STM针尖和外电场在Si（111）—7＊7表面单原子操纵中的作用

利用第一性原理的离散变分局域密度泛函方法,采用团簇模型（Ｓｉ３４Ｈ３６－Ｗ１１）来模拟ＳＴＭ操纵（Ｓｉ１１１）－７＊７表面顶角吸附原子的过程,通过分析在进行原子操纵过程中体系的能量与电子云密度分布来研究针尖和外电场的作用。     

Ge在Si(111)7×7表面的选择性吸附

利用超高真空扫描隧道显微镜研究了室温条件下Ge在Si(111)7×7表面上初期吸附过程.在Ge所形成团簇中存在一个临界核.这些Ge团簇的吸附中心总是在三个增原子所围成的区域中.它们的电子结构具有类似半导体的性质,即其局域态密度在远离费米面的能级处很大,而在费米面附近的能级处非常小. 关键词： 扫描隧道显微镜 Si(111)7×7表面 Ge团簇     

Si(111)7×7清洁表面的总电流谱

用自制的总电流谱仪对Si(111)7×7清洁表面进行了测量,得到A,B,C,D四个谱峰的能量位置分别在真空能级以上2.6,5.2,8.6和12.9eV。样品饱和吸氢后表面峰A消先。用带间跃迁模型对实验结果作了初步分析。 关键词：     

Si(111)表面原子弛豫研究

本文用原子集团模型和推广的Hueker方法研究Si(111)面的表面弛豫,得到表面Si原子向体内弛豫0.10?的结论,改进了已有的经验估计和理论计算结果,与LEED的分析结果符合较好。 关键词：     

超高真空原子尺度Aux/Si(111)-(7×7)表面吸附的电荷分布测量

原子尺度表面吸附Au原子的物理化学性质对研究纳米器件的制备以及表面催化等起着非常重要的作用.利用调频开尔文探针力显微镜研究了室温下Au在Si(111)-(7×7)表面吸附的电荷分布的特性.首先,利用自制超高真空开尔文探针力显微镜成功得到了原子尺度Au在Si(111)-(7×7)不同吸附位的表面形貌与局域接触电势差(LCPD);其次,通过原子间力谱与电势差分析了Au/Si(111)-(7×7)特定原子位置的原子特性,实现了原子识别;并通过结合差分电荷密度计算解释了Au/Si(111)-(7×7)表面间电荷转移与Au的吸附特性.结果显示,Au原子吸附有单原子和团簇形式.其中,Au团簇以6个原子为一组呈六边形结构吸附于Si(111)-(7×7)的层错半单胞内的3个中心原子位;单个Au原子吸附于非层错半单胞的中心顶戴原子位;同时通过电势差测量得知单个Au原子和Au团簇失去电子呈正电特性.表面差分电荷密度结果显示金在吸附过程中发生电荷转移,失去部分电荷,使得吸附原子位置上的功函数局部减少.在短程力、局域接触势能差和差分电荷密度发生变化的距离范围内,获得了理论和实验之间的合理一致性.     

用低能电子衍射研究Si(111)7×7表面的原子结构

本文提出了一个由低能电子衍射能带理论计算所确定的Si(111)7×7表面的不等边三角形聚合与添加原子模型。发现:第一层空间距d_k=0.95±0.02?(膨胀21.3%±0.02?),第二层空间距d_l=0.83±0.02?(膨胀5.9%±0.02?),第三层空间距d_l=0.69±0.05?(收缩10.9%±0.08?)和第四层空间距d_b=2.38±0.08?(膨胀3.8%±0.08?)。     

STM study of nucleation of Ag on Si(111)−(7 × 7) surface

Initial stages of Ag on Si(111)−(7 × 7) surface nucleation were studied at submonolayer coverage. Samples were prepared by thermal evaporation of Ag from tungsten wire under UHV conditions (p<2.5 × 10⁻⁸ Pa). Various deposition rates (0.002–0.1 ML s⁻¹) were used to prepare Ag island films with coverages (0.002–2) ML (1 ML ≈ 7.58 × 10¹⁴ atoms cm⁻²) at room temperature. We observed preferential growth on faulted half unit cells (F cells). At constant coverage both the island density and ratio of occupied F and U (unfaulted) cells are independent of the deposition rate, which is an evidence for dominant influence of substrate structure. The preference of nucleation in the F cells against U cells decreases with the coverage until the ratio is 1:1 for 1 ML Ag film. We have observed that presence of an Ag island in any type of the half unit cell (F or U) considerably reduces nucleation probability in neighbouring cells. This results in forming of structural patterns observed among randomly grown Ag-islands which is a new feature found for Ag/Si(111)−(7 × 7) system. Presented at the VIII-th Symposium on Surface Physics, Třešt’ Castle, Czech Republic, June 28 – July 2, 1999. This work was supported by the Grant Agency of Charles University — projects GAUK 34/97 and 147/99, by the Grant Agency of Czech Republic — project GAČR 202/97/1109 and by the Ministry of Education grant VS 97116.     

Si(111)-(7×7)表面上Ge量子点的自组织生长

用扫描隧道显微镜研究了Si(111)(7×7)表面上Ge量子点的自组织生长.室温下用固相外延法在硅基底上沉积亚单层的Ge,然后在适当的温度下退火可以聚集形成有序的Ge量子点.由于Ge在Si(111)(7×7)表面选择性的吸附而形成有序的Ge量子点. 关键词： 锗 硅 扫描隧道显微镜 自组织生长     

Al(111)表面单个Al原子的操纵── W针尖与Al原子的相互作用

为了较清楚地阐明扫描隧道显微镜针尖在样品表面原子操纵中的具体作用，根据第一性原理的离散变分理论计算，采用“团簇模型”研究了在无外加电场下，W针尖与样品Al(111)表面Al原子的相互作用．结果表明：随着W针尖与样品表面接近到一定程度（针尖与样品表面的距离S≤10a.u.(0.53nm))时，由于针尖原子与样品表面原子的相互作用，使位于针尖正下方的表面Al原子在脱离表面时感受到一稳定的势阱，即在无外场的情况下，当W针尖与样品Al(111)表面接近到一定程度时，由于针尖的吸引作用，将使针尖正下方的Al原子自动离开样品表面而移向W针尖，实现Al(111)表面单个Al原子的操纵． 关键词：     

低温下水汽在Si(111)7×7表面上的化学吸附

用ELS和XPS研究了低温下水汽在Si(111)7×7表面上的化学吸附及其随退火温度的变化。150K低温下水以解离形式吸附在Si(111)7×7表面。     

Observation of a line growth fault on the Si(111)-7 × 7 surface using STM

Using a scanning tunnelling microscope we have observed an interesting new fault on the Si(111)-7 × 7 surface, corresponding to an adatom registry shift of 1 bulk unit cell in the [1̄1̄2] direction. We propose a model to account for the structure along the fault.     

在Si(111)-(7×7)表面自组织生长二维Ge团簇超晶格

利用超高真空扫描隧道显微镜研究了室温条件下亚单层Ge在Si(111)(7×7)表面上的自组织生长.通过控制Ge的沉积量,在Si(111)(7×7)表面上自组织生长成一种具有六重对称性的二维Ge团簇超晶格.构成超晶格的Ge团簇均位于(7×7)亚单胞的位置上,而且它们的形状和大小基本保持一致.文中对这种自组织结构的形成机理进行了讨论     

Formation of Br-terminated Si6 rings during etching of Si(111)-7 × 7

Scanning tunneling microscopy was used to study the morphological evolution of Si(111)-7 × 7 exposed to molecular bromine. Etching at 900 K results in the removal of adatoms and conversion from the 7 × 7 surface to a 1 × 1 Br-terminated structure. Removal is dominated by bilayer step retreat with edge profiles that reflect etching anisotropies. Unique structures attributed to regrowth of Si released during step etching were consistent with six-membered Si rings terminated with Br. The distribution of such rings near the steps reflects the local bonding and etching anisotropies for the steps. Theoretical analyses of these rings terminated with Cl determine bond lengths, bond angles, and charge transfer within the ring.     

Si(111)7×7结构模型的稳定性研究

本文基于有相互作用的结构件的概念,对Si(111)7×7结构模型的稳定性进行研究。利用紧束缚法,计算了各种结构件的形成能及其相互作用能。由这些结构件可灵活地构成各种大单胞的表面结构并对其进行总能计算,而避免了大工作量的计算。对Si(111)5×5和7×7DAS模型,我们得到其表面能分别为-0.467eV和-0.477eV,与Qian和Chadi的结果很接近。并指出,Harrison提出的7×7吸附原子模型和Binnig等人提出的7×7吸附原子-空位模型都是不稳定的。     

Adsorption of Perylene on Si(111)(7×7)

We investigate the adsorption of organic molecular semiconductor perylene on(7 × 7) reconstructed Si(111)surface by ultraviolet photoemission spectroscopy.It is observed that seven features that derive from the organic material are located at 0.71,2.24,4.0,5.9,7.46,8.65 and 9.95 eV in binding energy.The theoretical calculation results reveal the most stable adsorption geometry of organic molecule perylene on Si(111)(7 × 7) substrates is at the beginning of deposition.     

在Si(111)-(7×7)表面自组织生长二维Ge团簇超晶格

利用超高真空扫描隧道显微镜研究了室温条件下亚单层Ge在Si(111)-(7×7)表面上的自组织生长.通过控制Ge的沉积量,在Si(111)-(7×7)表面上自组织生长成一种具有六重对称性的二维Ge团簇超晶格.构成超晶格的Ge团簇均位于(7×7)亚单胞的位置上,而且它们的形状和大小基本保持一致.文中对这种自组织结构的形成机理进行了讨论.     

Na原子在Si(111)-(7×7)表面的吸附:从二维原子气到纳米团簇阵列

作者利用扫描隧道显微镜 (STM)详细研究了室温下Na原子在Si(111) (7× 7)表面的吸附 .对STM图像及功函数变化的分析表明 ,当Na原子覆盖度小于临界覆盖度 (0 .0 8ML)时 ,Na原子具有类气态的性质并可以在一个吸附能阱中快速移动 .从STM图像可看出这种移动导致的对比度调制 .在临界覆盖度以上 ,Na原子自组装形成团簇阵列 .第一原理模拟计算的结果与作者的实验结论很好吻合 .     

Continuous-time observation of pseudo-vacancy diffusion at Si(111)-7 × 7 surfaces

Scanning tunneling microscopy (STM) is used to study surface diffusion of a special type of point defects at Si(111)-7 × 7 surfaces. These defects survive even after annealing up to 1250°C. They appear darker than Si adatoms at the tunneling biases ranging from −3 to +3 V, but they are not true vacancies. We found that these vacancy-like defects (hereafter, we refer to them as pseudo-vacancies) are not caused by adsorption of major contaminants in the vacuum chamber, nor by dopants. We also observed migration of pseudo-vacancies between nearest neighboring Si adatom sites at temperatures above 500°C. Most of the jumps are within a half of the 7 × 7 unit cell. Thousands of STM images were recorded from 520 to 610°C and the activation energies and frequency factors were determined. Varying the tunneling current produces almost no effect on the diffusion, but varying the scanning speed produces a small effect.     

扫描隧道显微镜分辨能力的研究：对Si(111)-(7×7)表面的观察

用超高真空扫描隧道显微镜首次同时清晰地分辨出Si(111)-(7×7) 表面每个元胞中的12个顶戴原子和6个静止原子,这6个静止原子的亮度与无层错半元胞内中心顶戴原子的亮度基本相同. 第一性原理计算图像和STM实验结果完全符合,针尖的尺度小于7时,可以完全同时分辨出Si(111)-(7×7)表面的静止原子.