Determination of trace elements in Syrian medicinal plants and their infusions by energy dispersive X-ray fluorescence and total reflection X-ray fluorescence spectrometry

X-ray fluorescence (XRF) and total-reflection X-ray fluorescence (TXRF) techniques suited well for a multi-element determination of K, Ca, Mn, Fe, Cu, Zn, Rb, and Sr in some Syrian medicinal plant species. The accuracy and the precision of both techniques were verified by analyzing the Standard Reference Materials (SRM) peach-1547 and apple leaves-1515. A good agreement between the measured concentrations of the previously mentioned elements and the certified values were obtained with errors less than 10.7% for TXRF and 15.8% for XRF. The determination of Br was acceptable only by XRF with an error less than 24%. Furthermore, the XRF method showed a very good applicability for the determination of K, Ca, Mn, Fe, Cu, Zn, Rb, Sr, and Br in infusions of different Syrian medicinal plant species, namely anise (Anisum vulgare), licorice root (Glycyrrhiza glabra), and white wormwood (Artemisia herba-alba).     

Vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis on Ge wafers

Ge substrates are recently being reconsidered as a candidate material for the replacement of Si substrates in advanced semiconductor devices. The reintroduction of this material requires reengineering of the standard IC processing steps. In this paper, we present the extension of the methodology of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry (VPD–DC–TXRF) for metallic contamination analysis towards Ge substrates. A first step that asked for adaptation was the collection chemistry as the Ge wafers surface is not hydrophobic after the VPD treatment. The contact angle could be significantly increased using a concentrated HCl solution. This chemistry has been proved to perform well in the collection of metals from intentionally contaminated Ge wafers. A second step that needed optimization was the matrix removal method as a sample preparation step prior to the TXRF analysis. First, the upper limits of TXRF on Ge containing solutions have been characterized. The accuracy of TXRF is found to be acceptable for Ge contents lower than 1×10¹⁴ atoms (250 ppb in 50 μL) but decreases systematically with higher Ge contents. Fortunately, Ge can be volatilized at low temperatures as GeCl₄ by the addition of HCl. The parameters within this method have been investigated with respect to the removal of Ge and the recovery of metal traces. Finally, the full VPD–DC–TXRF method has been applied on intentionally contaminated Ge wafers and proved to be very accurate.     

Determination of sulphur in uranium matrix by total reflection X-ray fluorescence spectrometry

The possibility of sulphur determination in uranium matrix by total reflection x-ray fluorescence spectrometry (TXRF) has been studied. Calibration solutions and samples of sulphur in uranium matrix were prepared by mixing uranium in form of a standard uranyl nitrate solution and sulphur in the form of Na₂SO₄ standard solution, prepared by dissolving Na₂SO₄ in Milli-Q water. For major element analysis of sulphur, it was determined without separation of uranium whereas for the trace level determinations, uranium was first separated by solvent extraction using 30% tri-n-butyl phosphate (TBP) in dodecane as an extractant. In order to countercheck the TXRF results, a few samples of Rb₂U(SO₄)₃, a chemical assay standard for uranium, were diluted to different dilutions and sulphur content in these solutions were determined. The TXRF determined results for trace determinations of sulphur in these diluted solutions were counterchecked after addition of another uranium solution, so that sulphur is at trace level compared to uranium, separating uranium from these solution mixtures using TBP extraction and determining sulphur in aqueous phase by TXRF. For such TXRF determinations, Co was used as internal standard and W Lα was used as excitation source. The precision and accuracy of the method was assessed for trace and major element determinations and was found to be better than 8% (1σ RSD) and 15% at a concentration level of 1 μg/mL of sulphur measured in solutions whereas for Rb₂U(SO₄)₃, these values were found to be better than 4 and 13%, respectively.     

Determination of uranium in human urine by total reflection X-ray fluorescence

Uranium has been classified as a toxic chemical. It affects the kidneys, with nephritis being the primarily chemically-induced effect in animals and humans. Intermediate-term studies on animals indicate that increased uranium doses are positively correlated with various biochemical effects and histopathological changes. Since the kidneys efficiently excrete in urine the major portion of solubilized uranium circulating in blood, an increased urinary uranium excretion can provide a sensitive quantitative measure of exposure, especially in the case of acute exposure. In the present work a method was developed for the quantitative determination of uranium in human urine. It combines the chemical treatment of urine, which results in a significant pre-concentration of uranium, with its subsequent detection by means of total reflection X-ray fluorescence (TXRF). The method has been proven to be relatively fast, offering detection limits that allow for monitoring uranium intake above normal levels.     

Recent trends in total reflection X-ray fluorescence spectrometry for biological applications

This review is focused on the application of total reflection X-ray fluorescence (TXRF) spectrometry in the field of biological research. In the last decade, most papers were published by authors who applied laboratory-scale TXRF equipments. The application of synchrotron radiation as excitation source (SR-TXRF) shows a slowly increasing tendency. In the cited papers the micro-, trace and multielement capability of these TXRF techniques was demonstrated in the clinical and medical laboratory practice, as well as in various plant physiological studies. For speciation of elements in biological matrices, the TXRF was used as element specific detector following an off-line separation step (e.g., thin layer chromatography, high performance liquid chromatography), however, these off-line methods are not competitive with the on-line coupled HPLC-inductively coupled plasma mass spectrometry.     

A road map to assess critical materials content in boron industrial wastes using sustainable micro-X-ray fluorescence and total reflection X-ray fluorescence instrumentation

Turkey is the leading country in the world in terms of boron production and sale. Increasing boron production goes along with an increasing generation of boron wastes. The pollution of the soil and the air around the waste piles, as well as the occupation of several square kilometers of ground, are major environmental problems. It is, therefore, very important to make use of the wastes to both protect the environment and create revenue. This work presenteda road map for fast screening of boron waste for critical elements followed by determination of the elements using small footprint low power instrumentation. The sample preparation was kept to a minimum. A procedure that allowed an assessment of critical materials in industrial production waste with minimal consumption of hazardous acids, energy, and time was presented. The samples were first screened for valuable and hazardous elements by micro-X-ray fluorescence (XRF). Samples with considerable contents of Cs, Rb, and Aswere then prepared as slurries for the total reflection XRF (TXRF) measurement. To evaluate the TXRF procedure, a standard reference material was analyzed. As a result, Rb and Cs in concentrations up to 420 ± 70 and 1500 ± 200 mg/kg were detected in some of the waste forms. The time savings were in order of a factor of 3 when comparing the prescreening combined micro-XRF and TXRF approach to an all TXRFanalysis approach.     

Total reflection X-ray fluorescence analysis of trace-elements in candies marketed in Mexico

Trace metals concentrations in food are significant for nutrition, due either to their nature or toxicity. Sweets, including chewing gum and candies, are not exactly a food, but they usually are unwearied consumed by children, the most vulnerable age-group to any kind of metal contamination in the food chain. The presence of relatively high concentrations of heavy metals such as Lead elicits concern since children are highly susceptible to heavy metals poisoning. Trace-metals concentrations were determined for six different flavors of a Mexican candy by means of Total X-ray Fluorescence Spectrometry. Triplicate samples of the various candy's flavours (strawberry, pineapple, lemon, blackberry, orange and chilli) were digested in 8 mL of a mix of supra-pure HNO₃ and H₂O₂ (6 mL: 2 mL) in a microwave oven MARS-X. Results show the presence of essential and toxic elements such as Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, and Pb. All metal concentrations were higher and significantly different (α = 0.05) in chilli candy, compared to other candy flavours. Lead concentration fluctuated in the range of 0.102 to 0.342 μg g^− 1. A discussion about risk consumption and concentration allowed by Mexican and International Norms is made. As a part of the Quality Control Program, a NIST standard of “Citrus Leaves” and a blank were treated in the same way.     

Comparison of direct-total-reflection X-ray fluorescence,sweeping-total-reflection X-ray fluorescence and vapor phase decomposition-total-reflection X-ray fluorescence applied to the characterization of metallic contamination on semiconductor wafers

The issues related to the matching between the 3 modes of Total-reflection X-Ray Fluorescence available on the latest generation of commercial equipment: Direct-Total-reflection X-Ray Fluorescence, Sweeping-Total-reflection X-Ray Fluorescence and Vapor Phase Decomposition-Total-reflection X-Ray Fluorescence, are discussed for quantitative analysis of metallic contamination on Si wafers. Direct-Total-reflection X-Ray Fluorescence and Sweeping-Total-reflection X-Ray Fluorescence agrees very well (+/− 20% for light elements, transition metals and heavy metals), but due to a poor surface coverage with Direct-Total-reflection X-Ray Fluorescence, the matching is correct on a whole wafer only for uniform contaminations. Vapor Phase Decomposition-Total-reflection X-Ray Fluorescence might agree with other Total-reflection X-Ray Fluorescence modes only if the collection of contaminants following the oxide decomposition step is 100% completed. This is not achieved for 2 situations: noble metals which plate on bare Si, and solid particles partially digested during the Vapor Phase Decomposition and collection protocol. Furthermore, even if the collection of contaminants is well completed, quantification after Vapor Phase Decomposition depends on the shape of the dried residues and the Total-reflection X-Ray Fluorescence incident angle. With the incident angle selected to maximize the signal to noise ratio for ultra trace applications, i.e. about 0.5 times the Si critical angle, an increase of the quantification by a factor up to 10 is often seen after Vapor Phase Decomposition because of particle-like shape of the metals against film-like shape for the initial distribution. Taking into account advantages and drawbacks of each Total-reflection X-Ray Fluorescence mode, a proposal for the use of Total-reflection X-Ray Fluorescence in advanced Integrated Circuit manufacturing is given and illustrated by practical results from a R&D pilot line and a mass production plant.     

Direct determination of trace elements in boron nitride powders by slurry sampling total reflection X-ray fluorescence spectrometry

The use of slurry sampling total reflection X-ray fluorescence spectrometry (SlS-TXRF) for the direct determination of Ca, Cr, Cu, Fe, Mn and Ti in four boron nitride powders has been described. Measurements of the zeta potential showed that slurries with good stabilities can be obtained by the addition of polyethylenimine (PEI) at a concentration of 0.1 wt.% and by adjusting the pH at 4. For the optimization of the concentration of boron nitride in the slurries the net line intensities and the signal to background ratios were determined for the trace elements Ca and Ti as well as for the internal standard element Ga in the case of concentrations of boron nitride ranging from 1 to 30 mg mL⁻¹. As a compromise with respect to high net line intensities and high signal to background ratios, concentrations of 5 mg mL⁻¹ of boron nitride were found suitable and were used for all further measurements. The limits of detection of SlS-TXRF for the boron nitride powders were found to range from 0.062 to 1.6 μg g^– 1 for Cu and Ca, respectively. Herewith, they are higher than those obtained in solid sampling and slurry sampling graphite furnace atomic absorption spectrometry (SoS-GFAAS, SlS-GFAAS) as well as those of solid sampling electrothermal evaporation inductively coupled plasma optical emission spectrometry (SoS-ETV-ICP-OES). For Ca and Fe as well as for Cu and Fe, however, they were found to be lower than for GFAAS and for ICP-OES subsequent to wet chemical digestion, respectively. The universal applicability of SlS-TXRF to the analysis of samples with a wide variety of matrices could be demonstrated by the analysis of certified reference materials such as SiC, Al₂O₃, powdered bovine liver and borate ore with a single calibration. The correlation coefficients of the plots for the values found for Ca, Fe and Ti by SlS-TXRF in the boron nitride powders as well as in the before mentioned samples versus the reference values for the respective samples over a concentration range from 2.5 to 1470 μg g^– 1 were found to be 0.995, 0.991 and 0.997, respectively.     

Determination of trace elements in planktonic microcrustaceans using total reflection X-ray fluorescence (TXRF): First results from two Chilean lakes

First results are described from the application of a recently developed dry method for determination of elements in single specimens of freshwater microcrustaceans, using total reflection X-ray fluorescence spectrometry (TXRF). This method is a powerful, non-destructive technique for quantifying the trace element content of minute biological samples with a dry weight of 3–50 g. Three different freshwater microcrustaceans were sampled, from the natural, uncontaminated Lake Laja and from the artificial Rapel reservoir which is slightly contaminated by drainage water from a copper mine. Single specimens of Daphnia pulex, Bosmina chilensis, and Ceriodaphnia dubia were prepared using a modification of the dry method and measured by TXRF. The results showed that both As, Mn, Fe, Ni, Zn, and Cu content and the bioaccumulation of these metals were usually significantly different between the microcrustaceans from the two lakes. The largest difference was found for Cu which was eight times more concentrated in the two microcrustaceans from Rapel reservoir than it was in D. pulex from Lake Laja.     

Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples

X-ray absorption fine structure (XAFS) experiments in fluorescence mode have been performed in total reflection excitation geometry and conventional 45°/45° excitation/detection geometry for comparison. The experimental results have shown that XAFS measurements are feasible under normal total reflection X-ray fluorescence (TXRF) conditions, i.e. on droplet samples, with excitation in grazing incidence and using a TXRF experimental chamber. The application of the total reflection excitation geometry for XAFS measurements increases the sensitivity compared to the conventional geometry leading to lower accessible concentration ranges. However, XAFS under total reflection excitation condition fails for highly concentrated samples because of the self-absorption effect.     

Total reflection X-ray fluorescence mercury analysis after immobilization on quartz surfaces

Quartz reflectors are a common substrate for total reflection X-ray fluorescence (TXRF) analysis. Especially low masses of trace elements can be determined on these surfaces. In the present work, various complexing reagents were immobilized on the surface of quartz reflectors. The reflectors were immersed in mercury solutions and selective mercury collection took place. The effect of immersion time was examined and a few minutes were found adequate. The reflectors were analysed for mercury by TXRF. Different complexing reagents showed different collection capabilities; 4-(2-pyridazo-resorcinol) gave the best among them. The effect of various experimental parameters was examined like pH, interferences from other ions, etc. Mercury speciation was successfully tested by comparing inorganic mercury results with the methyl mercury ones. A very good selectivity for inorganic mercury was found. It was achieved very good linearity in the 1-500 ng mL⁻¹ mercury concentration range and the minimum detection limit was equal to 2.5 ng mL⁻¹.     

Photovoltaic substrates and hafnium based gate dielectrics characterized with total reflection X-ray fluorescence

In this study, the capabilities of total reflection X-ray fluorescence spectroscopy characterization for both the photovoltaic industry and advanced semiconductor processing were investigated. Analysis of single crystal silicon coupon samples from various cleans during photovoltaic processing showed that certain clean steps were more effective in removing trace metal contamination. The multicrystalline photovoltaic silicon sample also had detected, but difficult to quantify, metallic contamination. Changes in the silicon dioxide content of hafnium silicate films used in semiconductor processing were also characterized by total reflection X-ray fluorescence spectroscopy analysis.     

Determination of metallic impurities in U3O8 using energy dispersive X-ray fluorescence spectrometry

In order to examine the capability of energy dispersive X-ray fluorescence spectrometry for the determination of some common metallic impurities in nuclear grade U₃O₈ matrix, a series of synthetic U₃O₈ standards, containing impurities such as Ca, Co, Cr, Cu, Fe, Mn, Mo, Ni ,V, W and Zn in the concentration range, 100–1000 μg/g, were prepared. Using these standards, calibration curves were set up for different elements after optimizing the spectrometer parameters. Two synthetic samples and five reference standards obtained through an inter-laboratory comparison exercise within analytical laboratories of Department of Atomic Energy, India were analyzed to evaluate the performance of the newly developed analytical methods. The estimates for most of the analytes were in good agreement with the added amounts. The method is fast, since it requires no chemical treatment. The method has good precision for the analytes determined.     

Total reflection X-ray fluorescence spectrometric determination of elements in water hyacinth from the Lerma River

The Lerma River is one of the most polluted body water in Mexico. For this reason, only the highly resistant organisms such as water hyacinth are able to reproduce in this river. The aim of this work was to evaluate the concentration of K, S, Fe, Ca, Mn, Ti, Zn, Sr, Rb, Cu, Cr, Ni, Pb and Br in roots of water hyacinth (Eichhornia crassipes) from the Lerma River. The samples were collected from five sites in the river and analyzed in triplicate using a TXRF Spectrometer ‘TX-2000 Ital Structures’ with a Si(Li) detector and a resolution of 140 eV (FWHM) at Mn Kα. A Mo tube (40 kV, 30 mA) with 17.4 KeV excitation energy was used for a counting time of 500 s. Results show that the average metal concentration in the water hyacinth roots decrease in the following order: K (9698.2 µg/g) > S (7593.3 µg/g) > Fe (4406.6 µg/g) > Ca (2601.8 µg/g) > Mn (604.2 µg/g) > Ti (230.7 µg/g) > Zn (51.65 µg/g) > Sr (43.55 µg/g) > Rb (18.61 µg/g) > Cu (12.78 µg/g) > Cr (6.45 µg/g) > Ni (4.68 µg/g) > Pb (4.32 µg/g) > Br (4.31 µg/g) and the bioconcentration factors in the water hyacinth decrease in the sequence: Ti > Fe > Mn > Cu > Ni > Zn > S > Pb > Rb > K > Cr > Sr > Br > Ca. The concentrations in roots of water hyacinth reflect the high pollution level of the river.     

Optimization of a glancing angle for simultaneous trace elemental analysis by using a portable total reflection X-ray fluorescence spectrometer

By using a portable total reflection X-ray fluorescence spectrometer with a 1 W X-ray tube, a specimen containing nanograms of Ca, Sc, Ti, V, Cr, Mn, Fe, and Ni is measured at several glancing angles of incident X-rays. Continuum X-rays are used as the excitation source. The intensities of the spectral background which degrades sensitivity to trace elements are decreased with a decrease of the glancing angle, and all these elements are detected at the glancing angle of 0.13° smaller than the critical angle for total reflection of the incident X-rays (0.20°). An optimum glancing angle for simultaneously detecting these trace elements is around 0.13°, and detection limits at 0.13° are sub-nanograms to ten nanograms.     

Cold plasma ashing improves the trace element detection of single Daphnia specimens by total reflection X-ray fluorescence spectrometry

The recently developed dry method for the element determination of single freshwater microcrustacean specimens (Daphnia) using total reflection X-ray fluorescence (TXRF) spectrometry showed that inhomogeneities of the biological material on the glass carriers resulted in some cases in high background and hampered the detection of certain trace elements (e.g. Cr, Ni). The aim of this study was to test how inhomogeneities of the biological material can be reduced using cold plasma ashing (CPA) techniques. For that, single specimens of the microcrustacean Daphnia pulex prepared according to the dry method were measured by TXRF before and after CPA. To determine the efficiency of the removal of organic matrix, the background and signal-to-background relationship of 28 samples were analyzed. The results showed (1) a highly significant reduction of the background by CPA fluctuating between 26 and 46% (all elements) and (2) a significant increase of the signal-to-background relationship by the factor 1.5–2.5 (all elements) and a much better detection of Cr, Pb, As and Se. The element concentrations (with exception of Cr, Ni and Pb) after ashing were in the same range or slightly higher than that before ashing. No significant differences between the two treatments were observed for Mn, As, Pb, Se (November), Sr (November), Cr (March) and Pb (March). The element concentration of P, K, Ca, Cu, Zn, Cr (November), Fe and Rb were significantly higher after ashing. In general, they increased by 1.5–13.6% and were highest for Rb (March) and P (November). In contrast, the element concentration of Ni and Cr (only March) decreased significantly after ashing (Ni: 91.6–92.1%, Cr: 91.3%). We recommend the use of CPA for biological material in the microgram-range as a routine method for TXRF analysis, especially when trace elements in minute concentrations are of interest.     

Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers

The unique properties of synchrotron radiation, such as high incident flux combined with low divergence, its linear polarization and energy tunability, make it an ideal excitation source for total reflection X-ray fluorescence (TXRF) spectroscopy in order to non-destructively detect trace impurities of transition metals on Si wafer surfaces. When used with a detector suitable for the determination of low energy radiation this technique can be extended to the detection of low-Z elements, such as Al, Na and Mg. Experiments have been performed at SSRL Beamline 3-3, a bending magnet beamline using monochromatic radiation from a double multilayer monochromator. The wafer was mounted vertically in front of the detector, which was aligned along the linear polarization vector of the incoming synchrotron radiation. This configuration allows the detector to accept a large solid angle as well as to take advantage of the reduced scattered X-ray intensity emitted in the direction of the linear polarization vector. A comparison between droplet samples and spin coated samples was done, in order to compare the capabilities of vapor phase decomposition (VPD-TXRF) with conventional SR-straight-TXRF. Detection limits in the range of 50 fg corresponding to 2E10 atoms/cm² have been obtained for Na. The spin coated samples, prepared from solutions containing an equal amount of Na, Mg and Al showed an unexpected result when performing a scan of the angle of incidence of the incoming X-rays suggesting a different adsorption behavior of the elements in a multielement solution on the wafer surface. The observation of this behavior is important because the spin coating technique is the standard method for the preparation of surface standards in semiconductor quality control. This effect could be characteristic of the Na, Mg, Al solution used, but the angle dependence of the fluorescence signal of a standard should always be investigated before using the standard for calibration of the apparatus and quantification.     

Determination of calcium, potassium, manganese, iron, copper and zinc levels in representative samples of two onion cultivars using total reflection X-ray fluorescence and ultrasound extraction procedure

The chemical characterization of onion cultivar samples is an important tool for the enhancement of their productivity due to the fact that chemical composition is closed related to the quality of the products. A new sample preparation procedure for elemental characterization is proposed, involving the acid extraction of the analytes from crude samples by means of an ultrasonic bath, avoiding the required digestion of samples in vegetable tissue analysis. The technique of total reflection X-ray fluorescence (TXRF) was successfully applied for the simultaneous determination of the elements Ca, K, Mn, Fe, Cu and Zn. The procedure was compared with the wet ashing and dry ashing procedures for all the elements using multivariate analysis and the Scheffé test. The technique of flame atomic absorption spectrometry (FAAS) was employed for comparison purposes and accuracy evaluation of the proposed analysis method. A good agreement between the two techniques was found when using the dry ashing and ultrasound leaching procedures. The levels of each element found for representative samples of two onion cultivars (Yellow Granex PRR 502 and 438 Granex) were also compared by the same method. Levels of K, Mn and Zn were significantly higher in the 438 Granex cultivar, while levels of Ca, Fe and Cu were significantly higher in the Yellow Granex PRR 502 cultivar.