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1.
Several methods of correcting the X-ray intensity in the electron probe microanalysis were examined for getting the local concentrations of Ga, Al and As in Ga1−xAlxAs epitaxial layers. Most correct results were obtained by combining the method of BIRKS for the Al-determination with that of DUNCUMB /REED /SPRINGER for the Ga-determination. In this case the mean departure from 50% for the sum of the Ga and Al atom-percents is only −0.1%. Equations for the mutual conversion of concentrations into masses, necessary for the practical use, are given in an appendix.  相似文献   

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The semiconductor CdxHg1–xTe serves as a starting material for the production of infrared detectors with a high detectivity and a small time constant. CdxHg1–xTe single crystals are necessary to manufacture detectors efficiently. The single crystals should not contain segregations and have to include a homogeneous molar concentration x. An electron microprobe X-ray analyzer meets all requirements expected from the measuring method for checking the homogeneity of CdxHg1–xTe crystals. — Results of qualitative and quantitative studies in the microscopical and macroscopical range are presented. Typical defects of the crystals were detected by using the qualitative electron microprobe X-ray analysis. The quantitative analysis was carried out with standard samples. The method for determination of the molar concentration x of the standard samples is described.  相似文献   

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In a horizontal 2-zone resistance furnace nearly ideally formed crystals were grown at the end of an evacuated ampoule, using temperatures between 750 and 720°C, a ΔT of 15 to 10 deg between the rooms of the solution and growth. When applying single heating zone and special conditions good crystals were grown by the use of a quartz rod or a quartz plate as nucleation center. — Finally analytical data on the products of growing are given.  相似文献   

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A direct spectrochemical method for the quantitative determination of silicon in AlxGa1–xAs (x ≈ 0,8) crystals was elaborated. The results of the analysis of highly doped samples (1019 … 1020 cm−3) were discussed in connection with photoluminescence spectra and electrical measurements.  相似文献   

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Refractive indices and effective electro‐optic coefficient γc of (1–x)Pb(Zn1/3Nb2/3)O3xPbTiO3 (PZN‐xPT, x = 0.05, 0.09 and 0.12) single crystals were measured at 532 nm wavelength. Orientation and temperature dependences of the electro‐optic coefficient were investigated. Large electro‐optic coefficient (γc = 470 pm/V) was observed in [001]‐poled PZN‐0.09PT crystal. More importantly, γc of tetragonal PZN‐0.12PT is almost unchanged in a temperature range −20 ∼ 80 °C. The γc of PZN‐xPT single crystals are much higher than that of widely used electro‐optic crystal LiNbO3 (γc = 20 pm/V). These results show that PZN‐xPT single crystals are very promising materials for electro‐optic modulators in optical communications.  相似文献   

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Lead magnesium niobate Pb(Mg1/3Nb2/3)O3 — lead titanate PbTiO3 [abbr. as (1 — x) PMN — x PT] ferroelectric ceramics with different excesses of MgO and PbO were systematically studied under different processing conditions for ferroelectric refrigeration application. It was found that the excess amount of MgO and PbO, and the sintering temperature have great effect on the crystallographic properties of the ceramics. In our experiments, (1 — x) PMN —x PT (x = 0.08, x = 0.10, and x = 0.25 respectively) with the excesses of 2 mol% MgO and 2 mol% PbO ceramics sintered at 1250 °C/1 hour possess the desired perovskite structures and large electrocaloric temperature change (ΔT = 1 K and more) in the vicinity of room temperature under a dc electric field of 1.5 kV/mm. It is expected that (1 — x) PMN — x PT electrocaloric ceramics could be applied for cascade refrigeration near room temperature.  相似文献   

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In heteroepitaxy of ternary compound systems of the type (AxB1–x)1–ΔC1+Δ has to be taken into account the occurrence of complex diffusion phenomena independent on the epitaxial method applied which cannot be considered within a quasi-binary system AC–BC. Based on the statements of thermodynamics of irreversible processes a model for the calculation of diffusion profiles, regarding the influence of the compound crystal composition x on the deviation from stoichiometry Δ, is presented. Concentration profiles calculated in accordance to this model show typical maxima and minima. – Tellurium distribution profiles determined on heterostructures of the type (Pb1–xSnx)1–ΔTe1+Δ /PbTe got by electron-probe microanalysis may be explained qualitatively within the presented model. With the EBIC-method additional p-n junctions at the position of the extrema in the tellurium distribution were found.  相似文献   

10.
Investigations of the thermal expansion of (CuAlTe2)1–x(CuAlSe2)x solid solutions in the temperature range from 100 to 800 K have been carried out for the first time. It has been demonstrated that the thermal expansion coefficient αL grows considerably in the temperature range from 100 to 300 K, whereas the temperature dependence above 300 K is rather weak. The isotherms of composition dependence of the thermal expansion coefficient αL for 100, 293, 500 and 800 K were constructed, and it was found that linear relations could express them. The Debye temperatures θD , the average mean‐square dynamic displacements , the average root‐mean‐square amplitudes of thermal vibration RMS , the anion position parameter u using S. C. Abrahams & J. L. Bernstein (uAB ) and J. E. Jaffe & A. Zunger (uJZ ) models were calculated. The composition dependence of microhardness H using the phenomenological theory was also calculated, and it was discovered that this dependence has a non‐linear character with a maximum of 383 kg/mm2 at x=0.67. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)  相似文献   

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The (CuInSe2)x(2ZnSe)1‐x and (CuInTe2)x(2ZnTe)1‐x solid solution crystals prepared by Bridgman method and chemical vapor transport have been studied. The nature of the crystalline phases, the local structure homogeneity and composition of these materials have been investigated by X‐ray diffraction (XRD) and Electron Probe Microanalysis (EPMA) methods. The analysis revealed the presence of chalcopyrite‐sphalerite phase transition between 0.6 ≤ X ≤ 0.7. Lattice constants, value of σ position parameter and bond length between atoms were also calculated. It was found that the lattice parameters exhibit a linear dependence versus composition. The transmission spectra of solid solution crystals in the region of the main absorption edge were studied. It was established that the optical band gap of these materials changes non‐linearly with the X composition. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)  相似文献   

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Peculiarities of the interatomic interaction in the Zn3(PxAs1–x)2 (0 ≦ x ≦ 1) solid solutions are discussed in terms of the magnetic susceptibility data. It is shown that the dependence χmol(x) has a break at x ≈︁ 0.15 which is, apparently, associated with the transition from the structures with indirect optical transitions to those with direct optical ones in the above mentioned system. In the framework of the MOLKAO model the magnetic susceptibility is divided into the Langevin diamagnetic and the Van Vleck paramagnetic components.  相似文献   

14.
Mixed crystals (MgxNi1–x)SeO4 · 6 H2O and (MgxCu1–x)SeO4 · 5 H2O have been prepared studying the solubility in the MgSeO4–NiSeO4–H2O and MgSeO4–CuSeO4–H2O systems at 25 °C. It has been shown that the monoclinic structure of MgSeO4 · 6 H2O is unstable and undergoes a change into tetragonal structure due to the included nickel ions (about 4 at %). The lattice parameters of (MgxNi 1–x)SeO4 6 H2O have been calculated. It has been established that the magnesium ions incorporate isodimorphously in the crystal structure of CuSeO4 · 5 H2O which could be an indication of the existence of MgSeO4 · 5 H2O isostructural with the triclinic CuSeO4 5 H2O. The distribution coefficients of the salt components between the liquid and solid phases have been calculated.  相似文献   

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On the basis of X-ray, magnetic and neutron diffraction measurements the range of solubility in the CrSxTe1−x (x = 0−0.2) system has been established and the magnetic phase diagram of the system has been plotted. The decrease of magnetization at low temperature and the additional reflections in the neutron diffraction patterns are associated with the formation of noncollinear magnetic structure which is characterized by the antiferromagnetic component of the magnetic moments. This component has the orthorhombic unit cell with \documentclass{article}\pagestyle{empty}\begin{document}$ a_M = \sqrt {3a_0 } $\end{document}, bM = a0, cM = c0. The character of the exchange interactions giving rise to this magnetic structure is discussed.  相似文献   

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Large crystals of La0.63Pb0.37Mn O3+δ with small La(Pb)‐ deficiency of about 0.005‐0.01 at.% were grown by high temperature solution growth method. The structure of the grown crystals was determined as rhombohedral with R‐3 space group by single‐crystal X‐ray diffractometry. The surface morphology of the crystals and the exact chemical composition was examined by scanning electron microscopy and energy dispersive X‐ray analysis methods, respectively. The IR‐transmission spectrum reveals the presence of Mn3+O6‐ and Mn4+O6‐ octahedra in the lattice of La0.63Pb0.37Mn O3+δ crystals. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)  相似文献   

19.
Doping of GaAs and Ga1−xAlxAs with Zn in the LPE process was studied by a radioanalytical method. It is found that Zn diffuses from the Ga-(Al)-As-Zn-solution into the n-GaAs substrate before epitaxial growth starts. This “pre-diffusion” and the following diffusion of Zn out of the epitaxial layer into the substrate results in three regions with distinct Zn-graduation in the vicinity of the pn-junction. There are no striking differences for GaAs/GaAs and Ga1−xAlxAs/GaAs structures. The Zn concentration in GaAs epitaxial layers decreases exponentially from the substrate up to the layer surface. From this profile the temperature dependence of the Zn segregation coefficient is calculated. At 900°C a value keff = 5,2 · 10−2 is found. The doping profile in Ga1−xAl/As layers is more complex. It is influenced by the changings of temperature during the growth of the layer and by the nonuniform Aldistribution over the layer thickness.  相似文献   

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