Partial dislocations and stacking faults in cubic SiC

Numerous stacking faults and dislocations (formed by intersection of stacking faults and dislocations limiting nonintersecting stacking faults) in the 3C-SiC films grown by molecular beam epitaxy on a silicon substrate were studied by electron microscopy with the use of weak beams. A procedure for determining any of possible Burgers vectors of the (1/6)〈116〉-type glide dislocations and the (1/6) 〈110〉-and (1/3)〈001〉-type sessile partial dislocations (in face-centered cubic lattices) is developed based on the criterion of the contrast value. The sessile dislocations formed by intersections of stacking faults were shown to have the (1/6)〈110〉-and (1/3)〈001〈-type Burgers vectors. The width of nonintersecting stacking faults corresponds to the stacking-fault energy ranging within 0.1–2 mJ/m².     

Burgers Vectors of Dislocations in Creep-deformed Fe3Si Single Crystals

In creep-deformed Fe₃Si single crystals the Burgers vectors of the dislocations were examined by transmission electron microscopy. The Burgers vector in a sample deformed under conditions of 60 MPa and 575–600 °C was of the type 1/2 〈110〉, whereas 〈111〉 superlattice dislocations were not found. 1/2 〈110〉 is the shortest translation distance in the D0₃ superlattice structure of Fe₃Si.     

Melt Growth of CdTe Crystals and Transmission Electron Microscopic Investigations of their Grain Boundaries

Transmission electron microscopy investigations are carried out on CdTe crystals grown in quartz ampoules in a temperature region (1020–1091 °C) near to the melting point of 1092 °C, by travelling heater method in quasi-closed and in sealed (at 0.135 Pa) volume, and by the Bridgman method from nearly stoichiometric melts. An original method for preparation of CdTe thin foil is reported. Two types of grain boundaries are observed: high-angle misoriented grain boundaries (more than ten degrees misorientation between adjacent grains) and low-angle misoriented grain boundaries (less than one degree misorientation between adjacent sub-grain). Both dislocations with Burgers vector b = a/6 〈112〉 and b = a/2 〈110〉 are present.     

TEM and X-ray investigations of defect structure of PbSnTe crystal

The Pb_0.8Sn_0.2Te single crystal grown by the Bridgman technique was examined by X-ray and TEM methods. The X-ray reflection topography revealed that the PbSnTe crystal consisted of monocrystallinic blocks with linear dimensions of 1–5 mm separated by low angle boundaries of tilt-twist character. “As grown” defects observed by TEM method have been identified as single perfect dislocations and dislocation pairs. A mean density of dislocations inside the crystal blocks was no more than 10³ cm⁻². Except “as grown” defects rows of mobile dislocations were observed. All of dislocations lines were characterized by the same type of Burgers vector, i.e. b = 1/2a〈110〉.     

Dislocations and dislocation reduction in space grown GaSb

The behaviour of dislocations in GaSb crystals grown in space both from a stoichiometric melt (floating zone method, FZ) and a Bi solution (floating solution zone, FSZ) respectively, is studied. Predominantly straight 60° dislocations with Burgers vectors of the type b = a/2 <110> in (111) glide planes are identified. In the 20 mm long FZ single crystal the linear growing out of the dislocations is observed which reduces the dislocation density in the centre of the crystal to values below 300 cm^–2. The Bi incorporation in the FSZ crystal results in a misfit between seed and grown crystal and in a network of misfit dislocations at the interface. Thermocapillary convection during growth as well as the surface tension may be the reasons for the presence of curved dislocations and the higher dislocation density within a 1 – 2 mm border region at the edges of both of the crystals. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Stability of dislocations in MgO single crystals at high temperatures

The dislocation structures of MgO single crystals annealed at 1900 °C for 3 hrs and at 2000°C for 1 hr were observed electron microscopically, and it was found that the following reactions took place at high temperatures: a/2 〈11 0〉 + a/2 [110], = a [100], a/2 [110] + a/2 〈11 01〉 = a/2 [011]. The resultant dislocations were sessile. Their interaction with impurities would make the subgrain boundaries stable.     

Morphology and orientation relations of BaCl2 precipitates in NaCl single crystals

In the present paper morphology and orientation relations of BaCl₂ precipitates in NaCl single crystals are described. It is shown that BaCl₂ precipitates of large dimensions are formed at the dislocations of a/2〈110〉{100}, the dislocation lines of which are oriented in the directions 〈210〉.     

Defects in implanted and Czochralski silicon

Rod-like defects, a6〈114〉 and a/3〈111〉 faults, and a/2〈110〉 loops may all be generated by self-interstitial aggregation during the annealing of implanted or Czochralski silicon, and several models, intended to account for one or more of these, are compared. It is concluded that the rod-like defects are {113} faults, and that the three faulted defects form independently (i.e. they are not related in an „evolutionary”︁ sequence). The dipolelike a/2〈110〉 loops probably result from the unfaulting of {113} faults, while other perfect loops are generated by the shear of a/6〈114〉 defects. At a given temperature, the latter appear considerably more likely to unfault than the a3〈111〉 faults. The structure of the {113} fault remains uncertain.     

Calculation of phase diagrams in AlxIn1−xAs/InP,AsxSb1−xAl/InP and AlxIn1−xSb/InSb nano-film systems

The models for calculation of phase diagrams of semiconductor thin films with different substrates were proposed by considering the contributions of strain energy, the self-energy of misfit dislocations and surface energy to Gibbs free energy. The phase diagrams of the Al_xIn_1−xAs and As_xSb_1−xAl thin films grown on the InP (1 0 0) substrate, and the Al_xIn_1−xSb thin films grown on the InSb (1 0 0) substrate at various thicknesses were calculated. The calculated results indicate that when the thickness of film is less than 1 μm, the strain-induced zinc-blende phase appears, the region of this phase extends with decreasing of the layer thickness, and there is small effect of surface energies of liquid and solid phases on the phase diagrams.     

Dislocations in BZS and PMN pyrochlores

The dislocations observed in Bi_3/2ZnSb_3/2O₇ (BZS) and Pb_1.83Mg_0.29Nb_1.71O_6.39 (PMN) pyrochlores are described. An attempt is made to determine the Burgers vectors.     

Electron microscopy analysis of dislocation behavior in HVPE-AlGaN layer grown on a stripe-patterned (0 0 0 1) sapphire substrate

Microstructures were investigated by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) in order to clarify the dislocation behavior in AlGaN layers HVPE-grown on a stripe-patterned sapphire (0 0 0 1) substrate. SEM observation revealed very clearly the growth process: if AlGaN starting to grow from the side-wall of patterned substrate develops, a poly-crystalline region is formed up to the top surface of thin film. When the growth from the upper side (terrace) of patterned substrate is predominant, AlGaN becomes a single-crystalline layer with a flat surface. Threading dislocations (TDs) generated from the interface to the terrace propagate upwards, inclining to the wing regions. They are scarcely merged with one another. The AlGaN layer on the patterned substrate with a wider groove has a smaller density of dislocation to be about 1×10⁹ cm⁻². There are four types of dislocations: (1) TDs inclining toward 〈1 1¯ 0 0〉 normal to their Burgers vector B; (2) TDs inclining toward 〈2 1¯ 1¯ 0〉 on their slip-plane; (3) TDs inclining largely or horizontal dislocations (HDs) along 〈2 1¯ 1¯ 0〉 and (4) roundly curved HDs lying on (0 0 0 1) plane. Some TDs change the direction of inclination, suggesting that internal stress changed intricately during the growth.     

Diffusion of self-point defects in body-centered cubic iron crystal containing dislocations

The energetic, crystallographic, and diffusion characteristics of self-point defects (SPDs) (vacancies and self-interstitial atoms (SIAs)) in body-centered cubic (bcc) iron crystal in the absence of stress fields have been obtained by the molecular statics and molecular dynamics methods. The effect of elastic stress fields of dislocations on the characteristics of SPDs (elastic dipoles) has been calculated by the methods of the anisotropic linear theory of elasticity. The SPD diffusion in the elastic fields of edge and screw dislocations (with Burgers vectors 1/2 〈111〉 and 〈100〉) at 293 K has been studied by the kinetic Monte Carlo method. The values of the SPD sink strength of dislocations of different types are obtained. Dislocations are more effective sinks for SIAs than for vacancies. The difference in the sink strengths for SIAs and vacancies in the case of edge dislocations is larger than the screw dislocations.     

TEM Investigation of Dislocations in RNi2B2C (R = Y,Tb, Ho,Er, Y0.6Tb0.4, Er0.8Tb0.2)

To evaluate the influence of different rare earth metals on dislocation type and stacking fault occurrence in RNi2B2C compounds samples with R = Y, Tb, Ho, Er, Y_0.6Tb_0.4 and Er_0.8Tb_0.2 were investigated. As a result of the TEM analysis the parameter decisive for the lattice defects in these compounds is not the type of components but the annealing treatment of the samples. In well homogenized material the dominant Burgers vector of perfect dislocations was <100] and stacking faults are hardly found. In inhomogeneous samples the dominant Burgers vector was <110] and the perfect dislocations often lie in the planes of the numerous stacking faults. In both types of materials the experimental results hint at the existence of two different slip systems.     

Defects in LEC-grown Indium Phosphide Crystals Doped with Tin

Crystalline defects in Sn-doped LEC indium phosphide have been revealed by chemical etching and analyzed by TEM. Grown-in dislocations, various kinds of defect clusters and colonies of microdefects were found. The symmetrical defect clusters are shown to equate mostly with larger dislocation loops exhibiting shear components and/or other dislocation arrangements generated by a stress source which is positioned in the centre of the dislocation cluster. Those centres are often formed by a plate-like agglomeration composited of tiny inclusions and very small faulted dislocation loops. Such planarly arranged accumulations of microdefects lie on {111} planes. The direct vicinity of single threading grown-in dislocations is always enriched with tiny perfect dislocation loops and precipitates. Additionally, very large isolated interstitial-type perfect dislocation loops with b = a₀/2 〈110〉 have been found by TEM experiments. Mostly, the {110} habit plane of such loops is decorated with an high number of small dislocation loops and precipitates as a consequence of dislocation climb.     

Edge misfit dislocations in the GeSi/Si(001) pair: Conditions and specific features of high-quantity generation

Dislocation structure of Ge_xSi_1?x films (x=0.4?0.8) grown by molecular-beam epitaxy on Si(001) substrates was studied by means of transmission electron microscopy. It was found that the density of edge MDs formed at the early stage of plastic strain relaxation in the films could exceed the density of 60° MDs. In our previous publications, a predominant mechanism underlying the early formation of edge misfit dislocations (MD) in Ge_xSi_1?x/Si films with x>0.4 was identified; this mechanism involves the following processes. A 60° glissile MD provokes nucleation of a complementary 60° MD gliding on a mirror-like tilted plane (111). A new edge MD forms as a result of interaction of the two complementary 60° MDs, and the length of the newly formed edge MD can then be increased following the motion of the “arms” of the complementary 60° MDs. Based on this scenario of the edge MD generation process, we have calculated the critical thickness of insertion of an edge MD into GeSi layers of different compositions using the force balance model. The obtained values were found to be more than twice lower than the similar values for 60° MDs. This result suggests that a promising strategy towards obtaining dislocation arrays dominated by 90° dislocations in MBE-grown Ge_xSi_1?x/Si films can be implemented through preliminary growth on the substrate of a thin, slightly relaxed buffer layer with 60° MDs present in this layer. The dislocated buffer layer, acting as a source of threading dislocations, promotes the strain relaxation in the main growing film through nucleation of edge MDs in the film/buffer interface. It was shown that in the presence of threading dislocations penetrating from the relaxed buffer into the film nucleation of edge MDs in the stressed film can be initiated even if the film thickness remains small in comparison with the critical thickness for insertion of 60° MDs. Examples of such unusual MD generation processes are found in the literature.     

TEM-Untersuchungen von Gitterfehlern in ZnSiP2-Einkristallen

Results are dealt with concerning TEM investigations of lattice defects in ZnSiP₂ single crystals. After the crystal growth dislocations or stacking faults were found in a few cases only. More frequently twins were present in the microstructure. The crystallographic elements of twinning are {112} 〈111〉. After plastic deformation by bending at 900 °C local dislocation arrangements with high defect density (N_v ≈ 10⁶…︁ 10⁷ cm⁻²) were observed. By means of the diffraction contrast one Burgers vector b = 1/2 〈111〉 could be identified. In some cases the crystals also contained wide deformation stacking faults, which were limited by partial dislocations. The density of twins was not increased under the conditions of deformation reported here. As it can be concluded from investigations of Oettel et al. and from the results of the twin analysis, slip and generation of stacking faults take place on {112}-planes in ZnSiP₂ crystals. Crystallographic considerations on both processes are dealt with.     

Growth condition related orientation transition for YBa2Cu3O7−δ films on NdGaO3 substrate

For comprehensive understanding, the crystallographic out-of-plane axis transition for YBa₂Cu₃O_7?δ (YBCO or Y123) films grown on (110) NdGaO₃ (NGO) substrate, using liquid phase epitaxy (LPE), was systematically investigated via changing flux composition, processing temperature and oxygen partial pressure. It is found that LPE films could grow, remarkably, in a wide temperature range between 24 K above and 25 K below the peritectic temperature (T_p). The unpredicted c-oriented films formed at the temperatures above T_p, is deduced to be attributed to the etch-back behavior, i.e., Nd partially dissolved from the NGO substrate into solution, which leads to a locally high supersaturation for facilitating film growth. Even more distinctively, decreasing from the high temperature in this wide range, the YBCO films characteristically experienced the orientation transitions, the double transition of the c-axis oriented→a/c-axis mixed→c-axis oriented in air, and a single evolution of the c-axis→a-axis in the pure oxygen atmosphere. By combining supersaturation with the NGO etch-back, and solute diffusion, the transition origin of the film orientation in various temperature regions was clarified.     

Nature and origin of V-defects present in metalorganic vapor phase epitaxy-grown (InxAl1−x)N layers as a function of InN content,layer thickness and growth parameters

Our study of samples grown in different metalorganic chemical vapor deposition reactors and with different growth conditions reveals that V-pits are always present in (In_xAl_1?x)N films whatever the layer thickness and the InN content. V-pits are empty inverted pyramids terminating threading dislocations. InN-rich triangular regions are present around the threading dislocations terminated by pits with a hexagonal 6-fold symmetry distribution in {11?20} planes. The nature of the facets of the V-pits depends on the growth conditions: pits with either {11?2l}, l being between 1 and 3, or {1?101} facets have been observed. Moreover, the nature of the threading dislocations terminated by pits also depends on the growth conditions. Our observations suggest that with a high V/III ratio only edge a+c-type dislocations are terminated by pits whereas with a low V/III ratio both edge a-type and mixed a+c-type dislocations are terminated by pits.     

Gosset helicoids: II. Second coordination sphere of eight-dimensional lattice <Emphasis Type="Italic">E</Emphasis><Subscript>8</Subscript> and ordered noncrystalline tetravalent structures

This paper completes a series of works in which the three-dimensional Euclidean realization of the system of constructions of algebraic geometry determines the three-level (cluster-helicoid-union of helicoids) scheme of the assembly of ordered tetravalent structures. The algebraic and topological properties of the second coordination sphere of the eight-dimensional lattice E ₈ have been used to derive an ordered noncrystalline diamond-like structure. An a priori constructed model represents a helicoidal assembly of finite tubes (from allowably distorted 〈110〉 diamond chains) with transverse pentacycles, hexacycles, and heptacycles and nonintegral screw axes. It has been assumed that similar structures can be formed in diamond-like thin films, gas hydrates, biological structures, nanostructures, and other ordered systems.     

Characterization of dislocations in a LiNbO3 single crystal grown by micro pulling down method

LiNbO₃ single crystals grown by the micro pulling down (μ-PD) method have been revealed to be as free of dislocations and subgrain boundaries up to 500 μm in diameter. On the other hand, μ-PD LiNbO₃ single crystals grown along the x-axis in diameter of 800 μm were observed to be dislocated due to the size effect of crystal. The Burgers vectors of dislocations were determined to be [22 01], [101 1], and [01 11] by X-ray topography.