The measurement of differential EXAFS modulated by high pressure

Differential EXAFS (DiffEXAFS) is able to detect subtle atomic perturbations in the local area of the absorbing atom. Here a new method of performing DiffEXAFS experiments under the modulation of high pressure has been developed. Periodic pressure was achieved in the gasket with the help of a dynamic diamond anvil cell, and the measurements were conducted in common energy‐scanning mode. This technique has been utilized on ZnSe at 4.8 GPa. The present results have demonstrated a good agreement with the equation of state of ZnSe, and revealed sensitivity to atomic displacements of one order higher in magnitude than that of conventional EXAFS.     

Extended X-ray absorption fine structure measurements of laser-shocked V and Ti and crystal phase transformation in Ti

Extended x-ray absorption fine structure (EXAFS), using a laser-imploded target as a source, can yield the properties of laser-shocked metals on a nanosecond time scale. EXAFS measurements of vanadium shocked to approximately 0.4 Mbar yield the compression and temperature in good agreement with hydrodynamic simulations and shock-speed measurements. In laser-shocked titanium at the same pressure, the EXAPS modulation damping is much higher than is warranted by the predicted temperature increase. This is shown to be due to the alpha-Ti to omega-Ti crystal phase transformation, known to occur below approximately 0.1 Mbar for slower shock waves.     

遗传算法在EXAFS谱图解析中的应用

扩展Ｘ射线吸收精细结构（ＥＸＡＦＳ）谱是研究物质原子近邻结构和表面结构的有力工具。ＥＸＡＦＳ谱的解析通常采用标准样品比较法或最小二乘曲线拟合方法。但前者对标样的要求很高，而后者则参数初值难以确定，且结果有时不唯一。本文提出一种ＥＸＡＦＳ曲线拟合的新方法一遗传算法，并对单配位层Ｃｕ样品的ＥＸＡＦＳ谱图进行了解析，取得满意的结果。     

谐波对EXAFS振幅的影响

本文讨论了晶体单色器高次衍射形成的谐波对EXAFS振幅的影响。给出了一般计算表达式和计算实例。这种影响是使EXAFS振幅减小,它与谐波和基波强度之比、样品厚度及吸收系数等因素有关。分别测量了不同厚度的铜箔样品有谐波与无谐波时的K吸收EXAFS谱,得出的单配位层EXAFS振幅的变化测量值与计算值相符。从而提供了对谐波影响进行修正的方法。 关键词：     

EXAFS方法在金属玻璃结构研究中的误差分析

本文对EXAFS方法在金属玻璃结构研究中所得径向距离的误差进行了分析。所做的模拟计算表明当前流行的关于这个问题的误差理论不能圆满地解释这一现象。本文分析了玻璃态和晶态的相移函数,指出在相似的体系中玻璃态和晶态相移函数与k的关系采用线性函数近似时,其斜率可能是不同的,而且无序度相差越大,两者的偏差可能也越大。在EXAFS数据处理过程中,没有考虑这种偏差的影响是造成EXAFS方法结果中径向距离误差的一个原因。本文还提出了一个修正参考样品(晶态)相移函数斜率偏差的方法,并将它应用于Cu₅₅Zr₄₅金属玻璃的EXAFS数据处理中,所得结果与用X射线异常散射方法测定的结果符合得很好。 关键词：     

A comparative study of the spectra recorded at RRCAT synchrotron BL-8 dispersive EXAFS beamline with other beamlines

The aim of the present work is to make a comparative study of the EXAFS spectra recorded at the BL-8 dispersive EXAFS beamline at 2 GeV Indus-2 synchrotron source at RRCAT, Indore (India) with those recorded at other synchrotron EXAFS beamlines, viz., X-19A at NSLS, BNL (USA), EXAFS wiggler beamline 4-1 at the SSRL (USA) and beamline 11.1 at ELETTRA (Italy). For this purpose, EXAFS spectra at Cu K-edge in copper metal have been recorded at these four beamlines. Further, EXAFS spectra at Cu K-edge in a copper complex have also been recorded at BL-8 beamline and beamline 11.1 at ELETTRA (Italy). The obtained experimental μ(E) data have been background-subtracted and then normalized. The normalized data have been then converted to χ(k) data, which have been Fourier-transformed and then fitted with the theoretical model, thereby yielding different structural parameters. It has been shown that the results obtained from the EXAFS spectra recorded at the BL-8 beamline are comparable with those obtained from other synchrotron EXAFS beamlines and also with the crystallographic results reported by earlier workers. The reliability, usefulness and data quality of the BL-8 beamline have been discussed.     

Thermomodulated exafs of soft x-ray absorption edges

Thermotransmission measurements exhibit structure for over 100 eV above the L_2,3 edge in Al and the M_2,3 edge in Ni, structure attributed to the temperature modulation of EXAFS. It appears to arise from both thermal expansion and a Debye-Waller factor.     

Temperature dependence of EXAFS intensities near second order phase transitions

Extended x-ray absorption fine structure (EXAFS) measures near neighbor bond lengths. Thermal damping of the oscillatory absorption modulation is caused by bond-length fluctuations and is predicted to show a weak change in temperature derivative at the temperature T_c of a second order structural phase transition. The size of the slope change is a measure of the sensitivity of T_c to changes in the bond-stretching force constant.     

Local order in light emitting porous silicon studied by XEOL and TEY

The local structure of porous silicon has been studied exciting its optical luminescence by X-rays (XEOL). The photoluminescence yield and the total electron yield (TEY), recorded simultaneously as a function of the X-ray energy at the Si K edge, give rise to the extended X-ray absorption fine structures (EXAFS). Analysis of EXAFS data confirms that the optical luminescence of porous Si originates from the nanocrystalline cores and shows that XEOL–EXAFS and TEY–EXAFS are sensitive to different Si local environment. It can be assumed that XEOL–EXAFS is related only to the light emitting sites while TEY–EXAFS is sampling both luminescent and non-luminescent Si sites.     

Pressure study of monoclinic ReO2 up to 1.2 GPa using X‐ray absorption spectroscopy and X‐ray diffraction

The crystal and local atomic structure of monoclinic ReO₂ (α‐ReO₂) under hydrostatic pressure up to 1.2 GPa was investigated for the first time using both X‐ray absorption spectroscopy and high‐resolution synchrotron X‐ray powder diffraction and a home‐built B₄C anvil pressure cell developed for this purpose. Extended X‐ray absorption fine‐structure (EXAFS) data analysis at pressures from ambient up to 1.2 GPa indicates that there are two distinct Re—Re distances and a distorted ReO₆ octahedron in the α‐ReO₂ structure. X‐ray diffraction analysis at ambient pressure revealed an unambiguous solution for the crystal structure of the α‐phase, demonstrating a modulation of the Re—Re distances. The relatively small portion of the diffraction pattern accessed in the pressure‐dependent measurements does not allow for a detailed study of the crystal structure of α‐ReO₂ under pressure. Nonetheless, a shift and reduction in the (011) Bragg peak intensity between 0.4 and 1.2 GPa is observed, with correlation to a decrease in Re—Re distance modulation, as confirmed by EXAFS analysis in the same pressure range. This behavior reveals that α‐ReO₂ is a possible inner pressure gauge for future experiments up to 1.2 GPa.     

Position and flux stabilization of X‐ray beams produced by double‐crystal monochromators for EXAFS scans at the titanium K‐edge

The simultaneous and active feedback stabilization of X‐ray beam position and monochromatic beam flux during EXAFS scans at the titanium K‐edge as produced by a double‐crystal monochromator beamline is reported. The feedback is generated using two independent feedback loops using separate beam flux and position measurements. The flux is stabilized using a fast extremum‐searching algorithm that is insensitive to changes in the synchrotron ring current and energy‐dependent monochromator output. Corrections of beam height are made using an innovative transmissive beam position monitor instrument. The efficacy of the feedback stabilization method is demonstrated by comparing the measurements of EXAFS spectra on inhomogeneous diluted Ti‐containing samples with and without feedback applied.     

A study of EXAFS associated with the Re LIII discontinuity in metal and some compounds

The authors have reanalysed the data on the EXAFS associated with the rhenium L_III absorption discontinuity in the metal and in some of its compounds, and have interpreted them in the light of the recent theory proposed by Lytle, Sayers and Stern. It has been shown that the α parameter of EXAFS is a measure of valency and that the metallic valency of rhenium is two.     

X‐ray‐Raman‐scattering‐based EXAFS beyond the dipole limit

X‐ray Raman scattering (XRS) provides a bulk‐sensitive method of measuring the extended X‐ray absorption fine structure (EXAFS) of soft X‐ray absorption edges. Accurate measurements and data analysis procedures for the determination of XRS‐EXAFS of polycrystalline diamond are described. The contributions of various angular‐momentum components beyond the dipole limit to the atomic background and the EXAFS oscillations are incorporated using self‐consistent real‐space multiple‐scattering calculations. The properly extracted XRS‐EXAFS oscillations are in good agreement with calculations and earlier soft X‐ray EXAFS results. It is shown, however, that under certain conditions multiple‐scattering contributions to XRS‐EXAFS deviate from those in standard EXAFS, leading to noticeable changes in the real‐space signal at higher momentum transfers owing to non‐dipole contributions. These results pave the way for the accurate application of XRS‐EXAFS to previously inaccessible light‐element systems.     

能量分辨率对EXAFS的影响

测量EXAFS谱时,系统的能量分辨率是影响其结果的重要因素。本文提出了分辨率影响结构参数的计算方法,以Ge,Ni样品为例,测量及计算了不同分辨率下的结构参数的差异。测量结果与计算结果符合得很好,讨论了分辨率如何影响EXAFS谱及结构参数,给出了修正方法。 关键词：     

Correction method for the self‐absorption effects in fluorescence extended X‐ray absorption fine structure on multilayer samples

A novel correction method for self‐absorption effects is proposed for extended X‐ray absorption fine structure (EXAFS) detected in the fluorescence mode on multilayer samples. The effects of refraction and multiple reflection at the interfaces are fully considered in this correction method. The correction is performed in k‐space before any further data analysis, and it can be applied to single‐layer or multilayer samples with flat surfaces and without thickness limit when the model parameters for the samples are known. The validity of this method is verified by the fluorescence EXAFS data collected for a Cr/C multilayer sample measured at different experimental geometries.     

Extended X-ray-absorption fine structure of mixed-coordination systems

An analysis method of the extended x-ray absorption fine structure (EXAFS) for mixed-coordination systems (MCS) is provided to determine structure parameters of the same type of atoms located at different coordination sites and proportion of them. It's demonstrated that if the effects of different sites on EXAFS amplitudes are ignored, the coordination numbers gotten from EXAFS analyzing must be wrong mostly. The method has been well tested by analyzing a known structure Gd₃Ga₅O₁₂ (GGG) crystal in which the Ga atoms have two different coordination sites. Li₂O-ZnO-GeO₂ glass system is also analyzed by means of the EXAFS method for MCS. Two different coordination sites for Ge atoms in the glasses. are found and the occupancies of them and the structure parameters are determined.     

Local structures of Mn in dilute magnetic semiconductor ZnMnO

The local structures of Mn atoms in (Zn, Mn)O have been investigated by extended x-ray absorption fine structure (EXAFS). For samples with lower Mn concentrations (<11%), EXAFS results show that the majority of Mn atoms are incorporated at Zn substitutional sites. Ferromagnetic behavior has been observed in those ZnMnO samples. It is the direct evidence to suppose that the ferromagnetism in (Zn, Mn)O is not due to Mn-related secondary phases but is intrinsic. When the Mn concentration is increased to 20% or higher, the EXAFS simulation shows the formation of MnO secondary phases and the films show a change from ferromagnetic (FM) to antiferromagnetic (AFM) state. We suggest that Mn-related secondary phases might be responsible for the transformation from FM to AFM state.     

Local distortion induced metal-to-insulator phase transition in PrRu4P12

Extended x-ray absorption fine structure (EXAFS) experiments have been carried out on PrRu(4)P(12) and PrOs(4)P(12) to study the metal-to-insulator (MI) phase transition in PrRu(4)P(12). No Pr displacement was observed across the MI transition temperature from the EXAFS data. Instead, our EXAFS data clearly show that a Ru displacement is associated with this MI transition. The very high Debye temperature for the Ru-P bond (Theta(D) = 690 K) suggests that a slight rotation/displacement of relatively rigid RuP(6) octahedra leads to this small Ru displacement, which accompanies the MI transition at 62 K in PrRu(4)P(12).     

The effect of self‐consistent potentials on EXAFS analysis

A theory program intended for use with extended X‐ray‐absorption fine structure (EXAFS) spectroscopy and based on the popular FEFF8 is presented. It provides an application programming interface designed to make it easy to integrate high‐quality theory into EXAFS analysis software. This new code is then used to examine the impact of self‐consistent scattering potentials on EXAFS data analysis by methodical testing of theoretical fitting standards against a curated suite of measured EXAFS data. For each data set, the results of a fit are compared using a well characterized structural model and theoretical fitting standards computed both with and without self‐consistent potentials. It is demonstrated that the use of self‐consistent potentials has scant impact on the results of the EXAFS analysis.     

EXAFS characterization of ferric oxyhydroxides

The EXAFS method has been used for investigating the local structures of ferric oxyhydroxides which are reaction products formed on an iron surface exposed to air or immersed in salt water. Fe K EXAFS spectra of two references of ferric oxyhydroxides, i.e. goethite and lepidocrocite, which are often detected as components of reaction products, have been also studied for comparison thereof. The two reference oxyhydroxides demonstrated different EXAFS spectra, which are interpreted based on the atomic local structures. Fe K EXAFS spectra and their radial distribution functions of the reaction products formed on an iron surface have been compared with those of the reference oxyhydroxides. This comparison shows that the first and second nearest neighboring structures around ferric ions in the reaction products are different from those of the two references. These results indicate that the local structures around ferric ions in the reaction products are disordered, although the atomic local structures of Fe–O may be described as being local structural units.