Optical Properties of Swift Heavy Ion Beam Irradiated Polycarbonate/Polystyrene Composites Films

Polycarbonate/polystyrene composites films were irradiated by 55 MeV Carbon ion beam with fluence ranging from 1 × 10¹¹ to 1 × 10¹³ ions/cm². The polymer composites films were prepared by solution mixing method. The effects of ion beam on structural, optical and surface morphology of PC/PS composites films were investigated by X-ray diffraction (XRD), UV-visible spectroscopy (UV-vis), Fourier Transform Infrared Spectroscopy (FT-IR) and Optical Microscope. The XRD pattern shows the average crystallite size, percentage of crystallinity and inter-chain separation, which decreases with increase in ion fluences. UV-vis spectra show that the energy band gap and transmittance decreases while number of carbon atoms increases with fluences. The FT-IR spectra evidenced very small change in cross linking and chain scissoring at high ion fluences, while the optical microscopy shows a color change with ion fluence.     

100 keV H+ ion irradiation of as‐deposited Al‐doped ZnO thin films: An interest in tailoring surface morphology for sensor applications

We report the influence of 100 keV H⁺ ion beam irradiation on the surface morphology, crystalline structure, and transport properties of as‐deposited Al‐doped ZnO (Al:ZnO) thin films. The films were deposited on silicon (Si) substrate by using DC sputtering technique. The ion irradiation was carried out at various fluences ranging from 1.0 × 10¹² to 3.0 × 10¹⁴ ions/cm². The virgin and ion‐irradiated films were characterized by X‐ray diffraction, Raman spectroscopy, atomic force microscopy, and Hall probe measurements. Using X‐ray diffraction spectra, 5 points Williamson‐Hall plots were drawn to deduce the crystallite site and strain in Al:ZnO films. The analysis of the measurements shows that the films are almost radiation resistant in the structural deformation under chosen irradiation conditions. With beam irradiation, the transport properties of the films are also preserved (do not vary orders of magnitude). However, the surface roughness and the crystallite size, which are crucial parameters of the ZnO film as a gas sensor, are at variation with the ion fluence. As ion fluence increases, the root‐mean‐square surface roughness oscillates and the surface undergoes for smoothening with irradiation at chosen highest fluence. The crystallite size decreases initially, increases for intermediate fluences, and drops almost to the value of the pristine film at highest fluence. In the paper, these interesting experimental results are discussed in correlations with ion‐matter interactions especially energy losses by the ion beam in the material.     

The effects of energetic ion irradiation on metal-to-polymer adhesion

In this study, the simple and effective surface modification of polymers through ion irradiation is described to improve metal-to-polymer adhesion. The surface of polymer films was irradiated with 150 keV Xe⁺ ions at various fluences, and copper (Cu) was then deposited onto the surface-modified polymer films. The surface properties of the modified films were investigated in terms of their wettability, chemical composition, and surface morphology. The metal-to-polymer adhesion strength was estimated using a nano-indenter. As a result, the surface environment of the polymer films was physiochemically changed by ion irradiation, which could have a significant effect on the metal-to-polymer adhesion. The irradiated polymer films exhibited a higher adhesion strength than the control film, and the strength depended on the fluence. The maximum adhesion strength (8.45 mN) of the Cu deposited on the irradiated PEN films was obtained at a fluence of 5×10¹⁴ ions/cm².     

50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications

Thin films of Al doped ZnO (Al:ZnO) were deposited on two substrates (Si and glass) at room temperature and 300°C using DC magnetron sputtering. These films were bombarded with 50 keV H⁺ beam at several fluences. The pristine and ion beam irradiated films were analysed by X‐ray diffraction, Raman spectroscopy, scanning electron microscopy, and UV‐Vis spectroscopy. The X‐ray diffraction analysis, Hall measurements, Raman and UV‐Vis spectroscopy confirm that the structural and transport properties of Al:ZnO films do not change substantially with beam irradiation at chosen fluences. However, in comparison to film deposited at room temperature, the Al:ZnO thin film deposited at 300°C shows increased transmittance (from 70% to approximately 90%) with ion beam irradiation at highest fluence. The studies of surface morphology by scanning electron microscopy reveal that the ion irradiation yields smoothening of the films, which also increases with ion fluences. The films deposited at elevated temperature are smoother than those deposited at room temperature. In the paper, we discuss the interaction of 50 keV H⁺ ions with Al:ZnO films in terms of radiation stability in devices.     

Excimer Laser Crystallization of SnO2:Sb Sol-Gel Films

Instead of classical or rapid thermal annealing, KrF excimer laser irradiation has been successfully applied to crystallize dried SnO₂:Sb films elaborated by a sol-gel process. The penetration of the crystallization front below the film surface, as imaged by transmission electron microscopy, is controlled by the laser fluence and the number of pulses and can thus be confined in the film itself without affecting sensitive substrates. All films laser irradiated at fluences higher than 40 mJ/cm² become conductive. At constant laser fluence, the electrical sheet resistance goes through a minimum with increasing number of pulses. The consequence of film's densification and morphology on electrical properties is discussed.     

Dielectric properties and surface morphology of swift heavy ion beam irradiated polycarbonate films

Swift heavy ion beam irradiation induces modification in the dielectric properties and surface morphologies of polycarbonate (PC) films. The PC films were irradiated by 55 MeV energy of C⁵⁺ beam at various ions fluences ranging from 1 × 10¹¹ to 1 × 10¹³ ions cm^?2. The dielectric properties (i.e., dielectric constant, dielectric loss, and AC conductivity) and surface morphologies of pristine and SHI beam irradiated PC films were investigated by dielectric measurements, atomic force microscopy (AFM), and optical microscopy. The dielectric measurements show that the dielectric constant, dielectric loss, and AC conductivity increase with ion fluences and temperature, however, the dielectric constant and AC conductivity decrease while dielectric loss increases with frequency. AFM shows the increase in average roughness values with ion fluences. The change of color in PC films has been observed from colorless to yellowish and then dark brown with increases of ion fluence by using optical microscopy.     

Medium energy,heavy and inert ion irradiation of metallic thin films: studies of surface nano‐structuring and metal burrowing

In context to the ion induced surface nanostructuring of metals and their burrowing in the substrates, we report the influence of Xe and Kr ion‐irradiation on Pt:Si and Ag:Si thin films of ~5‐nm thickness. For the irradiation of thin films, several ion energies (275 and 350 keV of Kr; 450 and 700 keV of Xe) were chosen to maintain a constant ratio of the nuclear energy loss to the electronic energy loss (S_n/S_e) in Pt and Ag films (five in present studies). The ion‐fluence was varied from 1.0 × 10¹⁵ to 1.0 × 10¹⁷ ions/cm². The irradiated films were characterized using Rutherford backscattering spectroscopy (RBS), atomic force microscopy (AFM) and scanning electron microscopy (SEM). The AFM and SEM images show ion beam induced systematic surface nano‐structuring of thin films. The surface nano‐structures evolve with the ion fluence. The RBS spectra show fluence dependent burrowing of Pt and Ag in Si upon the irradiation of both ion beams. At highest fluence, the depth of metal burrowing in Si for all irradiation conditions remains almost constant confirming the synergistic effect of energy losses by the ion beams. The RBS analysis also shows quite large sputtering of thin films bombarded with ion beams. The sputtering yield varied from 54% to 62% by irradiating the thin films with Xe and Kr ions of chosen energies at highest ion fluence. In the paper, we present the experimental results and discuss the ion induced surface nano‐structuring of Pt and Ag and their burrowing in Si. Copyright © 2016 John Wiley & Sons, Ltd.     

Ion Beam Modification of Polymethyl methacrylate (PMMA) Polymer Matrix Filled with Organometallic Complex

A Nickel Dimethylglyoxime (Ni‐DMG) compound was dispersed in polymethyl methacrylate (PMMA) films at different concentrations. PMMA was synthesized by a solution polymerization technique. These films were irradiated with 120 MeV Ni¹⁰⁺ ions at the fluences of 1×10¹¹ and 1×10¹² ions/cm². The radiation induced changes in dielectric properties and average surface roughness were investigated by using an LCR meter in the frequency range 50 Hz to 10 MHz and atomic force microscopy (AFM), respectively. The electrical properties of irradiated films are found to increase with the fluence and also with the concentration of Ni‐DMG. From the analysis of frequency, f, dependence of dielectric constant, ?, it has been found that the dielectric response in both pristine and irradiated samples obey the Universal law given by ? α f ^n?1. The dielectric constant/loss is observed to change significantly due to the irradiation. This suggests that ion beam irradiation promotes (i) the metal to polymer bonding (ii) convert the polymeric structure in to hydrogen depleted carbon network due to the emission of hydrogen gas and/or other volatile gases. Atomic force microscopy (AFM) shows that the average surface roughness and surface morphology of irradiated films are observed to change.     

Carbon ion beam induced modifications of optical,structural and chemical properties in PADC and PET polymers

We report a study on the carbon ion beam induced modifications on optical, structural and chemical properties of polyallyl diglycol carbonate (PADC) commercially named as CR-39 and Polyethyleneterepthalate (PET) polymer films. These films were then irradiated by 55 MeV C⁵⁺ ion beam at various fluences ranging from 1×10¹¹ to 1×10¹³ ions/cm². The pristine as well as irradiated samples were subjected to UV–Visible spectral study (UV–Vis), Photoluminescence (PL), X-ray diffraction (XRD) and Fourier transform infrared (FTIR) spectroscopy. It has been found that ion irradiation may induce a sort of defects in the polymers due to chain scission and cross linking as observed from PL spectral study. It is revealed from UV–Vis spectra absorption edge shifted towards longer wavelength region after irradiation with increasing ion fluence. This shift clearly reflects decrease in optical band gap. The XRD study indicates the gradual decrease in intensity in case of PADC with increasing ion fluence. However, the intensity pattern increased in case of PET at fluence of 10¹¹ ion/cm² then decreased with further increase in fluence. Crystalline size of PADC was found to be decreasing gradually with increase of ion fluence. Whereas, the crystalline size of PET films found to increase with lower fluence and decreases with higher ion fluence. FTIR spectrum also shows the change in intensity of the typical bands after irradiation in the both the polymers. The results so obtained can be used successfully in heavy ions dosimetry using well reported techniques.     

A comparison of modifications induced by Li<Superscript>3+</Superscript> and Ag<Superscript>8+</Superscript> ion beams irradiation in poly(lactide-<Emphasis Type="Italic">co</Emphasis>-glycolide) films

Poly(lactide-co-glycolide) (PLGA) films were irradiated by 180 MeV/amu Ag⁸⁺ ions and 50 MeV/amu Li³⁺ ions at different fluences of 5 × 10¹⁰, 5 × 10¹¹ and 1 × 10¹² ions/cm². Modifications of polymer films induced by the swift heavy ions (SHI) irradiation were studied by X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM), Fourier transform infrared spectroscopy (FTIR) and UV–Vis spectroscopy. The dominant effect of the SHI beam irradiation is proposed to be chain scission which leads to breakage of polymer chains, followed by hydrogen abstraction. The results from FTIR spectroscopy showed that the intensity of all peaks of the irradiated samples decreased at high fluence of SHI, suggesting PLGA samples significantly degraded at high SHI fluence. The variation in optical band gap energy and Urbach energy with increasing fluence was calculated from UV–Vis spectroscopy and explained in terms of changes occurring in the polymer matrix. X-ray diffraction patterns also show appreciable changes in PLGA at high fluence. FESEM results revealed that the hydrophilicity of the PLGA surface increased with an increase in ion fluence. In this paper the optical, chemical and structural changes with different fluence rates are discussed.     

Radiation Stability of Copper Films under Irradiation with He<Superscript>2+</Superscript> Ions

The effect of irradiation of copper films with low-energy He²⁺ ions on their structural properties has been studied. The surface morphology and structural properties of the samples before and after irradiation have been examined by scanning electron microscopy, energy dispersive analysis, and X-ray diffraction. Bombardment of the initial samples with He²⁺ ions at a fluence of 1 × 10¹⁶ion/cm² alters the surface morphology of copper films and leads to the formation of nanoscale inclusions of hexagonal shape. An increase in the fluence to 1 × 10¹⁷ ion/cm² and higher results in the formation of cracks and amorphous oxide inclusions on the sample surface.     

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

We demonstrate depth profiling of polymer materials by using large argon (Ar) cluster ion beams. In general, depth profiling with secondary ion mass spectrometry (SIMS) presents serious problems in organic materials, because the primary keV atomic ion beams often damage them and the molecular ion yields decrease with increasing incident ion fluence. Recently, we have found reduced damage of organic materials during sputtering with large gas cluster ions, and reported on the unique secondary ion emission of organic materials. Secondary ions from the polymer films were measured with a linear type time‐of‐flight (TOF) technique; the films were also etched with large Ar cluster ion beams. The mean cluster size of the primary ion beams was Ar₇₀₀ and incident energy was 5.5 keV. Although the primary ion fluence exceeded the static SIMS limit, the molecular ion intensities from the polymer films remained constant, indicating that irradiation with large Ar cluster ion beams rarely leads to damage accumulation on the surface of the films, and this characteristic is excellently suitable for SIMS depth profiling of organic materials. Copyright © 2009 John Wiley & Sons, Ltd.     

Evolution of a polysulfone nanofiltration membrane following ion beam irradiation

Ion beam irradiation was used to modify the surface of a sulfonated polysulfone water treatment membrane. A beam of 25 keV H (+) ions with four irradiation fluences (1 x 10 (13), 5 x 10 (13), 1 x 10 (14), and 5 x 10 (14) ions/cm (2)) was used to study the effects of ion beam irradiation on chemical structure, surface morphology, microstructure, and performance. XPS and ATR-FTIR analyses were performed on the virgin and irradiated membranes in order to determine the changes to chemical structure incurred by ion beam irradiation. The results showed that some sulfonic and C-H bonds were broken and new C-S bonds were formed after irradiation. AFM analysis showed that the roughness of the membranes decreased after irradiation, and the decrease in surface roughness was proportional to the increase in irradiation fluence. An increase in flux after ion beam irradiation was also observed along with a smaller flux decline during operation. Flux was not a function of irradiation fluence. Hydrophobicity, pore size distribution, and membrane rejection efficiencies were not affected by ion beam irradiation. Overall, irradiation led to an improvement in membrane performance.     

Investigation of O7+ swift heavy ion irradiation on molybdenum doped indium oxide thin films

Molybdenum (0.5 at%) doped indium oxide thin films deposited by spray pyrolysis technique were irradiated by 100 MeV O⁷⁺ ions with different fluences of 5×10¹¹, 1×10¹² and 1×10¹³ ions/cm². Intensity of (222) peak of the pristine film was decreased with increase in the ion fluence. Films irradiated with the maximum ion fluence of 1×10¹³ ions/cm² showed a fraction of amorphous nature. The surface microstructures on the surface of the film showed that increase in ion fluence decreases the grain size. Mobility of the pristine molybdenum doped indium oxide films was decreased from ～122 to 48 cm²/V s with increasing ion fluence. Among the irradiated films the film irradiated with the ion fluence of 5×10¹¹ ions/cm² showed relatively low resistivity of 6.7×10^?4 Ω cm with the mobility of 75 cm²/V s. The average transmittance of the as-deposited IMO film is decreased from 89% to 81% due to irradiation with the fluence of 5×10¹¹ ions/cm².     

Swift heavy ion induced modification in dielectric and microhardness properties of polymer composites

Polymer composites with different concentrations of organometallics (ferric oxalate) dispersed PMMA were prepared. PMMA was synthesized by solution polymerization technique. These films were irradiated with 120 MeV Ni¹⁰⁺ ions in the fluence range 10¹¹-5 × 10¹² ions/cm². The radiation induced modifications in dielectric properties, microhardness, structural changes and surface morphology of polymer composite films have been investigated at different concentrations of filler and ion-fluences. It was observed that electrical conductivity and hardness of the films increase with the concentration of the filler and also with the fluence. The dielectric constant (?) obeys the Universal law given by ?αfⁿ⁻¹. The dielectric constant/loss is observed to change significantly due to irradiation. This suggests that ion beam irradiation promotes the metal to polymer bonding and convert polymeric structure into hydrogen depleted carbon network. This makes the composites more conductive and harder. Surface morphology of the films has been studied using atomic force microscopy (AFM) and scanning electron microscopy (SEM). The average surface roughness is observed to increase after irradiation as revealed by AFM studies. The SEM images show the blisters type of phenomenon on the surface due to ion beam irradiation.     

Ion induced controlled modifications in structural and optical properties of indium oxide thin films – studies with 25‐keV Co− and N+ beam implantations

Two sets of indium oxide thin films (~150 nm) grown on quartz substrates using thermal evaporation technique were processed separately with 25‐keV Co^? and N⁺ ions with several fluences ranging from 1.0 × 10¹⁵ to 1.0 × 10¹⁶ ions/cm². The pristine and the ion implanted films were characterized by Rutherford backscattering spectroscopy (RBS), X‐ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and UV–Vis spectrometry. The RBS spectra reveal signature of only cobalt and nitrogen in accordance to their fluences confirming absence of any contamination arising due to ion implantation. An increase in the average crystallite size (from 13.7 to 15.3 nm) of Co^? ions implanted films was confirmed by XRD. On the other hand, the films implanted with N⁺ ions showed a decrease in the average crystallite size from 20.1 to 13.7 nm. The XRD results were further verified by SEM micrographs. As seen in AFM images, the RMS surface roughness of the samples processed by both ion beams was found to decrease a bit (29.4 to 22.2 nm in Co^? implanted samples and 24.2 to 23.3 nm in N⁺ implanted samples) with increasing fluence. The Tauc's plot deduced from UV–visible spectroscopy showed that the band gap decreases from 3.54 to 3.27 eV in Co^? implanted films and increases from 3.38 to 3.58 eV for films implanted with N⁺ ions. The experimental results suggest that the modifications in structural and optical properties of indium oxide films can be controlled by optimizing the implantation conditions. Copyright © 2017 John Wiley & Sons, Ltd.     

Ion‐beam‐induced morphology on the surface of thin polymer films at low current density and high ion fluence

The effect of Xe⁺ bombardment on the surface morphology of four different polymers, polystyrene (PS), poly(phenylene oxide), polyisobutylene, and polydimethylsiloxane, was investigated in ion energy and fluence ranges of interest for secondary ion mass spectrometry depth‐profiling analysis. Atomic force microscopy (AFM) was applied to analyze the surface topography of pristine and irradiated polymers. AFM analyses of nonirradiated polymer films showed a feature‐free surface with different smoothness. We studied the influence of different Xe⁺ beam parameters, including the incidence angle, ion energy (660–4000 eV), current density (0.5 × 10² to 8.7 × 10² nA/cm²), and ion fluence (4 × 10¹⁴ to 2 × 10¹⁷ ion/cm²). Xe⁺ bombardment of PS with 3–4 keV at a high current density did not induce any change in the surface morphology. Similarly, for ion irradiation with lower energy, no surface morphology change was found with a current density higher than 2.6 × 10² nA/cm² and an ion fluence up to 4 × 10¹⁶ ion/cm². However, Xe⁺ irradiation with a lower current density and a higher ion fluence led to topography development for all of the polymers. The roughness of the polymer surface increased, and well‐defined patterns appeared. The surface roughness increased with ion irradiation fluence and with the decrease of the current density. A pattern orientation along the beam direction was visible for inclined incidence between 15° and 45° with respect to the surface normal. Orientation was not seen at normal incidence. The surface topography development could be explained on the basis of the balance between surface damage and sputtering induced by the primary ion beam and redeposition–adsorption from the gas phase. Time‐of‐flight secondary ion mass spectrometry analyses of irradiated PS showed strong surface modifications of the molecular structure and the presence of new material. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 314–325, 2001     

Surface analysis of high performance carbon/bismaleimide composites exposed to electron irradiation

The aim of this article was to investigate the effects of electron irradiation in ultrahigh vacuum environment on the surface properties of high‐performance carbon/bismaleimide (BMI) composites used in aerospace. The changes in surface chemical composition with increasing irradiation fluence were studied by XPS. The evolution of surface morphology and surface roughness were observed by atomic force microscopy (AFM). The mass loss behavior occurring in the surface layer of the composites was examined. The results indicated that the electron irradiation in high vacuum caused rupture of chemical bonds and cross‐linking process in the surface layer, thereby leading to the mass loss behavior and the formation of carbonification layer in the surface of the carbon/BMI composites. The changes in the surface chemical composition were determined by a competing effect existing between the rupture of chemical bonds and the cross‐linking process at lower irradiation fluence, and by a degradation process only at higher fluence of electron irradiation. The surface morphology was altered and the surface roughness was increased significantly after electron irradiation. The mass loss ratio first increased obviously at lower fluences, and then reached a plateau value of 0.45% beyond 5 × 10¹⁵ cm^?2 fluence of electron irradiation. Copyright © 2011 John Wiley & Sons, Ltd.     

The effect of vacuum-ultraviolet laser wavelengths on the surface treatment of polyolefinic polymers

The laser-induced modification of the surface morphology of poly(propylene) fibers and films was investigated. It is known that strongly absorbing fibers such as poly(ethylene terephthalate) and polyamide obtain characteristic surface morphologies after treatment with 193 or 248 nm laser irradiation. Polyolefinic material cannot be modified directly (i.e., without doping) by irradiation with these wavelengths. Therefore experiments were carried out using a 157 nm F₂-laser. After irradiation in a vacuum chamber at fluences in excess of 50 mJ/cm² poly(propylene) also reveals the well-known surface morphology. Compared with aromatic polymers a rather high number of pulses is needed to generate the effect. © 1993 John Wiley & Sons, Inc.     

PHYTOCHROME MACRO-DISTRIBUTION, LOCAL PHOTOCONVERSION AND INTERNAL PHOTON FLUENCE RATE FOR Cucurbita pepo L. COTYLEDONS

Abstract— Using 7-day-oId cotyledons of Cucurbita pepo L., local phytochrome photoconversions could be measured for blue, red and far-red light. For this purpose, after nonsaturating irradiation, cotyledons were sliced into discs 0.3 to 0.5 mm thick and signals measured. This method also yielded the internal phytochrome distribution of the cotyledons with maximal concentration near the adaxial surface, dropping to about 50% in the center and reaching again about 90% at the abaxial surface. Local phytochrome conversion rates were used to calculate internal fluence rates across the cotyledons. Relative internal fluence rates were also derived from measured reflectances and transmittance according to the Kubelka-Munk theory. The general shape of the internal fluence distribution calculated on the basis of these two methods coincided well. It was observed that the internal local photoconversion is proportional to the penetration depth over a wide range of incident fluences and for all wavelengths tested, showing in addition that reciprocity holds. A method to calculate internal fluence rates by a simplified procedure assuming either linear or exponential functions is described.