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研究了Nd1-xSrxCoO3(0.1≤x≤0.5)系列多晶样品在低温时的亚铁磁行为.通过传统的固相反应法合成了Nd1-xSrxCoO3多晶样品,应用物理性质测试系统对样品进行了直流磁化强度、磁滞回线的测试.磁化强度的研究表明,随掺杂量增加,团簇的数目和尺寸都在增加,铁磁性增强.同时,多晶样品在低温时形成亚铁磁序.磁滞回线的研究表明,Nd离子与Co离子之间存在磁性耦合.由于Co与Nd的反平行排列,Nd1-xSrxCoO3体系低温时出现亚铁磁序. 相似文献
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以CaCO3作为Ca2+源, 利用传统固相烧结法制备了Cd1-xCaxO (x=0, 0.01, 0.03, 0.05) 多晶块体样品并研究了Ca2+掺杂对CdO高温热电性能的影响. CaCO3的掺入会导致CdO多晶载流子浓度降低, 使Cd1-xCaxO的电阻率ρ和塞贝克系数的绝对值|S|增大、电子热导率κe减小. 同时, 在CdO中掺入CaCO3会引入点缺陷和气孔并可抑制CdO晶粒长大、晶界增多, 从而增加了对声子的散射, 使样品的声子热导率κp减小. 由于总热导率的大幅降低, Cd0.99Ca0.01O多晶样品在1000 K时的热电优值ZT可达0.42, 比本征CdO提高了约27%, 为迄今n型氧化物热电材料报道的最好结果之一. 相似文献
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研究了掺Ba对Bi2Sr2-xBaxCaCu2Oy(0≤x≤0.15,0.3)单晶和多晶样品超导电性的影响,结果表明,有少量Ba2+离子进入了超导相,且有固溶度极限.对于2212相单晶,c轴参数和Tc均随Ba含量增加而增加;对于慢冷多晶样品,掺Ba可明显提高Tc;然而对于淬大多晶样品,Tc没有明显变化,用掺Ba
关键词: 相似文献
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采用水热法制备不同醇水比的NaYF4:20%Yb3+,2%Er3+晶体,通过XRD、FE-SEM、TEM、PL测试手段对合成样品进行表征和分析。样品的FE-SEM图结果表明,随着醇水比的增大,颗粒尺寸越来越小,最小可达纳米级。通过XRD测试表明,醇水比对样品的晶相亦有影响,当醇水比为30/10 mL时,产物中开始出现α-NaYF4晶相。验证了形成机理的正确性并得到一条相转变反应时间与醇水比关系的模拟曲线图。TEM图显示样品属于多晶,且结晶性能良好。在980 nm近红外光激发下,β-NaYF4:20%Yb3+,2%Er3+上转换晶体发出绿光和红光。 相似文献
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采用固相反应法制备La5/8(PrxCa1-x)3/8MnO3(x=0.25,0.5,0.75)多晶样品,研究其磁性质和电磁输运特性.X射线衍射表明,La5/8(PrxCa1-x)3/8MnO3(x=0.25,0.5,0.75)多晶样品室温的晶体结构呈Pnma空间群的正交结构.磁化强度-电阻(M~T)关系显示,La5/8(PrxCa1-x)3/8MnO3(x=0.25,0.5,0.75)的居里温度TC随Pr掺杂量增加而逐渐降低,三种样品分别为160K、150K、100K.此外,随着Pr3+掺杂量增加,样品晶格畸变程度增大,铁磁相互作用减弱,并且三种成分均形成自旋玻璃态,其自旋冻结温度分别为150K、75K、70K.电阻-温度(ρ~T)关系表明,样品在x=0.25时出现电阻的双峰现象,这是由于样品中铁磁相与反铁磁相相互竞争造成的.结果表明,通过对钙钛矿锰氧化物的A位稀土掺杂,可对其CMR效应进行有效调控. 相似文献
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本文针对Sm3Co粗晶和纳米晶合金材料的制备和基础性能进行了研究.采用磁悬浮熔炼技术多次精炼制备出Sm3Co粗晶合金.以此为母材,利用高能球磨非晶化和放电等离子烧结致密化并同步晶化的技术路线,制备出平均晶粒尺寸为8 nm的超细纳米晶Sm3Co合金块体材料.构建了Sm3Co纳米晶合金的晶体结构模型,并结合其显微组织的表征,分析了Sm3Co纳米晶合金的磁性能和力学性能,并与粗晶合金进行了比较粗晶Sm3Co合金不具有硬磁特性,而同种成分的纳米晶合金则表现出一定的硬磁特性.纳米晶Sm3Co合金的显微硬度和弹性模量分别达到4.87 GPa和63.7 GPa,比粗晶合金增大约8.7%和13.3%.本文研究结果为Sm-Co体系合金的基础性能及其纳米尺度效应提供了系统的参考依据. 相似文献
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Good-quality polycrystalline BaTiO3 thin films are deposited on MgO substrates by pulsed laserdeposition. The deposition parameters are optimized to achieve optical-quality films with an attenuation coefficient of 4 dB/cm at the 633-nm wavelength. Thin-film electro-optic Mach-Zehnder modulators are fabricated with standard lithography and ion-beam etching. The waveguides patterned by lithography are the ridge type, and they ensure single-mode propagation in the wavelength range of 633-1550 nm. An electro-optic coefficient of 22 pm/V is estimated for the polycrystalline BaTiO3 films. 相似文献
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R.B. Gangineni J.W. Kim K. NenkovL. Schultz 《Journal of magnetism and magnetic materials》2012,324(6):1153-1156
The spin-polarised transport in ferromagnetic polycrystalline La0.7(Sr,Ca)0.3MnO3 films on piezoelectric substrate has been investigated. The systematic study involved in finding the effect of in-situ strain on extrinsic electrical transport of various thick polycrystalline La0.7(Sr,Ca)0.3MnO3 thin films. The in-situ strain in the manganite polycrystalline thin film is achieved by applying an electric field to the piezoelectric substrate 0.72 Pb(Mg1/3Nb2/3)O3-0.28 PbTiO3 (PMN-PT). A reversible strain of about 0.11% is acquired with an application of 10 kV/cm to the piezoelectric substrate. A typical drop in resistance at low magnetic fields has been found in all the polycrystalline manganite films. The effect of reversible strain versus the resultant strain gauges was discussed in all the polycrystalline films. At low temperatures, the effect of strain on low-field magnetoresistance and high-field magnetoresistance was found to be negligible. Further, the results are compared with the transport in manganite films deposited on step edge junctions. 相似文献
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A semiquantitative technique for estimating the limits of the critical current density in polycrystalline high-temperature superconductors is presented. This technique is based on the transport properties of single grain boundaries. Various factors essential in deducing the critical current density of polycrystalline high-T
c materials from the characteristics of single grain boundaries are discussed. The results for tectured, polycrystalline YBa2Cu3O7 fibers are reported, and the influence of the microstructure on their critical current density is discussed. 相似文献
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LuTaO4是最高密度的闪烁体基质, 研究它的结构及其相变对单晶制备具有指导意义. 用固相法制备了Lu2O3和Ta2O5摩尔比为1:1时在不同温度下形成的多晶粉末, 用X射线衍射及Rietveld全谱拟合研究了多晶粉末的物相和结构. 结果表明, Lu2O3: Ta2O5摩尔比为1:1的样品在1740 ℃时合成的物相为M'-LuTaO4, 在1800 ℃时为M'-LuTaO4和M-LuTaO4的混合物, 在1840 ℃时全部转变为M-LuTaO4. 当温度升高到2058 ℃时, 样品呈熔融状态, 对淬火得到的样品进行结构精修, 给出了M-LuTaO4, Lu3TaO7和Ta2O5的晶胞和原子坐标参数, 它们的重量比分别占78.1%, 18.9%和3.0%. 这些结果为制备以LuTaO4为基质的高密度闪烁体单晶具有参考价值.
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相变
粉末衍射
Rietveld精修 相似文献
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L. Wee R. L. Stamps Z. Celinski L. Malkinski D. Skrzypek 《Journal of magnetism and magnetic materials》2002,240(1-3):270-272
Magnetic anisotropies at epitaxial Fe/KNiF3 interfaces were probed by ferromagnetic resonance. Fe(0 0 1) films coupled to single crystal KNiF3 exhibit four-fold in-plane anisotropy and a unidirectional bias upon field-cooling. In Fe(0 0 1) with polycrystalline KNiF3, the bias direction deviates from the field-cooling direction. Lattice mismatch strain due to polycrystalline KNiF3 also induces uniaxial anisotropy in Fe. 相似文献
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Magnetization σ vs. temperature T was measured from 80 to 700 K in polycrystalline DyFe3 in a magnetic field H = 10 kOe. From σ = f(T), the Curie temperature was determined. Also, σ was measured vs. H from 0 to 70 kOe at 4.2 K. Magnetization at saturation σ0 at 4.2 K and the magnetic moment of DyFe3 were also determined. First observations of domain structure in DyFe3 are reported. The mean domain with
is determined in its dependence on the grain size
. The magnetocrystalline anisotropy constant of polycrystalline DyFe3 is determined as K1 = -1.2×107 erg/cm3. 相似文献
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H. Ryssel H. Iberl M. Bleier G. Prinke K. Haberger H. Kranz 《Applied Physics A: Materials Science & Processing》1981,24(3):197-200
The diffusion behavior of implanted arsenic in polycrystalline silicon was investigated, using backscattering and electrical
measurements. The diffusion coefficient isD=8.5×10−3 exp (−2.74/kT) for polycrystalline silicon deposited on freshly-etched silicon andD=1.66 exp (−3.22/kT) for the deposition on silicon having natural oxide. At the interface to the single-crystalline silicon,
a pile-up of arsenic occurs, which depends also on the surface treatment prior to the deposition of the polycrystalline silicon. 相似文献