Coherent Excitation of Gigahertz Range Vibrations in Single Crystal Diamond with a Built-In Graphitized Layer

The paper presents the results of experimental observations of stimulated low-frequency Raman scattering (SLFRS) on acoustic eigenvibration of graphitized layers of different thicknesses in single-crystal diamond volume excited by a nanosecond laser pulse.     

Stimulated Low-Frequency Raman Scattering in a Single-Crystal Diamond with a Buried Graphitized Layer

Optics and Spectroscopy - The results of experimental observation of stimulated low-frequency Raman scattering (SLFRS) in a single-crystal diamond with a buried graphitized layer created as a...     

Coherent Excitation of Sodium Chloride Nanoparticles

We register stimulated low-frequency Raman scattering (SLFRS) caused by laser-pulse interaction with nanoparticle acoustic vibrations in an ethanol suspension of sodium chloride nanoparticles and measure the SLFRS conversion efficiency and threshold. Frequency shifts of scattered light from the exciting light frequency are situated in the gigahertz range. We show that the frequency shifts increase with decrease in the nanoparticle sizes.     

Effective acousto-optical interactions in suspensions of nanodiamond particles

We present experimental investigations of interactions of pulsed-laser radiation with colloid suspensions of detonated nanodiamond particles. We register stimulated low-frequency Raman scattering (SLFRS) with high conversion efficiency.     

Photoluminescence of SiV centers in CVD diamond particles with specific crystallographic planes

We prepared the isolated micrometer-sized diamond particles without seeding on the substrate in hot filament chemical vapor deposition. The diamond particles with specific crystallographic planes and strong silicon-vacancy(SiV) photoluminescence(PL) have been prepared by adjusting the growth pressure. As the growth pressure increases from 2.5 to 3.5 kPa,the diamond particles transit from composite planes of {100} and {111} to only smooth {111} planes. The {111}-faceted diamond particles present better crystal quality and stronger normalized intensity of SiV PL with a narrower bandwidth of 5 nm. Raman depth profiles show that the SiV centers are more likely to be formed on the near-surface areas of the diamond particles, which have poorer crystal quality and greater lattice stress than the inner areas. Complex lattice stress environment in the near-surface areas broadens the bandwidth of SiV PL peak. These results provide a feasible method to prepare diamond particles with specific crystallographic planes and stronger SiV PL.     

Growth of nano-crystalline diamond on single-crystalline diamond by CVD method

Nanocrystalline (NC) diamond films are grown by chemical vapor deposition on various single crystal diamond faces. Under conditions of NC diamond growth, the growing filmmorphology is reduced to two planes: {100} and {111}. The {100} planes are smooth and homoepitaxial layerby-layer growth occurs on them, whereas the NC film formed by twin crystalliteswith sizes of several tens and hundreds nanometers grows on {111} planes. Nitrogen impurity sharply increases the diamond growth rate.     

高温高压下掺硼宝石级金刚石单晶生长特性的研究

本文在5.1—5.6 GPa,1230—1600℃的压力、温度条件下,以FeNiMnCo作为触媒,进行单质硼添加宝石级金刚石单晶的生长研究.借助于有限元法,对触媒内的温度场进行模拟.研究得到了FeNiMnCo-C-B体系下,金刚石单晶生长的P-T相图.该体系下合成金刚石单晶的最低压力、温度条件分别为5.1 GPa,1230℃左右.研究发现,在单晶同一{111}扇区内部,硼元素呈内多外少的分布规律.有限元模拟结果给出,该分布规律是由在晶体生长过程中,{111}扇区的增长速度逐渐减小所致.{111}晶向的晶体生长实验结果表明,硼元素优先从{111}次扇区进入晶体.研究发现,这是该扇区增长速度相对较快,硼元素扩散逃离可用时间短导致的.另外,同磨料级掺硼金刚石单晶生长相比,对于温度梯度法生长掺硼宝石级金刚石单晶,由于晶体的增厚速度较慢,即使硼添加量相对较高,也可以实现表面无凹坑缺陷的优质金刚石单晶的生长.     

Enhanced interface properties of diamond MOSFETs with Al_2O_3 gate dielectric deposited via ALD at a high temperature

The interface state of hydrogen-terminated(C–H) diamond metal–oxide–semiconductor field-effect transistor(MOSFET) is critical for device performance. In this paper, we investigate the fixed charges and interface trap states in C–H diamond MOSFETs by using different gate dielectric processes. The devices use Al_2O_3 as gate dielectrics that are deposited via atomic layer deposition(ALD) at 80℃ and 300℃, respectively, and their C–V and I–V characteristics are comparatively investigated. Mott–Schottky plots(1/C~2–VG) suggest that positive and negative fixed charges with low density of about 1011 cm~(-2) are located in the 80-℃-and 300-℃ deposition Al_2O_3 films, respectively. The analyses of direct current(DC)/pulsed I–V and frequency-dependent conductance show that the shallow interface traps(0.46 e V–0.52 e V and0.53 e V–0.56 e V above the valence band of diamond for the 80-℃ and 300-℃ deposition conditions, respectively) with distinct density(7.8 × 10~(13) e V~(-1)·cm~(-2)–8.5 × 10~(13) e V-1·cm~(-2) and 2.2 × 1013 e V~(-1)·cm~(-2)–5.1 × 10~(13) e V~(-1)·cm~(-2) for the80-℃-and 300-℃-deposition conditions, respectively) are present at the Al_2O_3/C–H diamond interface. Dynamic pulsed I–V and capacitance dispersion results indicate that the ALD Al_2O_3 technique with 300-℃ deposition temperature has higher stability for C–H diamond MOSFETs.     

高长径比柱状金刚石的高温高压合成与机理研究

为了拓展金刚石的种类和解决金刚石工具使用过程中因把持力不足造成的使用寿命降低等, 在中国式六面顶压机上, 通过对FeNi触媒成分和工艺的优化, 成功合成出高质量长径比大于2.5, 平均粒度在0.8—1.0 mm的柱状金刚石晶体. 该晶体独特的形貌, 将极大改善金刚石工具的在使用过程中出现的"脱粒"现象. 另外, 实验中发现, 柱状金刚石晶体的生长速度也远大于传统晶体的生长速度. 采用扫描电镜(SEM)和能谱(EDS)等手段对柱状金刚石晶体及晶体周围触媒成分进行了表征; 结果表明, 柱状金刚石晶体在生长过程中存在{100}和{111}晶面拉长, 以及包覆在晶体周围的触媒成分偏析. 在此基础上, 阐明了柱状晶体生长机理.     

Studying the effect of hydrogen on diamond growth by adding C10H10Fe under high pressures and high temperatures

In this paper, hydrogen-doped industrial diamonds and gem diamonds were synthesized in the Fe–Ni–C system with C₁₀H₁₀Fe additive, high pressures and high temperatures range of 5.2–6.2?GPa and 1250–1460°C. Experimental results indicate similar effect of hydrogen on these two types of diamonds: with the increasing content of C₁₀H₁₀Fe added in diamond growth environment, temperature is a crucial factor that sensitively affects the hydrogen-doped diamond crystallization. The temperature region for high-quality diamond growth becomes higher and the morphology of diamond crystal changes from cube-octahedral to octahedral. The defects on the {100} surfaces of diamond are more than those on the {111} surfaces. Fourier transform infrared spectroscopy (FTIR) results indicate that the hydrogen atoms enter into the diamond crystal lattice from {100} faces more easily. Most interestingly, under low temperature, nitrogen atoms can also easily enter into the diamond crystal lattice from {100} faces cooperated with hydrogen atoms.     

Formation of two-dimensional periodic nanostructures on fused quartz,polyimide, and polycrystalline diamond by pulsed four-wave interference laser modification

Atomic force microscopy is used to examine the topography of submicron periodic structures formed on the surfaces of synthetic polycrystalline diamond and polyimide films. The films are deposited on fused quartz substrates by four-wave interference modification using a pulsed 308-nm UV XeCl excimer laser. It is demonstrated that a two-dimensional periodic relief with a submicron period can be formed on the diamond surface directly by laser evaporation in the absence of a photoresist. Depending on the exposure, two mechanisms of polyimide film modification are observed. At exposures less than 100 mJ/cm², the relief is formed due to swelling at the positions of interference maxima. At exposures greater than 100 mJ/cm², holes are formed in the films. A periodic relief on the fused quartz surface is formed by using a UV photoresist exposed to pulsed interference laser radiation and subsequent Ar ion etching.     

Diamond cleavage: importance to high pressure research

The extraordinary properties of diamond make it the number-one choice for anvils in high pressure experiments involving anvil cells. In much of the literature on the properties of diamond the only cleavage mentioned is {111}. However, experience has shown that diamond anvils made with their [001] axis oriented in line with the principal stress axis of the anvil or at a small angle to it often failed with flat faces having {110} orientations; a cleavage plane is reported in some publications. Analysis of the anisotropy of strength and Poisson ratio in diamond has shown that such orientations do, indeed, favor initial failure on {110} cleavage planes. This analysis, in conjunction with stereographic projections of the {111} and {110} cleavage planes, suggests that a 27° tilt of the [001] axis with respect to the linear stress axis by rotation around the [100] or [010] axis should provide significantly greater resistance to failure by cleaving.     

高温高压下氮氢协同掺杂对{100}晶面生长宝石级金刚石的影响

在压力为5.5–6.2 GPa, 温度为1280–1450 ℃的条件下, 利用温度梯度法详细考察了氮氢协同掺杂对100晶面生长宝石级金刚石的影响. 实验结果表明伴随合成腔体内氮、氢浓度的升高, 合成条件明显升高, 金刚石生长V形区间上移; 晶体的红外光谱中与氮相关的吸收峰急剧增强, 氮含量可达2000 ppm, 同时位于2850 cm^-1和2920 cm^-1对应于 sp³杂化 C–H 键的对称伸缩振动和反对称伸缩振动的红外特征峰逐渐增强, 表明晶体中既有高的氮含量, 同时又含有氢. 对晶体进行电镜扫描发现, 氮氢协同掺杂对晶体形貌影响明显, 出现拉长的{111}面, 且晶体表面上有三角形生长纹理. 拉曼测试表明, 晶体的峰位向高频偏移、半峰宽变大, 说明氮、氢杂质的进入对晶体内部产生了应力. 本文成功地以{100}晶面为生长面合成出高氮含氢宝石级金刚石单晶, 在探究氮氢共存环境下金刚石生长特性的同时, 也可为理解天然金刚石的形成机理提供帮助.     

Electron behaviour in CH4／H2 gas mixture in electron-assisted chemical vapour deposition

The behaviour of electrons in CH_{4}/H_{2} gas mixture in electron-assisted chemical vapour deposition of diamond is investigated using Monte Carlo simulation. The electron drift velocity in gas mixture is obtained over a wide range of E/P (the ratio of the electric field to gas pressure) from 1500 to 300000 (V/m kPa^{-1}). The electron energy distribution and average energy under different gas pressure (0.1－20kPa) and CH_{4} concentration (0.5%－10.0%) are calculated. Their effects on the diamond growth are also discussed. It is believed that these results will be helpful to the selection of optimum experimental conditions for high quality diamond film deposition.     

Dependence of Limited Growth Rate of High-Quality Gem Diamond on Growth Conditions

The growth rate of diamond has been investigated for a long time and researchers have been attempting to enhance the growth rate of high-quality gem diamond infinitely. However, it has been found according to previous research results that the quality of diamond is debased with the increase of growth rate. Thus, under specific conditions, the growth rate of high-quality diamond cannot exceed a limited value that is called the limited growth rate of diamond. We synthesize a series of type Ib gem diamonds by temperature gradient method under high pressure and high temperature （HPHT） using the as-grown {100} face. The dependence of limited growth rate on growth conditions is studied. The results show that the limited growth rate increases when synthetic temperature decreases, also when growth time is prolonged.     

氮掺杂金刚石{100}晶面的缺陷发光特性

氮是金刚石中最常见的杂质之一, 其对金刚石的缺陷发光具有重要的影响. 氮可以与金刚石中的本征缺陷形成复合缺陷. 本文首先利用阴极射线发光照片(CL)对一个高温高压合成的氮掺杂金刚石进行表征, 发现{100}晶面为蓝色, 然后利用透射电子显微镜(TEM)对该晶面进行电子辐照及后续退火处理, 以引入本征点缺陷进而形成含氮的复合缺陷, 并利用低温光致发光光谱(PL光谱)表征其缺陷发光特性, 发现该晶面主要以氮-空位复合缺陷(NV中心)发光为主, 并伴随着较弱的503 nm发光. 关键词： 金刚石 缺陷 发光     

Anisotropy of the mean free paths of phonons in single-crystal films of germanium,silicon, and diamond at low temperatures

The physical aspects of the influence of the elastic energy anisotropy of crystals on the anisotropy of the mean free paths of phonons in single-crystal films of germanium, silicon, and diamond in the diffuse scattering of phonons at the boundaries of the samples have been considered. It has been shown that, for sufficiently wide films of germanium, silicon, and diamond with the {100} and {111} orientations and the lengths of less than or equal to their width, the phonon mean free paths are isotropic (independent of the direction of the temperature gradient in the plane of the film). The anisotropy of the phonon mean free paths depends primarily on the orientation of the film plane and is determined by the focusing and defocusing of phonon modes. For single-crystal films of germanium, silicon, and diamond with the {100} and {111} orientations and lengths much larger than their width, the phonon mean free paths are anisotropic.     

CVD金刚石薄膜孪晶形成的原子机理分析

采用X射线衍射技术、电子背散射衍射技术和扫描电镜分别观察了不同甲烷浓度条件下沉积的CVD自支撑金刚石薄膜的宏观织构、晶界分布和表面形貌. 研究了一阶孪晶在金刚石晶体{111}面生长的原子堆垛过程. 结果表明，由于一阶孪晶〈111〉60°的取向差关系以及{111}面的原子堆垛结构，使{111}面上容易借助碳原子的偏转沉积产生一阶孪晶. 低甲烷浓度时，碳原子倾向于在表面能较低的{111}面沉积，为孪晶的形成提供了便利，且高频率孪晶使薄膜织构强度减弱. 甲烷浓度升高使生长激活能较小的{001}面成为主要前沿生长面，因而只有〈001〉晶向平行薄膜法向的晶粒能够不断长大，因此孪晶形核概率明显减小. 另外，在薄膜中发现二阶孪晶，并对二阶孪晶的形成进行了分析. 关键词： 金刚石薄膜 孪晶 原子机理 取向差     

Probing nanoscale solids at thermal extremes

We report a novel nanoscale thermal platform compatible with extreme temperature operation and real-time high-resolution transmission electron microscopy. Applied to multiwall carbon nanotubes, we find atomic-scale stability to 3200 K, demonstrating that carbon nanotubes are more robust than graphite or diamond. Even at these thermal extremes, nanotubes maintain 10% of their peak thermal conductivity and support electrical current densities approximately 2 x 10{8} A/cm{2}. We also apply this platform to determine the diameter dependence of the melting temperature of gold nanocrystals down to three nanometers.     

化学汽相沉积金刚石生长表面氢原子覆盖率的研究

化学汽相沉积金刚石生长表面的悬挂键是其赖以成核和生长的表面活性格点。但是两个以上悬挂键聚集在一起时,局部表面能量比较高,悬挂键之间容易发生重构,形成π键或者dimer键,成为石墨结构的生长基样点。因此,金刚石的生长主要依赖于表面上的单个悬挂键集团和气相中的碳氢活性基团。石墨则主要依赖于表面上的多个悬挂键组成的集团,石墨的生长可以被表面附近活性氢原子的刻蚀作用所抑制。对表面悬挂键的微观分布状态的统计计算结果表明,(111)和(100)生长表面的氢原子覆盖率分别为0.86单层(ML)和0.80ML时,单位表面