Study of archaeological ceramics by total-reflection X-ray fluorescence spectrometry: Semi-quantitative approach

Total-reflection X-ray fluorescence spectrometry has been compared with Instrumental Neutron Activation Analysis in order to test its potential application to the study of archaeological ceramics in the archaeometric field. Two direct solid non-chemical sample preparation procedures have been checked: solid sedimentation and solid chemical homogenization. For sedimentation procedure, total-reflection X-ray fluorescence allows the analysis of the elemental composition with respect to the size fraction but not the average evaluation of the composition. For solid chemical homogenization procedure, total-reflection X-ray fluorescence provides precise (from 0.8% to 27% of coefficient of variation) and accurate results (from 91% to 110% of recovery) for 15 elements (Cr, Hf, Ni, Rb, Al, Ba, Ca, K, Mn, Ti, V, Cu, Ga, Y and Fe) with an easy sample preparation process of the solid clay and without previous chemical treatment. The influence of the particle sizes has been checked by total-reflection X-ray fluorescence sample angle scans and anomalous behaviors have been found for three additional detected elements: As, Sr and Zn, which can be attributed to interference effects of the mineral grain sizes of their associated chemical phases in the total-reflection X-ray fluorescence interference region. The solid chemical homogenization procedure produces data useful for archaeological interpretation, which is briefly illustrated by a case-study. Finally, the decantation procedure data can be also useful for size chemical speciation and, consequently, for alternative environmental total-reflection X-ray fluorescence applications.     

Total-reflection X-ray fluorescence analysis of Austrian wine

The concentration of major, minor and trace elements in Austrian wine was determined by total-reflection X-ray fluorescence using gallium as internal standard. A multi-elemental analysis was possible by pipetting 6 μl of wine directly on the reflector and drying. Total-reflection X-ray fluorescence analysis was performed with Atomika EXTRA II A (Cameca) X-rays from a Mo tube with a high-energy cut-off at 20 keV in total-reflection geometry. The results showed that it was possible to identify only by the elemental analysis as fingerprint the vineyards and year of vintage among 11 different wines.     

Trace elements determination in red and white wines using total-reflection X-ray fluorescence

Several wines produced in different regions from south of Brazil and available in markets in Rio de Janeiro were analyzed for their contents of elements such as: P, S, Cl, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Rb and Sr. Multi-element analysis was possible with simple sample preparation and subsequent analysis by total-reflection X-ray fluorescence using synchrotron radiation. The measurement was carried at the X-ray fluorescence beamline in the Synchrotron Light Source Laboratory in Campinas, Brazil. The levels of the various elements obtained were lower in the Brazilian wines than the values generally found in the literature. The present study indicates the capability of multi-element analysis for determining the contents of various elements present in wines coming from Brazil vineyards by using a simple, sensitive and precise method.     

Calibration of total-reflection X-ray fluorescence using a nickel bulk sample

A standard-free calibration procedure for total-reflection X-ray fluorescence has been developed which is based on the Fresnel theory for the reflection and refraction of X-rays on surfaces at grazing incidence. The technique requires only a pure metal surface as reference. The formalism is described in more detail for the measurement of contaminants on silicon wafer surfaces for both film-like and particulate distributions. Only natural constants are involved in the calculations. The resulting calibration factor is compared with those obtained from the droplet method normally applied elsewhere.     

Determination of concentration distribution of trace elements near the detection limit

The results of a numerical simulation, performed to check the validity of a method developed for reconstruction of concentration distributions truncated by the detection limit, are reported in the context of trace element analysis in biomedical samples by total-reflection X-ray fluorescence. This method, by correcting a distribution over the whole range of concentrations in a population of samples, restores a number of measurements reporting results below the detection limit. We show by Monte Carlo simulations, assuming lognormal distributions to describe both the concentrations measured as well as the detection limits in the biomedical samples, that the method developed is accurate to within 5% for most typical situations. Moreover, we demonstrate that the factor limiting the accuracy of the correction is the number of measurements, not the correction procedure itself. We have found in simulations that the reconstruction of a concentration distribution, for a typical population size of N=100, is possible when the concentrations are measured only in 20–30% of samples. On the other hand, we show that by ignoring the truncation of a concentration distribution by the detection limit, the results can be systematically biased by as much as 50%. The method developed is applied to the analysis of trace elements in human breast tissue samples by total-reflection X-ray fluorescence (TXRF). The results are also discussed in terms of the size of the population studied.     

Formation of binary and ternary metal deposits on glass–ceramic carbon electrode surfaces: electron-probe X-ray microanalysis,total-reflection X-ray fluorescence analysis,X-ray photoelectron spectroscopy and scanning electron microscopy study

The features of the formation of binary and ternary alloys during the electrochemical deposition and co-deposition of copper, cadmium and lead from aqueous solutions on disc glass–ceramic carbon electrode surfaces were studied by electron-probe X-ray microanalysis, total-reflection X-ray fluorescence analysis, X-ray photoelectron spectroscopy and scanning electron microscopy. The macroscopic properties of electrodeposits such as morphology, lateral distribution of the elements along the disc electrode surface and depth distribution of the elements in the electrodeposit bulk were established. The mechanisms of metal nucleation and growth of thin films of electrodeposits were discussed.     

Total-reflection X-ray fluorescence — a tool to obtain information about different air masses and air pollution

Atmospheric aerosols are solid particles dissolved in air and change their chemical composition frequently depending on various parameters. In order to identify regional air circulation atmospheric aerosol filter samples were taken at Loyola University Chicago's Lake Shore Campus during the months of July and August 2000 with sampling times ranging between 1 and 2 h. The samples were digested in a microwave oven and analyzed by total-reflection X-ray fluorescence (TXRF) spectrometry. One diurnal variation comprising five consecutive sampling events was selected and discussed as well as 4 days experiencing different meteorology were compared to exemplify the variation in trace elemental concentration according to air mass movements and highlight the capability of total-reflection X-ray fluorescence analysis. It was found that due to changes in meteorological conditions particularly wind direction and wind speed, trace elemental compositions varied rapidly and could be used to distinguish between ‘Lake Michigan air’ and ‘metropolitan Chicago air’ on such short-term time scale like one hour. Back trajectory analysis was applied to support and corroborate the results. The outcome of this study clearly shows that total-reflection X-ray fluorescence is an optimal tool for analysis of atmospheric aerosols.     

Detection limit calculations for the total reflection techniques of X-ray fluorescence analysis

In this work, theoretical calculations of detection limits for different total reflection techniques of X-ray fluorescence analysis are presented. Calculations include grazing incidence (TXRF) and gracing emission (GEXRF) conditions. These calculations are compared with detection limits calculated for conventional X-ray fluorescence (XRF). In order to compute detection limits, Shiraiwa and Fujino's model was used to calculate X-ray fluorescence intensities. This model makes certain assumptions and approximations to achieve the calculations, especially in the case of the geometrical conditions of the sample, and the incident and takeoff beams. Nevertheless, the calculated data of detection limits for conventional XRF and total-reflection XRF show a good agreement with previous results. The model proposed here allows us to analyze the different sources of background and the influence of the excitation geometry, which contribute to a better understanding of the physical processes involved in the XRF analysis by total reflection. Finally, a comparison between detection limits in total-reflection analysis at grazing incidence and at grazing emission is carried out. Here, a good agreement with the theoretical predictions of the Reciprocity Theorem is found, showing that, in theory, detection limits are similar for both techniques.     

An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy

An electrolytic separation and enrichment technique was developed for the determination of trace elements by total-reflection X-ray fluorescence spectroscopy (TXRF). The elements of interest are electrodeposited out of the sample solution onto a solid, polished disc of pure niobium which is used as sample carrier for the TXRF measurement. The electrochemical deposition leads to a high enrichment of the analytes and at the same time to a removal of the matrix. This results in substantially improved detection limits in the lower picogram per gram region. The deposited elements are directly measured by TXRF without any further sample preparation step. The homogeneous thin layer of the analytes is an ideal sample form for TXRF, because scattered radiation from the sample itself is minimized. The proposed sample preparation method is useful particularly for the analysis of heavy metals in liquid samples with for TXRF disturbing matrices, e.g. sea water.     

Data processing technique for mercury determination by total-reflection X-ray fluorescence,using amalgamation with gold

We have developed a method to determine mercury concentrations using total-reflection X-ray fluorescence (TXRF) which leads to reliable results. The usual sample preparation procedure of TXRF is not applicable due to element loss by evaporation on account of its high vapor pressure. The method we developed consists of forming an amalgam on a thin layer of gold affixed in a specular-surface quartz reflector while it is in contact with a mercury ionic solution. Subsequently, a traditional TXRF analysis is performed. Since the mercury and gold peaks overlap, we have developed a data processing scheme to achieve the most precise results. Using a molybdenum anode X-ray tube at 40 kV and 20 mA, the limit of detection achieved for a 10-μl specimen with 2000 s counting time is 250 ppb.     

Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis

A one-step sample preparation by electro-deposition for total-reflection X-ray fluorescence (TXRF) analysis has been developed using a common three-electrode arrangement with a rotating disc as the working electrode. Several elements such as Cr, Mn, Fe, Co, Ni, Cu, Zn, Ag, Cd, Pb, As and U have been determined simultaneously in saline matrix. A special electrode tip has been constructed as a holder for the TXRF sample carrier, which consists of polished glassy carbon. The influence of parameters such as time, pH value, and trace element concentration on the deposition yield has been examined for 14 elements. From repeatability studies, the uncertainty in deposition yields at the 95% confidence level has been found to be less than 20% for most of these elements. Typical detection limits range from 5 to 20 ng/l under the experimental conditions applied here. By an appropriate choice of the reference element and by calculation of yield factors, reliable quantification can be achieved directly by internal standardization. First results obtained for the standard reference material CRM 505 are presented.     

Identification of steel by X-ray fluorescence analysis with a pyroelectric X-ray generator

An application of X-ray fluorescence analysis with a pyroelectric X-ray generator is presented. Steel standard samples were identified by X-ray fluorescence analysis with this novel X-ray generator to check its capability for performing qualitative and quantitative analysis as an X-ray source for X-ray fluorescence spectrometers. Cr, Ni, V, Co, and W were detected in steel standard samples. V and Cr can be detected even when the content is below 1%. Although it is difficult to detect minor elements because of the low power of the excitation X-rays, it is possible to identify the analyzed samples on the basis of major elements at the percentage level. The pyroelectric X-ray generator is very suitable for portable X-ray fluorescence spectrometers.     

Quantification in grazing-emission X-ray fluorescence spectrometry

In grazing-emission X-ray fluorescence (GEXRF) spectrometry wavelength-dispersive detection can be applied. Much softer radiation and hence lighter elements than in total-reflection X-ray (TXRF) spectrometry can thus be detected. We used simulations to investigate methods of quantification of GEXRF results involving soft characteristic radiation. From these studies, it is concluded that for ultra-thin layers, e.g. the sub-monolayer amounts encountered in semiconductor contamination analysis, calibration plots are linear. For thicker layers, quantification should be performed very carefully because of deviations from linearity due to absorption of radiation and to oscillations in the calibration curve. These oscillations are caused by interference of fluorescence radiation emitted directly towards the detector and radiation reflected at the sample–substrate interface. Suggestions for a judicious choice of measurement conditions are made and the benefits of internal standardisation are discussed.     

Dose determination of nickel implantations in silicon wafers

Summary The dose of nickel ions implanted with an energy of 300 keV or 6 MeV, respectively, into silicon wafers was measured by X-ray fluorescence analysis (XRFA) after the implantation process. Dose values for Ni were determined within the range from 5×10¹⁵ to 1×10¹⁸ ions/cm². The detection limit of this simple and non-destructive procedure amounts to about 10¹⁴ atoms/cm². The accuracy was confirmed by flame atomic absorption spectrometry (FAAS), total-reflection X-ray fluorescence analysis (TXRFA), and by Rutherford-backscattering spectroscopy (RBS). The study confirms XRFA to be a suitable method for dose determinations after the implantation process.     

Elemental content in deionized water by total-reflection X-ray fluorescence spectrometry

This study aimed to evaluate minor and trace elements in the water during different water purification steps of a deionized water production plant, located at CENA, by total-reflection X-ray fluorescence (TXRF) technique, using Ga as internal standard for elemental quantification. This approach was capable of determining Cr, Mn, Fe, Co, Ni, Cu, Zn, Ge, As, Se, Br, Rb at concentrations higher than 40–100 μg L⁻¹, and for K, Ca, Sc, Ti, V and Sr at concentrations higher than sub mg L⁻¹ in the water samples. TXRF spectrometer encompasses an X-ray tube with a Mo target with a Zr filter. The elemental characteristic X-rays were recorded by a Si(Li) semiconductor detector and the X-ray spectra deconvoluted by AXIL software.     

A solid phase extraction procedure for the simultaneous determination of total inorganic arsenic and trace metals in seawater: Sample preparation for total-reflection X-ray fluorescence

In this paper we present a procedure allowing total-reflection X-ray fluorescence spectrometry (TXRF) determinations of arsenic in water samples, especially in seawater samples. The procedure consists of an arsenate reduction step (performed by using a l-cysteine solution) followed by a complexation of As⁺³ with sodium dibenzyldithiocarbamate and solid phase extraction. The new procedure is a modification of a method developed by Prange and allows a simultaneous determination of As together with V, Fe, Ni, Cu, Zn, Pb, and U in seawater by TXRF. The procedure was tested using the Certified Reference Material CASS-4 and was later applied to regular seawater samples collected from the North Sea. The detection limit for arsenic is 10 ng L^− 1.     

Total-reflection X-ray fluorescence analysis for semiconductor process characterization

Semiconductor process characterization techniques based on total-reflection X-ray fluorescence (TXRF) analysis are reviewed and discussed. One of the most critical factors in obtaining reliable determinations by TXRF is the reliability of the standard samples that are used. Conventional physisorption standard samples such as spin coat wafers have two potential drawbacks: reproducibility of depth profile and stability. A method of chemisorption called ‘immersion in alkaline hydrogen peroxide solution (IAP)’ was proposed that provides answers to these two problems. IAP standard samples were used to experimentally examine three methods of TXRF application: Straight-TXRF, VPD-TXRF, and Sweeping-TXRF. In the application of Straight-TXRF, the linearity of Cu at a level of 10⁹ atoms cm⁻² is examined. In the application of VPD-TXRF, test results of VPD-TXRF for both transition metals and light elements are shown. Finally, a new measurement protocol called Sweeping-TXRF is proposed to conduct whole-surface analysis without chemical preconcentration.     

Total-reflection X-ray fluorescence imaging

A new experimental technique for surface imaging using total-reflection X-ray fluorescence (TXRF) is described. Although TXRF has so far been used to analyze the average chemical composition of rather large sample areas in the order of centimeters squared, a new opportunity to obtain spatial information has arisen through the combination of conventional TXRF and position-sensitive measurement using a collimator and a CCD camera. The most significant point here is that the extremely close detector sample geometry of TXRF measurement fits very well with the present imaging procedure. Scanning of the sample and/or incident beam is not necessary, and therefore the exposure time is reasonably short, typically 3–10 min. The number of pixels is approximately 1 million, and the spatial resolution obtained was several tens of microns in the present preliminary case. The selective-excitation capability of tunable monochromatic synchrotron radiation enhances the present imaging technique. Changing the energy of incident photons makes it possible to distinguish the elements, and one can obtain a surface image of the specific elements.     

Beijing synchrotron radiation total-reflection X-ray fluorescence analysis facility and its applications on trace element study of cells

The feasibility of total-reflection X-ray fluorescence (TXRF) analysis excited by synchrotron radiation applied to trace element analysis of biological cells is investigated. The Beijing synchrotron radiation TXRF facility and the related experimental method are also described. The elemental minimum detection limits of some standard reference materials are determined. The elemental compositions of a cluster of small intestine cells of a small white mouse are given, and hence the average trace element contents of the single small intestine cell are also obtained. With this technique, the changes of some trace elements in the cells of lung and cervix cancer before and after apoptosis are also preliminarily studied.     

A micro co-precipitation technique for use in X-ray fluorescence analysis

An apparatus and a procedure are described for the preconcentration of nanogram amounts of trace elements. Co-precipitation and pressure filtration confine the precipitate to a 1.27 mm diameter spot on a filter membrane. Trace elements in the 10-100 ng range are collected reproducibly and detected with high sensitivity by X-ray fluorescence, by use of a milliprobe instrument. Advantages of the technique for quantitative applications are discussed.