ZnSe-ZnS应变超晶格的Raman散射

本文报导了Znse—ZnS应变超晶格的Raman光学声子谱.我们观测到,随着应变大小的改变,ZnSe和ZnS的纵向光学声子发生频移.ZnSe层中纵向光学声子可发生较大的蓝移,也可发生较小的红移;ZnS层中的纵向光学声子发生较大的红移.这些现象为“应变场下的光学模理论”所解释.文中还报导了在波数为110cm-1处观测到一很强的散射峰,并把它归结为超晶格表面层单斜Se所引起的散射;在其它地方还观测到非晶态Se、三角Se引起的散射峰.     

Raman spectroscopy of optical phonons as a probe of GaN epitaxial layer structural quality

We report on Raman scattering measurements of all Raman-active phonons in wurtzite and zinc blende structure GaN epilayers grown on GaAs (001), GaAs (111)A, and GaAs (111)B oriented substrates by means of molecular beam epitaxy (MBE). Raman spectra are taken from these epilayers at room temperature and 77 K in backscattering geometry. The measured values of the phonon frequencies are in agreement with other studies and with lattice dynamic calculations of phonon modes in GaN zinc blende and wurtzite structures. We show that crystal quality is much better in samples grown on GaAs (111) substrates than in samples grown on GaAs (001) substrates. The observation of disorder-activated modes gives information about sample quality. Comparison of the spectra from different thickness epilayers shows that the GaN is more highly disordered close to the substrate, particularly for the (001) substrates. Received 16 July 1999     

Si(100)和蓝宝石(0001)衬底上3C-SiC的Raman研究

单晶Si和蓝宝石(0001)是两种重要的3C-SiC异质外延衬底材料，然而，由于Si及蓝宝石和3C-SiC之间大的晶格失配度和热膨胀系数失配度，在3C-SiC中会产生很大的内应力，直接影响3C-SiC的电学特性。Raman散射测试是一个功能很强的测试方法，其强度、宽度、Raman位移等有关Raman参数可以给出有关SiC晶体质量的信息，其中包括内应力。利用背散射几何构置的Raman方法研究了Si(100)和蓝宝石(0001)村底上LPCVD方法生长的SiC外延薄膜，在生长的所有样品中均观察到了典型的3C-SiC的TO和LO声子峰，在3C-SiC／Si材料中，这两个声子峰分别位于970．3cm-l和796．0cm-1，在3C-SiC／蓝宝石材料中，分别位于965．1cm^-1和801．2cm-1，这一结果表明这两种外延材料均为3C-SiC晶型。利用一个3C-SiC自由膜作为无应力标准样品,并根据3C-SiC／Si和3C-SiC／蓝宝石的TO和LO声子峰Raman位移相对于自由膜的移动量，得到3C-SiC中的内应力约分别为1GPa和4GPa。实验发现在这两种材料的TO声子峰的Raman位移移动方向相反，通过比较3C-SiC、Si和蓝宝石的热膨胀系数，预期Si衬底上的3C-SiC外延膜受到的应力为张应力，而蓝宝石衬底上3C-SiC受到的应力则为压应力。     

A Raman study of the strain in InP/GaAs heterostructures grown by MOVPE

A Raman investigation on InP layers grown by Metal Organic Vapour Phase Epitaxy on GaAs (001) substrates, with thicknesses exceeding the critical thickness and ranging from 23 to 280 nm, is reported. The InP LO phonon shows an increasing frequency blue-shift with decreasing layer thickness, indicating a residual compressive strain due to the lattice mismatch and to the difference between the thermal expansion coefficients of InP and GaAs.     

Raman studies of InAs/In0.53Ga0.47As single quantum wells grown on InP substrate by M.B.E.

We analyzed using the Raman technique a series of single quantum wells of InAs/In _0.53Ga_0.47As at different thicknesses of InAs layer grown on a (100) InP substrate by MBE. These high lattice mismatch systems are particularly interesting for potential applications in the mid-IR wavelength range. The well thickness was between 6 and 12 monolayers. The In _0.53 Ga_0.47As grown on an InAs layer is subject to a tensile biaxial strain and the InAs to a compressive one. In the Raman spectra we observed an intense narrow line corresponding to the LO phonon of the InAs layer between a GaAs-like LO mode and a smaller InAs-like LO phonon typical of In_0.53Ga_0.47As. With the increase of the well thickness the experimental energy shift of the LO phonon of the InAs layer decreases, indicating a smaller strain, whereas the GaAs-like LO phonon of the alloy remains constant and the intensity ratio of these two modes becames smaller. The dominant and sharp features of the InAs LO and GaAs-like LO characterize the good quality of our structures. With the increase of the InAs layer thickness we also observed the appearance and the intensity rise of a weak peak around the frequency of the InAs TO mode. This peak could be associated with the TO mode that is forbidden in our scattering geometry. We believe that this is indicative of a slight deterioration of the structural perfection of the sample with the increase of the well thickness. To our knowledge, this is the first study of vibrational properties of InAs/In _0.53 Ga_0.47As single quantum wells grown on InP substrates.     

Raman studies of lattice and local vibrational modes of GaInNAs prepared by molecular beam epitaxy

Polarized Raman spectra have been studied on the lattice-matched Ga_0.94In_0.06N_0.025As_0.975 epitaxial layers grown on (100) GaAs by molecular beam epitaxy. Polarization dependence of TO and LO phonon modes has been examined. The N-related local vibrational mode (LVM) in GaInNAs has been studied with emphasis on the light polarization and the effect of the thermal annealing. The thermal annealing-induced change of the N-related LVM in GaInNAs is discussed in terms of the local atomic arrangement around N atoms.     

Phonon freedom and confinement in GaAsAlxGa1−xAs superlattices

Phonon modes in GaAsAl_xGa_1?xAs superlattices simplify when the phonon wavevector q is perpendicular to the plane of the layers. We have studied such modes using a Raman back-scattering technique on SL's grown by MBE. The results are consistent with simple ideas of LA phonon freedom and LO phonon confinement suggested by one-dimensional lattice dynamical calculations. The longitudinal acoustic (LA) modes show zone folding due to mini-zone formation. Their frequencies occur in doublets linearly dependent on q and show little mini-gap formation. This is consistent with a picture of approximately free plane wave propagating through the interfaces with Raman coupling due to SL layering of the photoelastic coefficient. By contrast, Raman data on LO modes in small period GaAsAlAs SL's suggest that these modes are standing waves strongly confined in either GaAs or AlAs.     

分子束外延GaAs/Si材料的喇曼散射研究

对逐层腐蚀的GaAs/Si材料进行喇曼散射实验,研究晶格振动声子谱沿外延生长方向的剖面分布,发现GaAs外延层从表面到界面经历着从双轴张应力到双轴压应力的变化。用Anastassakis等人提出的特殊相关模型对GaAsLO声子的谱形进行分析,发现GaAs外延层的晶体质量随着外延层厚度的减薄(从1μm—500?)是渐渐退化的,这是由于界面失配位错进入外延层所致。对GaAs LO声子与TO声子强度之比分析表明:外延层厚度从3.3μm变化到1μm左右时,其晶体质量并不是简单地随着厚度的减薄而退化,在1.3μm左右外延层晶体质量反而变好。对这种现象做了详细的讨论。 关键词：     

双层介电系统的Raman散射——ZnSe/玻璃和ZnSe/GaAs的表面声子模

本文实验观测了双层介电系统ZnSe/玻璃和ZnSe/GaAs的表面声子模,并利用极化场边界条件对上述体系的表面声子频率进行了计算。实验结果与计算结果符合得比较满意。     

Raman study of InAs/GaAs quantum dot solar cells

We report polarized and resonant Raman study of InAs/GaAs quantum dot solar cell (QDSC) structures. Raman spectra obtained from the top surfaces of the samples suggested that the formation of InAs QDs induced tensile strain in the overgrown GaAs layers. Furthermore, a longitudinal optical phonon-plasmon (LPP) coupled modes were observed in the p-type GaAs layers. The tensile strain was increased with an increase in the QD size. The hole concentrations estimated by fitting the individual LPP coupled modes were in the range of 2.4–3.5 × 10¹⁸ cm^?3. Resonant Raman spectra obtained from the cleaved sides, where the QDs were located, showed a 225 cm^?1 mode in parallel polarization configurations. Based on accurate analysis, this mode was identified as the LA(X) phonon of GaAs.     

分子束外延PbTe单晶薄膜的反常拉曼光谱研究

采用分子束外延(MBE)方法在BaF₂(111)衬底上生长了高质量的PbTe单晶薄膜， 拉曼光谱测量观察到了表面氧化物的振动模、布里渊区中心(q≈0)纵光学(LO)声子振动模以 及声子-等离子激元耦合模振动.随着显微拉曼光谱仪激光光斑聚焦深度的改变，各拉曼散射 峰的峰位、积分强度、半高宽等都表现出不同的变化趋势. 随着激光光斑聚焦位置从样品表 面上方3μm处变化到表面下方3μm处，PbTe外延薄膜的LO声子频率从119cm^-1移 动到124cm^{-1关键词： PbTe外延薄膜 拉曼散射 纵光学声子}     

ZnSe—ZnTe应变层超晶格的纵光学声子模

本文首次利用室温非共振喇曼后向散射测得具有7.3％晶格失配的ZnSe-ZnTe应变层超晶格限制在ZnSe层中的纵光学声子模。计算了限制效应引起的声子模频率的红移,以及弹性应变引起的声子模的移动,它比前者大得多。ZnSe层所受拉伸应变引起声子频率红移,ZnTe层所受压缩应变引起声子频率蓝移。同时在喇曼光谱中观察到由于这种效应导致出现的纵光学声子折叠模。     

Raman study of confined TO phonons in GaAs/AlAs superlattices grown on GaAs (311)A and B surfaces

The use of Raman scattering in different polarization geometries makes it possible to observe the splitting of transverse optical (TO) phonon modes confined in GaAs/AlAs superlattices grown on faceted GaAs (311)A surfaces. The frequencies of TO modes with atomic displacements in the direction along the facets were observed to be higher than in the transverse one. Increased splitting, up to 3.5 cm ^− 1, was observed for (311)A superlattices when the average thickness of the GaAs layers was 6 monolayers or less. The splitting was absent in superlattices grown on (311)B surfaces under the same conditions. The effect of splitting is reputed to be caused by corrugation of GaAs/AlAs (311)A interfaces and formation of lateral superlattices or arrays of quantum wires, depending on the GaAs layer thickness.     

Electrical field analysis of metal‐surface plasmon resonance using a biaxially strained Si substrate

Electrical field components of metal‐surface plasmon resonance were analyzed in detail. Both longitudinal optical (LO) and transverse optical (TO) phonon modes of a biaxially strained Si layer can be excited by surface‐enhanced Raman spectroscopy (SERS). The z to y polarization ratio in SERS measurements was calculated to be 0.78 using the intensity ratio of TO to LO phonon modes. The electrical field components of SERS were also calculated by the finite‐difference time‐domain method. Copyright © 2014 John Wiley & Sons, Ltd.     

分子束外延ZnSe/GaAs材料的拉曼散射研究

用分子束外延(MBE)技术，在GaAa(100)衬底上生长了厚度从0．045μm到1．4μm的ZnSe薄膜。通过室温拉曼光谱的测量对ZnSe薄膜纵光学声子(Longitudinal-opticalphonon)的谱形进行了分析。用拉曼散射的空间相关模型定量分析了一级拉曼散射的型间相关长度与晶体质量之间的关系，结果表明ZnSe外延层的晶体质量随着外延层厚度的减薄是渐渐退化的，这是由于界面失配位错引入外延层所致，理论分析与实验结果相吻合。     

Anisotropy of long-wavelength optical phonons in GaAs/AlAs superlattices

The angular anisotropy of optical phonons in GaAs/AlAs (001) superlattices is investigated by Raman scattering spectroscopy. Scattering configurations allowed for phonons with wave vectors oriented along the superlattice layers and normally to them are used. For phonons localized in GaAs layers, the theoretically predicted mixing of the LO1 longitudinal modes with TO1 transverse modes in which atomic displacements occur along the normal to the superlattice is observed experimentally. These modes possess noticeable angular anisotropy. For transverse modes in which atoms move in the plane of the superlattice, the angular anisotropy is small.     

气相外延GaN的拉曼散射

测量了在蓝宝石衬底上气相外延生长GaN的拉曼散射谱.除观察到已被确认的两个E2,一个A1(TO)和一个E1(TO)声于振动以外,在734±3cm-1处观察到一个散射峰且从实验上确认其为GaN的纵向光学声子模E1(LO).而且发现其强度与外延层晶体质量密切相关.A1(TO)和高频E2散射峰相对强度变化显示不同生长条件引起的外延层质量的变化.     

分子束外延Zn_（1－x）Cd_xSe／ZnSe超晶格的拉曼光谱

运用分子束外延（ＭＢＥ）技术成功地生长出Ｚｎ１－ｘＣｄｘＳｅ／ＺｎＳｅ超晶格，并对不同的样品进行了拉曼散射光谱的测试。获得了多达５级的ＺｎＳｅ的ＬＯ声子峰和ＺｎＳｅ的ＴＯ声子峰；同时还在频移为１４４ｃｍ－１、３７０ｃｍ－１处观测到了两个新声子峰，估计是来自于ＺｎＣｄＳｅ的声学模和光学模。     

Raman study of InAs quantum dots on GaAs/InP grown by low pressure metal-organic chemical vapor deposition

Raman spectra of InAs quantum dots (QDs) on InP substrate were investigated. Both longitudinal-optic (LO) and transverse-optic (TO) frequency of InAs QDs showed a large blue-shift comparing to its bulk due to the compressive strain in InAs QDs. Raman scattering of InAs QDs with a thin GaAs interlayer was studied. We obtained that the peak position of LO and TO mode of InAs QDs became larger blue-shifted when we inserted the GaAs layer. At the same time, we found a red-shift of the frequency of GaAs LO mode because of tensile strain. Theoretical calculation was performed and its prediction coincided with our experiment results well. They both showed that strain played an important role in formation of InAs QDs.     

Study of δ-doped GaAs layers by micro-Raman spectroscopy on bevelled samples

Si δ-doped GaAs layers were studied by micro-Raman spectroscopy. The spectra were recorded along the bevelled structure using the light of Ar⁺-ion laser (514.5 nm line) with high power density. The observed changes in the Raman spectra are discussed in the sense of coupling present between LO phonon and photoexcited electron–hole plasma and plasma of electrons arising from ionised Si atoms. Plasmon-LO-Phonon modes of the coupling of photoexcited plasma in δ-doped GaAs layers were observed for the first time. The minimal thickness of cap layer was estimated in the range of 10–19 nm depending on the doping concentration.