共查询到12条相似文献,搜索用时 62 毫秒
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利用射频等离子体辅助分子束外延技术在蓝宝石衬底上外延了晶体质量较好的单晶InAlGaN薄膜.在生长InAlGaN外延层时,获得了外延膜的二维生长.卢瑟福背散射测量结果表明,InAlGaN外延层中In,Al和Ga的组分分别为2%,22%和76%,并且元素的深度分布比较均匀.InAlGaN(0002)三晶X射线衍射摇摆曲线的半高宽为4.8′.通过原子力显微镜观察外延膜表面存在小山丘状的突起和一些小坑,测量得到外延膜表面的均方根粗糙度为2.2nm.利用光电导谱测量InAlGaN的带隙为3.76eV. 相似文献
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利用射频等离子体辅助分子束外延技术在蓝宝石衬底上外延了晶体质量较好的单晶InAlGaN薄膜.在生长InAlGaN外延层时,获得了外延膜的二维生长.卢瑟福背散射测量结果表明,InAlGaN外延层中In,Al和Ga的组分分别为2%,22%和76%,并且元素的深度分布比较均匀.InAlGaN(0002)三晶X射线衍射摇摆曲线的半高宽为4.8′.通过原子力显微镜观察外延膜表面存在小山丘状的突起和一些小坑,测量得到外延膜表面的均方根粗糙度为2.2nm.利用光电导谱测量InAlGaN的带隙为3.76eV. 相似文献
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利用射频等离子体辅助分子束外延(RF-MBE)技术在蓝宝石衬底上外延了铟铝镓氮(InAlGaN)薄膜,研究了生长温度对RF-MBE外延InAlGaN薄膜的影响.X射线衍射测量结果表明,不同生长温度下外延生长的InAl-GaN薄膜均为单一晶向.卢瑟福背散射(RBS)测量结果表明,随着生长温度的提高,InAlGaN外延层中In的组分单调降低,Al和Ga的组分都有所增加.扫描电镜(SEM)的测试结果表明,在较高温度下(600和590℃)生长的In-AlGaN存在裂纹,580℃生长的四元合金表面比较平整,在570℃温度下生长的InAlGaN表面存在很多颗粒状突起. 相似文献
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利用射频等离子体辅助分子束外延(RF-MBE)技术在蓝宝石衬底上外延了铟铝镓氮(InAlGaN)薄膜,研究了生长温度对RF-MBE外延InAlGaN薄膜的影响.X射线衍射测量结果表明,不同生长温度下外延生长的InAl-GaN薄膜均为单一晶向.卢瑟福背散射(RBS)测量结果表明,随着生长温度的提高,InAlGaN外延层中In的组分单调降低,Al和Ga的组分都有所增加.扫描电镜(SEM)的测试结果表明,在较高温度下(600和590℃)生长的In-AlGaN存在裂纹,580℃生长的四元合金表面比较平整,在570℃温度下生长的InAlGaN表面存在很多颗粒状突起. 相似文献
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Andreas Kraus Heiko Bremers Uwe Rossow Andreas Hangleiter 《Journal of Electronic Materials》2013,42(5):849-853
The initial steps of three different methods for growth of InN were investigated. For this purpose, layers of approximately 15 nm thickness were grown by applying continuous, pulsed or double-pulsed source fluxes. The surface morphologies were investigated by atomic force microscopy and scanning electron microscopy. The structural properties were investigated by reflection high-energy electron diffraction and high-resolution x-ray diffraction. For the continuous and pulsed growth methods, fine-grained structures with grain sizes of approximately 80 nm and 120 nm are observed. In contrast, the double-pulsed growth method leads to surface morphologies made of atomically flat, nearly 2-μm-sized grains. Furthermore, XRD ω scans of the InN (0002) reflection show that the full-width at half-maximum (FWHM) values are smallest for this method. These results were used to develop a new growth method that enables growth of atomically flat InN surfaces without any evidence of metallic In within or on top of the layer. 相似文献
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Wang Baozhu Wang Xiaoliang Wang Xiaoyan Wang Xinhua Guo Lunchun Xiao Hongling Wang Cuimei Ran Junxue Wang Junxi Liu Hongxin Li Jinmin 《半导体学报》2007,28(S1):197-199
Single crystalline InAIGaN films are grown on sapphire substrate by radio-frequency plasma-excited molecularbeam epitaxy (RF-MBE).With the increase of growth temperature,the In content decreases,while the AI and Ga content increase.The InAIOaN grown at high temperature(600℃and 590℃)has some cracks on the surface.The surface of InAl.GaN grown at 580。C is very smoothing.There were SOme hillocks on the surface of InAIGaN film grown at 570℃. 相似文献