Dynamics of single InGaN quantum dots

Decay dynamics for single InGaN quantum dots are presented using time-resolved photoluminescence. The recombination is shown to be characterized by a single exponential decay, in contrast to the non-exponential recombination dynamics seen in the 2D wetting layer. The lifetimes of single dots in the temperature range 4–60 K decrease with increasing temperature. Different dots show similar lifetimes of 2 ns.     

Splitting and storing excitons in strained coupled self-assembled quantum dots

We present a novel self-assembled quantum dot structure designed to spatially separate and store photo-generated electrons and holes in pairs of strain coupled quantum dots. The spatial separation of electron–hole pairs into quantum dots and strain-induced quantum dots has been investigated and verified by photoluminescence experiments. Results from time-resolved PL demonstrates that at low temperatures (3 K) the electron–hole pair can be stored for several seconds.     

Carrier capture and relaxation of self-assembled ZnTe/ZnSe quantum dots prepared under Volmer–Weber and Stranski–Krastanow growth modes

The carrier capture and relaxation of type II ZnTe/ZnSe quantum dots have been investigated with ultrafast time-resolved photoluminescence upconversion. The carrier capture times were 7 and 38 ps for the Volmer–Weber mode and Stranski–Krastanow mode, respectively. We found that the carrier relaxation of QDs exhibits faster decay under the Volmer–Weber growth mode than under the Stranski–Krastanow growth mode. We attribute the difference of carrier relaxation to the wetting layer formed in the Stranski–Krastanow growth mode.     

New method to induce 2D–3D transition of strained CdSe/ZnSe layers

We present new growth conditions for growing high-quality CdSe/ZnSe quantum dots with photoluminescence emission measurable up to room temperature. The surface morphology is characterized in situ by Reflective High Energy Electron Diffraction (RHEED). The key point is the introduction of a new step in the growth process using amorphous selenium to induce a 2D–3D transition of a CdSe strained layer on ZnSe to form the dots. Optical characterizations by photoluminescence of CdSe/ZnSe quantum dots obtained that way, as well as X-ray diffraction results are also discussed here.     

Highly efficient radiative recombination of electron–hole pairs localized at compound semiconductor quantum dots embedded in Si

We have studied the optical properties of compound semiconductor quantum dots (CSQDs) embedded in Si. Both photoluminescence and electroluminescence spectra were found to be associated with an inhomogeneously broadened band in the near-infrared. A long decay lifetime of luminescence was observed, which is in support of an indirect transition in both k- and real-space. Strong localization of electron–hole pairs was found to occur due to a deep potential well created by the built-in electric dipole at the III–V/Si interface. A Si-based light-emitting diode with GaSb-CSQDs in the active layer showed a high value of quantum efficiency. Light amplification was also observed under pulsed laser excitation.     

Temperature dependent time-resolved exciton luminescence in GaAs/AlGaAs quantum wires and dots

Transient photoluminescence of GaAs/AlGaAs quantum wires and quantum dots formed by strain confinement is studied as a function of temperature. At low temperature, luminescent decay times of the wires and dots correspond to the radiative decay times of localized excitons. The radiative decay time can be either longer or shorter than that of the host quantum well, depending on the size of the wires and dots. For small wires and dots (∼ 100 nm stressor), the exciton radiative recombination rate increases due to lateral confinement. Exciton localization due to the fluctuation of quantum well thickness plays an important role in the temperature dependence of luminescent decay time and exciton transfer in quantum wire and dot structures up to at least ∼ 80 K. Lateral exciton transfer in quantum wire and dot structures formed by laterally patterning quantum wells strongly affects the dynamics of wire and dot luminescence. The relaxation time of hot excitons increases with the depth of strain confinement, but we find no convincing evidence that it is significantly slower in quasi 1-D or 0-D systems than in quantum wells.     

Solution processed microcavity structures with embedded quantum dots

The authors report the fabrication of a one-dimensional microcavity structure embedded with colloidal CdSe/ZnS core/shell quantum dots using solution processing. The microcavity structures were fabricated by spin coating alternating layers of polymers of different refractive indices (poly-vinylcarbazole—PVK, and poly-acrylic acid—PAA) to form the distributed Bragg reflectors (DBRs). Greater than 90% reflectivity was obtained using ten periods of the structure. The one-dimensional microcavity was formed by sandwiching a λ/n thick defect layer between two such DBRs. The emission of the quantum dots from the microcavity structure demonstrated directionality following the cavity mode dispersion and spectral narrowing. Room temperature time-resolved photoluminescence measurements carried out on this structure showed significant reduction in the photoluminescence decay time which is attributed primarily to nonradiative mechanism originating in the presence of the PVK host matrix. The photoluminescence decay time of the quantum dots was found to be 1000 ps while for the quantum dots embedded in the polymer host and the microcavity were 400 and 150 ps, respectively.     

Phonon satellites and time-resolved studies of carrier recombination dynamics in InGaN quantum wells

We have studied the photoluminescence and time-resolved photoluminescence of a set of InGaN quantum wells with well thickness from 1 to 7.5 nm. An analysis of the phonon satellites at 5 K shows Huang–Rhys factors from 0.32 to 0.44. The increase of this factor is caused by the electron–hole separation induced by the piezoelectric field. The time-resolved photoluminescence at room temperature shows that the decay time of the 1 and 2 nm wells does not depend on the wavelength. The maximum decay time is around 600 ps for the 2, 3 and 4 nm wells. However, for the 3 and 4 nm wells a decrease of the photoluminescence decay time is observed at the highest wavelengths. This suggest the onset of a non-radiative process in these samples. The optimum well width for efficient emission for these single quantum wells was found to be 2 nm.     

Photoexcited carrier dynamics in aligned InAs/GaAs quantum dots grown on strain-relaxed InGaAs layers

Carrier dynamics in aligned InAs/GaAs quantum dots (QDs) grown on cross-hatched patterns induced by metastable In_xGa_1−xAs layers have been studied by time-resolved photoluminescence. The low-temperature carrier lifetimes were found to be of the order of 100–200 ps and determined by carrier trapping and nonradiative recombination. Comparisons with control “nonaligned” InAs QDs show remarkable differences in dependence of peak PL intensities on excitation power, and in PL decay times dependences on both temperature and excitation intensities. Possible origin of traps, which determine the carrier lifetimes, is discussed.     

The Effect of Ligands and Solvents on Nonradiative Transitions in Semiconductor Quantum Dots (A Review)

Data on quantum yields and photoluminescence decay times of quantum dots have been collected. Photoprocesses that occur in quantum dots are compared with photoprocesses occurring in complex organic molecules in the condensed phase. The review consists of the introduction, three parts, and conclusions. The first two parts are devoted to quantum dots that are formed by indirect-gap semiconductors. The first part is devoted to data on the photoluminescence quantum yields and decay times of carbon quantum dots, and Table 1 presents selected values and short comments to these data. Table 2 of the same part presents data on fast relaxation processes in the same objects. In the second part, Tables 3 and 4, as well as the following text, contain similar information about silicon quantum dots. Data on photoprocesses in quantum dots formed by direct-gap semiconductors are collected in the third part. Data on the photoluminescence yields, decay times, and relaxation processes are listed in Tables 5 and 6. Particular attention in the present review is given to the effect that a change in the frequency of vibrations in the environment of a quantum dot has on the photoluminescence yields and the rate of relaxation processes between electronic levels in bands, which indicates that the inductive resonance mechanism of nonradiative transitions is applicable to these systems.     

Optical properties of 1.3 μm room temperature emitting InAs quantum dots covered by In0.4Ga0.6As/GaAs hetero-capping layer

Room temperature 1.3 μm emitting InAs quantum dots (QDs) covered by an In_0.4Ga_0.6As/GaAs strain reducing layer (SRL) have been fabricated by solid source molecular beam epitaxy (SSMBE) using the Stranski–Krastanov growth mode. The sample used has been investigated by temperature and excitation power dependent photoluminescence (PL), photoluminescence excitation (PLE), and time resolved photoluminescence (TRPL) experiments. Three emission peaks are apparent in the low temperature PL spectrum. We have found, through PLE measurement, a single quantum dot ground state and the corresponding first excited state with relatively large energy spacing. This attribute has been confirmed by TRPL measurements which allow comparison of the dynamics of the ground state with that of the excited states. Optical transitions related to the InGaAs quantum well have been also identified. Over the whole temperature range, the PL intensity is found to exhibit an anomalous increase with increasing temperatures up to 100 K and then followed by a drop by three orders of magnitude. Carrier’s activation energy out of the quantum dots is found to be close to the energy difference between each two subsequent transition energies. PACS 68.65.Ac; 68.65.Hb; 78.67.Hc     

Electronic excitation energy transfer between CdS quantum dots and carbon nanotubes

Stationary and transient photoluminescence of CdS quantum dots deposited on silicon substrates and carbon nanotubes is investigated. The photoluminescence spectrum of quantum dots on a silicon substrate is dominated by a band originating from electron transitions between the quantum-confinement levels in the dots. When the quantum dots are deposited on carbon nanotubes, the intensity of this band decreases significantly. Furthermore, the kinetics of the photoluminescence decay becomes faster, which brings evidence of an additional channel for the quantum-dot deexcitation. The analysis of the experimental data demonstrates that the Förster energy transfer from CdS quantum dots to carbon nanotubes is most probably responsible for this channel. The efficiency of this process exceeds 60%.     

Fast synthesize ZnO quantum dots via ultrasonic method

Green emission ZnO quantum dots were synthesized by an ultrasonic sol–gel method. The ZnO quantum dots were synthesized in various ultrasonic temperature and time. Photoluminescence properties of these ZnO quantum dots were measured. Time-resolved photoluminescence decay spectra were also taken to discover the change of defects amount during the reaction. Both ultrasonic temperature and time could affect the type and amount of defects in ZnO quantum dots. Total defects of ZnO quantum dots decreased with the increasing of ultrasonic temperature and time. The dangling bonds defects disappeared faster than the optical defects. Types of optical defects first changed from oxygen interstitial defects to oxygen vacancy and zinc interstitial defects. Then transformed back to oxygen interstitial defects again. The sizes of ZnO quantum dots would be controlled by both ultrasonic temperature and time as well. That is, with the increasing of ultrasonic temperature and time, the sizes of ZnO quantum dots first decreased then increased. Moreover, concentrated raw materials solution brought larger sizes and more optical defects of ZnO quantum dots.     

Abnormal Energy Dependence of Photoluminescence Decay Time in InGaN Epilayer

We employ photoluminescence (PL) and time-resolved PL to study exciton localization effect in InGaN epilayers.By measuring the exciton decay time as a function of the monitored emission energy at different temperatures,we have found unusual behaviour of the energy dependence in the PL decay process. At low temperature, the measured PL decay time increases with the emission energy. It decreases with the emission energy at 200K, and remains nearly constant at the intermediate temperature of 12OK. We have studied the dot size effect on the radiative recombination time by calculating the temperature dependence of the exciton recombination lifetime in quantum dots, and have found that the observed behaviour can be well correlated to the exciton localization in quantum dots. This suggestion is further supported by steady state PL results.     

Photoluminescence of germanium quantum dots grown in silicon on a SiO<Subscript>2</Subscript> submonolayer

The photoluminescence of quantum dots in Si/Ge/SiO₂/Si and Si/Ge/Si structures is investigated as a function of temperature. The low activation energies for the temperature quenching of photoluminescence of germanium quantum dots in both structures are explained in terms of the thermally stimulated capture of holes from quantum dots to the energy levels of defects localized in their vicinity.     

Millisecond photoluminescence kinetics in a system of direct-bandgap InAs quantum dots in an AlAs matrix

Anomalously long millisecond kinetics of photoluminescence (PL) is observed at low temperatures (4.2–50 K) in direct-bandgap InAs quantum dots formed in an AlAs matrix. An increase in temperature leads to a decrease in the duration of PL decay down to several nanoseconds at 300 K, whereas the integral PL intensity remains constant up to 210 K. In order to explain the experimental results, a model is proposed that takes into account the singlet-triplet splitting of exciton levels in small quantum dots.     

Successful growth of two different quantum dots on one substrate

We report the successful growth of ZnSe and ZnTe quantum dots (QDs) embedded in ZnS on GaAs substrate. These QDs have good optical properties and show quantum confinement effect. High-resolution electron scanning microscope studies show that these QDs are grown in Volmer–Weber mode. It is found that the size of the QDs is controlled by the growth duration. When the growth time is short, high density of QDs could be fabricated, but with a long growth time the small QDs get together to form a large cluster. We also show that with this growth method it is possible to grow both ZnSe quantum and ZnTe QDs on one substrate at the same time. For this dual QDs system, two peaks corresponding to the emission from the ZnSe dots (3.0 eV, blue–violet) and ZnTe dots (2.6 eV, green–blue) could be observed at the same time in the photoluminescence measurement.     

Temperature dependence of photoluminescence of semiconductor quantum dots upon indirect excitation in a SiO2 dielectric matrix

The processes of excitation and relaxation of confined excitons in semiconductor quantum dots upon indirect high-energy excitation have been considered. The temperature behavior of photoluminescence of quantum dots in a SiO₂ dielectric matrix has been described using a model accounting for the process of population of quantum-dot triplet states upon excitation transfer through mobile excitons of the matrix. Analytical expressions that take into account the two-stage and three-stage schemes of relaxation transitions have been obtained. The applicability of these expressions for analyzing fluorescence properties of semiconductor quantum dots has been demonstrated using the example of silicon and carbon nanoparticles in the thin-film SiO₂ matrix. It has been shown that the complex character of the temperature dependences of the photoluminescence upon indirect excitation can be an indication of a multistage relaxation of excited states of the matrix and quantum dots. The model concepts developed in this study allow one to predict the form of temperature dependences of the photoluminescence for different schemes of indirect excitation of quantum dots.

     

Recombination processes in structures with GaN/ALN quantum dots

Mechanisms of the generation and the radiative and nonradiative recombination of carriers in structures with GaN quantum dots in the AlN matrix are studied experimentally and theoretically. Absorption, stationary and nonstationary photoluminescence of quantum dots at different temperatures are investigated. It is found that the photoluminescence intensity considerably decreases with the temperature while the photoluminescence kinetics weakly depends on the temperature. The photoluminescence kinetics is shown to be determined by radiative recombination inside quantum dots. A mechanism of nonradiative recombination is proposed, according to which the main reason for the thermal quenching of photoluminescence is nonradiative recombination of charge carriers, generated by optical transitions between quantum dots and wetting layer states.     

Influence of a lateral electric field on the optical properties of InAs quantum dots

We have performed single dot photoluminescence and time-resolved ensemble photoluminescence measurements on InAs quantum dots embedded in a lateral in-plane p–i–n or n–i–n device, respectively, which makes the application of lateral electric fields, i.e. field direction perpendicular to the growth direction, feasible. Time-resolved measurements show an increase in the radiative lifetime of up to 30% with increasing field. We attribute this to the reduced overlap between the electron and hole wave functions. Single dot spectroscopy revealed a small red-shift of the emission energies of maximum 0.5 meV. This shift can be explained by the quantum confined Stark effect taking into account that the red-shift due to the band-tilting is partly compensated by a decrease in exciton binding energy.