移相干涉测量术及其应用

为了对移相式数字干涉仪在光学元件测量中的应用有全面了解，介绍了移相干涉术的基本原理。结合激光数字波面干涉仪，阐述移相干涉术的四步重叠平均算法、压电晶体移相器(PZT)的结构、3 PZT的组合方法、移相器的标定误差和非线性误差的校正方法、波面相位解包的自适应种子算法、波面相位的评价指标等内容。结合移相数字波面干涉仪，叙述了移相干涉测量技术在普通光学元件、红外光学元件、大口径光学元件、非球面光学元件等测量中的应用并指出了应用过程中的注意事项。最后明确指出光干涉技术正沿着高相位分辨率、高空间分辨率、宽波段和瞬态高速测量的方向发展，并将会在瞬态波前测量、微机械的微结构动态分析等方面有着越来越广泛的应用。     

Absolute measurement of a long, arbitrary distance to less than an optical fringe

A scheme is proposed for high-precision, absolute length measurement for an arbitrary optical distance of a few meters to beyond 10(6) m. The approach utilizes a phase-stabilized femtosecond laser to provide both incoherent, time-of-flight information and coherent, fringe-resolved interferometry. Such a combined measurement capability allows an optical wavelength resolution to be achieved for absolute length measurement over a large dynamic range.     

Two-wavelength micro-interferometry for 3-D surface profiling

Three-dimensional non-contact optical techniques for rapid and accurate mapping of micro-machined surfaces are important for the optoelectronic industry. Interferometry is a well-established technique for 3-D surface profiling. The conventional interferometric surface profilers using a single wavelength offer excellent vertical resolution, but a serious limitation to their use is that they can only handle smooth profiles and step heights less than half a wavelength. In this paper we describe a two-wavelength micro-interferometric setup for 3-D surface profile characterization of smooth as well as rough micro-specimens. The method removes ambiguity associated with the single-wavelength data and also extends the phase measurement range compared to the conventional single-wavelength interferometry. Seven-phase step algorithm is used for quantitative fringe analysis. The design of the system along with experimental results on smooth and rough micro-specimens is presented.     

表面微观形貌测量及其参数评定的发展趋势

由于表面加工质量的不断提高，对微观形貌测量技术提出了更高的要求。传统触针式轮廓仪测量具有稳定、可靠、测量动态范围大等优点，但会划伤被测表面；而非接触式形貌测量技术克服了接触式测量易划伤表面的缺点，它主要包括光学散射法、各种光探针法、光学显微干涉法以及采用ＳＥＭ、ＳＴＭ、光子隧道显微镜和原子力显微镜（ＡＦＭ）来探测表面微观形貌的方法。各种测量方法均有其优点和局限性。光学测量方法由于受衍射限制，使其横向分辨率很难提高，在测量大斜率及台阶表面时，测量误差很大。而ＡＦＭ被公认为是一种理想的表面微观形貌测量方法。此外，在表面微观形貌评定方面，国际上正积极探索各种三维评定参数以取代原来的二维参数。     

双光路双波长相移干涉显微法测量衍射光学元件形貌

衍射光学元件（ＤＯＥ）表面形貌的测量需要解决因表面结构深度较大和表面不连续给测量带来的困难。本文将双波长测量法的思想推广应用到不连续深结构表面的测量,并提出了一种新型数据处理方法,有效地克服了这些困难。理论分析和测量结果表明,基于这些方法的三维表面形貌测量系统纵向分辨率为０．５ｎｍ,横向分辨率约为０．５μｍ（ＮＡ＝０．４）,在整个纵向测量范围内重复测量精度地１．３ｎｍ,满足了衍射光学元件表面形貌测     

Spectrally-resolved white-light interferometry as a profilometry tool

Phase-shifting interferometry and white-light interferometry are reliable techniques for surface analysis in which the optical path difference has to be changed by some transducer to evaluate the phase. We present here a different procedure in which optical path modulation is completely avoided. This technique is based on the spectral analysis of white-light interferograms. By means of a spectroscopic device, a non-visible interferogram is split into its monochromatic components and absolute, unambiguous values of the phase are obtained along the spectral axis. Only one interferogram is required to obtain the profile of one-dimensional surfaces with nanometric resolution.     

基于复合干涉的光纤低相干干涉传感系统研究

研究一种能够进行远程及绝对测量的光纤低相干干涉传感系统。该系统包含两个光纤干涉仪,其中一个光纤干涉仪置于被测场中感应被测量的变化,可实现远程测量;另一个光纤干涉仪解调被测量的值。运用波分复用技术,使用于解调的光纤干涉仪同时工作于低相干干涉和高相干干涉状态。用低相干干涉信号决定被测量的幅值,对被测量实现绝对测量,并使测量量程不受波长限制;同时,用高相干干涉信号对被测量进行高精度的测量。系统的测量量程为6mm,测量分辨率小于1nm,位移实验结果的线性相关系数R为0.99。     

Measurement of surface profile in vibrating environment with instantaneous phase shifting interferometry

In-process measurement has been the requirement of the precision industries, but due to vibrations while manufacturing, in-process measurement has been difficult to achieve. There is little work on in-process measurement using phase shifting interferometry, as phase shifting is extremely sensitive to vibrations. In this work, the advantage of the developed non-mechanical and instantaneous phase shifting interferometry is felt while measuring surface profile of large flat surfaces under vibrating conditions which can be extended for in-process measurement of surface profile. A near common path optical configuration is achieved and the effect of the environment is reduced. Moreover, the measurement of phase is instantaneous which increases the versatility of this technique for measuring vibrating objects. Profile measurements were carried out on a smooth mirror surface excited with vibrations of different frequencies and the technique was found to be immune to vibrations of up to 1000 Hz.     

宽谱段相移干涉多自由度采集系统设计与分析

为了满足现代工业领域中对复杂结构产品的高精度多自由度测量需求,构建了多自由度联合采集系统模型。建立了宽谱段相移干涉多自由度采集系统模型,并对系统中的光学部件进行了设计;以相移干涉技术为基础,提出了多自由度联合测量算法,并分析验证了所设计系统的合理性;根据仪器的物理和光学参数对算法进行了具体实现,基于Simulink的仿真试验结果表明:深度测量精度在μm级,测量范围在m级;光谱检测分辨率在nm级,测量带宽300 nm,覆盖整个可见光区域,光谱准确度为0.2 nm,误差率小于0.1%。该系统满足了现代工业精密测量中高深度分辨率、宽深度测量范围、高光谱准确度、高光谱分辨率的要求。     

Digital speckle interferometry for assessment of surface roughness

In this work, the principle of interferometry is used to assess the surface roughness of the machined surfaces. Interferometry produces an interference fringe pattern when two or more light waves interact with each other. It is one of the important tool for precision optical metrology and testing. Well-known advantages of the phase shifting interferometry include high measurement accuracy, rapid measurement, good result even with low contrast fringes and that the polarity of the wave front can be determined. In fringe projection techniques, a known optical fringe pattern is projected onto the surface of interest. The fringe pattern on the surface is perturbed in accordance with the profile of the test surface, thereby enabling direct derivation of surface profile.In this work, an attempt has been made to assess the surface roughness using a speckle fringe analysis method of five frame phase shift algorithm for machined surface (ground surface). As these fringes are too noisy, advanced filtering technique has been used so as to reduce noise and to get improved wrapped phase map from the phase shifted fringes. A phase unwrapping software has been developed using discrete cosine transform (DCT) to generate the three-dimensional (3-D) profiles. Finally, it is compared with R_a values measured using a mechanical stylus instrument, showing good agreement.     

Fiber-optic temperature sensor using low-coherence interferometry

Low-coherence interferometric sensors are an important group of optical fibre sensors. Combining high measurement resolution with broad measurement range, these sensors can measure accurately several physical quantities e.g. temperature. In this article we present the fiber-optic temperature sensor using low-coherent interferometry, which has been designed and elaborated.     

基于飞秒光梳多路同步锁相的多波长干涉实时绝对测距及其非模糊度量程分析

飞秒光梳被广泛用于时间频率技术和精密光谱测量,由其时频特性所衍生的绝对测距技术以可溯源、大尺寸、高精度等优点有望成为未来长度计量的最重要手段.本文提出了一种基于飞秒光梳多路同步锁相的多波长干涉实时绝对测距方法,使多个连续波激光器通过光学锁相环技术同步锁定到飞秒光梳梳模上,通过多路同步相位测量和小数重合算法最终实现绝对距离测量.所提测量方法不仅能保留传统激光干涉测距的高分辨力和精度,而且可溯源至时间频率基准,对高精度长度测量、尤其是对物理复现“米”的定义具有重要计量意义.测距实验证明,四波长干涉测距的非模糊度量程达到44.6 mm,折射率波动导致非模糊度量程变化为纳米量级;多波长干涉测距的非模糊度量程也受制于空气折射率的测量误差,多波长干涉绝对测距的非模糊度量程在实验室环境下可达数米、甚至几十米,并通过2米线性位移实验证明了多波长绝对测距的大量程和线性测量性能.     

New Laser Interferometer with OPD Multiplication for Nanometer Measurement

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New Laser Interferometer with OPD Multiplication for Nanometer Measurement

By using coupled differential interferometry a new laser displacement measurement interferometer with nanometric accuracy has been developed. The resolution and the stability of the interferometer are improved by multiplicating the optical path difference (OPD). The new interferometer is simple in concept,symmetric in optical paths,without optical deadpath,easy to set up and align. λ/1600 resolution and nanometric accuracy are achieved within the measurement range of 10 mm.     

Quantitative phase retrieval in dynamic laser speckle interferometry

The rapid progress of modern manufacturing and inspection technologies has posed stringent requirements on optical techniques for vibration characterization and dynamic testing. Due to its simplicity, accuracy and whole-field characters, laser speckle interferometry has served as one of the major techniques for dynamic measurement. In this paper, a two-step phase shifting method is developed for quantitative speckle phase measurement, which helps to eliminate the specklegrams needed for phase evaluation and facilitate dynamic measurement. Unlike previously reported two-step methods using fringe patterns with known phase shift of π/2, a small unknown phase shift is employed instead in the proposed method, which eliminates the need for phase shifting devices. Further investigation shows that small phase shifts are preferable over large phase shifts in this method. Shearographic experiments conducted have demonstrated the effectiveness of the proposed technique.     

Φ2 m平面反射镜低频轮廓非接触测量设备研制进展

口径2 m的高质量平面反射镜可用于大口径光电设备像质评价和性能检测,但受使用环境影响,平面反射镜的面形精度不易长期保持稳定,因此需要在使用前对其面形精度进行现场、快速校验,而常规的全口径或子孔径干涉检测均难以满足上述需求。由于反射镜面形在制造过程引入的中高频误差已处于稳定状态,环境扰动只引入低频像差,而选择子孔径斜率扫描再重构波面低频轮廓的方法较适于面形精度现场校验。提出双五棱镜配合双测角仪进行子孔径斜率同步差分测量的方法,可改善长测量周期内环境扰动引起的随机误差。并对测量设备光学、机械及控制系统进行设计,提出采用2台S-H传感器代替传统测角仪用于子孔径斜率测量的解决方法。验证试验结果表明,波面重构算法以及仪器测角精度可满足面形测量精度需求,其与ZYGO干涉仪测量结果的互差小于20 nm（RMS）。     

Investigation of glass panels thickness profile by all-fiber digital heterodyne interferometry

All-fiber digital heterodyne interferometry is a laser metrology technique employing pseudo-random codes phase modulated onto an optical carrier signal. In this heterodyne interferometer system, the optical signal includes signal reflected and transmitted from the sample, respectively. Compared with the conventional heterodyne interferometry, this enhanced optical system has much higher measurement sensitivity, and can distinguish the signal which reflected from the front and the rear surface of the sample. Analysis and simulation for the digital heterodyne interferometry are presented. It takes approximately 4 s to scan the whole surface with the diameter of 300 mm. The thickness profile of the sample is obtained in the experiment. The discussion about the experiment is given finally.     

加速器束流诊断技术的新进展

介绍了加速器束流诊断技术的新进展, 包括束流位置测量技术、束团横向尺寸测量技术和束团长度测量技术. 束流位置测量技术主要介绍具有高位置分辨率的腔型束流位置检测器和数字束流位置处理技术. 束团尺寸测量技术主要介绍高空间分辨率的激光丝扫描器、光学渡越辐射和光学衍射辐射技术. 束团长度测量技术主要介绍高时间分辨率的相干辐射光谱技术、RF横向偏转腔、RF零相位技术和电光采样技术.     

基于反相条纹投影技术测量大范围变化的面形

在较高精度面形测量的光学方法中,很多测量范围都受到光波波长的限制。简述了一种利用光栅投影系统来增强其垂直方向测量范围的新方法。通过投影仪来产生能够消除表面低频变化影响的变形光栅,测量该栅线经过被检面的变形图像,通过处理得到表面的高频信息,然后将高频和低频信息叠加得到表面轮廓图。通过实验模型的建立证明,该方法具有测量精度范围宽,能实时地得到表面轮廓图。     

Quadrature spectral interferometric detection and pulse shaping

We introduce a new variant of spectral interferometry, using spectrally dispersed ultrafast laser pulses and quadrature detection to measure optical thickness variations related to surface structure. We can resolve surface features with depths of 3 mm to 25 nm, using a lateral resolution of ~100mum . Quadrature detection gives a larger dynamic range and solves the sign ambiguity problem. This method has potential applications in device manufacture, optical communications, and error compensation in pulse shaping.