Influence of solvent on solution processed Cu2ZnSnS4 nanocrystals and annealing induced changes in the optical,structural properties of CZTS film

The well-known quaternary Cu₂ZnSnS₄ (CZTS) chalcogenide thin films are playing an important role in modern technology. The CZTS nanocrystal were successfully prepared by solution method using water, ethylene glycol and ethylenediamine as different solvent. The pure phase material was used for thin film coating by thermal evaporation method. The prepared CZTS thin films were characterized by XRD, Raman spectroscopy, FESEM, XPS and FT-IR spectroscopy. The XRD and Raman spectroscopy analysis revealed the formation of polycrystalline CZTS thin film with tetragonal crystal structure after annealing at 450 ^°C. The oxidation state of the annealed film was studied by XPS. A direct band gap about 1.36 eV was estimated for the film from FT-IR studies, which is nearly close to the optimum value of band gap energy of CZTS materials for best solar cell efficiency. The CZTS annealed thin films are more suitable for using as a p-type absorber layer in a low-cost solar cell.     

Influence of the carrier concentration on the optical absorption edge of n-CuInSe2

The absorption spectra of as-grown and copper-annealed n-CuInSe₂ samples were obtained at room temperature. A shift of the absorption edge to higher energy for the annealed sample as compared to its value in the as-grown sample, is observed in the measurements. This behaviour can be explained as due to the fact that n-CuInSe₂ becomes degenerate at relatively low electron concentration because of its small electron effective mass.     

连续离子层吸附反应沉积后硫化法制备柔性铜锌锡硫薄膜太阳电池

在柔性钼箔衬底上采用连续离子层吸附反应法(successive ionic layer absorption and reaction)制备ZnS/Cu2SnSx叠层结构的预制层薄膜,预制层薄膜在蒸发硫气氛、550 C温度条件下进行退火得到Cu2ZnSnS4吸收层.分别采用EDS,XRD,Raman,SEM表征吸收层薄膜的成分、物相和表面形貌.结果表明,退火后薄膜结晶质量良好,表面形貌致密.用在普通钠钙玻璃上采用相同工艺制备的CZTS薄膜表征薄膜的光学和电学性能,表明退火后薄膜带隙宽度为1.49 eV,在可见光区光吸收系数大于104cm 1,载流子浓度与电阻率均满足薄膜太阳电池器件对吸收层的要求.用上述柔性衬底上的吸收层制备Mo foil/CZTS/CdS/i-ZnO/ZnO:Al/Ag结构的薄膜太阳电池得到2.42%的效率,是目前报道柔性CZTS太阳电池最高效率.     

Effect of annealing on structural and optical properties of lead tungstate microcrystals

Shuttle-like lead tungstate (PbWO₄) microcrystals are synthesized at room temperature using the precipitation method with the cetyltrimethyl ammonium bromide. Results from both the X-ray diffraction and the scanning electron microscopy show that the lattice distortions of the PbWO₄ microcrystals are reduced significantly when the annealing temperature is increased to 873 K. The result from the ultraviolet-visible diffuse reflectance spectroscopy shows that the exciton absorption appears in the sample annealed at 673 K. The self-trapped exciton luminescence due to the Jahn-Teller effect is also observed in the blue band. The interstitial oxygen ions in the WO₄^2- groups are mainly resposible for the enhancement effect of the green luminescence of the annealed samples. The above results are supported by the spectrum analysis of the as-grown and the post-annealed samples using the X-ray photoelectron spectroscopy.     

Heat treatment effects on the structural and electrical properties of thermally deposited AgIn5S8 thin films

The heat treatment effects on structural and electrical properties of thermally deposited AgIn₅S₈ thin films have been investigated. By increasing the annealing temperature of the sample from 450 to 500 K, we observed a change in the crystallization direction from (420) to (311). Further annealing of the AgIn₅S₈ films at 550, 600 and 650 K resulted in larger grain size in the (311) preferred direction. The room temperature electrical resistivity, Hall coefficient and Hall mobility were significantly influenced by higher annealing temperatures. Three impurity levels at 230, 150, and 78 meV were detected for samples annealed at 350 K. The electrical resistivity decreased by four orders of magnitude when the sample annealing temperature was raised from 350 to 450 K. The temperature dependent electrical resistivity and carrier concentration of the thin film samples were studied in the temperature ranges of 25-300 K and 140-300 K, respectively. A degenerate-nondegenerate semiconductor transition at approximately 180 was observed for samples annealed at 450 and 500 K. Similar type of transition was observed at 240 K for samples annealed at 600 and 650 K.     

Effects of in situ thermal annealing on the structural, optical, and electrical properties in Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

Scanning electron microscopy (SEM), Fourier transform infrared (FTIR) transmission, and Hall effect measurements were performed to investigate the structural, optical, and electrical properties of as-grown and in situ-annealed Hg_0.7Cd_0.3Te epilayers grown on CdTe buffer layers by using molecular beam epitaxy. After the Hg_0.7Cd_0.3Te epilayers had been annealed in a Hg-cell flux atmosphere, the SEM images showed that the surface morphologies of the Hg_0.7Cd_0.3Te thin films were mirror-like with no indication of pinholes or defects, and the FTIR spectra showed that the transmission intensities had increased in comparison to that of the as-grown Hg_0.7Cd_0.3Te epilayer. Hall-effect measurements showed that n-Hg_0.7Cd_0.3Te epilayers were converted to p-Hg_0.7Cd_0.3Te epilayers. These results indicate that the surface, optical, and electrical properties of the Hg_1 − xCd_xTe epilayers are improved by annealing and that as-grown n-Hg_1 − xCd_xTe epilayers can be converted to p-Hg_1 − xCd_xTe epilayers by in situ annealing.     

Investigation of the effect of annealing on the magnetic properties of Sn1−xEuxTe single crystals

A study of the effect of annealing on the magnetic properties of single crystals Sn_1−xEu_xTe is reported. The width of the electron paramagnetic resonance line of the crystal is found to decrease upon annealing but its g-value of 1.991 is nearly unaffected. Magnetization results indicate that the pair exchange interaction is weakly antiferromagnetic with a value of −0.67 K for the non-annealed sample and −0.29 K after annealed sample. Susceptibility measurements performed as a function of temperature also indicate the presence of EuTe clusters in the as-grown Sn_1−xEu_xTe crystals. Therefore it was deduced that the Eu²⁺ ions tend to form clusters, particularly pairs, in the as-grown crystal and these clusters disappear after annealing, as the Eu²⁺ ions occupy isolated sites in the SnTe host lattice.     

Effect of laser incident energy on the structural,morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films

The polycrystalline Cu₂ZnSnS₄ (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5–3.0 J/cm². The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm². However, when the laser incident energy was further increased to 3.0 J/cm², leads to degrade the structural, morphological and optical properties of the CZTS thin films.     

Surface morphology of ZnO buffer layer and its effects on the growth of GaN films on Si substrates by magnetron sputtering

ZnO thin films were first prepared on Si(111) substrates using a radio frequency magnetron sputtering system. Then the as-grown ZnO films were annealed in oxygen ambient at temperatures of 700, 800, 900, and 1000°C , respectively. The morphologies of ZnO films were studied by an atom force microscope (AFM). Subsequently, GaN epilayers about 500 nm thick were deposited on the ZnO buffer layers. The GaN/ZnO films were annealed in NH₃ ambient at 900°C. The microstructure, morphology and optical properties of GaN films were studied by x-ray diffraction (XRD), AFM, scanning electron microscopy (SEM) and photoluminescence (PL). The results are shown, their properties having been investigated particularly as a function of the ZnO layers. For better growth of the GaN films, the optimal annealing temperature of the ZnO buffer layers was 900°C.     

XRD, HRTEM, magnetic and Mössbauer studies on chemically prepared Fe-doped nanoparticles of cerium oxide

Nanocrystalline samples of Fe-doped cerium oxide (Ce_0.90Fe_0.1O₂) are prepared by sol-gel method. The precursor materials used for the synthesis are ferric nitrate and cerium nitrate. The as-prepared samples is annealed at different temperatures to obtain the sample with different particle sizes. The crystallographic phases of the nanocrystalline materials have been confirmed by X-ray diffractograms (XRD). The sizes of the nanoparticles estimated from the peaks of the XRD patterns using Debye-Scherrer equation are in the range 6-58 nm. Results extracted from the high-resolution transmission electron microscopy (HRTEM) are in agreement with the findings obtained from XRD. The average magnetic susceptibilities of all the samples with different particle sizes are measured in the temperature range 300-14 K. The average susceptibilities of the samples annealed below ∼740 °C show paramagnetic behaviour. The susceptibilities of the samples annealed at and above ∼740 °C sharply decrease at ∼240 K and this sharp transition is quite likely due to the anti-parallel alignment of Fe³⁺ spins and is attributed to Morin transition of α-Fe₂O₃. Mössbauer spectra of the samples annealed at and above ∼740 °C give sextet patterns indicating the presence of exchange interaction among the Fe³⁺ ions of these samples and these sextets are also of typical nature of the α-Fe₂O₃ phase. The Mössbauer spectra of the samples annealed below ∼740 °C are doublets which may be attributed to either superparamagnetic and/or paramagnetic type nanoparticles.     

Influence of annealing temperature on structural, optical and magnetic properties of Zn0.95Cu0.02Cr0.03O powders

Zn_0.95Cu_0.02Cr_0.03O powders have been synthesized by the sol-gel method and sintered in argon atmosphere under different temperatures. The structural, optical and magnetic properties of the powders were investigated by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), photoluminescence (PL) and vibrating sample magnetometer (VSM). The XRD results demonstrated that Cr and Cu ions are incorporated into ZnO successfully when annealing temperatures were 600 and 700 °C. But when the samples were annealed at 500 °C, the crystallinity of the samples was not very good. However, when the annealing temperature was increased to 800 °C, the secondary phase of Cu and ZnCr₂O₄ appeared in the samples. The PL spectra revealed that the position of the ultraviolet (UV) emission peak of the samples showed a blue shift and the green emission peak enhanced significantly with the annealing temperature increasing from 600 to 700 °C. Magnetic measurements indicated that the room temperature ferromagnetism of Zn_0.95Cu_0.02Cr_0.03O was intrinsic in nature. In addition, the saturation magnetization (Ms) increased from 0.0078 to 0.0088 emu/g with the annealing temperature increased from 600 to 700 °C.     

前驱体和退火温度对Nd2O3薄膜组分影响的定量研究

采用Nd(thd)₃和O₃作为反应前驱体, 利用先进的原子层淀积方法在P型硅(100)衬底上制备了超薄Nd₂O₃介质膜, 并在N₂气氛下进行了退火处理. 采用X射线光电子能谱仪对薄膜样品组分进行分析. 研究结果表明, 淀积过程中将前驱体温度从175 ℃提高到185 ℃后, 薄膜的质量得到提高, O/Nd 原子比达到1.82, 更接近理想的化学计量比, 介电常数也从6.85升高到10.32.     

Effect of annealing on the magnetic properties of Cu-capped ultrathin Co films

We report the effect of intermixing of Cu on the magnetic properties of ultrathin Co films deposited on Si(1 0 0). Rutherford backscattering was employed to determine the extent of intermixing, which increased from 7% in an as-grown sample to nearly 23% when annealed at 400 °C. The as-grown sample showed a higher value of magnetization of 530 emu/cm³, which dropped to 20 emu/cm³ on annealing at 400 °C. The low temperature magnetization behavior of the as-grown Co films showed the presence of both positive and negative exchange bias due to the formation of antiferromagentic domains in parallel with ferromagnetic domains. This behavior is explained using the Malozemoff Random Field Model, which predicted values of exchange bias closely matching the present experimental findings.     

Synthesis, characterization and magnetic properties on nanocrystalline BaFe12O19 ferrite

Single phase BaM (BaFe₁₂O₁₉) ferrites are prepared by using sol–gel method. The preparing conditions of samples are investigated in detail, such as acid/nitrate ratio, the value of pH and annealing temperature. The best conditions on preparing BaFe₁₂O₁₉, which can be obtained on a Fe/Ba ratio of 12, the citric acid contents R = 3, the starting pH of solution is 9, and annealing temperature 950 °C. The thermal decomposition behavior of the dried gel was examined by TG–DSC, the structure and properties of powders were measured respectively by XRD techniques. The magnetic properties of barium ferrites are emphatically researched about the changing crystallite size and annealing temperature by the vibrating sample magnetometer (VSM). Magnetic measurement shows that the barium ferrite samples annealed at 1000 °C has the maximal coercive field of 5691.91 Oe corresponding to the maximal remnant magnetization of 35.60 emu/g and the sample synthesized at 1000 °C has the maximal saturation magnetization of 60.75 emu/g.     

Investigation of structural and optical properties of nanoporous GaN film

The structural and optical characteristics of porous GaN prepared by Pt-assisted electroless etching under different etching durations are reported. The porous GaN samples were investigated by scanning electron microscopy (SEM), high-resolution X-ray diffraction (HR-XRD), photoluminescence (PL) and Raman scattering. SEM images indicated that the density of the pores increased with the etching duration; however, the etching duration has no significant effect on the size and shape of the pores. XRD measurements showed that the (0 0 0 2) diffraction plane peak width of porous samples was slightly broader than the as-grown sample, and it increased with the etching duration. PL measurements revealed that the near band edge peak of all the porous samples were red-shifted; however, the porosity-induced PL intensity enhancement was only observed in the porous samples; apart from that, two additional strain-induced structural defect-related PL peaks observed in as-grown sample were absent in porous samples. Raman spectra showed that the shift of E₂ (high) to lower frequency was only found in samples with high density of pores. On the contrary, the absence of two forbidden TO modes in the as-grown sample was observed in some of porous samples.     

Hard magnetic properties of rapidly annealed NdFeB thin films on Nb and V buffer layers

NdFeB thin films of the form A (20 nm)/NdFeB(d nm)/A(20 nm), where d ranges from 54 to 540 nm and the buffer layer A is Nb or V were prepared on a Si(1 0 0) substrate by magnetron sputtering. The hard Nd₂Fe₁₄B phase is formed by a 30 s rapid anneal or a 20 min anneal. Average crystallite size ranged from 20 to 35 nm with the rapidly annealed samples having the smaller crystallite size. These samples also exhibited a larger coercivity and energy product than those treated by a 20 min vacuum anneal. A maximum coercivity of 26.3 kOe at room temperature was obtained for a Nb/NdFeB (180 nm)/Nb film after a rapid anneal at 725°C. Initial magnetization curves indicate magnetization rotation rather than nucleation of reverse domains is important in the magnetization process. A Brown's equation analysis of the coercivity as a function of temperature allowed us to compare the rapidly annealed and 20 min annealed samples. This analysis suggests that rapid annealing gives higher quality crystalline grains than the 20 min annealed sample leading to the observed large coercivity in the rapidly annealed samples.     

Effect of annealing time on properties of spinel LiNi<Subscript>0.5</Subscript>Mn<Subscript>1.5</Subscript>O<Subscript>4</Subscript> high-voltage lithium-ion battery electrode materials prepared by co-precipitation method

In this wok, a series of LiNi_0.5Mn_1.5O₄ (LNMO) samples with an octahedral shape entirely composed of (111) crystal planes were prepared by calcining the mixture of the precursor Ni_0.25Mn_0.75(OH)₂ and LiOH·H₂O at 800 °C for 15 h in air, followed by annealing them at 600 °C for different dwelling times. Powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and several electrochemical technologies were used to investigate the effect of annealing time on properties of the LNMO samples. XRD analysis indicates that the lattice parameters of the LNMO samples show a decreasing trend with increasing of annealing time, and the impurity peaks become less apparent for the sample annealed for 6 h and almost disappear for the samples annealed for 9 and 24 h. SEM results show that the annealing time has no obvious influence on the morphologies of the LNMO samples. Electrochemical measurements show that the electrochemical performances (capacity, cycle life, and rate capability) of the samples annealed for 6, 9, and 24 h are better than those of the unannealed sample, and the sample annealed for 9 h shows the best electrochemical properties among them due to its superior electrochemical kinetics of Li⁺ insertion/desertion.     

Photoluminescence study of disordering in the cation sublattice of Cu2ZnSnS4

In this study we investigated the influence of the degree of disordering in the cation sublattice on low temperature photoluminescence (PL) properties of Cu₂ZnSnS₄ (CZTS) polycrystals. The degree of disordering was changed by using different cooling rates after post-annealing at elevated temperatures. The results suggest that in the case of higher degree of cation sublattice disorder radiative recombination involving defect clusters dominates at T = 10 K. These defect clusters induce local band gap energy decrease in CZTS. The concentration of defect clusters can be reduced by giving more time for establishing ordering in the crystal lattice. As a result, radiative recombination mechanism changes and band-to-impurity recombination involving deep acceptor defect with ionization energy of about 200 meV starts to dominate in the low temperature PL spectra of CZTS polycrystals.     

Effects of different ions implantation on yellow luminescence from GaN

The influence of C, N, O, Mg, Si and co-implants (Mg+Si) ions implantation with fluences in the wide range 10¹³-10¹⁷ cm⁻² on the yellow luminescence (YL) properties of wurtzite GaN has been studied by photoluminescence (PL) spectroscopy. Two types of n-type GaN samples grown by metal-organic chemical vapor deposition method (MOCVD) and labeled as No-1 and No-2 were studied. In their as-grown states, No-1 samples had strong YL, while No-2 samples had weak YL. Results of the frontside and backside PL measurements in one of the as-grown GaN epifilms are also presented. Comparing the intensity of YL between frontside and backside PL spectra, the backside PL spectrum shows the more intense YL intensity. This implies that most of the intrinsic defects giving rise to YL exist mainly near the interface between the epilayer and buffer layer. Our experimental results show that the intensity ratio of YL to near-band-edge UV emission (I_YL/I_UV) decreases gradually by increasing the C implantation fluence from 10¹³ to 10¹⁶ cm⁻² for No-1 samples after annealing at 900 °C. When the fluence is 10¹⁷ cm⁻², a distinct change of the I_YL/I_UV is observed, which is strongly increased after annealing. For No-2 samples, after annealing the I_YL/I_UV decreases gradually with increase in the C implantation fluence from 10¹³ to 10¹⁵ cm⁻². The I_YL/I_UV is gradually increased with increasing C fluence from 10¹⁶ to 10¹⁷ cm⁻² after annealing, while I_YL/I_UV for other ions-implanted GaN samples decreases monotonically with increase in the ions implantation fluences from 10¹³ to 10¹⁷ cm⁻² for both No-1 samples and No-2 samples. It is noted that for annealed C-implanted No-2 samples I_YL/I_UV is much higher than that of the as-grown one and other ion-implanted ones. In addition, I_YL/I_UV for the Mg, Si, and co-implants (Mg+Si) implanted No-2 samples with a fluence of 10¹³ cm⁻² after being annealed at 900 °C is higher than that of the as-grown one. Based on our experimental data and literature results reported previously, the origins of the YL band have been discussed.     

CL study of yellow emission in ZnO nanostructures annealed in Ar and O2 atmospheres

The yellow emission of thermally treated undoped and In doped ZnO nanostructures was studied by the cathodoluminescence (CL) technique. CL spectra acquired at room temperature of the as-grown samples revealed two emissions at about 3.2 eV and 2.13 eV, corresponding to the near band edge and defect related emissions, respectively. On annealing the samples at 600  ^°C in Ar and O₂ atmospheres, the defect emission suffers a red shift, irrespective of the annealing atmosphere. This red shift is explained in terms of variations in the relative intensities of the two component bands centered at about 2.24 eV and 1.77 eV, which were clearly resolved in the CL spectra acquired at low temperature of the annealed samples. A decrease of the relative intensity of the yellow emission (2.24 eV) was observed for all thermally annealed samples. The annealing of zinc interstitial point defects is proposed as a possible mechanism to explain this intensity decrease.