Ultrafast structural dynamics using time-resolved x-ray diffraction driven by relativistic laser pulses

Based on a femtosecond laser plasma-induced hard x-ray source with a high laser pulse energy( 100 mJ) at 10 Hz repetition rate,we present a time-resolved x-ray diffraction system on an ultrafast time scale.The laser intensity is at relativistic regime(2 × 10~(19) W/cm~2),which is essential for effectively generating K_α source in high-Z metal material.The produced copper K_α radiation yield reaches to 2.5 × 10~8 photons/sr/shot.The multilayer mirrors are optimized for monochromatizating and two-dimensional beam shaping of K_α emission.Our experiment exhibits its ability of monitoring the transient structural changes in a thin film SrCoO_(2.5) crystal.It is demonstrated that this facility is a powerful tool to perform dynamic studies on samples and adaptable to the specific needs for different particular applications with high flexibility.     

Lattice imperfection studies in polycrystalline materials by x-ray diffraction line-profile analysis

This review concerns our recent investigations with a series of binary fcc Ag- and Cu-base alloys (viz Ag-Ga, Ag-Ge, Ag-Al and Cu-Ga, Cu-Ge) from detailed analyses of x-ray diffraction line profiles, the importance of which has been briefly summarized. The theoretical formulations of the Warren-Averbach’s method of Fourier analysis of peak-shapes along with the methods of peak-shift and peak-asymmetry have been outlined. A preview on the significant studies carried out earlier with Ag- and Cu-base (fcc) binary alloys has been made in short. A detailed analyses on the recorded profiles in the present considerations revealed, in general, quantitative estimates of several microstructural parameters characterising the deformed state of the materials namely, propensity of stacking faults (intrinsic, extrinsic and twin faults), rms microstrains, coherent domain sizes, long-range residual stresses, lattice parameter changes, dislocation density and stacking fault energy. The results indicate a general trend of increase in the concentrations of stacking faults, primarily, of intrinsic character, with increase in solute concentrations; which are solely responsible for the observed peak-shifts as well as domain size broadening. Small asymmetry in the profiles is due to the presence of extrinsic stacking faults, relatively less in magnitude compared to the intrinsic ones while the deformation twin faults are almost absent—an observation with significance. The dislocation density, quite appreciable in magnitude, has been evaluated from the anisotropic values of the coherent domain sizes and rms microstrains. The stacking fault energies of pure Ag and Cu, an important parameter have also been estimated and compared with those obtained from electron microscopy. Annealing experiments with a Ag-5·8% Al alloy, aluminium being a precipitating solute, do not reveal any detectable evidence of solute segregation at the stacking faults. The occurrence of stacking faults in the alloy systems has been correlated with a number of physical factors involving solvent-solute types.     

Studies on the electrical conductivity, optical absorption and x-ray diffraction in bismuth thin film

Spectroscopically pure bismuth is evaporated onto glass substrates at different substrate temperature using a Hind Hivac coating plant. The electrical conductivity of bismuth thin films, prepared at different substrate temperatures is measured and thermal activation energy is evaluated. From the recorded optical absorption spectrum in the ultraviolet and visible regions optical band gapE _g is determined. X-ray diffractograms are recorded and lattice parameters are determined.     

Diffuse scattering of modulated structures and quasicrystals

The method of Fourier transforms is applied to the calculation of sharp (coherent) and diffuse (incoherent) scattering of modulated structures and quasicrystals. It is shown that the fundamental difference between both may best be described by introducing different distribution functions of atoms, before applying modulations of the structure.     

X-ray diffraction studies on oxide-superconductors under pressure by a new X-ray detection system

Abstract

A new high pressure x-ray diffraction system has been developed, which consists of a diamond anvil cell, an imaging plate as a detector and an 18 kW rotating anode type generator. By this system we found an anisotropic compression and anomalies in linear compressibility for the Bi-oxide superconductors.     

Microstructure and strain films using in-plane grazing analysis of GaN epitaxial incidence x-ray diffraction

This paper investigates the major structural parameters, such as crystal quality and strain state of （001）-oriented GaN thin films grown on sapphire substrates by metalorganic chemical vapour deposition, using an in-plane grazing incidence x-ray diffraction technique. The results are analysed and compared with a complementary out-of-plane x- ray diffraction technique. The twist of the GaN mosaic structure is determined through the direct grazing incidence t of （100） reflection which agrees well with the result obtained by extrapolation method. The method for directly determining the in-plane lattice parameters of the GaN layers is also presented. Combined with the biaxial strain model, it derives the lattice parameters corresponding to fully relaxed GaN films. The GaN epilayers show an increasing residual compressive stress with increasing layer thickness when the two dimensional growth stage is established, reaching to a maximum level of-0.89 GPa.     

超快电子衍射仪理论及实验研究

研制一套同时具有时间分辨及空间分辨能力的超快电子衍射(UED)系统,理论时间分辨能力达到300 fs,空间分辨能力160 lp/mm,并对该系统进行了静态性能分析。实验表明,优化后系统电子束直径约为300 m,电子打靶角度约为0.09,同时对x和y偏转板的灵敏度、电子束斑尺寸及位置稳定性进行定量分析,利用该系统进行多晶铝膜电子衍射实验,分析衍射图样表明系统最小可以分辨单个晶格间距的0.36%。     

超快电子衍射仪理论及实验研究

研制一套同时具有时间分辨及空间分辨能力的超快电子衍射(UED)系统,理论时间分辨能力达到300 fs,空间分辨能力160 lp/mm,并对该系统进行了静态性能分析。实验表明,优化后系统电子束直径约为300 m,电子打靶角度约为0.09,同时对x和y偏转板的灵敏度、电子束斑尺寸及位置稳定性进行定量分析,利用该系统进行多晶铝膜电子衍射实验,分析衍射图样表明系统最小可以分辨单个晶格间距的0.36%。     

Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction

This paper investigates the major structural parameters,such as crystal quality and strain state of (001)-oriented GaN thin films grown on sapphire substrates by metalorganic chemical vapour deposition,using an in-plane grazing incidence x-ray diffraction technique.The results are analysed and compared with a complementary out-of-plane xray diffraction technique.The twist of the GaN mosaic structure is determined through the direct grazing incidence measurement of (100) reflection which agrees well with the result obtained by extrapolation method.The method for directly determining the in-plane lattice parameters of the GaN layers is also presented.Combined with the biaxial strain model,it derives the lattice parameters corresponding to fully relaxed GaN films.The GaN epilayers show an increasing residual compressive stress with increasing layer thickness when the two dimensional growth stage is established,reaching to a maximum level of-0.89 GPa.     

Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques

The composition and stain distributions in the InGaN epitaxial films are jointly measured by employing various x-ray diffraction (XRD) techniques, including out-of-plane XRD at special planes, in-plane grazing incidence XRD, and reciprocal space mapping (RSM). It is confirmed that the measurement of (204) reflection allows a rapid access to estimate the composition without considering the influence of biaxial strain. The two-dimensional RSM checks composition and degree of strain relaxation jointly, revealing an inhomogeneous strain distribution profile along the growth direction. As the film thickness increases from 100 nm to 450 nm, the strain status of InGaN films gradually transfers from almost fully strained to fully relaxed state and then more In atoms incorporate into the film, while the near-interface region of InGaN films remains pseudomorphic to GaN.     

Mössbauer study of the stability of quasicrystalline phases: Al78Fe22 and Al82Fe18

A quasicrystal of Al-Fe with a stoichiometric composition very close to a crystalline phase is shown to transform to the crystalline phase with simple thermal cycling from 300 K through 78 K and 300 K.     

Neutron,x-ray and lattice dynamical studies of paraelectric Sb2S3

Neutron and x-ray diffraction studies of Sb₂S₃ indicate extensive diffuse scattering in the plane perpendicular to the chain axis of polymer-like (Sb₄S₆) _n molecules. The crystal structure of the paraelectric phase is said to be orthorhombic with space group D _2h ¹⁶ with four molecules per unit cell. The observed diffuse scattering may be due to static disorder or some dynamical effects. In this paper the authors have examined the possible dynamical origin by recourse to lattice dynamical studies. Dispersion relation of phonons along the three symmetry directionsa*,b* andc* is evaluated based on a lattice dynamical model incorporating Coulomb, covalent and a Born-Mayer-like short range interactions. Group theoretical analysis based on the group of neutral elements of crystal sites (GNES) was essential in order to examine and aid in the numerical computations. The group theoretical technique involving GNES extended to ‘pseudo-molecular’ systems is also discussed in this context. The phonon dispersion relation shows that there are rather flat TA-TO branches of very low frequency in thea andc directions which may give rise to diffuse scattering. The branches along theb-axis are quite dissimilar to those alonga andc axes because of anisotropy. Variation of the potential parameters leads to instability of the lowest TA-TO branch. This is suggestive of a temperatures or pressure-dependent phase transition. However since these modes are optically ‘silent’ one needs to carry out either high resolution neutron scattering or ultrasonic studies to confirm various aspects of the theoretical studies.     

High pressure neutron diffraction using the paris-edinburgh cell: Experimental possibilities and future prospects

Abstract

High pressure neutron diffraction using the Paris-Edinburgh cell has attracted considerable interest ever since it has been shown that full structural data can be obtained at pressures up to 10 GPa. In this paper we will focus on the current state of this technique. Specifically, we report on new experimental possibilities concerning: i) access to “ultrahigh” pressures beyond 20 GPa, ii) experiments at variable temperatures down to 100 K, and iii) experiments on single crystals in inelastic neutron scattering. Current attempts to increase the pressure and temperature range are discussed.     

Powder x-ray diffraction and Rietveld analysis of (C_2H_5NH_3)_2CuCl_4

Structural properties of the organic-inorganic hybrid(C_2H_5NH_3)_2CuCl_4 have been investigated by means of x-ray powder diffraction and Rietveld analysis. A structural phase transition from Pbca to Aba2 occurs at T_4= 240 K, which results in a paraelectric–ferroelectric phase transition. The release of the Jahn–Teller distortion with increasing temperature toward T_4 is revealed by the structural analysis.     

Fe/Al混合膜的PLD法制备及表面分析

采用脉冲激光气相沉积（PLD）技术制备了Fe/Al混合膜,测量了该混合膜的光电子能谱（XPS）,并采用原子力显微镜（AFM）、扫描电子显微镜（SEM）对Fe/Al混合膜作了表面分析。结果表明：Fe/Al混合膜的表面粗糙度对衬底温度有明显的依赖性, 随着衬底温度的升高,薄膜的表面逐渐变得平滑,膜层变得致密,在200 ℃衬底温度下制得了均方根（rms）粗糙度为0.154 nm、具有原子尺度光滑性的Fe/Al混合膜, 膜中Fe和Al分布比较均匀,其成分比约为1∶3,同时XPS分析也表明Fe/Al混合膜暴露在空气中后表面形成了Al2O3和FeO氧化层。     

PLD方法制备的纳米Fe/Al薄膜的结构及应力分析

采用PLD方法制备了Fe/Al合金薄膜,研究了Fe/Al合金薄膜的物相、结构、应力等。研究表明薄膜的沉积速率随着衬底温度的升高而降低。原子力显微镜（AFM）图像显示,薄膜表面平整、致密且光滑,均方根粗糙度小于1 nm。等离子体发射谱（ICP）表明Fe/Al原子比为1∶1。X射线小角衍射（XRD）分析表明薄膜中的物相是Al0.5Fe0.5,Al0.5Fe0.5晶体具有简单立方结构(SC),晶格常数为0.297 nm,平均晶粒尺寸为81.74 nm,平均微畸变为0.007 6。     

Mössbauer, X-ray diffraction and magnetization studies of Fe–Mn–Al–Nb alloys prepared by high energy ball milling

Fe₆₀Mn₁₀Al₂₀Nb₁₀, (Fe₆₀Mn₁₀Al₃₀)₉₅Nb₅ and (Fe₆₀Mn₁₀Al₃₀)₉₀Nb₁₀ ball milled powdered alloys were investigated using X-ray diffraction, Mössbauer spectrometry, thermomagnetic (TGM) and magnetization measurements. We studied the influence of Nb content and of different milling times on the structural and magnetic properties. Two main features can be concluded: (1) the FeAlMn induces a BCC phase whatever the Nb content is, and (2) as both increasing Nb content and milling time give rise to an highly disordered state in conjunction with a decrease of the ferromagnetic behavior.     

Magnetization and neutron diffraction studies on FeCrP

Crystal structure and magnetic behaviour of FeCrP have been investigated using magnetization and neutron diffraction measurements. FeCrP crystallizes in orthorhombic FeZrP type structure (P_nma space group,Z = 4) in which Cr atoms occupy the pyramidal site and Fe atoms occupy the tetrahedral site with total preference. Structural parameters including positional parameters have been refined. The refined values of positional parameters for Fe and Cr are quite different from those in FeZrP. The nature of magnetization-temperature curve is suggestive of antiferromagnetic nature withT _N = 280 (±10) K. Preliminary analysis of neutron diffraction pattern at 13 K is indicative of a rather complicated magnetic structure.     

超快电子衍射系统的时间空间分辨能力研究及其优化

超快电子衍射技术是研究物质瞬态结构变化及超快结构动力学的有效手段.研制了国内第一套同时具有超快时间分辨及超高空间分辨能力的超快电子衍射系统,并研究了在该超快电子衍射系统上实现超快时间分辨及超高空间分辨能力的技术手段及其优化方法.实验结果表明：经过优化后该系统可以具有优于500 fs的时间分辨能力,其空间分辨能力达到0.04%的衍射峰位置变化,对应的晶面变化为0.0005?.该系统可以为实时测量超快光脉冲激发的物质瞬态结构变化,特别是为研究晶体材料的超快动力学行为提供了强有力的实验工具. 关键词： 超快电子衍射 空间分辨 时间分辨     

XAFS和XRD研究高能球磨对Fe70Cu30合金结构的影响

利用XRD和XAFS方法研究机械合金化Fe70Cu30二元金属合金随球磨时间的结构变化.XRD结果表明,球磨2 h后,部分金属Fe与Cu生成Fe-Cu合金;球磨20h后,金属Fe与Cu已完全合金化生成Fe-Cu合金,并只在2θ=44°处出现一个宽化的弱衍射峰,认为是在球磨20h后的Fe70Cu30合金中共存着fcc和bcc结构的Fe-Cu合金相.XAFS结果进一步表明,在球磨的初始阶段(2h),fcc结构的Cu颗粒的晶格产生较大的畸变,其无序度σ(σ＝σT+σS)为0.0190nm.球磨5h后,部分fcc结构的Cu原子进入了无序度相对较小的bcc结构的α-Fe相,导致Cu原子的平均无序度σ降为0.0108 nm.球磨10h后,样品中很大比例的Fe原子处于fcc结构的Fe-Cu合金相,其无序度为σ=0.0119 nm;而大部分Cu原子依然保持fcc结构,无序度为σ=0.0110 nm.这是由于扩散到bcc结构α-Fe相的Cu原子超过某一浓度后(约30%-40%),Cu原子能诱导其产生fcc结构相变所致.球磨时间增加到20h,样品中Cu原子和Fe原子在fcc和bcc相的比例与球磨10h基本相同,生成的Fe-Cu合金混合相的组成和结构分别近似于bcc结构的Fe80Cu20和fcc结构的Fe60Cu40.