Determination of low atomic number elements at trace levels in uranium matrix using vacuum chamber total reflection X-ray fluorescence

Determinations of low atomic number elements Na, Mg and Al present at trace concentrations in uranium matrix were made by vacuum chamber total reflection X-ray fluorescence spectrometer for the first time. For this purpose, synthetic samples of uranium with known amounts of these low atomic number elements were prepared by mixing different volumes of their solutions with U solution of high purity. The concentrations of these elements in the samples were in the range of 100–300 μg/g with respect to uranium and 10–20 μg/mL in the solutions. Major matrix uranium was separated by solvent extraction with 30% solution of tri-n-butyl phosphate in dodecane. After the solvent extraction, aqueous phase containing trace elements was mixed with Sc internal standard and the samples were analyzed by vacuum chamber total reflection X-ray fluorescence spectrometer having a Cr Kα excitation source. The total reflection X-ray fluorescence results obtained, after blank corrections, indicated an average deviation of 14% from the calculated concentrations of these low atomic number elements on the basis of their preparation. However, the total reflection X-ray fluorescence determined concentration of Mg was exceptionally lower than the calculated concentration in two samples. These studies have shown that vacuum chamber total reflection X-ray fluorescence is a promising technique for the determination of low atomic number elements in uranium matrix after its separation.     

Multilayer mirror as a substrate for total reflection X-ray fluorescence spectrometry

X-ray field intensity generated over a multilayer surface during a strong Bragg reflection condition has been used to analyze the particulate matter deposited on its surface, for the average particles size distribution and detection sensitivity of various elements. The elemental detection sensitivities achieved at Bragg reflection condition are compared to those obtained at incidence angles below critical angle, under total external reflection condition. The results obtained indicate that when big size particles (> 1 μm) are distributed over a large surface area, the observed fluorescence yields deteriorate by 15–18% in the total external reflection condition, due to strong sample absorption effects. In such a case, use of a multilayer mirror as a sample carrier and fluorescence excitation under Bragg reflection condition provides better fluorescence yield and hence improved detection sensitivity for an element.     

Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

A deposition system capable of delivering picoliter quantities of solution in programmable arrays was investigated as a method for sample preparation for total reflection X-ray fluorescence (TXRF) spectroscopy. Arrays of trace metals in solution were deposited on Si wafers. The array deposits provide a capability of depositing closely spaced (100 μm or less), typically 5–20 μm diameter droplets in an area that can be matched to the analysis spot of the TXRF detector. The dried depositions were physically characterized and the effect of deposition type and matrix on the TXRF signal was investigated.     

Automated nanoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

In this study, a BioDot BioJet dispensing system was investigated as a nanoliter sample deposition method for total reflection X-ray fluorescence (TXRF) analysis. The BioDot system was programmed to dispense arrays of 20 nL droplets of sample solution on Si wafers. Each 20 nL droplet was approximately 100 μm in diameter. A 10 × 10 array (100 droplets) was deposited and dried in less than 2 min at room temperature and pressure, demonstrating the efficiency of the automated deposition method. Solutions of various concentrations of Ni and Ni in different matrices were made from stock trace element standards to investigate of the effect of the matrix on the TXRF signal. The concentrations were such that the levels of TXRF signal saturation could be examined. Arrays were deposited to demonstrate the capability of drying 100 μL of vapor phase decomposition-like residue in the area of a typical TXRF detector.     

Optimization of a glancing angle for simultaneous trace elemental analysis by using a portable total reflection X-ray fluorescence spectrometer

By using a portable total reflection X-ray fluorescence spectrometer with a 1 W X-ray tube, a specimen containing nanograms of Ca, Sc, Ti, V, Cr, Mn, Fe, and Ni is measured at several glancing angles of incident X-rays. Continuum X-rays are used as the excitation source. The intensities of the spectral background which degrades sensitivity to trace elements are decreased with a decrease of the glancing angle, and all these elements are detected at the glancing angle of 0.13° smaller than the critical angle for total reflection of the incident X-rays (0.20°). An optimum glancing angle for simultaneously detecting these trace elements is around 0.13°, and detection limits at 0.13° are sub-nanograms to ten nanograms.     

A new technique for the deposition of standard solutions in total reflection X-ray fluorescence spectrometry (TXRF) using pico-droplets generated by inkjet printers and its applicability for aerosol analysis with SR-TXRF

A new technique for the deposition of standard solutions on particulate aerosol samples using pico-droplets for elemental determinations with total reflection X-ray fluorescence spectrometry (TXRF) is described. It enables short analysis times without influencing the sample structure and avoids time consuming scanning of the sample with the exciting beam in SR-TXRF analysis. Droplets of picoliter volume (∼ 5–130 pL) were generated with commercially available and slightly modified inkjet printers operated with popular image processing software. The size of the dried droplets on surfaces of different polarity namely silicone coated and untreated quartz reflectors, was determined for five different printer types and ten different cartridge types. The results show that droplets generated by inkjet printers are between 50 and 200 μm in diameter (corresponding to volumes of 5 to 130 pL) depending on the cartridge type, which is smaller than the width of the synchrotron beam used in the experiments (< 1 mm at an energy of 17 keV at the beamline L at HASYLAB, Hamburg). The precision of the printing of a certain amount of a single element standard solution was found to be comparable to aliquoting with micropipettes in TXRF, where for 2.5 ng of cobalt relative standard deviations of 12% are found. However, it could be shown that the printing of simple patterns is possible, which is important when structured samples have to be analysed.     

Development of off-line layer chromatographic and total reflection X-ray fluorescence spectrometric methods for arsenic speciation

Rapid and low cost off-line thin layer chromatography–total reflection X-ray fluorescence spectrometry and overpressured thin layer chromatography–total reflection X-ray fluorescence spectrometry methods have been developed for separation of 25 ng of each As(III), As(V), monomethyl arsonic acid and dimethylarsinic acid applying a PEI cellulose stationary phase on plastic sheets and a mixture of acetone/acetic acid/water = 2:1:1 (v/v/v) as eluent system. The type of eluent systems, the amounts (25–1000 ng) of As species applied to PEI cellulose plates, injection volume, development distance, and flow rate (in case of overpressured thin layer chromatography) were taken into consideration for the development of the chromatographic separation. Moreover, a microdigestion method employing nitric acid for the As spots containing PEI cellulose scratched from the developed plates divided into segments was developed for the subsequent total reflection X-ray fluorescence spectrometry analysis. The method was applied for analysis of root extracts of cucumber plants grown in As(III) containing modified Hoagland nutrient solution. Both As(III) and As(V) were detected by applying the proposed thin layer chromatography/overpressured thin layer chromatography–total reflection X-ray fluorescence spectrometry methods.     

Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB,beamline L

At the Hamburger Synchrotronstrahlungslabor (HASYLAB), Beamline L, a vacuum chamber for synchrotron radiation-induced total reflection X-ray fluorescence analysis, is now available which can easily be installed using the adjustment components for microanalysis present at this beamline. The detector is now in the final version of a Vortex silicon drift detector with 50-mm² active area from Radiant Detector Technologies. With the Ni/C multilayer monochromator set to 17 keV extrapolated detection limits of 8 fg were obtained using the 50-mm² silicon drift detector with 1000 s live time on a sample containing 100 pg of Ni.Various applications are presented, especially of samples which are available in very small amounts: As synchrotron radiation-induced total reflection X-ray fluorescence analysis is much more sensitive than tube-excited total reflection X-ray fluorescence analysis, the sampling time of aerosol samples can be diminished, resulting in a more precise time resolution of atmospheric events. Aerosols, directly sampled on Si reflectors in an impactor were investigated. A further application was the determination of contamination elements in a slurry of high-purity Al₂O₃. No digestion is required; the sample is pipetted and dried before analysis. A comparison with laboratory total reflection X-ray fluorescence analysis showed the higher sensitivity of synchrotron radiation-induced total reflection X-ray fluorescence analysis, more contamination elements could be detected. Using the Si-111 crystal monochromator also available at beamline L, XANES measurements to determine the chemical state were performed. This is only possible with lower sensitivity as the flux transmitted by the crystal monochromator is about a factor of 100 lower than that transmitted by the multilayer monochromator. Preliminary results of X-ray absorption near-edge structure measurements for As in xylem sap from cucumber plants fed with As(III) and As(V) are reported. Detection limits of 170 ng/l of As in xylem sap were achieved.     

Analysis of total and dissolved heavy metals in surface water of a Mexican polluted river by total reflection X-ray fluorescence spectrometry

The present area of study is located in the Upper Course of the Lerma River (UCLR). The Lerma is one of the most important rivers of Mexico, where it drains highly populated and industrialized regions. The aim of the present study is to determine the heavy metal concentration of Cr, Mn, Fe, Cu and Pb in dissolved and total phases of the UCLR by means of Total Reflection X-ray Fluorescence Spectrometry (TXRF). The surface water samples were collected at 8 sites distributed following the stream flow direction of the river. Four sampling campaigns were carried out in each site in a 1-year period. A sample preparation method was applied in order to obtain the total and dissolved fraction and to destroy the organic matter. The total heavy metal average concentration decrease in the following order: Fe (2566 μg/L) > Mn (300 μg/L) > Cu (66 μg/L) > Cr (21 μg/L) > Pb (15 μg/L). In general, the heavy metal concentrations in water of the UCLR are below the maximum permissible limits.     

Matrix effect on the detection limit and accuracy in total reflection X-ray fluorescence analysis of trace elements in environmental and biological samples

The effect of matrix contents on the detection limit of total reflection X-ray fluorescence analysis was experimentally investigated using a set of multielement standard solutions (500 ng/mL of each element) in variable concentrations of NH₄NO₃. It was found that high matrix concentration, i.e. 0.1–10% NH₄NO₃, had a strong effect on the detection limits for all investigated elements, whereas no effect was observed at lower matrix concentration, i.e. 0–0.1% NH₄NO₃.     

Total reflection X-ray fluorescence trace mercury determination by trapping complexation: Application in advanced oxidation technologies

It is well known that Hg species cause high noxious effects on the health of living organisms even at very low levels (5 μg/L). Quantification of this element is an analytical challenge due to the peculiar physicochemical properties of all Hg species. The regulation of the maximal allowable Hg concentration led to search for sensitive methods for its determination. Total reflection X-ray fluorescence is a proved instrumental analytical tool for the determination of trace elements. In this work, the use of total reflection X-ray fluorescence for Hg quantification is investigated. However, experimental determination by total reflection X-ray fluorescence requires depositing a small volume of sample on the reflector and evaporation of the solvent until dryness to form a thin film. Because of volatilization of several Hg forms, a procedure to capture these volatile species in liquid samples by using complexing agents is proposed. Acetate, oxalic acid, ethylenediaminetetracetic acid and ammonium pyrrolidine–dithiocarbamate were assayed for trapping the analytes into the solution during the preparation of the sample and onto the reflector during total reflection X-ray fluorescence measurements. The proposed method was applied to evaluate Hg concentration during TiO₂-heterogeneous photocatalysis, one of the most known advanced oxidation technologies. Advanced oxidation technologies are processes for the treatment of effluents in waters and air that involve the generation of very active oxidative and reductive species. In heterogeneous photocatalysis, Hg is transformed to several species under ultraviolet illumination in the presence of titanium dioxide. Total reflection X-ray fluorescence was demonstrated to be applicable in following the extent of the heterogeneous photocatalysis reaction by determining non-transformed Hg in the remaining solution.     

A novel total reflection X-ray fluorescence procedure for the direct determination of trace elements in petrochemical products

A total reflection X-ray fluorescence (TXRF) procedure was developed for the determination of metal traces in petrochemical end products or intermediates for surfactant synthesis. The method combines a fast and straightforward sample preparation, i.e. deposition on the sample holder and evaporation of the sample matrix, with an efficient quantification method based on internal standardization (organic gallium standard). The method developed showed detection limits below 0.05 μg g^-1 and in most cases below 0.005 μg g^-1. Fifteen elements (Ca, Cd, Co, Cr, Cu, Fe, Mn, Mo, Ni, Pb, Rh, Sn, Sr, V and Zn) were determined in matrices such as paraffins, n-olefins, linear alkylbenzenes, long-chain alkyl alcohols and esters: typical metal contents were below 1 μg g^-1. The results were compared with the reference method ASTM D5708 (test method B) based on inductively coupled plasma optical emission spectroscopy: advantages and drawbacks of the two procedures were critically evaluated. The TXRF method developed showed comparable precision and absence of bias with respect to the reference method. A comparison of the performances of the two methods is presented.     

Energy-dispersive X-ray fluorescence spectrometer for analysis of conventional and micro-samples: Preliminary assessment

The energy-dispersive X-ray fluorescence spectrometer for analysis of conventional and micro-samples using pinhole collimators of various sizes is developed. The measurements can be performed in the air or, in order to decrease the absorption of long-wavelength radiation of low-Z elements, in helium atmosphere. The sample is excited by the air-cooled Rh target X-ray tube of ca. 100 μm nominal focal spot size and maximum power 75 W. The X-ray spectra of the samples are collected by thermoelectrically cooled Si-PIN detector. The tungsten pinhole collimators of the size holes from 50 to 2000 μm are placed between primary filter and analyzed sample to reduce size of analyzed area. The sample can be moved using the X–Y stage. The position of the sample is monitored by CCD camera and two laser pointers. The beam spot sizes for various collimators are evaluated by the thin-wire and knife-edge methods. Beside the beam spot sizes, the loss of radiation intensity and the changes of spectral distribution of the incident radiation caused by applying various collimators are also investigated. The sample-surface-down geometry in the designed spectrometer allows for a simple analysis of various samples: solutions, loose powders, solid samples of conventional size and micro-samples.     

Uranium determination in seawater by total reflection X-ray fluorescence spectrometry

A study regarding uranium determination in seawater by total reflection X-ray fluorescence (TXRF) spectrometry is reported. Uranium, present in seawater in concentration of about 3.3 ng/mL, was selectively extracted in diethyl ether and determined by TXRF after its preconcentration by evaporation and subsequent dissolution in a small volume of 1.5% suprapure HNO₃. Yttrium was used as an internal standard. Before using diethyl ether for selective extraction of uranium from seawater, its extraction behavior for different elements was studied using a multielement standard solution having elemental concentrations in 5 ng/mL levels. It was observed that the extraction efficiency of diethyl ether for uranium was about 100% whereas for other elements it was negligible. The detection limit of TXRF method for uranium in seawater samples after pre-concentration step approaches to 67 pg/mL. The concentrations of uranium in seawater samples determined by TXRF are in good agreement with the values reported in the literature. The method shows a precision within 5% (1σ). The study reveals that TXRF can be used as a fast analytical technique for the determination of uranium in seawater.     

Simple method of determination of copper,mercury and lead in potable water with preliminary pre-concentration by total reflection X-ray fluorescence spectrometry

Total reflection X-ray fluorescence spectrometry and chemical pre-concentration procedures have been applied for the analysis of trace concentrations of copper, mercury, and lead in drinking water samples. A simple total reflection module has been used in X-ray measurements. The elements under investigation were pre-concentrated by complexation using a mixture of carbamates followed by solvent extraction with methyl isobutyl ketone. The preconcentration procedure was tested with the use of twice-distilled water samples and samples of mineral and tap water spiked with known additions of copper, mercury, and lead. The obtained recovery and precision values are presented. The minimum detection limits for the determination of these elements in mineral and tap water samples were found to be 40 ng l⁻¹, 60 ng l⁻¹, and 60 ng l⁻¹, respectively.     

Direct determination of trace elements in boron nitride powders by slurry sampling total reflection X-ray fluorescence spectrometry

The use of slurry sampling total reflection X-ray fluorescence spectrometry (SlS-TXRF) for the direct determination of Ca, Cr, Cu, Fe, Mn and Ti in four boron nitride powders has been described. Measurements of the zeta potential showed that slurries with good stabilities can be obtained by the addition of polyethylenimine (PEI) at a concentration of 0.1 wt.% and by adjusting the pH at 4. For the optimization of the concentration of boron nitride in the slurries the net line intensities and the signal to background ratios were determined for the trace elements Ca and Ti as well as for the internal standard element Ga in the case of concentrations of boron nitride ranging from 1 to 30 mg mL⁻¹. As a compromise with respect to high net line intensities and high signal to background ratios, concentrations of 5 mg mL⁻¹ of boron nitride were found suitable and were used for all further measurements. The limits of detection of SlS-TXRF for the boron nitride powders were found to range from 0.062 to 1.6 μg g^– 1 for Cu and Ca, respectively. Herewith, they are higher than those obtained in solid sampling and slurry sampling graphite furnace atomic absorption spectrometry (SoS-GFAAS, SlS-GFAAS) as well as those of solid sampling electrothermal evaporation inductively coupled plasma optical emission spectrometry (SoS-ETV-ICP-OES). For Ca and Fe as well as for Cu and Fe, however, they were found to be lower than for GFAAS and for ICP-OES subsequent to wet chemical digestion, respectively. The universal applicability of SlS-TXRF to the analysis of samples with a wide variety of matrices could be demonstrated by the analysis of certified reference materials such as SiC, Al₂O₃, powdered bovine liver and borate ore with a single calibration. The correlation coefficients of the plots for the values found for Ca, Fe and Ti by SlS-TXRF in the boron nitride powders as well as in the before mentioned samples versus the reference values for the respective samples over a concentration range from 2.5 to 1470 μg g^– 1 were found to be 0.995, 0.991 and 0.997, respectively.     

Determination of carbon in natural freshwater biofilms with total reflection X-ray fluorescence spectrometry

There is a growing interest in determination of low Z elements, i.e., carbon to phosphorus, in biological samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon).Biofilms can be used for biomonioring purposes in the aquatic environment. Besides the trace metals, especially the determination of the carbon content is important for the better understanding of the early stage of biofilm formation. For this, an ATI low Z spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a Si(Li) detector with ultra thin window was used. Biofilms were grown on two different artificial supports (granite and plexiglass), freeze dried, suspended in high purity water and analyzed. As an internal standard the natural titanium content of the biofilms was used. The accuracy of the method was checked by total carbon measurement using a combusting carbon analyzer.     

Total reflection X-ray fluorescence analysis of river waters in its stream across the city of Cordoba,in Argentina

The aim of this work was to analyze the composition of river waters and to study their quality by detecting possible contaminants. The samples were taken at 32 points of the Suquía River in its stream across the city of Córdoba (in the Province of Córdoba, Argentina). The samples were analyzed with total reflection X-ray fluorescence (TXRF) using beam guides. Beam guides made of two Si plate reflectors were used as sample carriers and to guide the X-ray photons to the sample; the measurements were taken using the characteristic configuration that ensures the best excitation and detection conditions (in TXRF). The analyses were carried out by preconcentration of the water samples and by adding an internal standard (Gallium); small amounts of samples (30 μl) were deposited on the Si reflector plate and they were then analyzed in the total reflection regime. Spectra were analyzed with standard methods using conventional programs. The results show interesting behaviors of the concentration of trace elements along the river: elements of low atomic number (such as Ca, Cl, S, K) present higher concentrations as compared to high Z elements (such as Fe, Zn, Br, Sr); the concentrations of light elements follow a similar behavior along the stream, the same situation is observed in the set of elements with high atomic number. Some samples present high concentrations in certain elements indicating possible sources of contamination.     

Determination of fluorine by total reflection X-ray fluorescence spectrometry

There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon).     

Challenges of total reflection X-ray fluorescence for surface- and thin-layer analysis

Within the last 30 years total reflection X-ray fluorescence (TXRF) has acquired a high rank among the competitive methods of spectral analysis. It plays an important role in trace- and microanalysis of the elements. Besides this, it also shows essential advantages in surface- and thin-layer analysis, especially for flat substrates like wafers. TXRF has become a major technique for contamination control in the semiconductor industry. Furthermore, it is capable of a non-destructive analysis of thin near-surface layers deposited on flat substrates. Depth-profiling by repeated sputter-etching and TXRF is a new approach which is as reliable as Rutherford backscattering but it shows a better depth resolution on the order of a nanometer. Although it is time-consuming, it also allows the analysis of transition or implantation layers and can even reveal a swelling or shrinking of the substrate induced by implantation. A continuing trend in surface- and thin-layer analysis comprises the combination of total reflection with several other methods of excitation and absorption of X-rays. They are aimed at species analysis and thus gain insight into atomic structures.