

The effects of different surface modifications on the adhesion of copper to a liquid‐crystalline polymer (LCP) were investigated with X‐ray photoelectron spectroscopy, scanning electron microscopy, atomic force microscopy, contact‐angle measurements, and pull tests. High pull‐strength values were achieved when copper was sputter‐deposited onto plasma and reactive‐ion‐etching (RIE)‐pretreated LCP surfaces. The values were comparable to the reference pull strengths obtained with laminated copper on the LCP. The adhesion was relatively insensitive to the employed feed gas in the pretreatments. The surface characterizations revealed that for RIE and plasma treatments, the enhanced adhesion was attributable to the synergistic effects of the increased surface roughness and polar component of the surface free energy of the polymer. However, if the electroless copper deposition was performed on RIE‐ or plasma‐treated surfaces, very poor adhesion was measured. Good adhesion between the LCP substrate and electrolessly deposited copper was achieved only in the case of wet‐chemical surface roughening as a result of the creation of a sufficient number of mechanical interlocking sites, together with a significant loss of oxygen functionalities, on the surface. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 623–636, 2003     

Oxidation‐induced nanostructures on Cu{100}, Cu(Ag) and Ag/Cu{100} studied by photoelectron spectroscopy

Initial surface oxidation and nanoscale morphology on Cu{100}, Cu(Ag) and Ag/Cu{100} have been investigated in situ by X‐ray photoelectron spectroscopy (XPS), X‐ray induced Auger electron spectroscopy (XAES) and the inelastic electron background analysis as a function of oxygen exposure at 3.7 × 10^?2 and 213 mbar pressures at a surface temperature of 373 K. Relative Cu₂O concentrations have been quantified by analysis of the peak shape of the XAES Cu LMM transition. The surface morphology of Cu₂O islands and the Ag layer has been characterized by inelastic electron background analysis of XAES O KLL and Ag 3d transitions. Oxygen‐induced segregation of Cu, as well as the subsequent Cu₂O island formation on Cu(Ag) and Ag/Cu{100} surfaces, has been investigated quantitatively. Our results indicate that Ag has a clear inhibitive effect on the initial oxidation and Cu₂O island formation on Cu(Ag) and Ag/Cu{100} surfaces. The Cu₂O islands are also observed to remain highly strained on Ag/Cu{100} even at higher O₂ exposures. The results suggest that strained Cu₂O islands eventually penetrate through the buried Ag layer, and in conjunction with segregating Cu atoms enable the oxidation to proceed at a similar rate to or even faster than on the unalloyed Cu surface. Copyright © 2007 John Wiley & Sons, Ltd.     

Characterization of high‐aspect‐ratio periodic structures by X‐ray photoelectron spectroscopy

X‐ray photoelectron spectroscopy (XPS) is a powerful surface characterization technique often relied on for quantification of surface species and coverages. Investigation of silicon microrods, considered a model for high‐aspect‐ratio structures, at different angles with respect to substrate normal was determined to have a significant impact on the relative sensitivity of surface‐bound species on rods relative to the base substrate. Comparison between planar silicon and microrod arrays demonstrates that the angular dependence is complicated and that careful studies must optimize conditions to differentiate between surfaces. In addition, the use of reverse angle resolved XPS, where the substrate is turned away from the X‐ray source, is shown to assist in simplifying the spectrum by removing underlying signal from the substrate near the base. Copyright © 2016 John Wiley & Sons, Ltd.     

XPS and resistive studies on thin films of a copper(II)‐based coordination polymer deposited on functionalized interdigital electrodes

A symmetrical 2‐thiopyrimidine based molecule with an expanded π‐electron system is synthesized and used to form a self‐assembled monolayer (SAM) on gold surfaces. Utilizing chemical vapor deposition a monolayer of (3‐mercaptopropyl)triethoxysilane is formed on silicon dioxide substrates. Both of these SAM coated substrates are characterized by X‐ray photoelectron spectroscopy and the growth of a coordination polymer built up from 5,5′‐(ethyne‐1,2‐diyl)bis(2‐hydroxyacetophenone) and copper(II) on dual SAM coated transducers is studied. After the deposition procedure on interdigital electrodes the electrical properties of the polymer are investigated performing resistive measurements. A significant change of the resistance, which depends on the surrounding atmosphere, proves the sensing behavior of the synthesized coordination polymer. © 2014 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2015 , 53, 335–344     

XPS investigations of ink‐jet printed paper

Different ink‐jet printed paper materials were investigated using X‐ray photoelectron spectroscopy (XPS) yielding the elemental composition of the near‐surface region of the papers. We found significant differences with respect to the detected elements and their atomic concentrations in the different inks studied here. Two different groups of inks could be identified by means of a lower ratio of the O and C atomic concentrations and lower concentrations in specific trace elements like Mg, Na and Si. High‐resolution spectra of C 1s and O 1s core levels allowed a detailed determination of the chemical state of the respective elements. On the basis of a detailed deconvolution of these XPS signals, significant differences between all the investigated ink‐jet printed papers were found, thereby allowing their discrimination. The applicability of the measurements and, more generally, the XPS technique for forensic investigations of paper are discussed. Copyright © 2007 John Wiley & Sons, Ltd.     

Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’

A summary of the workshop entitled ‘Angle‐Resolved XPS: The Current Status and Future Prospects for Angle‐resolved XPS of Nano and Subnano Films’ is given, which was held at the Riviera Maya, Mexico, 26–30 March 2007, under the main sponsorship of the International Union for Vacuum Science, Technique and Applications (IUVSTA). Angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) can provide detailed chemical as well as depth profile information about the near‐surface composition of materials and thin films. This workshop was held to review the present status and level of understanding of Angle‐resolved XPS, and to stimulate discussions leading to a deeper understanding of current problems and new solutions. The main goal of the workshop was to find better ways to perform experiments and, very importantly, better ways to extract information from the experimental data. This report contains summaries of presentations and discussions that were held in sessions entitled ‘Basics and Present Limits of ARXPS’, the Analysis of ARXPS Data, Applications of ARXPS, Equipment for ARXPS, and Future Developments in ARXPS'. There were 33 participants at the workshop. Copyright © 2009 John Wiley & Sons, Ltd.     

X‐ray Photoelectron Spectroscopy of Pyridinium‐Based Ionic Liquids: Comparison to Imidazolium‐ and Pyrrolidinium‐Based Analogues

We investigate eight 1‐alkylpyridinium‐based ionic liquids of the form [C_nPy][A] by using X‐ray photoelectron spectroscopy (XPS). The electronic environment of each element of the ionic liquids is analyzed. In particular, a reliable fitting model is developed for the C 1s region that applies to each of the ionic liquids. This model allows the accurate charge correction of binding energies and the determination of reliable and reproducible binding energies for each ionic liquid. Shake‐up/off phenomena are determinedfor both C 1s and N 1s spectra. The electronic interaction between cations and anions is investigated for both simple ionic liquids and an example of an ionic‐liquid mixture; the effect of the anion on the electronic environment of the cation is also explored. Throughout the study, a detailed comparison is made between [C₈Py][A] and analogues including 1‐octyl‐1‐methylpyrrolidinium‐ ([C₈C₁Pyrr][A]), and 1‐octyl‐3‐methylimidazolium‐ ([C₈C₁Im][A]) based samples, where X is common to all ionic liquids.     

Efficiency of visual peak detection in X‐ray photoelectron spectra

We report initial results of a VAMAS/TWA2 project to evaluate procedures for automated peak detection in X‐ray photoelectron spectra. As a reference for investigations of the efficiency of automated peak‐detection software, we report the efficiency of visual peak detection in three test spectra. It was found that (i) characteristics of analysts are grouped into four categories using principal component analysis (PCA); the first participant group to detect large numbers of peaks for the three test spectra, the second one to detect small numbers of peaks for them, the third one to detect similar numbers of peaks, and the fourth one to detect a relatively large number of peaks for one of them and small numbers for two of them, (ii) scattering of detected peak numbers seems to depend on detection of medium‐intensity peaks because of participants' subjectivity or ambivalence for judgment of intensity, and (iii) the peaks that are detected by the analysts with a detectability more than 75% almost correspond to the peak signal‐to‐noise(S/N) ratio of more than 10 in logarithmic expression. Copyright © 2008 John Wiley & Sons, Ltd.     

Influence of bath temperatures on the wettability of copper films surface prepared by electroless plating method on beech wood

Copper films were coated on beech wood substrates by electroless plating method. The influence of bath temperature on the copper films properties was studied by varying the bath temperatures 25, 35, 45 and 55 °C. Scanning electron microscopy (SEM) equipped with energy dispersive spectroscopy (EDS), X‐ray diffraction (XRD) pattern, X‐ray photoelectron spectroscopy (XPS), micro Raman spectroscopy and contact angle measurements were used to both characterize the physical and chemical copper films properties and understand the influence of bath temperature on the wettability of copper surface. In our studies, we have found that the gained copper mass significantly increased at 55 °C. The crystalline nature of the coated copper was confirmed by XRD. The presence of Cu₂O and CuO was observed by XPS and micro Raman techniques, which confirms the oxidization of the coated copper surface. Also these characterization techniques have shown the big influence of bath temperature on the morphology, grain size, chemical composition and the film thickness of the coated copper. The wettability was highly influenced by increasing CuO on the coated copper, which is increased by the bath temperature. The contact angle measurements have demonstrated the influence of C―O, O―C?O and CuO components of the surface on the wettability of the samples. Copyright © 2016 John Wiley & Sons, Ltd.     

Evaluation of the Conductivity of the Polypyrrole Film via Its CC Bonds Stretching on Surface‐Enhanced Raman Spectrum

In this study, the conductivities of various polypyrrole (PPy) films were evaluated via the corresponding surface‐enhanced Raman scattering (SERS) spectrum and X‐ray photoelectron spectroscopy (XPS). The results indicate that the peak position of C?C bonds stretching of PPy obtained from the SERS spectrum shows more exactly both qualitatively and quantitatively representing the conductivity of PPy than the N⁺/N ratio or the doping level obtained from the XPS analysis does. Namely the peak position of C?C bonds stretching of PPy monotone decreases to a lower frequency side with the increase of the conductivity of PPy. Furthermore, a satisfactory correlated equation between them was obtained. On the contrary, neither the N⁺/N ratio nor the doping level can be qualitatively reflective on the corresponding conductivity of PPy.     

Fabrication of Metal‐Block‐Copolymer Composite Films by a Palladium‐Catalyzed Electroless Nickel‐Plating Process

Summary: Homogeneous films of PI‐b‐PDMAEMA are prepared on top of silicon (100) substrates. The free film surface shows microdomains of PDMAEMA within a PI matrix. These microdomains act as templates for the highly site‐selective synthesis of metal nanoparticles via palladium‐catalyzed electroless nickel plating. The particle formation is studied by atomic force microscopy in tapping mode and implications for a redox reaction and a nanoparticle growth mechanism on the surface of nanopatterned films are discussed.

Chemical structure of the PI‐b‐PDMAEMA copolymer and AFM phase image of a PI‐b‐PDMAEMA film on Si (100) substrate.