原子力显微镜与x射线光电子能谱对LiBq4/ITO和LiBq4/CuPc/ITO的表面分析

利用原子力显微镜对8-羟基喹啉硼化锂(LiBq₄)/铟锡氧化物和8-羟基喹啉硼化锂/酞菁铜(CuPc)/铟锡氧化物表面分别进行了扫描，显示了LiBq₄在不同衬底上的形貌差异，并进一步利用样品表面的x射线光电子能谱图验证了这一差异.实验表明，CuPc层的加入改善了LiBq₄的成膜质量，并将这种改善归因于分子构型与电子亲和势的不同. 关键词： 原子力显微镜 x射线光电子能谱 电子亲和势     

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 × 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/m at single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region.     

PTCDA/ITO表面和界面的X射线光电子能谱分析

利用X射线光电子能谱对PTCDA/p-Si有机/无机光电探测器中PTCDA/ITO表面和界面进行了测试分析。结果表明,苝环上的C原子的结合能为284.6 eV,酸酐中的C原子的结合能为288.7 eV,并存在来源于ITO膜中的氧对C原子的氧化现象,界面处C(1s)谱中较高结合能峰消失,且峰值向低结合能发生化学位移;CO键中O原子的结合能为531.5 eV,C—O—C键中的O原子的结合能为533.4 eV。     

Observation of single- and double-stranded DNA using non-contact atomic force microscopy

Non-contact atomic force microscopy (NC-AFM) has been applied to observe single- and double-stranded DNA. For the wet processes used to prepare the sample, a strong adhesion force at the surface is observed even in vacuum conditions. Despite the presence of this adhesion force, single- and double-stranded DNA images can be obtained by NC-AFM. Because of the high sensitivity of the tip-sample interaction, NC-AFM images provide stronger contrast than tapping mode (TM)-AFM images. NC-AFM images reveal detailed structures of single- and double-stranded DNA which are not revealed by TM-AFM. In addition, several NC-AFM images show contrast artifacts, which might provide information on the detailed structure of DNA.     

原子力显微镜扫描成像DNA分子

采用Mg2+处理DNA、APTES或戊二醛修饰云母表面、DNA拉直方法制备了λ-DNA及DNA-组蛋白复合物样品.室温下原子力显微镜以轻敲模式在空气中扫描样品成像.实验结果表明:AFM扫描成像的效果与样品的制备方法有关,同时也受操作因素影响.     

原子力显微术研究进展

原子力显微术是微纳米尺度实空间形貌成像与结构表征的关键技术之一。近些年,原子力显微术衍生发展出了一系列令人瞩目的功能化探测模式和新技术。文章从以下两个方面论述了原子力显微术的前沿进展：(1)原子力显微术的功能化探测模式及其在微纳米尺度物性研究与测量以及微纳加工等领域的应用;(2)原子力显微术自身在更高精度、更高分辨率、更快速度、更多功能等方面的进展及在基础和应用研究领域中的应用。文章还展望了原子力显微术的下一步发展方向和正在不断扩展的研究领域。     

原子力显微镜在轻敲模式下的动力学模型

基于Hamaker假设、Lennard-Jones势能定律及经典弹性理论建立了一种新型的球体与平面黏着接触的弹性模型，该模型显示黏着力在原子力显微镜(AFM)针尖趋近和撤离样品表面，即加载和卸载的两个过程中存在黏着滞后现象，表明了AFM在轻敲工作模式中存在能量耗散.同时，根据所建的黏着接触弹性模型，建立了AFM在轻敲工作模式下的动力学模型，研究了AFM在轻敲工作模式下的振动幅度、相位差及耗散功率随针尖与样品表面间距的变化规律，仿真结果与现有的实验结果相一致.     

Investigating biomolecular recognition at the cell surface using atomic force microscopy

Probing the interaction forces that drive biomolecular recognition on cell surfaces is essential for understanding diverse biological processes. Force spectroscopy has been a widely used dynamic analytical technique, allowing measurement of such interactions at the molecular and cellular level. The capabilities of working under near physiological environments, combined with excellent force and lateral resolution make atomic force microscopy (AFM)-based force spectroscopy a powerful approach to measure biomolecular interaction forces not only on non-biological substrates, but also on soft, dynamic cell surfaces. Over the last few years, AFM-based force spectroscopy has provided biophysical insight into how biomolecules on cell surfaces interact with each other and induce relevant biological processes. In this review, we focus on describing the technique of force spectroscopy using the AFM, specifically in the context of probing cell surfaces. We summarize recent progress in understanding the recognition and interactions between macromolecules that may be found at cell surfaces from a force spectroscopy perspective. We further discuss the challenges and future prospects of the application of this versatile technique.     

原子力显微镜在生物物理领域的新应用

介绍了原子力显微镜在生物物理领域的最新应用:蛋白质去折叠、DNA拉伸、生物膜受力,通过分析实验得到的力谱,可以获取关于蛋白质、DNA、生物膜结构信息.原子力显微镜不仅能反映测量体系的力学性质,由于其具有独特的时间、空间分辨及实时成像,因而能提供更多信息.     

Theory of higher harmonics imaging in tapping-mode atomic force microscopy

The periodic impact force induced by tip-sample contact in tapping mode atomic force microscope (AFM) gives rise to non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dynamical behaviour of tip--sample system was developed in this paper. An analytic formula was introduced to describe the relationship between time-varying tip--sample impact force and tip motion. The theoretical analysis and numerical results both show that the time-varying tip--sample impact force can be reconstructed by recording tip motion. This allows for the reconstruction of the characteristics of the tip--sample force, like contact time and maximum contact force. It can also explain the ability of AFM higher harmonics imaging in mapping stiffness and surface energy variations.     

Noncontact atomic force microscopy: Bond imaging and beyond

It was a long-cherished dream for chemists to take a direct look at chemical bonding, a fundamental component of chemistry. This dream was finally accomplished by the state-of-the-art noncontact atomic force microscopy (NC-AFM) equipped with qPlus force sensors and carbon monoxide (CO) functionalized tips. The resolved interconnectivity between atoms and molecules in NC-AFM frequency shift images is interpreted as chemical bonding, providing essential knowledge of the bond length, bond angle and even bond order. The featured contrast of different chemical bonds can serve as fingerprints for further interpretation of chemical structures toward unknown species synthesized on surfaces. This breakthrough enriches characterization tools for surface science and brings our understanding of on-surface reactions to a new level. Beyond bond imaging, the application of NC-AFM has been extended to quantifying interatomic interactions, identifying three-dimensional nanostructures, manipulating molecules and reactions, as well as determining molecular electronic characteristics. Moreover, some recent efforts address the improvement of the usability and versatility of the bond-resolved NC-AFM technique, including high-resolution molecular investigation on bulk insulators, application-specific tip modification, stable bond imaging above liquid helium temperature and autonomous experimentation implemented by artificial intelligence.     

Modification of electrical properties of tungsten oxide nanorods using conductive atomic force microscopy

Electrical conduction of tungsten oxide nanorods has been characterized by conductive atomic force microscopy (C-AFM). The conduction measurements were carried out in air using a conductive P⁺-type diamond-coated tip. This technique allows either the simultaneous measuring of the topography and the special current distribution or the recording of the current voltage distribution in a single point mode. We have proposed an equivalent electrical circuit which allows us to understand the I(V) curves. During C-AFM observations we have observed significant changes in image contrast and hysteresis in the I(V) characteristics which depend on the applied bias voltage. The bias dependence effect is interpreted as being due to a local oxidation-reduction phenomenon induced by the tip in the presence of water.     

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal set of parameters from first principles as a function of the tip–sample system. The result shows that the either the acquisition rate or the signal-to-noise ratio could be increased by up to two orders of magnitude by using stiffer cantilevers and smaller amplitudes than are in use today.     

Adaptive semi-empirical model for non-contact atomic force microscopy

Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution. Here we propose a new approach to estimate the interaction between its tips and samples, which combines a semi-empirical model with density functional theory (DFT) calculations. The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO, Cu, CuCl, and CuO_x tips. This approach achieves accuracy close to DFT calculation with much lower computational cost.     

自组装硫醇分子膜电输运特性的导电原子力显微镜研究

在Au(111)表面自组装制备了不同链长的烷烃硫醇分子膜，并利用导电原子力显微镜研究了 自组装分子膜的输运特性随外加压力的变化.结果发现分子膜的电流随压力的增加而增大， 其变化特征可以较好地用Hertz模型描述.在相同压力和电压下，通过分子膜的电流随分子链 长的增加呈指数衰减，其衰减因子先随压力的增加而减小，后逐渐趋于稳定.此外，长链分 子自组装膜的电流随压力的变化比短链分子膜更为明显.分析表明，自组装硫醇分子膜输运 特征的压力依赖性主要源于电荷在分子膜中的链间隧穿过程. 关键词： 分子自组装 输运特性 原子力显微镜     

Superconductivity and x—ray photoemission study of MgB2 thin films

Highly c-axis oriented MgB2 thin films with Tc^onset of 39.6K were fabricated by magnesium diffusing into pulsedlaser-deposited boron precursors.The estimation of critical current density Jc,using hysteresis loops and the Bean model,has given the value of 10^7A/cm^2(15K,0T),which is one of the highest values ever reported.The x-ray photoemission study of the MgB2 thin films has revealed that the binding energies of Mg 2p and B 1s are at 49.4eV and 186.9eV,which are close to those of metallic Mg and transition-metal diborides,respectively.     

Study of nitrogen ion implantation and diffusion phenomena on thin chromium layers followed by the atomic force microscopy and secondary ion mass spectroscopy techniques characterization

This research investigates the effect of ion implantation dosage level and further thermal treatment on the physical characteristics of chromium coatings on Si(1 1 1) substrates. Chromium films had been exposed to nitrogen ion fluencies of 1 × 10¹⁷, 3 × 10¹⁷, 6 × 10¹⁷ and 10 × 10¹⁷ N⁺ cm⁻² with a 15 keV energy level. Obtained samples had been heat treated at 450 °C at a pressure of 2 × 10⁻² Torr in an argon atmosphere for 30 h. Atomic force microscopy (AFM) images showed significant increase in surface roughness as a result of nitrogen ion fluence increase. Secondary ion mass spectroscopy (SIMS) studies revealed a clear increased accumulation of Cr₂N phase near the surface as a result of higher N⁺ fluence. XRD patterns showed preferred growth of [0 0 2] and [1 1 1] planes of Cr₂N phase as a result of higher ion implantation fluence. These results had been explained based on the nucleation-growth of Cr₂N phase and nitrogen atoms diffusion history during the thermal treatment process.     

原子力显微镜观测生物大分子图像的一种处理方法

针对具有复杂结构的生物大分子图像,本文改进了已有的半自动化方法,设计了一种新的算法去消除背景噪声,目的在于能够从生物大分子图像高效准确地提取量化信息.通过利用这种新的处理程序对生物大分子DNA原子力显微镜图像进行了研究,不仅可以对线性构像的DNA图像进行了处理,而且对于具有分支构像复杂DNA图像也能够处理.本文所提出的数字图像处理方法具有普适性,它也可以被应用到其他成像领域. 关键词： 原子力显微镜 数字图像处理 DNA     

新型AFM探针的制备及应用

采用熔拉 -腐蚀复合方法 ,将普通单模石英光纤制成直锥形光纤探针。利用自制工具将探针打弯 ,制成悬臂式光纤探针 ,在AFM上取得了较理想的测试结果。将自制光纤探针和商用硅材料探针获得的两种扫描图像进行了对比 ,分析了悬臂式光纤探针的特点     

Metal bonding strength in low‐temperature processed titanium using atomic force microscopy with single‐wall carbon nanotube tip

We report the development of a Ti–Ti bonding process at a low bonding temperature below 200 °C using chemically surface‐activated Ti thin films and a reliable evaluation method for measuring the Ti–Ti bond strength by means of atomic force microscopy (AFM). Using Ti as an interlayer enables void‐free bonding because Ti exhibits fast diffusion and oxide solubility. On the other hand, wafer bonding is an important processing step for 3D circuit integration that requires a high reliability of the process. However, the reliability of bonding‐strength values obtained by employing conventional measurement devices is limited by comparably large measurement errors and restricted the availability of suitable sample material. In this study, the use of AFM to measure the bonding strength is proposed. The interfacial bonding properties depend on the Ti deposition parameters. A bonding temperature of 200 °C was found to be appropriate for the development of a low bonding temperature wafer‐bonding process. The pretreatment methods like plasma activation and chemical activation at 200 °C result in a Ti bonding strength of approximately 8.22 J/m², sufficient for applications in 3D circuit integration. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)