Effects of in‐target Compton‐scattering in lanthanum fluorescence spectra

A study was made of the continuum adjacent to the Kα₁ and Kα₂ peaks (the ‘shoulder’) in lanthanum fluorescence spectra. The fluorescence was induced by 59.537 keV γ‐rays from a ²⁴¹Am source. The spectra were observed with an La₂O₃‐loaded paraffin target (the ‘La target’). To limit the observations to the scattering in the target, a collimator was used in front of the germanium detector, which strongly reduced the near‐detector scattering. Changes in the shoulder spectra were observed on attaching additional mass to the La target and on changing its orientation with respect to the detector‐to‐target centre‐line. The measurements clearly show that the main cause of the shoulder spectra is the in‐target Compton scattering. A different distribution of mass in the vicinity of the fluorescing atoms with respect to the detector‐to‐target centre‐line results in different probabilities of the observed scattering at all angles. Since the energy of secondary Compton photons is directly related to the scattering angles, different distributions of mass cause changes in the shoulder spectra. Comparison of the calculated and measured shoulder spectra shows good agreement on an absolute scale. Copyright © 2006 John Wiley & Sons, Ltd.     

掺杂C60的SiO2气凝胶的制备及荧光特性研究

利用“化学掺杂”方法，制备掺杂C₆₀-SiO₂气凝胶，对掺杂C₆₀-SiO₂气凝胶的红外吸收光谱、飞行时间质谱的测试表明C₆₀分子被成功地掺入SiO₂气凝胶中．室温条件下，在Ar⁺激光（488nm）激发下，观察到掺杂C₆₀-SiO₂气凝胶有很强的可见发光现象，发光峰位较纯C₆₀发光明显蓝移 关键词：     

Surface properties of superparamagnetic iron oxide MR contrast agents: Ferumoxides,ferumoxtran, ferumoxsil

The surface properties of the active ingredients in AMI colloidal, superparamagnetic iron oxide magnetic resonance (MR) contrast agents are described. Scanning electron microscopy/energy dispersive X-ray elemental analyses and diffuse reflectance Fourier transform infrared spectroscopy (FTIR) spectra of ferumoxsil (AMI-121 drug substance) were consistent with the presence of a monolayer of H₂NCH₂CH₂NHCH₂CH₂CH₂Si(O⁻)₃ siloxane monomer or dimer. The X-ray photoelectron spectra (XPS) of ferumoxsil are also consistent with complete coverage of the iron oxide surface with a monolayer of siloxane. The static secondary ion mass spectra (SSIMS) of ferumoxsil showed that the siloxane film is covalently bonded (i.e., SiOFe bonds) to the iron oxide surface. The FTIR of ferumoxides (AMI-25) and Ferumoxtran (AMI-227) showed only adsorbed dextran. The XPS spectra of the dextrancoated colloids showed that Ferumoxtran has a thicker layer of dextran than ferumoxides iron oxide particles (∼5 and ∼3 nm, respectively). The SSIMS spectra of these dextran-coated colloids showed only low mass fragments due to the adsorbed dextran. The nature of the interactions of the dextran coating with the iron oxide surfaces of ferumoxides and Ferumoxtran is discussed.     

Cluster generation by laser ablation

We produced niobium clusters over a wide size range (Nb_n: 1≤n≤1000) by a laser ablation method in a low-pressure condensation source. Mass spectra of the neutral clusters, positive and negative ion clusters were measured by a time-of-flight mass spectrometer with a high mass resolution and a wide mass range. Similarity and difference in their mass spectra were examined to understand the cluster generation process in different charged states.     

Characteristics of nitrogen-incorporated silicon oxycarbide films and plasmas for plasma enhanced chemical vapor deposition with TMOS/N2/NH3

Plasma enhanced chemical vapor deposition of nitrogen-incorporated silicon oxycarbide thin films obtained from the gas mixture of TMOS (tetramethoxysilane), N₂, and NH₃ is studied. The effects of the TMOS to N₂ pressure ratio on the properties of the film and the plasma are investigated. The deposited films are analyzed by in situ ellipsometry, ex situ Fourier transform infrared spectroscopy (FTIR), and by X-ray photoelectron spectroscopy (XPS). The plasma is characterized by using optical emission spectroscopy (OES). The mass spectra of the constituents in the plasma are obtained by quadrupole mass spectroscopy. The correlation between the film properties and the plasma characteristics is explained wherever possible. As the partial pressure of N₂ is decreased, the refractive index begins to decrease, reaches a minimum, and then saturates. The FTIR absorption bands are observed from about 850 to 1000 cm⁻¹ and from 1000 to 1250 cm⁻¹, and can be attributed to the formation of a nitrogen-incorporated silicon oxycarbide thin film. The variation of the refractive index is discussed in relationship with the deposition rate, the OES spectra, the mass spectra of the plasma, the film composition obtained by XPS, and FTIR spectra.     

The 4d-4f dipole resonance of the Pr atom in an endohedral metallofullerene, Pr@C82

The photoion yield spectra of an endohedral metallofullerene Pr@C₈₂ were measured in the photon energy range of 100-150 eV by using time-of-flight mass spectrometry. Parent ions Pr@C₈₂⁺, Pr@C₈₂²⁺ and Pr@C₈₂³⁺ were observed in the mass spectra. The photoion yield spectra of Pr@C₈₂²⁺ showed a broad peak at 120-140 eV that was assigned to the 4d-4f giant dipole resonance of the encapsulated Pr atoms. Absolute photoabsorption cross sections of Pr@C₈₂ were evaluated from the photoion yield spectra to be 37±12 Mb at 110 eV (off-resonance) and 52±13 Mb at 130 eV (on-resonance). These cross sections of Pr@C₈₂ were compared with the results of Ce@C₈₂, the only metallofullerene whose photoionization properties have ever been studied near the 4d edge of the encapsulated metal atom. The enhancement of photoabsorption due to the giant resonance was found to be similar in Pr@C₈₂ and Ce@C₈₂, but there are marked differences in the peak shapes, which can be explained as due to interference effects between the fullerene cage and the encapsulated metal atoms.     

Embedded structure of silicon monoxide in SiO2 films

The structure of SiO_x (x = 1.94) films has been investigated using both X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). The SiO_x films were deposited by vacuum evaporation. XPS spectra show that SiO_1.94 films are composed of silicon suboxides and the SiO₂ matrix. Silicon clusters appeared only negligibly in the films in the XPS spectra. Si₃O⁺ ion species were found in the TOF-SIMS spectra with strong intensity. These results reveal the structure of the films to be silicon monoxide embedded in SiO₂, and this structure most likely exists as a predominant form of Si₃O₄. The existence of Si-Si structures in the SiO₂ matrix will give rise to dense parts in loose glass networks.     

Cross sections for ionization and ionic fragmentation of pyrimidine molecules by electron collisions

The electron impact mass spectroscopy and the total ion collection measurements were used to investigate the ionization and ionic fragmentation of the pyrimidine, C₄H₄N₂, molecules in the gas phase. The cation mass spectra were measured in the 10−85 amu range and the observed mass peaks assigned to corresponding ionic fragments. The most abundant cation in the mass spectra is the parent cation, C₄H₄N \hbox{₂⁺_{\mathrm{2}}^{\mathrm{+}}} + 2 , at 80 amu. The appearance energies of the ionic fragments were determined and the possible fragmentation processes are discussed. The electron impact absolute total and partial ionization cross sections in pyrimidine were obtained over the energy range from the respective ionization thresholds up to 150 eV.     

Photoelectron spectroscopic characterization of vapors over heated alkali metaborate solids

The He(I) photoelectron spectra of the gaseous metaborates of K, Rb, and Cs have been obtained using a modified high-temperature cylindrical-mirror electron spectrometer equipped with a resistance-heated sample oven. Attempts to acquire data for LiBO₂ and NaBO₂ were unsuccessful because of the high temperature required for volatilization (on the order of 1300–1400 K). The identities of the vapor-phase molecules were based on mass spectrometric and electron diffraction data. Spectral lines were assigned molecular-orbital origins through the use of MO calculations and by analogy with other compounds of similar type.     

Optical Characterization of N-Doped GaN-AlxGa1?xN Multi Quantum Wells by Using Infrared Magnetoplasma Spectroscopy

We have used polarized oblique incidence infrared magneto spectroscopy to investigate optical phonons modes and electronic properties of doped GaN- Al_xGa_1–xN MQWs. The effective medium approach of magnetoplasm long period superlattice was used for modeling the reflectivity spectra. The optical phonons contributions as well as free carriers (plasmon and cyclotron response) in analyzing spectra were included in magnetoplasma dielectric tensor in the effective medium approach. The infrared spectra in the presence of a high magnetic field B_o (Voigt geometry) show a number of additional features due to cyclotron resonance that used to calculate electron and hole effective mass.     

Thermal release of trapped deuterium from silica injected by 80-keV D+ ion implantation and RF D2 plasma

When silica is irradiated by 80-keV D⁺ ions or RF plasma of D₂ gas, deuterium is trapped in the silica forming Si-OD bonds. The deuterium, trapped as OD bonds, is desorbed from the silica upon heating to form some release products. The thermal detrapping process corresponds to decrease of OD bonds and was studied by measurement of infrared Fourier transform spectroscopy (FTIR). The release products HDO, D₂O, HD, and D₂ were measured by quadrupole mass spectroscopy (QMS). The detrapping and release processes of trapped deuterium were studied by simultaneous measurement of FTIR and QMS. Since the release spectra of HDO, D₂O, HD, and/or D₂ correspond to the decrease spectra of OD bonds, these release products are formed by thermal decomposition of OD bonds. The formation of water (HDO, D₂O) and hydrogen (HD, D₂) depends upon concentration of pre-existing OH bonds and deuterium injection methods (80-keV D⁺ implantation or RF D₂ plasma irradiation).     

Intracluster electron transfer from a metal atom/cluster followed by anionic oligomerization of vinyl molecules

Intracluster electron transfer and oligomerization reaction were investigated by mass spectrometry of clusters of alkali metal atom (M) with acrylonitrile (AN; CH₂=CHCN). In the photoionization mass spectra of M(AN)_n, magic numbers were clearly observed at n = 3k (k = 1-4 for M = Na and K, k = 1 for M = Li). The results of photodissociation of neutral K(AN)_n indicate that the n = 3 cluster has an anomalous stability relative to other sizes of clusters. The C=C bond in vinyl molecules is also found to be necessary to form the magic numbers by measuring the photoionization mass spectrum of K atom with propionitrile. These results strongly support the intracluster anionic oligomerization reaction initiated by electron transfer from the alkali atom. The quantum chemical calculations have revealed that the evaporation induced by excess energy generated by intracluster oligomerization is important to form the magic numbers in the present clusters. Received 29 November 2000     

Laser Microprobe Mass Analysis of NH4 ReO4, AgReO4 and Al (ReO4)3

The laser microprobe mass analyzer (LAMMA) is a recently developed mass spectroscopic technique for both organic and inorganic microanalysis. LAMMA analysis involves laser ionization of the sample material followed by mass separation in a time of flight (TOF) mass spectrometer. The present application of LAMMA illustrates the characterization of three inorganic perrhenates: NH₄ReO₄, AgReO₄ and Al(ReO₄)₃. Results clearly show the value of LAMMA for inorganic mass spectrometry, in this study the most useful data originated in the negative-ion mass spectra.     

Preparation, characterization and photocatalytic activity of multi-walled carbon nanotube-supported tungsten trioxide composites

Multi-walled carbon nanotube (MWCNT)-supported tungsten trioxide (WO₃) composite catalysts were prepared by liquid-phase process. WO₃ nanoparticles grew on the inner and outer surface of MWCNTs. Their photocatalytic activities in the degradation of the Rhodamine B Dye were studied. The effects of mass ratio of MWCNTs to WO₃ were discussed. X-ray diffraction, field emission transmission electron microscopy, thermogravimetric-differential thermal analysis and ultraviolet-visible light absorption spectra were carried out to characterize the composite catalysts. The results indicated that the optimum mass ratio of MWCNTs to WO₃ is 5:100.     

Crystalloluminescence and temporary mechanoluminescence of As2O3 crystals

Crystalloluminescence and temporary mechanoluminescence of As₂O₃ crystals are investigated. The crystalloluminescence spectra are similar to the photoluminescence and mechanoluminescence (of fresh crystals, in CO₂ atmosphere) spectra. The mechanoluminescence spectra of freshly grown crystals taken in air consist of the superposition of the photoluminescence and nitrogen emissions. The mechanoluminescence spectra of old crystals of As₂O₃ consist of only the nitrogen emission. The total number of crystalloluminescence flashes is linearly related to the total mass of the crystals grown. The mechanoluminescence intensity increases with the mass of the crystals. The mechanoluminescence intensity decreases with the age of the crystals and the rate of decrease increases with increasing temperature of the crystals. Different possibilities of crystalloluminescence and mechanoluminescence excitations in As₂O₃ crystals are explored and it is concluded that crystalloluminescence and mechanoluminescence are of different origins.     

Terahertz spectroscopy of quantum-well narrow-bandgap HgTe/CdTe-based heterostructures

The energy spectra of quantum-well narrow-bandgap Hg_{1 ? y} Cd _y Te/Cd _x Hg_{1 ? x} Te heterostructures have been studied. The dependences of the effective cyclotron mass on the density (in classical magnetic fields) and the transition energy (in quantizing fields) have been obtained from the cyclotron resonance measurements. These dependences confirm the near-linear dispersion law for the electrons with small mass at the band bottom (the minimum cyclotron mass measured is 0.003 m ₀). The interband photoconductivity of the CdHgTe-based structures with the long-wavelength photoresponse edge lower than 6 meV has been demonstrated.     

The adsorption of hydrogen and the reaction of hydrogen with oxygen on Pt (100)

The adsorption of hydrogen on Pt (100) was investigated by utilizing LEED, Auger electron spectroscopy and flash desorption mass spectrometry. No new LEED structures were found during the adsorption of hydrogen. One desorption peak was detected by flash desorption with a desorption maximum at 160 °C. Quantitative evaluation of the flash desorption spectra yields a saturation coverage of 4.6 × 10¹⁴ atoms/cm² at room temperature with an initial sticking probability of 0.17. Second order desorption kinetics was observed and a desorption energy of 15–16 kcal/mole has been deduced. The shapes of the flash desorption spectra are discussed in terms of lateral interactions in the adsorbate and of the existence of two substates at the surface. The reaction between hydrogen and oxygen on Pt (100) has been investigated by monitoring the reaction product H₂O in a mass spectrometer. The temperature dependence of the reaction proved to be complex and different reaction mechanisms might be dominant at different temperatures. Oxygen excess in the gas phase inhibits the reaction by blocking reactive surface sites. At least two adsorption states of H₂O have to be considered on Pt (100). Desorption from the prevailing low energy state occurs below room temperature. Flash desorption spectra of strongly bound H₂O coadsorbed with hydrogen and oxygen have been obtained with desorption maxima at 190 °C and 340 °C.     

Mass spectrometric studies of laser ablated plume from a superconducting material

The ionic species present in the laser ablated plume from the surface of the Bi_1.6Pb_0.4Sr₂Ca₂Cu₃O_ysuperconducting target have been investigated using a non-commercial laboratory developed linear time-of-flight (TOF) mass spectrometer. The recorded TOF mass spectra reveal the presence of all the atomic species of the target material, monoxide and cluster ions. The occurrence of clusters in the mass spectra is the evidence of aggregation processes at higher laser fluence. The dependence of the ionic yield of the species has been studied using the fundamental (1064 nm), second harmonic (532 nm) and fourth harmonic (266 nm) of a Nd:YAG laser. The maximum ionization of the species present in the plume is observed at 266 nm even at lower laser fluence. The effect of the laser fluence on the total and individual ionic yields of the ablated species is also presented.     

Synthesis and Spectral Characterization of Methyl‐2‐pyridyl Ketone Benzoyl Hydrazone and Its Complexes with Rare Earth Nitrates

Abstract

The hydrazone ligand, methyl‐2‐pyridyl ketone benzoyl hydrazone (L), and its complexes with rare earth nitrates have been synthesized. These new complexes with the general formula of Ln(L)₂(NO₃)₃ · nH₂O (where Ln=La, n=5.5; Ce, Pr, n=5; Nd, Eu, n=4) were characterized by mass spectra, elemental analysis, IR spectra, thermal analysis, UV spectra, molar conductivity, and luminescent spectra. All the complexes are stable in air. The results show that the lanthanide ions in each complex are coordinated through oxygen and nitrogen atoms of the ligand, the oxygen atoms of the nitrate, and coordinated water molecules. The amide‐oxygen atoms of L coordinate to the Ln ions in its keto‐form. Tentative structures for the complexes have been proposed.     

Shallow surface etching of organic and inorganic compounds by electrospray droplet impact

The electrospray droplet impact (EDI) was applied to bradykinin, polyethylene terephthalate (PET), SiO₂/Si, and indium phosphide (InP). It was found that bradykinin deposited on the stainless steel substrate was ionized/desorbed without the accumulation of radiation products. The film thickness desorbed by a single collisional event was found to be less than 10 monolayers. In the EDI mass spectra for PET, several fragment ions were observed but the XPS spectra did not change with prolonged cluster irradiation. The etching rate for SiO₂ by EDI was measured to be ∼0.2 nm/min. The surface roughness of InP etched by EDI was found to be one order of magnitude smaller than that etched by 3 keV Ar⁺ for about the same etching depths. EDI is capable of shallow surface etching with little damage left on the etched surface.