BaSn1-xSbxO3-δ和Ba1-yLaySnO3-δ的导电机制

测量了ＢａＳｎ_1-xＳｂ_xＯ_3-δ和Ｂａ_1-yＬａ_yＳｎＯ_3-δ样品的低温电阻率和磁化率．实验结果表明，在较低温度区域，两类样品的导电机制均是传导电子的范围可变跳跃。而在较高温度区域，ＢａＳｎ_1-xＳｂ_xＯ_3-δ样品的电导主要是电子从定域态到扩展态的跃迁所贡献，Ｂａ_1-yＬａ_yＳｎＯ_3-δ样品的电导则可能来源于电子的最近邻跳跃。 关键词：     

d(x2-y2)+idxy混合波正常金属/绝缘层/超导体结中的隧道谱

考虑界面粗糙散射,在Blonder-Tinkham-Klapwijk(BTK)理论框架下,通过求解Bogoliubov-de-Gennes(BdG)方程,分别计算T=0K和有限温度下,d_(x²-y²)+id_xy混合波正常金属绝缘层超导体结中的准粒子输运系数和隧道谱.研究表明:隧道谱中的电导峰的劈裂程度强烈地依赖于d_xy波分量的强度、超导体的晶轴方位和界面粗糙强度,而温度的升高能压低电导峰. 关键词： NIS结 (x²-y²)+id_xy混合波超导体')" href="#">d_(x²-y²)+id_xy混合波超导体 隧道谱     

磁性半导体/磁性d波超导结中的自旋极化输运

通过求解磁性d波超导中的能隙与磁交换能的自恰方程,利用推广的Blonder-Tinkham-Klapwijk 理论研究磁性半导体/磁性d波超导结中自旋极化准粒子输运系数与微分电导. 计算表明： 1) 磁性d波超导结中的磁交换能h₀可导致零偏压电导峰与能隙电导峰劈裂,劈裂的宽度为2h₀;2) 磁性半导体中的磁交换能h_FS可使零偏压电导峰劈裂的峰值变低. 而由能隙电导峰劈裂的两个子峰,当两种磁性材料的磁 关键词： 磁性半导体 磁性d波超导体 自旋极化输运     

Fe3O4薄膜的电输运及光诱导特性研究

用脉冲激光沉积法在(111)Si衬底上成功制备了高度择优取向的Fe₃O₄薄膜.电阻-温度关系表明Fe₃O₄薄膜的Verwey转变(T_V)约在122 K,低温段(T_V)输运特征满足Mott变程跳跃模型,高温段(T>T_V)为小极化子输运.激光作用下的光电导实验发现,在整个温区表现为光致电阻率减小,而且低温段的电阻变化率比高温段要大很多.分析认为Fe₃O₄薄膜的光致电阻率变化主要与激光激发t_2g电子的转移有关. 关键词： 3O₄薄膜')" href="#">Fe₃O₄薄膜 小极化子 光诱导特性     

成型压力对CrO2低温输运性质的影响

本文研究了压力对CrO₂样品低温磁输运性质的影响.样品的X射线衍射结果表明(110)峰的相对强度随压力的增加而增大，说明压力对CrO₂针状纳米颗粒有取向的作用.低温时CrO₂样品的电阻和磁阻均随压力的增加而减少.实验结果表明，低温下样品的电导呈现出典型的晶粒间隧穿特征，其Δ值随着压力和磁场的增加而减小，并且Δ随磁场的变化幅度与成型压力有关，成型压力越高，Δ随磁场的变化越小.这些变化可以归因为压力对晶粒间隧穿势垒的调制. 关键词： 磁阻 压力 隧穿 势垒厚度     

低温凝聚InSb膜相变过程中的结构及其超导电性

本文研究了低温凝聚LnSb膜相变过程中的结构变化及其对超导电性的影响,由X射线衍射分析发现一系列新结果,从而解释了低温凝聚InSb膜相变过程中的电导及相应的T_c本文指出对应于第二电导峰值的T_c是六方晶系(InSb)H的层状导电机制所致。 关键词：     

Au-Si-Au结点电子输运性质的第一性原理计算

采用密度泛函理论和非平衡格林函数相结合的方法对Au(100)-Si-Au(100) 系统左侧对顶位、右侧对空位的纳米结点的电子输运性质进行了理论模拟计算, 结果得到纳米结点的电导随电极距离(d_z)增大而减小. 在d_z =9.72 Å时, 结点的结合能最低, 结构最稳定, 此时电导为1.227G₀ (G₀=2e²/h), 其电子输运通道主要是Si原子的p_x, p_y和 p_z轨道电子形成的最高占居轨道共振峰; 在外偏压下, 电流-电压曲线表现出线性特征; 随着外加正负电压的增大, 电导略有减小, 且表现出不对称性的变化. 关键词： 硅原子 电子输运 密度泛函理论 非平衡格林函数     

用热激电导谱确定非晶态半导体能隙态密度的研究

本文用较完整的热激电导理论分析方法,处理非晶态半导体的热激电导谱,获得a-Si:H薄膜和a-Si:H/a-SiN_x:H超晶格中能隙上半部缺陷态密度的分布。其结果与用Fritzsche的理论分析方法获得的态密度分布一致。进一步比较了两种处理方法的主要特点,讨论了它们的特征参量,最大热发射能级E_m与准费密能级E_q之间的关系。结果证明,a-Si:H热激电导的分析应用弱复合情况处理,热激载流子的再俘获不能忽略。表明Gu等人的理论分析进一步改进了对非晶态半导体热激电导谱的处理。 关键词：     

纳米硅薄膜的低温电输运机制

在很宽的温度范围(500—20K)研究了本征和不同掺磷浓度的纳米硅薄膜的电输运现象.发现 原先的异质结量子点隧穿(HQD)模型能很好地解释薄膜在高温下(500—200K)的电导曲线,但 明显偏离低温下的实验值.低温电导(100—20K)具有单一的激活能W,并与k_BT值 大小相当(W～1—3k_BT),呈现出Hopping电导的特征.对HQD模型做了修正,认为 纳米硅同时存在两种输运机制：热激发辅助的电子隧穿和费米能级附近定域态之间的Hoppin g电导.高温时(T 关键词： 纳米硅薄膜 低温电导 电输运     

不同退火温度下晶化硅薄膜的电学输运性质

采用等离子体化学气相沉积技术制备氢化非晶硅薄膜,经过不同温度下的热退火处理,使薄膜由非晶结构向晶化结构转变,得到含有纳米晶粒的晶化硅薄膜.在晶化过程中,采用Raman技术对样品的结构进行表征.通过变温电导率的测试,对薄膜的电学输运性质进行了分析.研究结果表明：退火温度为700 ℃时,样品中开始有纳米晶形成,随着退火温度的增加,样品的晶化比增大,在1000 ℃时,薄膜的晶化比达到90%以上.在700 ℃退火时,薄膜中晶化成分较低,载流子的传输特性主要受到与硅悬挂键有关的缺陷态影响,表现为带尾定域态的跳跃电导 关键词： 氢化非晶硅 退火 纳米硅 电输运     

Non-adiabatic small-polaron hopping conduction in VN–PbO–TeO2 glasses

The dc conductivity of VN–PbO–TeO₂ glasses with different mole percentages of VN, PbO and TeO₂ has been measured in the temperature range 125–450?K. The conductivity of the glasses increases with increasing VN content for a fixed mole percentage of PbO. Neither Mott's variable-range hopping (VRH) model at low temperatures (T<Θ_D/4, where Θ_D is the Debye temperature) nor Greaves’ VRH model at intermediate temperatures (Θ_D/?4<T<Θ_D/2) describe the dc conductivity data for these glasses. Multiphonon tunnelling transport of strongly coupled electrons is also unable to account for the carrier transport. However, at high temperatures (T?>?Θ_D/2), conduction is shown to be due to small-polaron hopping in the non-adiabatic regime. Alteration of the VN content causes a change in the model parameters achieved from best-fitting curves for the glasses. Modulated differential scanning calorimetry analysis shows that the glass transition temperatures T _g in this system vary from 269 to 302°C.     

Electrical properties of KTiOPO4 single crystal in the temperature range from −100 °C to 100 °C

The electrical property of a KTiOPO₄ single crystal was studied by means of a dielectric spectroscopy method in the temperature range from −100 to 100 °C. Dielectric dispersion began at a temperature, T_S=−80 °C. It is believed that this dielectric dispersion is related to the ionic hopping conduction, which arises mainly from the jumping of K⁺ ions. The activation energy concerned with hopping conduction is E_a∼0.20 eV above T_S. T_S=−80 °C can be the minimum temperature for the hopping K⁺ ion.     

The glass transition temperature of amorphous poly(ethylene terephthalate) by thermally stimulated currents

The relation between the temperature T_α of the dipolar relaxation, obtained by the technique of thermally stimulated currents (TSC) and the glass transition temperature T_g has been studied in amorphous poly(ethylene terephthalate) samples. The temperature T_α depends fundamentally on the polarization temperature T_p, the polarization time t_p, and the heating rate v. For each heating rate a maximum T_α, T_M, was obtained for an optimum polarization temperature T_po. The value of T_po is 70°C, independent of the heating rate, and very close to the glass transition temperature obtained by differential scanning calorimetry (69°C). The resulting value for T_M coincides with T_po in the limits of null heating rate and null isothermal polarization time, and, consequently, T_M gives the value of the glass transition temperature for each heating rate as a function of the isothermal dipolar contribution on polarizing at the temperature T_po.     

Impedance spectroscopy of KTiOPO<Subscript>4</Subscript> single crystal in the temperature range –100 to 100 °C

The electrical properties of a single crystal of KTiOPO₄ was studied by impedance spectroscopy methods in the temperature range –100 to 100 °C. The complex resistivity decreases rapidly with increasing temperature, and resistivity dispersion begins at a temperature of T_S=-80 °C. The complex resistivity was fitted to the superposition of two Cole-Cole-type relaxations. The low frequency relaxation is associated with the electrode/crystal surface, while the high frequency relaxation is interpreted as resulting from ion migration in the bulk. It is believed that high frequency relaxation is related to ionic hopping conduction, which arises mainly from the jumping of K⁺ ions. The activation energies associated with hopping conduction are E_a0.21 eV above T_S and E_a0.11 eV below T_S . PACS 77.22.-d; 77.22.Gm; 66.10.Ed; 77.84.-s; 66.30.Hs     

Electrical conduction mechanism in nanocrystalline CdTe (nc-CdTe) thin films

The present paper reports the electrical characterization of nc-CdTe thin films in different temperature ranges. Thin films of nc-CdTe are deposited on the glass substrates by Physical Vapor Deposition (PVD) using the Inert Gas Condensation (IGC) method. The Transmission Electron Microscopy (TEM) studies are made on the CdTe nanocrystals. The surface morphology and structure of the thin films are studied by the Scanning Electron Microscope (SEM) and X-Ray Diffraction (XRD) measurements. Dark conductivity measurements are made on the nc-CdTe thin films in the temperature range 110–370 K in order to identify the conduction mechanism in this temperature range. The obtained results reveal three distinct regions at high, low, and sufficiently low temperature regions with decreasing activation energies. The analysis of the high temperature conductivity data is based on the Seto’s model of thermionic emission. At very low temperatures, dc conductivity (σ _d) obeys the law: lnσT ^1/2∝T ^?1/4, indicating variable-range hopping in localized states near the Fermi level. The density of the localized states N(E _F) and various other Mott’s parameters like the degree of disorder (T _O), hopping distance (R), and hopping energy (W) near the Fermi level are calculated using dc conductivity measurements at low temperatures. Carrier type, carrier concentration, and mobility are determined from the Hall measurements. The transient photoconductivity decay measurements are performed on the nc-CdTe thin films at different intensities in order to know the nature of the decay process.     

Variable-range hopping in Fe70Pt30 catalyzed multi-walled carbon nanotubes film

Using low-pressure chemical vapour deposition (LPCVD), multi-walled carbon nanotubes (MWNTs) are grown on nanocrystalline Fe₇₀Pt₃₀ film. The Fe₇₀Pt₃₀ nanocrystalline film is deposited by vapour condensation technique. The size of the nanoparticles varies from 5–10 nm, as inferred from SEM micrographs of Fe₇₀Pt₃₀ film. SEM and TEM observations of as-grown CNTs film reveal that these are multi-walled and their diameter varies from 30–80 nm and length is of the order of several micrometers respectively. There is a structural change from ordinary geometry of CNTs to bamboo shaped as suggested by TEM image. Raman spectra shows sharp G and D bands with a higher intensity of G band showing the presence of graphitic nature of the nanotubes. An experimental study of the temperature dependence of electrical conductivity of MWNTs film is done over a wide temperature range from (293–4 K). The measured data gives a good fit to variable-range hopping (VRH) and the results are interpreted using Mott's (VRH) model. The conduction mechanism of the MWNTs film shows a crossover from the exp[ -(T_o/T)^1/4] law in the temperature range (293–110 K) to exp[ -(T_m/T)^1/3] in the low temperature range (110–4 K). This behaviour is attributed to temperature-induced transition from three-dimension (3D) to two-dimension (2D) VRH. Various Mott's parameters like characteristic temperature (T_m), density of states at Fermi level N(E_F), localization length (ξ), hopping distance (R), hopping energy (W) have also been calculated using above-mentioned model.     

La0.67Sr0.08Na0.25MnO3的奇特输运性质及CMR效应

用固相反应法制备了La_0.67Sr_0.08Na_0.25MnO₃样品.通过磁化强度-温度(M-T)曲线、电阻率-温度(ρ-T)曲线以及ρ-T拟合曲线研究了样品的输运性质及庞磁电阻(colossal magnetoresistance，CMR)效应.结果表明，ρ-T曲线和磁电阻-温度(MR-T)曲线均出现双峰现象；高温峰是伴随顺磁-铁磁(PM-FM)相变出现绝缘体-金属(I-M)相变，低温峰是颗粒界面效应；两个绝缘相输运机理不同：较低温度下(248K<T<274K)，ρ(T)符合极化子的可变程跃迁模型，而在更高温区(330K<T<374K)，ρ(T)符合极化子近邻跃迁模型；两个类金属相输运机理也不同：在低温区(67K<T<186K)，满足ρ-T^2.5关系，输运机理是自旋波散射和电-磁子散射作用，而在高温区(292K<T<304K)，满足ρ-T²关系，输运机理是单磁子散射作用. 关键词： 庞磁电阻 金属-绝缘体转变 晶界效应 输运行为     

Anisotropy of the hopping conductivity in TlGaSe2 single crystals

The temperature dependences of the conductivities parallel and perpendicular to the layers in layered TlGaSe₂ single crystals are investigated in the temperature range from 10 K to 293 K. It is shown that hopping conduction with a variable hopping length among localized states near the Fermi level takes place in TlGaSe₂ single crystals in the low-temperature range, both along and across the layers. Hopping conduction along the layers begins to prevail over conduction in an allowed band only at very low temperatures (10–30 K), whereas hopping conduction across the layers is observed at fairly high temperatures (T?210 K) and spans a broader temperature range. The density of states near the Fermi level is determined, N _F=1.3×10¹⁹eV·cm³)^?1, along with the energy scatter of these states J=0.011 eV and the hopping lengths at various temperatures. The hopping length R along the layers of TlGaSe₂ single crystals increases from 130 Å to 170 Å as the temperature is lowered from 30 K to 10 K. The temperature dependence of the degree of anisotropy of the conductivity of TlGaSe₂ single crystals is investigated.     

Electrical properties of a-antimony selenide

This paper reports conduction mechanism in a-Sb₂Se₃ over a wide range of temperature (238 to 338 K) and frequency (5 Hz to 100 kHz). The d.c. conductivity measured as a function of temperature shows semiconducting behaviour with activation energy ΔE=0.42 eV. Thermally induced changes in the electrical and dielectric properties of a-Sb₂Se₃ have been examined. The a.c. conductivity in the material has been explained using modified CBH model. The band conduction and single polaron hopping is dominant above room temperature. However, in the lower temperature range the bipolaron hopping dominates.