Pressure effect on the electron mobility in AlAs/GaAs quantum wells

By taking the influence of optical phonon modes into account, this paper adopts the dielectric continuum phonon model and force balance equation to investigate the electronic mobility parallel to the interfaces for AlAs/GaAs semiconductor quantum wells (QWs) under hydrostatic pressure. The scattering from confined phonon modes, interface phonon modes and half-space phonon modes are analysed and the dominant scattering mechanisms in wide and narrow QWs are presented. The temperature dependence of the electronic mobility is also studied in the temperature range of optical phonon scattering being available. It is shown that the electronic mobility reduces obviously as pressure increases from 0 to 4GPa, the confined longitudinal optical (LO) phonon modes play an important role in wide QWs, whereas the interface optical phonon modes are dominant in narrow QWs, the half-space LO phonon modes hardly influence the electronic mobility expect for very narrow QWs.     

Electric field induced non-linear multisubband electron mobility in V-shaped asymmetric double quantum well structure

ABSTRACT

We study the effect of the external electric field F_ext on the low-temperature electron mobility μ in an asymmetrically doped Al_xGa_1-xAs based V-shaped double quantum well (VDQW) structure. We show that nonlinearity of µ occurs under double subband occupancy on account of intersubband effects. The field F_ext alters the VDQW potential leading to transfer of subband wave functions between the wells, which affects the scattering potentials and hence μ. In the VDQW structure, due to the alloy channel layer, the alloy disorder (Al-) scattering happens to be significant along with the ionised impurity (Imp-) scattering. The non-linear behaviour of μ is because of μ^Imp, while the overall magnitude of μ is mostly due to μ^Al. The increase of difference in the doping concentrations of the outer barriers increases the nonlinearity of μ. The oscillatory character of μ is amended by varying the width of the well and barrier and also the height of the VDQW. Our results can be used to study VDQW based nanoscale field effect transistor structures.     

高电子迁移率晶格匹配InAlN/GaN材料研究

文章基于蓝宝石衬底采用脉冲金属有机物化学气相淀积(MOCVD)法生长的高迁移率InAlN/GaN材料,其霍尔迁移率在室温和77 K下分别达到949和2032 cm²/Vs,材料中形成了二维电子气(2DEG). 进一步引入1.2 nm的AlN界面插入层形成InAlN/AlN/GaN结构,则霍尔迁移率在室温和77 K下分别上升到1437和5308 cm²/Vs. 分析样品的X射线衍射、原子力显微镜测试结果以及脉冲MOCVD生长方法的特点,发现InAlN/GaN材料的结晶质量较高,与GaN晶格匹配的InAlN材料具有平滑的表面和界面. InAlN/GaN和InAlN/AlN/GaN材料形成高迁移率特性的主要原因归结为形成了密度相对较低(1.6×10¹³-1.8×10¹³ cm^-2)的2DEG,高质量的InAlN晶体降低了组分不均匀分布引起的合金无序散射,以及2DEG所在界面的粗糙度较小,削弱了界面粗糙度散射. 关键词： InAlN/GaN 脉冲金属有机物化学气相淀积 二维电子气 迁移率     

Interface modulated electron mobility enhancement in core-shell nanowires

The transport properties of core-shell nanowires (CSNWs) under interface modulation and confinement are investigated based on the atomic-bond-relaxation (ABR) correlation mechanism and Fermi's golden rule. An analytical expression for the relationship between carrier mobility and interface mismatch strain is derived and the influence of size, shell thickness and alloyed layer on effective mass, band structures, and deformation potential constant are studied. It is found that interface modulation can not only reduce the lattice mismatch to optimize the band alignment, but also participate in the carrier transport for enhancing mobility. Moreover, the underlying mechanism regarding the interface shape dependence of transport properties in CSNWs is clarified. The great enhancement of electron mobility suggests that the interface modulation may become a potential pathway to improving the performance of nanoelectronic devices.     

Significant performance enhancement in AlGaN/GaN high electron mobility transistor by high-κ organic dielectric

The electrical properties of AlGaN/GaN high electron mobility transistor (HEMT) with and without high-κ organic dielectrics are investigated. The maximum drain current I_{D max} and the maximum transconductance g_{m max} of the organic dielectric/AlGaN/GaN structure can be enhanced by 74.5%, and 73.7% compared with those of the bare AlGaN/GaN HEMT, respectively. Both the threshold voltage V_T and g_{m max} of the dielectric/AlGaN/GaN HEMT are strongly dielectric-constant-dependent. Our results suggest that it is promising to significantly improve the performance of the AlGaN/GaN HEMT by introducing the high-κ organic dielectric.     

Control of two-dimensional electron population in a semiconductor quantum well

We investigate the two-dimensional (2D) electron population in a semiconductor quantum well. It is found that, due to the position-dependent quantum interference, the 2D spatial distribution of electron population can be easily controlled via adjusting the system parameters. Thus, our scheme shows the underlying probability for the applications in solid-state optoelectronics.     

Electric field driven plasmon dispersion in AlGaN/GaN high electron mobility transistors

We present a theoretical study on the electric field driven plasmon dispersion of the two-dimensional electron gas(2DEG)in AlGaN/GaN high electron mobility transistors(HEMTs).By introducing a drifted Fermi–Dirac distribution,we calculate the transport properties of the 2DEG in the AlGaN/GaN interface by employing the balance-equation approach based on the Boltzmann equation.Then,the nonequilibrium Fermi–Dirac function is obtained by applying the calculated electron drift velocity and electron temperature.Under random phase approximation(RPA),the electric field driven plasmon dispersion is investigated.The calculated results indicate that the plasmon frequency is dominated by both the electric field and the angle between wavevector and electric field.Importantly,the plasmon frequency could be tuned by the applied source–drain bias voltage besides the gate voltage(change of the electron density).     

Time-dependent degradation of threshold voltage in AlGaN/GaN high electron mobility transistors

This paper gives a detailed analysis of the time-dependent degradation of the threshold voltage in AlGaN/GaN high electron mobility transistors(HEMTs) submitted to off-state stress. The threshold voltage shows a positive shift in the early stress, then turns to a negative shift. The negative shift of the threshold voltage seems to have a long recovery time. A model related with the balance of electron trapping and detrapping induced by shallow donors and deep acceptors is proposed to explain this degradation mode.     

高电子迁移率晶体管微波损伤仿真与实验研究

针对AlGaAs/InGaAs型高电子迁移率晶体管,利用TCAD半导体仿真工具,从器件内部空间电荷密度、电场强度、电流密度和温度分布变化分析出发,研究了从栅极注入1 GHz微波信号时器件内部的损伤过程与机理。研究表明,器件的损伤过程发生在微波信号的正半周,负半周器件处于截止状态;器件内部损伤过程与机理在不同幅值的注入微波信号下是不同的。当注入微波信号幅值较低时,器件内部峰值温度出现在栅极下方靠源极侧栅极与InGaAs沟道间,由于升温时间占整个周期的比例太小,峰值温度很难达到GaAs的熔点;但器件内部雪崩击穿产生的栅极电流比小信号下栅极泄漏电流高4个量级,栅极条在如此大的电流下很容易烧毁熔断。当注入微波信号幅值较高时,在信号正半周的下降阶段,在栅极中间偏漏极下方发生二次击穿,栅极电流出现双峰现象,器件内部峰值温度转移到栅极中间偏漏极下方,峰值温度超过GaAs熔点。利用扫描电子显微镜对微波损伤的高电子迁移率晶体管器件进行表面形貌失效分析,仿真和实验结果符合较好。     

高电子迁移率晶体管微波损伤仿真与实验研究

针对AlGaAs/InGaAs型高电子迁移率晶体管,利用TCAD半导体仿真工具,从器件内部空间电荷密度、电场强度、电流密度和温度分布变化分析出发,研究了从栅极注入1 GHz微波信号时器件内部的损伤过程与机理。研究表明,器件的损伤过程发生在微波信号的正半周,负半周器件处于截止状态;器件内部损伤过程与机理在不同幅值的注入微波信号下是不同的。当注入微波信号幅值较低时,器件内部峰值温度出现在栅极下方靠源极侧栅极与InGaAs沟道间,由于升温时间占整个周期的比例太小,峰值温度很难达到GaAs的熔点;但器件内部雪崩击穿产生的栅极电流比小信号下栅极泄漏电流高4个量级,栅极条在如此大的电流下很容易烧毁熔断。当注入微波信号幅值较高时,在信号正半周的下降阶段,在栅极中间偏漏极下方发生二次击穿,栅极电流出现双峰现象,器件内部峰值温度转移到栅极中间偏漏极下方,峰值温度超过GaAs熔点。利用扫描电子显微镜对微波损伤的高电子迁移率晶体管器件进行表面形貌失效分析,仿真和实验结果符合较好。     

Pulsed laser induced absorption (one–four) dependence of electron mobility in CdI2 and ZnS crystals

The photoconductivity and electron mobility of CdI₂ and ZnS crystals have been studied using N₂-laser, fundamental and frequency doubled Nd:YAG laser. Low values of the electron mobilities obtained in the present case have been attributed to laser-induced-absorption. It is low in one photon excitation and increases with the order of absorption.     

高功率微波作用下高电子迁移率晶体管的损伤机理

本文针对高电子迁移率晶体管在高功率微波注入条件下的损伤过程和机理进行了研究,借助SentaurusTCAD仿真软件建立了晶体管的二维电热模型,并仿真了高功率微波注入下的器件响应.探索了器件内部电流密度、电场强度、温度分布以及端电流随微波作用时间的变化规律.研究结果表明,当幅值为20 V,频率为14.9 GHz的微波信号由栅极注入后,器件正半周电流密度远大于负半周电流密度,而负半周电场强度高于正半周电场.在强电场和大电流的共同作用下,器件内部的升温过程同时发生在信号的正、负半周内.又因栅极下靠近源极侧既是电场最强处,也是电流最密集之处,使得温度峰值出现在该处.最后,对微波信号损伤的高电子迁移率晶体管进行表面形貌失效分析,表明仿真与实验结果符合良好.     

Theoretical study of the anisotropic electron scattering by steps in vicinal AlGaN/GaN heterostructures

It was found by many experiments that the electron mobilities in vicinal AlGaN/GaN heterostructures are highly anisotropic which was believed to be caused by the steps at the vicinal heterointerfaces. However, there is no theoretical explanation for such experimental results because it is difficult to find an universal expression for the electron relaxation time in all directions. In this work, we started from solving the standard linearized Boltzmann equation and separated the electron relaxation time into x- and y-components (perpendicular and parallel to the steps, respectively). In this way, the y-component of the relaxation time was found to be infinite while the x-component part depended on the form of the scattering potential. Subsequently we were able to find an analytic expression for the anisotropic mobility, and the calculated results were found to be consistent with the experimental values.     

AlGaN/GaN高电子迁移率晶体管温度传感器特性

本文制作了基于无栅AlGaN/GaN高电子迁移率晶体管结构的温度传感器,并对其温度相关的电学特性进行了表征.实验测试了器件从50℃到400℃的变温电流-电压特性,研究了器件灵敏度随着器件沟道长宽比的变化,并研究了在300—500℃高温的空气和氮气中经过1 h恒温加热后器件的电学特性变化.理论与实验研究结果表明,随着器件沟道长宽比的增大,器件的灵敏度会随之上升;在固定电流0.01 A下,器件电压随温度变化的平均灵敏度为44.5 mV/℃.同时,稳定性实验显示器件具有较好的高温保持稳定性.     

Hole mobility and trapping in PVK films doped with CdSe/CdS and CdSe quantum dots

Experimental study of the hole mobility in polyvinylcarbazole (PVK) films doped with two kinds of nanocrystals, on bare core CdSe and core-shell CdSe/CdS quantum dots, with concentrations ranging from 3 · 10¹⁰ to 3 · 10¹⁵ cm⁻³, is presented. The quantum dots investigated were made using colloidal chemistry. The hole mobility was measured using the time-of-flight technique as a function of the applied electrical field in the range 10⁵–10⁶ V/cm and for temperatures from 20°C to 50°C. The transient curves, being featureless on a linear plot, show on a double logarithmic scale a sharp inflection point indicating a dispersive carrier drift process. The recovered values of the mobility are in the range 3 · 10⁻⁸–10⁻⁶ cm²·V⁻¹·s⁻¹ and their field and temperature dependences can be analyzed formally within the framework of the Gaussian disorder model proposed by B?ssler. The energetic disorder is, within the experimental accuracy, independent of the concentration and type of quantum dots for the CdSe quantum dots at all concentrations and for the CdS/CdSe quantum dots up to 10¹⁴ cm⁻³. The spatial disorder factors are very large (from 5.3 to 8.7) and do not depend in a systematic way upon the type and concentration of quantum dots (QDs). The experiments show that the apparent mobility does not change considerably with concentration, but it was found that the samples with CdSe/CdS quantum dots at concentrations from 10¹⁵ to 3 · 10¹⁵ cm⁻³ show a decreased photocurrent response. The dependence of the time-integrated transients (corresponding to the full charge value) upon the quantum-dot concentration has been determined. Differences in total photogenerated charge for pure and doped polymer films imply that the quantum dots of that type are the hole traps with capture times much more smaller than the transit time and with emission times a few orders longer than the transit time. CdSe quantum dots without a shell do not seem to exhibit the same properties as core shells and do not produce considerable changes in the charge transfer, even at a density of 10¹⁵ cm⁻³.     

Vibrational symmetry classification and torsional tunneling splitting patterns in G6(EM), G12, and G36(EM) molecules

It is shown that the torsional splitting patterns in methanol-like molecules, with the excitation of small amplitude vibrational modes in the methyl group, are determined by mechanisms that can be formulated in an almost identical fashion to that for ethane-like molecules. This is achieved by treating ethane-like molecules by the internal axis method (IAM) and methanol-like molecules by the principal axis method (PAM) or rho-axis method (RAM). Using the extended molecular groups G₆(EM) or C_6v(M) for methanol and G₃₆(EM) for ethane, vibrations perpendicular to the internal rotation axis are conveniently described by modes of higher degeneracy (E for methanol and G_s for ethane) in the absence of coupling of top and frame. Head–tail coupling operators, except the cos-type barrier terms, lower the degeneracy, causing vibrational splittings. Coupled vibrational pairs with torsional splitting patterns that we call ‘regular’ (pure A₁, A₂ pairs for methanol and pure E_1d, E_2d pairs for ethane) or ‘inverted’ (pure B₁, B₂ pairs for methanol and pure E_1s, E_2s pairs for ethane) can be formed as limit cases. Actual splitting patterns occur between the above limits, and are basically determined by torsional Coriolis coupling, which can tune more or less to resonance pairs of uncoupled basis levels linked by specific head-tail coupling operators. The inversion of torsional splitting patterns, observed in perpendicular vibrational modes of the methyl group of methanol, can be predicted by these theoretical considerations. Similar considerations apply to molecules of G₁₂ symmetry.     

Influence of a two-dimensional electron gas on current—voltage characteristics of Al0.3{Ga}0.7 N/GaN high electron mobility transistors

The J-V characteristics of AltGa1 tN/GaN high electron mobility transistors（HEMTs） are investigated and simulated using the self-consistent solution of the Schro dinger and Poisson equations for a two-dimensional electron gas（2DEG） in a triangular potential well with the Al mole fraction t = 0.3 as an example.Using a simple analytical model,the electronic drift velocity in a 2DEG channel is obtained.It is found that the current density through the 2DEG channel is on the order of 10^13 A/m^2 within a very narrow region（about 5 nm）.For a current density of 7 × 10^13 A/m62 passing through the 2DEG channel with a 2DEG density of above 1.2 × 10^17 m^-2 under a drain voltage Vds = 1.5 V at room temperature,the barrier thickness Lb should be more than 10 nm and the gate bias must be higher than 2 V.     

The low-temperature mobility of two-dimensional electron gas in AlGaN/GaN heterostructures

To reveal the internal physics of the low-temperature mobility of two-dimensional electron gas （2DEG） in Al- GaN/GaN heterostructures, we present a theoretical study of the strong dependence of 2DEG mobility on Al content and thickness of AlGaN barrier layer. The theoretical results are compared with one of the highest measured of 2DEG mobility reported for AlGaN/GaN heterostructures. The 2DEG mobility is modelled as a combined effect of the scat- tering mechanisms including acoustic deformation-potential, piezoelectric, ionized background donor, surface donor, dislocation, alloy disorder and interface roughness scattering. The analyses of the individual scattering processes show that the dominant scattering mechanisms are the alloy disorder scattering and the interface roughness scattering at low temperatures. The variation of 2DEG mobility with the barrier layer parameters results mainly from the change of 2DEG density and distribution. It is suggested that in AlGaN/GaN samples with a high Al content or a thick AlGaN layer, the interface roughness scattering may restrict the 2DEG mobility significantly, for the AlGaN/GaN interface roughness increases due to the stress accumulation in AlGaN layer.     

Influence of drain bias on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors

Using measured capacitance-voltage curves and current-voltage characteristics for the AlGaN/AlN/GaN heterostructure field-effect transistors with different gate lengths and drain-to-source distances,the influence of drain bias on the electron mobility is investigated.It is found that below the knee voltage the longitudinal optical(LO) phonon scattering and interface roughness scattering are dominant for the sample with a large ratio of gate length to drain-to-source distance(here 4/5),and the polarization Coulomb field scattering is dominant for the sample with a small ratio(here 1/5).However,the above polarization Coulomb field scattering is weakened in the sample with a small drain-to-source distance(here 20 μm) compared with the one with a large distance(here 100 μm).This is due to the induced strain in the AlGaN layer caused by the drain bias.     

Simulations of inelastic electron tunneling spectroscopy of semifluorinated hexadecanethiol junctions

The inelastic electron tunneling spectroscopy (IETS) of semifluorinated hexadecanethiol junctions is theoretically studied. The numerical results show that the C-F vibration modes of semifluorinated alkanethiol series can not be detected, and the C-H stretching mode in IETS is related to the CH₂ vibration. It is demonstrated that the Raman modes are preferred over IR modes in IETS, which is in good agreement with the experimental measurements presented by Beebe et al. [Nano Lett., 2007, 7(5): 1364].