共查询到20条相似文献,搜索用时 46 毫秒
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从弥补仪器的缺陷和不确定度评定出发,得出减小测量误差的常用测量方法有:替代法、对称观测法、补偿法、差值法、交换法和累计放大法。 相似文献
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针对舰船不同安装基座间相对变形的高精度测量要求,提出了一种利用单摄像机三维姿态测量原理和亚像素定位法,通过若干台摄像机进行传递测量船体变形的方法,来解决对两个或多个不通视安装基座之间相对变形进行高精度测量的问题。分别对单摄像测量和多级摄像传递测量进行了测量精度分析,采用4台2K×2K分辨率的摄像机进行传递测量,测量精度优于23″。该方法在舰船上较易实施,且精度较高。 相似文献
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调制度测量轮廓术的系统标定 总被引:4,自引:4,他引:0
调制度测量轮廓术是一种采用垂直测量方式的三维面形测量方法,可以测量表面有剧烈变化区域的复杂物体。提出了一种基于调制度测量轮廓术测量系统的标定方法,其纵向标定是利用几个相互平行的标定平面建立与CCD像面各像素点对应的测量高度与实际高度之间的映射关系,并利用映射关系确定每一像素点对应的映射关系系数,然后建立映射关系系数查找表,存人测量系统中,完成纵向标定。首先分析了测量系统的误差来源,然后给出了标定方法和标定过程,最后给出了实测结果。结果表明,利用提出的系统标定方法可以有效消除调制度测量轮廓术测量系统误差,显著地提高了系统测量精度。 相似文献
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调制度测量轮廓术在复杂面形测量中的应用 总被引:7,自引:3,他引:4
调制度测量轮廓术(MMP)是将物体的高度信息编码在投影到待测物面上的正弦条纹的调制度信息中,可以实现对物体的垂直测量,特别适合测量表面有高度剧烈变化或不连续区域的物体。探讨了基于傅里叶变换的调制度测量轮廓术在复杂面形测量中的应用,提出了调制度焦深的概念并详细分析了调制度焦深对测量的影响,以调制度焦深为基础从测量系统设计的角度提出了提高测量精度的具体措施,给出了实验系统设计方案,讨论了影响测量精度的几个实际问题及解决方案。对复杂面形和深孔物体的实测结果表明,基于傅里叶变换的调制度测量轮廓术测量复杂面形物体可以达到较高的测量精度。 相似文献
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We derive a master equation describing the evolution of a quantum system subjected to a sequence of observations. These measurements occur randomly at a given rate and can be of a very general form. As an example, we analyse the effects of these measurements on the evolution of a two-level atom driven by an electromagnetic field. For the associated quantum trajectories we find Rabi oscillations, Zeno-effect type behaviour and random telegraph evolution spawned by mini quantum jumps as we change the rates and strengths of measurement. 相似文献
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A. V. Burlakov L. A. Krivitskii S. P. Kulik G. A. Maslennikov M. V. Chekhova 《Optics and Spectroscopy》2003,94(5):684-690
A method of optical realization of a protocol of restoration of the density matrix of an unknown state of a three-level system that represents an arbitrary polarization state of a single-mode biphoton field is proposed. The method is applied to a set of pure states of qutrits, with this set being determined by the properties of SU(2) transformations performed by polarization transformers (retardation plates). 相似文献
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基于双光栅的纳米测量方法 总被引:5,自引:3,他引:2
针对两个物体或平面的相对位移和间隙的纳米级变化量,提出并研究了一种光栅测量方法.采用两组周期接近的微光栅重叠可以产生一组周期分布的条纹,条纹的周期相对于两光栅周期被大幅度放大,并将光栅间的位移反应在条纹的相位信息中.建立了关于双光栅产生叠栅条纹的复振幅分布的近似理论模型.基于该模型设计了一种能够测量两个平行平面相对位移和间隙的方法.针对光栅移动产生相应条纹的过程进行了数值计算.结果表明,两个平行平面的相对微位移将引起相应条纹的大位移,并且该方法最终能在纳米级以内分辨两平面(物体)的相对位移或者间隙变化量. 相似文献
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报道了在新建成的放射性次级束流线上完成的20Na的β+缓发α粒子发射20Na—→β+ 20Ne→16O+α的在束测量.通过飞行时间和能损符合的方法实现20Na次级束流的在束鉴别与调制.在束和停束两个获取时段分别完成对次级束流和β+缓发粒子的记录.利用脉冲发生器和记数器实现20Na缓发粒子衰变半衰期的测量.实验测量到20Ne几个低能共振能级的衰变能量分别为2.69,3.09,4.74,5.54MeV,相对强度分别为100,4.15,1.10,15.20.测量到20Na的β+缓发α衰变的半衰期为(459±7)ms,与现有的核数据基本上吻合. 相似文献
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Burleson GR Faucett JA Fontenla CA Garnett RW Rawool MW Ditzler WR Hill D Hoftiezer J Johnson KF Lopiano D Shima T Shimizu H Spinka H Stanek R Underwood D Wagner R Yokosawa A Bhatia TS Glass G Hiebert JC Kenefick RA Nath S Northcliffe LC Damjanovich R Jarmer JJ Jeppesen RH Tripard GE 《Physical review letters》1987,59(15):1645-1648
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相位测量和频振动光谱(SFG)可以获得物质表面分子取向等信息,但在实验重复性、实验设计和界面分析等方面仍有一些关键问题没有解决.相位误差会引起光谱变化并误导界面结构分析,因此分析并准确控制误差是相位测量S FG的关键技术.使用z-切石英作为相位标准,测量了修饰在熔融石英基底上的十八烷基三氯硅烷(OTS)在C—H振动波段... 相似文献
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Richard Healey 《Foundations of Physics Letters》1993,6(4):307-316
Albert and Loewer[1] have recently clarified their earlier objection to the interactive interpretation presented in Healey[2]. They now charge that this interpretation fails to solve a problem of which the measurement problem is but a special case. The general problem is to reconcile quantum mechanics with theprima facie determinateness of such dynamical properties as the positions of macroscopic objects. In response I defend both the preeminent significance of determinate measurement outcomes and the claim that the models of Healey[3] go a long way toward securing their determinateness.1. They note ironically that the proponent of this interpretation must argue that since a natural measure of the set of states whose biorthonormal expansion has equal amplitudes is zero these states should be neglected. In fact these states werenot neglected in Healey[2] (see pp. 98-100) where I argued that even though the resulting indeterminateness in any such states would be real, it would be rapidly removed by subsequent environmental interactions. 相似文献
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投影光刻机硅片调焦调平测量模型 总被引:4,自引:1,他引:4
成像质量是光学光刻机的最主要指标,硅片调焦调平测量是光刻机控制成像质量的基础.为此建立了硅片调焦调平测量系统单个测量点的测量模型,并根据硅片形貌标准和集成电路尺寸标准,推导了近似运算规则,简化了曝光场高度与测量光斑在光电探测器上的位置之间的数学关系.运用最小二乘法和平面拟合曝光场曲面的方法,推导了基于多个测量点的曝光场高度和倾斜测量的数学模型.该模型能满足调焦调平实时测量和控制的需要,可用于测量精度优于10 nm的高精度调焦调平测量系统,能满足线宽小于100 nm投影步进扫描光刻机的需要. 相似文献
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The plasma presheath in a multidipole device was measured by an emissive probe using the inflection-point method in the limit of zero emission. The temporal evolution of ion-acoustic waves was also measured. Results are compared. It is shown that the potential in the bulk of the plasma is describable by a simplified version of the plasma-sheath equation. Inclusion of finite ion temperature has a negligible effect on the predicted results compared to the inclusion of the primary electrons in the theory. 相似文献
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The objectivity is a basic requirement for the measurements in the classical world, namely, different observers must reach a consensus on their measurement results, so that they believe that the object exists “objectively” since whoever measures it obtains the same result. We find that this simple requirement of objectivity indeed imposes an important constraint upon quantum measurements, i.e., if two or more observers could reach a consensus on their quantum measurement results, their measurement basis must be orthogonal vector sets. This naturally explains why quantum measurements are based on orthogonal vector basis, which is proposed as one of the axioms in textbooks of quantum mechanics. The role of the macroscopicality of the observers in an objective measurement is discussed, which supports the belief that macroscopicality is a characteristic of classicality. 相似文献