Pb(Zr,Sn,Ti)O_3反铁电陶瓷场诱相变性能的改进

为了获得场诱反铁电 (AFEt)—铁电 (FER)相变临界电场Ef 小、电滞ΔE小、场致应变x适当的反铁电陶瓷 ,对Pb(Zr ,Sn ,Ti)O3 采用Ba2 置换Pb2 ,同时在四方反铁电相AFEt—三方铁电FER 相界附近调节Ti/Sn比 ,来控制FER AFEt,AFEt 顺电相 (FEC)之间的相变温度TFA,TC,最终实现了对场诱相变参量 (Ef,ΔE)和反铁电工作温区 (ΔT =TC-TFA)的优化与调节 .获得了ΔE =0 85kV/mm ,Ef=1 6kV/mm ,x =0 1% - 0 2 %可用作开关致动器的新型反铁电陶瓷 .借助于X射线衍射、介电温谱、去极化电流谱、电滞回线等手段得到了这一系统AFEt/FER相界附近的温度 Ti含量相图 .     

Pb(Zr,Sn,Ti)O3反铁电陶瓷的低温相变扩散与极化弛豫

用弱场介电温谱、热释电流谱、强场电滞回线和变温X射线衍射谱研究了微量La掺杂Pb(Zr,Sn,Ti)O₃(PZST)反铁电(AFEt)陶瓷在-100—180℃温区内的结构与电学特性.弱场介电温谱显示,AFEt陶瓷在低温段(-100—50℃)呈现介电频率弥散(0.1—100kHz)和扩散型相变的特征,而变温X射线衍射谱却表明材料在这一温区内保持四方相结构;低温下经强场作用后,AFEt被诱导为亚稳三方铁电态,介电频率弥散消失.基于多元复杂化合物的组分起伏理论,讨论了PZST AFEt陶瓷 关键词： Pb(Zr Sn 3反铁电陶瓷')" href="#">Ti)O₃反铁电陶瓷 反铁电弛豫 相变 变温X射线衍射     

Pb(Zr,Sn,Ti)O3反铁电陶瓷的低温相变扩散与极化弛豫

用弱场介电温谱、热释电流谱、强场电滞回线和变温X射线衍射谱研究了微量La掺杂Pb(Zr ,Sn ,Ti)O3(PZST)反铁电 (AFEt)陶瓷在 - 10 0— 180℃温区内的结构与电学特性 .弱场介电温谱显示 ,AFEt陶瓷在低温段(- 10 0— 5 0℃ )呈现介电频率弥散 (0 1— 10 0kHz)和扩散型相变的特征 ,而变温X射线衍射谱却表明材料在这一温区内保持四方相结构 ;低温下经强场作用后 ,AFEt被诱导为亚稳三方铁电态 ,介电频率弥散消失 .基于多元复杂化合物的组分起伏理论 ,讨论了PZSTAFEt陶瓷的相变扩散与极化弛豫新现象 .     

La调节Pb(Zr,Sn,Ti)O_3反铁电陶瓷的相变与电学性质

利用X射线衍射、弱场介电温度谱、强场极化强度研究了不同La含量(Pb1-xLa2x3)(Zr06Sn03Ti01)O3(000≤x≤012)(PLZSnT)陶瓷的相变与电学特性.实验发现,随La含量增大,室温下材料由铁电三方相(x=000)转变为反铁电四方相(003≤x≤009)和立方相(x=012).介电测试表明,La含量增大,反铁电→顺电相变温度降低,峰值介电常量减小.在x=006的PLZSnT三元相图中,反铁电四方相区扩大到Ti含量约为18at%,该系统反铁电陶瓷具有“窄、斜”型双电滞回线和“三电滞回线”;在高Zr、高Sn区,反铁电→顺电相变呈现弥散相变和介电频率色散特征,即反铁电极化弛豫现象.从ABO3钙钛矿结构的容忍因子(t)和反铁电相的结构特征出发,讨论了La对Pb(Zr,Sn,Ti)O3相变与电学性质的影响机理 关键词： 场诱相变 弛豫型反铁电体 介电性能 La调节Pb(Zr Sn Ti)O3     

等静压诱导的PbLa(Zr,Sn,Ti)O3陶瓷铁电-反铁电相变性能研究

 研究了等静压诱导掺镧La的Pb(Zr,Sn ,Ti)O₃（PLZST）陶瓷材料的铁电-反铁电相变和介电压谱,结果发现介电压谱具有明显的扩散相变和频率弥散的特点,这一现象有利于拓宽人们对压力诱导的多组元弛豫型铁电体的扩散相变行为的认识和理解。     

锰掺杂对Ba(Zr,Ti)O3陶瓷压电与介电性能的影响

采用氧化物固相反应法制备了锰掺杂改性的Ba(Zr_0.06Ti_0.94)O₃陶瓷.研究了锰的掺杂量对Ba(Zr_0.06Ti_0.94)Mn_xO₃ (BZTM)陶瓷的结构、介电和压电性能的影响.实验发现,当锰含量x<0.5 mol%时进入晶格,使材料压电性能提高,损耗减小,表现出受主掺杂的特性;当锰含量x>0.5 mo 关键词： Ba(Zr 3 陶瓷')" href="#">Ti)O₃ 陶瓷 锰掺杂 介电性能 压电性能     

多孔未极化Pb(Zr0.95Ti0.05)O3铁电陶瓷单轴压缩力学响应与相变

通过添加造孔剂的方法制备了四种不同孔隙率未极化PZT95/5铁电陶瓷. 采用非接触式的数字散斑相关性分析(digital image correltation, DIC)全场应变光学测量技术, 对多孔未极化PZT95/5 铁电陶瓷开展了单轴压缩实验研究, 讨论了孔隙率对未极化PZT95/5铁电陶瓷的力学响应与畴变、相变行为的影响. 多孔未极化PZT95/5铁电陶瓷的单轴压缩应力-应变关系呈现出类似于泡沫或蜂窝材料的三阶段变形特征, 其变形机理主要归因于畴变和相变的共同作用, 与微孔洞塌缩过程无关. 多孔未极化PZT95/5铁电陶瓷的弹性模量、压缩强度都随着孔隙率的增加而明显降低, 而孔隙率对断裂应变的影响较小. 预制的微孔洞没有改善未极化PZT95/5铁电陶瓷材料的韧性, 这是因为单轴压缩下未极化PZT95/5铁电陶瓷的断裂机理是轴向劈裂破坏, 微孔洞对劈裂裂纹传播没有起到阻碍和分叉作用. 准静态单轴压缩下多孔未极化PZT95/5铁电陶瓷畴变和相变开始的临界应力都随着孔隙率的增大而呈线性衰减, 但相变开始的临界体积应变却不依赖孔隙率.     

(Pb0.97La0.02)(Zr0.65Sn0.35-xTix)O3反铁电陶瓷的热膨胀性质

在-100～200℃温度范围内，测量了(Pb0．97La0．02)(Zr0．65Sn0．35-xTix)O3(PZST，0．1≤x≤0．14)反铁电陶瓷的热膨胀性质．实验结果表明，组分在0．1≤x≤0．12的试样室温下为反铁电(AFE1)四方相，热膨胀系数(α)在低温段发生“弯曲”，而变温x射线衍射谱(XRD)显示材料保持四方相结构；当Ti含量在0．125≤x≤0．14时，室温下是铁电三方相(FER)，温度升高时FER→AEE1相变体积收缩，AEE1→立方顺电(PEc)相变体积增大；变温XRD谱证明了材料相结构随温度的转变过程．用多元复杂化合物存在纳米线度组分非均匀的观点解释了热膨胀性质随Ti含量演化的物理机理，并得到了该系统的温度-Ti(x)含量相图．     

等静压和温度诱导的PbLa(Zr,Sn,Ti)O3反铁电陶瓷相变和介电性能研究

研究了等静压和温度诱导掺镧La的Pb(Zr,Sn,Ti)O₃(PLZST)陶瓷材料的铁电反铁电相变、介电压力谱和介电温度谱,研究了温度对压致相变和介电压力谱的影响,结果发现温度使铁电反铁电相变压力降低,介电压力谱具有明显的扩散相变和频率弥散的特点;研究了等静压对介电温度谱的影响,结果表明等静压使铁电反铁电相变温度降低,反铁电顺电相变温度升高.这些现象有利于丰富和拓宽人们对温度和压力诱导的多组元弛豫型铁电体和弛豫型反铁电体扩散相变和弛豫行为的认识和理解. 关键词： 等静压和压致相变 铁电反铁电相变 介电压力谱 介电温度谱     

Shock-wave- and hydrostatic-pressure-induced depolarization of Pb(Zr,Sn,Ti)O3 for pulse power applications

Research on quasi-static pressure-induced depolarization illustrates that Pb(Zr,Sn,Ti)O₃ ceramic may be useful in the technology of pulse power. However, lack of knowledge on the shock-induced depolarization hinders this application. To fill this gap, we investigated the shock-wave- and hydrostatic-pressure-induced depolarization of Pb_0.99Nb_0.02[(Zr_0.90Sn_0.10)_0.96Ti_0.04]_0.98O₃ ceramic. In the hydrostatic experiment, complete and sudden depolarization took place at 140 MPa. Shock wave experiments in the normal and axial modes were conducted in the pressure range from 0.81 to 4.50 GPa. At 2.50 GPa, the phase transition occurred completely and the short-circuit current reached 32 A in the normal mode. We obtained 31.0 kV voltage, 0.96 MW and 0.92 J cm^?3 high-voltage pulse with 1000 Ω load. In the axial mode, the shape of the current pulse and its time integral were found to be strongly shock pressure dependent. Our work lays the foundation for the application of Pb(Zr,Sn,Ti)O₃ in the single-use power supply.     

Structure evolution and stoichiometry control of Pb(Zr, Ti)O3 thick films fabricated by electrospray assisted vapour deposition

Well-crystallized and stoichiometric Pb(Zr, Ti)O₃ (PZT) films, typically ∼5 μm thick, with pure perovskite-type rhombohedral structures have been successfully prepared via an electrospray assisted vapour deposition (ESAVD) method. Control of the deposition temperature within a narrow range of 300-400 °C resulted in films with the most desirable phases. PZT films with close stoichiometric match with the expected composition ratio and uniform element distribution were obtained by adding the appropriate levels of excess Pb in the precursor solutions. The annealed films were uniform, dense, compact and adherent to the substrates. The dielectric constant, ?_r, and loss tangent, tan δ, of the fabricated PZT films measured at 10 kHz were 442 and 0.09, respectively. The ESAVD deposited PZT films showed a remanent polarization, P_r, of 15.3 μC/cm² and coercive field, E_c, of 86.7 kV/cm. These results demonstrate the clear potential of the ESAVD method as a promising technique for the fabrication of thick PZT films.     

Modification of ferroelectric hysteresis in Pb(Nb,Zr,Ti)O3 thin films induced by CO2 adsorption

We report on the modification of ferroelectric hysteresis in Pb(Nb,Zr,Ti)O₃ thin films under the adsorption of CO₂ gas. The samples were exposed to the gas in ultra high vacuum while different voltages between the top (Ag) and bottom (Pt) electrodes were applied. After dosing, the samples were heated from room temperature at 1.8 K/s, and a mass spectrometer was used to detect the desorbed molecules. The effective molecular sticking was demonstrated by the appearance of the carbon Auger peak in the surface of the sample and by the presence of CO₂ in the desorption curves. After +(−) 9.9 V were applied to the bottom electrode during dosing, we found a shift of −0.52 (+0.58) μC/cm² in the remnant polarization. These evidences suggest the existence of a depolarizing field induced by molecular adsorption at the surface of the top electrode, and contribute to highlight the potential use of ferroelectric thin films as gas sensors.     

ELECTRICAL PROPERTIES, EQUATIONS OF STATE AND PHASE TRANSITION IN SOLID C60 AT HIGH PRESSURE

Electrical properties and equations of state in solid C₆₀ at room temperature and high pressure have been studied in a diamond anvil cell using capacitance and resistance measurements and a piston-cylinder type device using P-V measurements, respectively. Experimental results by capacitance and P-V measurements indicate that solid C₆₀ also undergoes a phase transition at room temperature and a lower pressure, about 2GPa. The phase transition may be from a face-centered-cubic to a simple-cubic structure.