Generation of second optical harmonic and magnetooptical Kerr effect in ferromagnet-semiconductor heterostructures CaF2/MnAs/Si(111)

The second optical harmonic generation and magnetooptical Kerr effect are investigated for the light (λ=800 nm) reflected by ferromagnet-semiconductor heterostructures CaF₂/MnAs/Si(111). The observed change in the second-harmonic intensity is odd in magnetization. A phenomenological analysis of possible contributions to the second harmonic is carried out, and the sources of optically nonlinear signals are determined from the experimental azimuthal dependences of the light intensity at double frequency. The difference in the field dependences of the second harmonic and the magnetooptical Kerr effect is observed.     

Magneto-optical phenomena in MnAs/CaF2/Si(111) epitaxial films in a transverse magnetic field

Field and angular dependences of the rotation of the plane of polarization in a transverse magnetic field H⊥k under normal reflection of light (λ=633 nm) have been studied in MnAs ferromagnetic epitaxial films grown by MBE on CaF₂/Si(111) substrates. The angle of rotation of the plane of polarization a is shown to be determined by contributions even and odd in the magnetization M. The odd contribution is associated with the deviation of the easy plane of magnetic anisotropy from the film plane, which originates from misorientation of the Si surface from the (111) plane, or from a presence of small regions of ( )-oriented MnAs. The even contribution is due to the optical anisotropy of films connected with quadratic-in-M terms in the dielectric permittivity tensor ɛ _ij of manganese arsenide. A method based on measuring the angular dependences of a in a rotating magnetic field is proposed to separate these contributions. Fiz. Tverd. Tela (St. Petersburg) 41, 110–115 (January 1999)     

Growth of high quality CoSi2/Si - superstructures on Si (111)

Using a newly developed solid phase epitaxy technique (SPE) it is shown that ultrathin essentially pinhole-free CoSi₂ layers can be grown epitaxially on Si (111). These form the basis of a number of short period metal/semiconductor superlattices that have been grown by combining SPE-grown CoSi₂ with MBE-grown Si. Substrate temperatures for Si-MBE have to be chosen very low (≈ 350 °C) in order to avoid a roughening of the layers.     

Formation of CrSi2 nanoislands on Si(111)7 × 7 and epitaxial growth of silicon overlayers in Si(111)/CrSi2 nanocrystallites/Si heterostructures

Low-energy electron diffraction and differential reflectance spectroscopy are used to study the self-formation of chromium disilicide (CrSi₂) nanoislands on a Si(111) surface. The semiconductor properties of the islands show up even early in chromium deposition at a substrate temperature of 500°C, and the two-dimensional growth changes to the three-dimensional one when the thickness of the chromium layer exceeds 0.06 nm. The maximal density of the islands and their sizes are determined. The MBE growth of silicon over the CrSi₂ nanoislands is investigated, an optimal growth temperature is determined, and 50-nm-thick atomically smooth silicon films are obtained. Ultraviolet photoelectron spectroscopy combined with the ion etching of the specimens with embedded nanocrystallites demonstrates the formation of the valence band, indicating the crystalline structure of the CrSi₂. Multilayer epitaxial structures with embedded CrSi₂ nanocrystallites are grown.     

Si(111)衬底上GaN的MOCVD生长

利用LP-MOCVD在Si（111）衬底上,以高温AIN为缓冲层,分别用低温GaN（LT-GaN）和偏离化学计量比富Ga高温GaN（HT-GaN）为过渡层外延生长六方相GaN薄膜。采用高分辨率双晶X射线衍射（DCXRD）,扫描电子显微镜（SEM）,原子力显微镜（AFM）和室温光致荧光光谱（RT-PL）进行分析。结果表明,有偏离化学计量比富Ga HT-GaN为过渡层生长的GaN薄膜质量和光致荧光特性均明显优于以LT-GaN为过渡层生长的GaN薄膜,得到GaN（0002）和（1012）的DCXRD峰,其半峰全宽（FWHM）分别为698s和842s,室温下的光致荧光光谱在361nm处有一个很强的发光峰,其半峰全宽为44．3meV。     

Growth Kinetics of Silicon Carbide Film Prepared by HeatingPolystyrene/Si(111)

在不同的温度下热处理用sol-gel法制的PS/Si(111)叠层凝胶膜制备出了SiC薄膜．用XRD、SEM、XPS、FTIR等分析方法研究了SiC薄膜的结构、组成和表面形貌等．根据FTIR光谱计算了不同温度下得到的SiC薄膜的厚度,并研究了PS/Si(111)热解法生长SiC薄膜的生长动力学．结果表明,随着生长温度的增加,SiC薄膜生长速率变化趋势为：1200～1250 oC生长速率增加缓慢是2D生长机制,1250～1270 oC生长速率快速增加是3D生长机制,1270～1300 oC生长速率为负增长是由于SiC薄膜生长与Si和C原子的挥发共同作用所致．由速率变化求得各段表观生长激活能分别是122.5、522.5、-127.5 J/mol．     

Ge/Si(111)与Si/Ge(111)体系的生长特性与表面再构研究

本文利用RHEED和AES对Ge/Si(111)和Si/Ge(111)体系的生长特性与表面再构进行了研究。由此提出了其生长模式,并讨论了应力对生长特性、界面特性和表面再构的作用。     

Pulsed KrF laser deposited GaN/TiN/Si(111) heterostructures by sequential TiN and liquid Ga laser ablation

GaN/TiN heterostructures were deposited on 4° miscut Si(111) substrates by pulsed KrF laser ablation of TiN through vacuum, followed by reactive pulsed KrF laser ablation of liquid Ga through 70-75 mTorr of microwave-activated NH₃. Deposition temperatures of 950 °C and 1050 °C were employed for the TiN layer while 900 °C was employed for the GaN layer. The targets were positioned 5 cm from the substrate and ablated by using a reimaging beamline at a nominal energy density of 3-4 J/cm². X-ray diffraction (XRD) revealed a highly textured heterostructure with GaN(0001)//TiN(111)//Si(111) and with a rocking curve width for both GaN(0001) and TiN(111) equal to ~1.1°. The mosaic spread through the TiN(001) reflection was ~1.3°, whereas that of the GaN(101_1) was undetectable because of low S/N. Scanning electron microscopy revealed large oriented 10 7m-sized hexagonal crystallites decorating large depressions in the TiN film with many smaller pits also present. The effect of substrate processing and TiN film processing on pit formation was explored.     

Temperature dependence of the built-in electric field strength of AlGaN/GaN heterostructures on Si(111) substrate

Photoreflectance spectroscopy was used to measure the barrier electric field strength F of as-grown AlGaN/GaN heterostructures on Si(111) substrate with two-dimensional electron gases in the temperature range from 80 up to 295 K. The Al-contents were in the range from 12 to 20%. Despite the difference of Al-contents and the large temperature variation we find only minute changes of F. This behaviour is explained by an almost constant strain state and thus a constant piezoelectric polarisation, which was concluded from the analysis of the GaN free excitonic transitions observed by photoluminescence excitation spectroscopy. Self-consistent conduction band calculations point to a pinning of the potential of the bare surface at 0.6 V, attributed to a large density of surface donor states.     

Simulation of Surfactant Effects on Growth of Semiconductor Hetero-Epitaxial Sb-Ge/Si(111)

A kinetic Monte Carlo simulation is performed in order to study the effect of Sb as a surfactant on the growth of Ge/Si(111). In our model the exchange mechanism between Ge and Sb atoms and the re-exchange mechanism in which the exchanged Ge adatom re-exchange with the lifted Sb atom to return to the surfactant layer, are considered. Our simulation shows the re-exchange process plays an important role on the growth mode transition in Ge/Sb/Si(111)
system. The influences of the substrate temperature and the deposition rate on the growth of Ge/Sb/Si(111) system is discussed.     

Growth and ordering of Ni(II) diphenylporphyrin monolayers on Ag(111) and Ag/Si(111) studied by STM and LEED

The room temperature self-assembly and ordering of (5,15-diphenylporphyrinato)nickel(II) (NiDPP) on the Ag(111) and Ag/Si(111)-(√3 × √3)R30° surfaces have been investigated using scanning tunnelling microscopy and low-energy electron diffraction. The self-assembled structures and lattice parameters of the NiDPP monolayer are shown to be extremely dependent on the reactivity of the substrate, and probable molecular binding sites are proposed. The NiDPP overlayer on Ag(111) grows from the substrate step edges, which results in a single-domain structure. This close-packed structure has an oblique unit cell and consists of molecular rows. The molecules in adjacent rows are rotated by approximately 17° with respect to each other. In turn, the NiDPP molecules form three equivalent domains on the Ag/Si(111)-(√3 × √3)R30° surface, which follow the three-fold symmetry of the substrate. The molecules adopt one of three equivalent orientations on the surface, acting as nucleation sites for these domains, due to the stronger molecule-substrate interaction compared to the case of the Ag(111). The results are explained in terms of the substrate reactivity and the lattice mismatch between the substrate and the molecular overlayer.     

Triangular Mott-Hubbard insulator phases of Sn/Si(111) and Sn/Ge(111) surfaces

The ground state of Sn/Si(111) and Sn/Ge(111) surface alpha phases is reexamined theoretically, based on ab initio calculations where correlations are approximately included through the orbital dependence of the Coulomb interaction (in the local density+Hubbard U approximation). The effect of correlations is to destabilize the vertical buckling in Sn/Ge(111) and to make the surface magnetic, with a metal-insulator transition for both systems. This signals the onset of a stable narrow gap Mott-Hubbard insulating state, in agreement with very recent experiments. Antiferromagnetic exchange is proposed to be responsible for the observed Gamma-point photoemission intensity, as well as for the partial metallization observed above 60 K in Sn/Si(111). Extrinsic metallization of Sn/Si(111) by, e.g., alkali doping, could lead to a novel 2D triangular superconducting state of this and similar surfaces.     

CoSi2/Si (111) Interface study by X-ray standing waves

Summary The CoSi₂/Si (111) interface has been studied with the X-ray standing-wave technique. The interface (a 49? thick CoSi₂ layer) has been epitaxially grown on Si (111) under ultrahigh vacuum andin situ characterized with Auger spectroscopy and low-energy electron diffraction. The perpendicular lattice mismatch between epilayer and substrate has been measured with double-crystal X-ray diffraction. The X-ray standing-wave analysis gives clear indication that the Co atoms are fivefold coordinated at the interface. This work has been partially supported by Progetto Finalizzato ?Materiali e dispositivi per l'Elettronica a Stato Solido?.