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1.
The effect heat treatment has on the electrotransport mechanisms in films of ZnO and In 2O 3, and in a multilayer (In 2O 3/ZnO) 83 structure obtained via ion-beam sputtering, is studied. It is shown that there is a mechanism of weak electron localization in the In 2O 3 and (In 2O 3/ZnO) 83 samples. The relaxation processes that occur during the heat treatment of In 2O 3 films are found to increase the length of elastic electron scattering, but to reduce this parameter in multilayer heterostructures. 相似文献
2.
In this study, SnO 2 and ZnO were co-doped in In 2O 3, and the phase development and electrical characteristics were examined. When Zn 2+ was added to 20 at.% Sn 4+ contained In 2O 3, in which a large amount of In 4Sn 3O 12 second phase exists, the amount of the second phase decreased as the content of Zn 2+ increased, which promoted grain growth and increased carrier mobility. In the case of a simultaneous substitution of Sn 4+ and Zn 2+ into In 2O 3 with almost the same atomic ratio, a large grain size without second phase was observed, while small grain sizes with many second phases were developed when Sn 4+ and Zn 2+ were added with different atomic ratios. The electrical characteristics analyzed by Hall effect measurement showed that the electron mobility and conductivity showed a close relationship with the microstructure, while the carrier concentration was almost constant regardless of the Zn 2+ content. 相似文献
3.
Octahedral In 2O 3 crystals were synthesized by evaporation of a mixture of In 2O 3 and graphite in a horizontal double-tube system. By adjusting the experimental conditions, In 2O 3 nanowires and nanobelts were also obtained. The microstructures of the resultant In 2O 3 materials were characterized by scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), selected-area electron diffraction (SAED), X-ray diffraction. In addition, the growth mechanism of the octahedral In 2O 3 crystals was discussed in detail. 相似文献
4.
A study of electrical and electrochemical properties of a dense In 2O 3 electrode in contact with a single crystal YSZ electrolyte was carried out by d.c. and a.c. methods. As a result, it was found that dense In 2O 3 electrodes have high electrical conductivity but very low electrochemical activity. In a vicinity of the equilibrium potential and under the anodic polarisation, the rate of Faraday reaction at the In 2O 3 electrodes was as low as to consider the electrode a blocking one. The blocking properties of the In 2O 3 electrodes were used to measure the hole conductivity of the YSZ electrolyte in the temperature range between 795 to 1163 K and oxygen partial pressure from 1 to 10 5 Pa. A comparison with the literature data confirmed that the dense In 2O 3 electrode blockes the ionic transfer through the YSZ. A set of experiments indicated that the oxygen exchange between the indium oxide surface presented to the oxygen containing gaseous phase and this phase is very poor. A route of the electrode process at O 2, In 2O 3 / YSZ electrode was proposed a limiting stage of which is the discharge of the oxygen ions to the atomic oxygen adsorbed on the electrode surface: $$O_0 ^x \left( {In_2 O_3 } \right)_s = V_0 ^{ \bullet \bullet } \left( {In_2 O_3 } \right)_s + O_{ad} \left( {In_2 O_3 } \right)_s + 2e'\left( {In_2 O_3 } \right).$$ The polarisation resistance decreases when platinum or the praseodymium oxide is deposited on the surface of the In 2O 3 electrodes. The cathodic polarisation also increases the electrochemical activity of the electrodes. Both the establishment of the steady state of the electrode under polarisation and the recovery of the equilibrium state by the electrode are very long processes, which are probably related to the diffusion mechanism by which the stoichiometry of the indium oxide is changed. 相似文献
5.
Ordered and perpendicular columnar arrays of In 2O 3 were synthesized on conducting ITO electrode by a simple glancing angle deposition (GLAD) technique. The as-deposited In 2O 3 columns were investigated by field emission gun-scanning electron microscope (FEG-SEM). The average length and diameter of the columns were estimated ~400 nm and ~100 nm, respectively. The morphology of the structure was examined by transmission electron microscopy (TEM). X-ray diffraction (XRD) analysis shows the polycrystalline nature of the sample which was verified by selective area electron diffraction (SAED) analysis. The growth mechanism and optical properties of the columns were also discussed. Optical absorption shows that In 2O 3 columns have a high band to band transition at ~3.75 eV. The ultraviolet and green emissions were obtained from the In 2O 3 columnar arrays. The P-N junction was formed between In 2O 3 and P-type Si substrate. The GLAD synthesized In 2O 3 film exhibits low current conduction compared to In 2O 3 TF. However, the Si/GLAD-In 2O 3 detector shows ~1.5 times enhanced photoresponsivity than that of Si/In 2O 3 TF. 相似文献
6.
Single-crystal ZnO has been hydrothermally grown with additional In 2O 3 in the solution. Schottky barrier contacts have been deposited by electron beam evaporation of Pd onto the face. Capacitance–voltage measurements have been performed to reveal the carrier concentration as a function of the In 2O 3 content in the solution, and secondary-ion mass spectrometry was used to measure the resulting In concentration in the samples. For an In 2O 3 content of 2×10 19 cm −3, the average free electron concentration increased to 5×10 18 cm −3 compared to 4×10 17 cm −3 for the non-doped material. An increase of the In 2O 3 content to 4×10 19 cm −3 leads to a measured carrier concentration of approximately 1×10 19 cm −3; however, only up to a quarter of the incorporated In became electrically active. From thermal admittance spectroscopy measurements two prominent electronic levels are found, and compared with to the non-doped material case, the freeze-out of the shallow doping in the In-doped samples takes place at lower temperatures (below 80 K). 相似文献
7.
Abstract MgO implanted at room temperature with 150keV In + ions and doses ranging from 10 15 to 10 17 ions cm ?2 was studied by optical absorption and transmission electron microscopy (TEM). Creation of defects in the anionic sublattice (F-, F +-, F 2-centers) and in the cationic sublattice (V ?-centers) are observed. Subsequent annealings of the implanted crystals have shown different behaviours depending on the implanted dose. For medium dose (2 × 10 16 ions cm ?2), the formation of In 3+ species seems to be the preponderant phenomenon. At higher dose (8 × 10 16 ions cm ?2), metallic precipitates are formed between 400 and 700°C. The identification of these precipitates has been achieved using TEM: they are formed of a metallic alloy Mg 3In with a hexagonal structure and their orientation relationship with respect to the MgO matrix is: (0001)Mg 3In//(111)Mgo and [1120] Mg3In// [l10]MgO. 相似文献
8.
Monodisperse indium oxide (In 2O 3) nanoparticles (NPs) with the average diameter of 11 nm were prepared by a solvothermal method. The In 2O 3 NPs were characterized by X-ray diffraction, Raman and transmission electron microscopy. The intrinsic nature of ferromagnetism in In 2O 3 NPs has been established with the experimental observation of magnetic hysteresis loop. Photoluminescence and UV–visible studies were employed to evidence the presence of oxygen vacancies and revealed that the oxygen vacancies contribute to the ferromagnetism. The origin of ferromagnetism in In 2O 3 NPs may be due to exchange interactions among localized electron spin moments resulting from oxygen vacancies. 相似文献
9.
SnO 2-core/In 2O 3-shell nanobelts were fabricated by a two-step process comprising thermal evaporation of Sn powders and sputter-deposition of In 2O 3. Transmission electron microscopy and X-ray diffraction analyses revealed that the core of a typical core–shell nanobelt comprised a simple tetragonal-structured single crystal SnO 2 and that the shell comprised an amorphous In 2O 3. Multiple networked SnO 2-core/In 2O 3-shell nanobelt sensors showed the response of 5.35% at a NO 2 concentration of 10 ppm at 300 °C. This response value is more than three times larger than that of bare-SnO 2 nanobelt sensors at the same NO 2 concentration. The enhancement in the sensitivity of SnO 2 nanobelts to NO 2 gas by sheathing the nanobelts with In 2O 3 can be accounted for by the modulation of electron transport by the In 2O 3–In 2O 3 homojunction. 相似文献
10.
采用磁控溅射方法在玻璃衬底上生长了In2O3晶体薄膜.该薄膜具有(111)晶面择优取向,晶粒尺寸达到33 nm.利用光刻工艺制作了以In2O3晶体薄膜为沟道层的底栅式薄膜晶体管.In2O3薄膜晶体管具有良好的栅压调制特性,场效应迁移率达到6.3 cm2/(V·s),开关电流比为3×103,阈值电压为-0.9 V.结果表明,In相似文献
11.
A memory device with In 2O 3 nanocrystals embedded in a biphenyl-tertracarboxylic dianhydride-phenylen diamine (BPDA-PDA) polyimide layer on a ZnO layer
was fabricated, and its electrical properties were evaluated. Then, the transmittance efficiency in the structure of the BPDA-PDA
polyimide/In 2O 3 nanocrystals/ZnO/ITO/double polishing sapphire substrate was measured to be about 80% between 440 to 800 nm by ultraviolet-visible
transmittance spectroscopy. A bipolar switching current bistability by difference resistance appeared in the sweep voltage
rage from −7 to 7 V. It was considered that the bipolar behavior of current-voltage may originate from a resistance fluctuation
because of the electron charging effect in In 2O 3 nanocrystals by voltage sweeping, Fowler–Nordheim tunneling, space-charge-limited current, and the migration of O 2− ions. 相似文献
12.
Indium oxide-doped hematite xIn 2O 3*(1- x) ??-Fe 2O 3 (molar concentration x = 0.1?C0.7) solid solutions were synthesized using mechanochemical activation by ball milling. XRD patterns yield the dependence of lattice parameters and grain size as function of milling time. After 12 h of milling, the completion of In 3?+? substitution of Fe 3?+? in hematite lattice occurs for x = 0.1. For x = 0.3, 0.5 and 0.7, the substitutions between In 3?+? and Fe 3?+? into hematite and respectively, In 2O 3 lattices occur simultaneously. The lattice parameters of ??-Fe 2O 3 ( a and c) and In 2O 3 (a) vary with milling time. For x = 0.1, Mössbauer spectra were fitted with one, two, or three sextets versus milling time, corresponding to gradual substitution of In 3?+? for Fe 3?+? in hematite lattice. For x = 0.3, Mössbauer spectra after milling were fitted with three sextets and two quadrupole-split doublets, representing In 3?+? substitution of Fe 3?+? in hematite lattice and Fe 3?+? substitution of In 3?+? in two different sites of In 2O 3 lattice. For x = 0.5 and 0.7, Mössbauer spectra fitting required two sextets and one quadrupole-split doublet, representing coexistence of In 3?+? substitution of Fe 3?+? in hematite lattice and Fe 3?+? substitution of In 3?+? in indium oxide lattice. The recoilless fraction studied versus milling time for each molar concentration exhibited low values, consistent with the occurrence of nanoparticles in the system. SEM/EDS measurements revealed that the mechanochemical activation by ball milling produced xIn 2O 3*(1- x) ??-Fe 2O 3 solid solution system with a wide range of particle size distribution, from nanometer to micrometer, but with a uniform distribution of Fe, In, and O elements. 相似文献
13.
In 2O 3 is introduced into TiO 2 by sol-gel method to improve the response/recovery rate and expand the operating temperature, when the In 2O 3-TiO 2 mixed system is exposed to H 2/O 2. The sensor is fabricated by thick film technology. Influence of In 2O 3 on the film phase composition, microstructure and sensing characteristics is discussed. Dynamic response properties show that the operating temperature of the mixed system is at 500-800 °C, which is about 600-800 °C for pure TiO 2. Response time of the sensor is about 200-260 ms (millisecond) while recovery time is in a narrow range of 60-280 ms at 600-800 °C. The promoting mechanism is suggested to arise from the introduction of In 2O 3 and grain size effect of the sensing film. Then In 2O 3-TiO 2 thick films are surface-modified by Pt using chloroplatinic acid. The promoting effect of Pt dispersed on the mixed system is also investigated. 相似文献
14.
Indium oxide-multi-walled carbon nanotubes (In 2O 3-MWCNTs) were prepared by sol-gel method for DSSCs. The synthesis of indium oxide (In 2O 3) was carried out by dissolving indium chloride (InCl 3) in a solvent of 2-methoxyethanol. Different annealing temperatures of 400, 450, 500, 550, and 600 °C were proposed in this study. The changes in the structural properties were analyzed by means of X-ray diffraction (XRD) and atomic force microscopy (AFM) analysis. The XRD spectrum estimated the average crystallite sizes of 3 nm for each sample. AFM results indicated very rough surface area of the films where it increased linearly from 1.8 to 11 nm as the annealing temperature increases. The In 2O 3-MWCNTs-based DSSC exhibited good photovoltaic performance with power conversion efficiency ( η), photocurrent density ( J sc ), open circuit voltage ( V oc ), and fill factor ( FF) of 1.13 %, 5.5 mA/cm 2, 0.53 V, and 0.42, respectively. Even though the film annealed at 450 °C exhibited low τ eff, it achieved the greatest D eff of 29.67 cm 2 s ?1 which provides an efficient pathway for the photogenerated electrons with minimum electron recombination loss that increased the J sc and V oc in the DSSC. The obtained structural and electron transport analysis was proposed as a suitable benchmark for In 2O 3-MWCNTs-based dye-sensitized solar cell (DSSCs) application. Hence, this study suggests that the optimum temperature for In 2O 3-MWCNTs is at annealing temperature of 450 °C prepared via sol-gel method. 相似文献
15.
We have fabricated a LPG and butane sensor whose sensitive element is a nanosize In 2O 3:Ga 2O 3 (96:4 weight %) film covered with a thin palladium catalytic layer. Technology of deposition of these films on a glassceramic substrate by the method of rf magnetron sputtering was elaborated. The surfaces of fabricated films were studied with use of a scanning electron microscope and the thickness of films was measured. The sensitivity of sensors based on the glassceramic/In 2O 3:Ga 2O 3 (96:4 weight %)/Pd structure depending on the thickness and sizes of film grains was studied. We revealed technological regimes of sputtering providing fabrication of films with the best parameters. 相似文献
16.
This study focuses on the influence of loading MWCNTs in In2O3-based DSSCs. In2O3-MWCNTs were prepared by sol-gel method via spin coating technique and annealed at 450 °C. The structural, morphology, and electrical properties of the photoanodes were characterized by means of XRD, AFM and FESEM, and J-V curve measurement and EIS properties, respectively. Incorporation of MWCNTs in In2O3 improved the J
sc
and V
oc
of the cell. However, excess loading of MWCNTs in In2O3 caused a serious aggregation of MWCNTs that increased the recombination rate. Thus, In2O3-MWCNTs with 0.3 % of MWCNTs achieved the highest PCE of 1.23 % with large surface area for efficient dye adsorption. Moreover, In2O3-MWCNTs(0.3%) exhibited large D
eff about 25.7 × 10−3 cm2 s−1 with low recombination effect that increased the PCE. This study suggests an optimum MWCNT incorporation of 0.3 % in the photoanode by sol-gel synthesis method of developing In2O3-based nanocomposite. 相似文献
17.
Perturbed γ-angular correlation measurements as function of the measuring temperature and the Sn-content have been performed in Sn-doped cubic In 2O 3 using 111In(EC) 111Cd and 111m Cd probes. By comparing the spectra of both isotopes, electronic relaxation phenomena, socalled decay after-effects, following the electron capture radioactive decay of 111In, were established. A time independent loss of the static quadrupole interaction amplitudes was found to be characteristic for the electronic relaxation, and its temperature and doping dependence were measured. The high statistical accuracy of the PAC-data allowed a separation between structural and dynamic effects and the observation of each lattice site’s behaviour. Relaxation rates were extracted from numerical simulations based on Blume’s theory and related to the predominant electron transport mechanisms in In 2O 3, especially, with rising Sn-content, to the transition to metallic conduction. 相似文献
18.
In this work, we report results of high‐pressure Raman experiments (P < 8 GPa) on In 2‐xY xMo 3O 12 for x = 0.0 and 0.5. A crystalline to crystalline structural phase transition and pressure‐induced amorphization (PIA) have been identified. The structural phase transition takes place at 1.5 and 1.0 GPa for In 2(MoO 4) 3 and In 1.5Y 0.5(MoO 4) 3, respectively, resulting in the change of structure from monoclinic P2 1/a to a more denser structure. The PIA started at 5 and 3.4 GPa for In 2Mo 3O 12 and In 1.5Y 0.5Mo 3O 12, respectively. The amorphization process takes place in two stages in the case of In 1.5Y 0.5Mo 3O 12 phase, while for In 2Mo 3O 12, it is not complete until the pressure is as high as 7 GPa. Our results also suggest that with increase of ionic size of the A 3+ ions, the octahedral distortion increases and consequently larger local structural disorder is introduced in the A 2(MoO 4) 3 system, where A is a trivalent ion (In, Y 3+, Sc 3+, Fe 3+, etc.). Copyright © 2015 John Wiley & Sons, Ltd. 相似文献
19.
Indium zinc oxide (IZO) thin films with different percentages of In content (In/[In+Zn]) are synthesized on glass substrates by magnetron sputtering, and the structural, electrical and optical properties of IZO thin films deposited at different In 2O 3 target powers are investigated. IZO thin films grown at different In 2O 3 target sputtering powers show evident morphological variation and different grain sizes. As the In 2O 3 sputtering power rises, the grain size becomes larger and electrical mobility increases. The film grown with an In 2O 3 target power of 100 W displays the highest electrical mobility of 13.5 cm·V -1·s -1 and the lowest resistivity of 2.4 × 10 -3 Ω·cm. The average optical transmittance of the IZO thin film in the visible region reaches 80% and the band gap broadens with the increase of In 2O 3 target power, which is attributed to the increase in carrier concentration and is in accordance with Burstein-Moss shift theory. 相似文献
20.
(In 1−xFe x) 2O 3 ( x = 0.02, 0.05, 0.2) powders were prepared by a solid state reaction method and a vacuum annealing process. A systematic study was done on the structural and magnetic properties of (In 1−xFe x) 2O 3 powders as a function of Fe concentration and annealing temperature. The X-ray diffraction and high-resolution transmission electron microscopy results confirmed that there were not any Fe or Fe oxide secondary phases in vacuum-annealed (In 1−xFe x) 2O 3 samples and the Fe element was incorporated into the indium oxide lattice by substituting the position of indium atoms. The X-ray photoelectron spectroscopy revealed that both Fe 2+ and Fe 3+ ions existed in the samples. Magnetic measurements indicated that all samples were ferromagnetic with the magnetic moment of 0.49-1.73 μ B/Fe and the Curie temperature around 783 K. The appearance of ferromagnetism was attributed to the ferromagnetic coupling of Fe 2+ and Fe 3+ ions via an electron trapped in a bridging oxygen vacancy. 相似文献
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