泡生法蓝宝石单晶不同生长阶段的数值模拟研究

针对泡生法蓝宝石单晶生长的不同生长阶段的温场、流场和固液界面形状进行数值模拟研究.并分析了加热器相对坩埚的轴向位置和不同生长速率对蓝宝石单晶生长的影响.结果表明:在蓝宝石单晶生长中,在靠近坩埚壁面和固液界面的熔体内,等温线密,温度梯度较大;在靠近坩埚底部的熔体内,等温线稀疏,温度梯度较小.随着晶体高度的增加,熔体对流由放肩阶段的两个涡胞变成等径阶段的一个涡胞,熔体平均温度有小幅度下降;加热器相对坩埚的轴向位置对晶体生长炉内温场和固液界面形状影响很大,随着加热器位置上移,晶体内平均温度升高,温度梯度减小;熔体内平均温度降低,温度梯度增大.同时固液界面凸度增大.随着晶体生长速率增大,固液界面凸度增大,界面更加凸向熔体.     

轴向磁场对环形浅液池内硅熔体热毛细对流的影响

为了更好地了解轴向磁场对温度梯度作用下Marangoni-热毛细对流的影响,采用有限差分法对环形浅液池内硅熔体制单晶的流动进行了数值模拟.研究了三种不同边界条件下,Ha数分别为0、10、20、30对应下硅熔体内部流动强度和自由表面速度.结果表明,轴向磁场对浅液池内的Marangoni对流、热毛细对流和耦合的Marangoni-热毛细对流都有较好的抑制作用,且随着磁场强度的增强,抑制作用增加,更有利于提高晶体的结晶质量.当磁场强度和底部热流密度一定时,随着水平温度梯度的增加,靠近内壁的流动得到增强,外壁附近流动反而减弱.     

分离结晶垂直Bridgman法生长CdZnTe晶体的全局数值模拟

采用FLUENT软件对分离结晶Bridgman法生长CdZnTe晶体进行了全局数值模拟.模拟对象为:熔体上部边界条件分别为固壁和自由表面时两种晶体生长系统.重点考虑坩埚和晶体之间狭缝宽度e和重力对分离结晶过程的影响.在计算中分别取e=0 mm、0.5 mm和1 mm三种狭缝宽度,得到了在微重力和常重力条件下的温度分布、结晶界面形状以及流函数分布图.结果表明:在微重力条件下,当熔体上部为固壁时,随着狭缝宽度的增大,热毛细力作用增强,流动强度增强;当熔体上部为自由表面时,则与之相反.在常重力条件下,由于浮力-热毛细对流的共同作用,随着狭缝宽度的增加,流动强度逐渐减弱,有助于提高晶体生长质量.     

微重力条件下Marangoni数对分离结晶过程的影响

为了了解微重力条件下新型分离结晶生长过程中熔体热毛细对流的基本特征,利用有限差分法进行了三维数值模拟.当熔体顶部分别为自由表面及固壁边界条件时,得到了新型分离结晶Bridgrnan生长过程中熔体热毛细对流的速度分布和温度分布.结果表明:熔体顶部为自由表面时,当Marangoni数较小时,在上自由表面和下部狭缝处自由表面的表面张力的驱动下,熔体内部产生了逆时针和顺时针两个流动方向相反的流胞,此时熔体内的流动状态为稳态;随着Marangoni数进一步的增大,流胞的流动逐渐增强并逐步向熔体内部扩展,熔体内部温度分布非线性增强,上自由表面和下部狭缝处自由表面处速度增大;当Marangoni数超过某一临界值后,流动转化为非稳态流动.当熔体顶部为固壁时,与熔体顶部为自由表面时相比,临界Marangoni数增大.流动失稳的物理机制是流速的变化和阻力的变化之间存在滞后.     

超导水平磁场结构对φ300mm直拉硅单晶固液界面影响的三维数值模拟

针对不同超导水平磁场结构的磁力线分布对φ300 mm直拉硅单晶固液界面影响问题,本文采用一种基于格子Boltzmann方法的耦合热格子模型,解决温度场与速度场耦合建模问题,并对不同结构的超导磁场作用下的晶体生长进行了三维数值模拟.结果表明,采用单磁力线分布的超导磁场结构使得固液界面氧含量降低,但是容易引起熔体内部热分布不均匀;采用双磁力线分布结构能够有效地改善熔体内部沿晶体生长的轴向温度梯度和沿固液界面的径向温度梯度,然而,其对固液界面氧含量抑制作用较小.当晶转、埚转工艺作用时,超导单磁力线水平磁场结构明显优于超导双磁力线水平磁场结构,固液界面形状对称性随磁感应强度的增加而增强.     

旋转磁场对空间浮区内流场及浓度场的影响

采用全浮区模型数值研究了旋转磁场作用下熔区内热毛细对流流动特性,分析了磁场强度对流场及浓度场的影响.研究发现,无磁场时,熔体内杂质浓度场和流场呈现三涡胞对称振荡特征;温度场主要由扩散作用决定,呈对称分布.旋转磁场作用下,Ma数基本保持不变.当磁场强度B0≤1 mT时,熔体内杂质浓度场和流场与无磁场时结构类似,但旋转磁场的搅拌作用使得熔体内周期性振荡提前出现,且当旋转磁场产生的洛伦兹力相对较大时,表面张力产生的三维振荡对流得到很好地抑制.B0=5 mT时,周向波动被完全抑制,熔区内流场和浓度场呈二维轴对称分布.旋转磁场对熔体流动产生的轴向抑制作用和周向搅拌作用,都有助于熔体流动的稳定性、浓度分布以及温度分布的均匀性,从而有利于高质量晶体的生长.     

轴向磁场作用下Czochralski浅液池内热对流特性研究

为了有效抑制熔体热对流并提高晶体的生长质量,采用三维数值模拟方法研究了轴向磁场对双向温差作用下Czochralski浅液池内Marangoni-热毛细对流的影响.在一个给定的底部热流密度条件下,探讨了轴向磁场对稳态流动和非稳态流动的影响,确定了不同磁场强度下流动由三维稳态流动向三维非稳态流动转变的临界Macri.结果表明:随着磁场强度的增大,临界Macri不断增大.轴向磁场对液池内稳态和非稳态Marangoni-热毛细对流均具有较好的抑制效果.对于稳态流动,磁场的引入会使自由表面温度波动幅值受到削弱,波数减少;对于非稳态流动,监测点P处的温度振荡随着磁场强度的增加不断逐渐减弱直至消失,流动由三维非稳态过渡为三维稳态,相应地,温度波动结构也会发生转变.     

磁场结构对Ф300 mm直拉单晶硅碳杂质的影响研究

本文利用CGSim晶体生长软件分析了不同磁场结构对直拉单晶硅中碳杂质含量的影响。结果表明,气氛中的碳原子主要通过熔体自由表面上靠近坩埚壁一侧区域扩散进熔体。通过调节对称磁场和非对称磁场的结构参数来抑制碳原子掺入区域的对流强度,增大碳原子扩散层的厚度,进而降低熔体中的碳原子浓度,最终获得低碳含量的直拉单晶硅。     

热屏位置影响直拉单晶硅熔体和固液界面的模拟

为了研究热屏位置对于直拉单晶硅的熔体和固液界面的影响,采用CGSim有限元软件对φ200 mm直拉单晶硅生长过程进行了模拟,结果表明,随着热屏底端位置上升(或径向内移),熔体自由表面及其邻近区域的温度下降;随着热屏底端位置径向内移,位于两个大涡胞之间的较小涡胞强度增大且移向熔体液面深处;热屏位置上升或径向外移均会使固液界面上凸程度增大,这主要归因于晶体热场的相应变化.     

不同驱动力对Cz硅生长中熔体对流影响的数值模拟研究

为了确定Cz单晶硅生长各种驱动力对熔体对流及固/液界面形状的影响,利用CGSim软件,对典型的Cz单晶硅生长中的熔体对流进行数值模拟.研究了重力、表面张力、平流力、晶转、埚转和氩气剪切力等各种驱动力的大小对熔体对流涡胞、涡胞强度、界面形状、温度分布的影响.结果表明:各种驱动力对熔体对流的影响大小依次为:浮力＞表面张力＞晶转力＞氩气剪切力＞埚转力＞平流力;浮力和表面张力使熔体产生一沿坩埚壁上升、从固/液界面附近下降的涡胞,晶转力和氩气剪切力使熔体产生与前面反方向的涡胞,而埚转力产生多个不同流向的对流涡胞,使熔体混合更加均匀,熔体凝固引起的平流力对熔体对流影响不大;增大埚转,熔体中涡胞数量更多、对流换热更充分、温度梯度更小、熔体内的最高温度更低,有利于减少石英坩埚氧的熔解,但界面更向下凹;增大晶转,熔体内的最高温度无明显变化;固定埚转Ωc=-10 r/min,晶转存在一临界值Ωs(C)=60～ 80 r/min,当Ωs＜Ωs(C)时,增大晶转,固/液界面更向上凹,当Ωs＞Ωs(C)时,增大晶转,固/液界面更向下凹.     

Modelling of mechanism of agglomeration of KCl crystallization

The article presents an analysis into agglomeration during KCl vacuum crystallization. The theoretical and experimental investigations into the mechanism of agglomeration during mass crystallization result in an extension of the growth phenomena within the known model equations. The basis for this is essentially constituted by the collision model concepts of the theory of floculation in disperse systems. The parameters derived from the microprocess analysis (energy dissipation, content of solids, growth rate of individual grains) lead to model equations which are confirmed by laboratory and test trials.     

Relationship of Morphological Types of Dynamic Forms of Crystals

Crystallography Reports - The relationship of morphological spectra (sets of data on the morphological types of real polyhedral crystals and their probabilities under current physicochemical...     

Velocities of Disappearance and Lifetime of Faces of Growing Crystals

The formulae for absolute R_disap and relative R velocities of disappearance and lifetime τ of faces of growing crystals have been derived for stationary growth. It was shown that the quantities are determined by the relative growth velocity R_A/R_critA of the vanishing face A with respect to the critical growth velocity R_critA and by the geometry of a crystal expressed by the trigonometric functions of interfacial angles β and γ formed between face A and the adjacent faces. R increases and τ decreases with the increase in R_A/R_critA to certain limiting values. The calculations have been verified and illustrated by the experimental results for triclinic potassium bichromate (KBC) crystals. Results enable ones to predict values of velocities of disappearance and lifetimes of undesirable, supplementary faces of any real crystal.     

Development of Pauling's concepts of geometric characteristics of atoms

The evolution of the geometric characteristics introduced by Pauling and their dependence on the specific features of the structure and chemical bonds have been considered. The values of the covalent and van der Waals radii are given as well as their relationships and mutual transitions.     

A review of measurement of thermophysical properties of silicon melt

Measurements of thermophysical properties of Si melt and supplementary study of X-ray scattering/diffraction by the authors' group were reviewed. The values obtained differed variously from those of literature. Density was 2–3% larger, surface tension 20–30% smaller, viscosity up to 40% larger, electrical conductivity 8% smaller, spectral emissivity more or less in good agreement with literature values, and thermal diffusivity a few percent larger. An anomalous density jump was found near the melting point. Surface tension and viscosity also showed anomaly. A strange time-dependent change of density was observed over 3 h after melting. X-ray analyses suggested a slight change in local atom ordering, but showed no sign of cluster formation. An addition of 0.1 at% gallium caused the density jump to disappear, while that of boron caused no change. An EXAFS study of the former melt indicated a strong interaction between Ga and Si atoms as if molecules of GaSi₃ existed. The implications of the measured properties are a possibility of soft-turbulence in an Si melt in a relatively large crucible, a more complicated manner of intake of oxygen depleted molten Si from the free surface region to underneath the growing crystal, and a relaxation of the melt after melting arising from trapped gas species.     

Dependence of the parameters of equations of viscous flow on chemical composition of silicate melts

The temperature dependence of viscosity of silicate melts is discussed in the framework of the Avramov–Milchev (AM) equation. The composition is described by means of two parameters: the molar fraction, x, and the “lubricant fraction”, l. The molar fraction is the sum of the molar parts x_i of all oxides dissolved in SiO₂, the molar fraction of the latter being 1 ? x. It is shown that, with sufficient precision, two of the parameters of the AM equation can be presented as unique functions of the molar fraction. On the other hand, x is not sufficient to determine properly the reference temperature T_r , at which viscosity is η_r = 10¹³ [dPa.s]. Therefore, additional parameter, “lubricant fraction” l, is introduced. For each of the components, l_i is a product of molar part x_i and a specific dimensionless coefficient 0 ≤ k_i ≤ 1 accounting for the specific contribution of this component to the increased mobility of the system. It is demonstrated that, for l > 0, the reference temperature is related to the “lubricant fraction” l through the reference temperature T_r,SiO2 of pure SiO₂.     

Comparative analysis of two methods of calculation of the orientation of domain walls in ferroelastics

Two types of domain-wall equations are analyzed: the equations derived by the Sapriel method and the equations obtained by interface matching of the thermal-expansion tensor. It is shown that, for W-type domain walls, these methods yield the same equations. For W′-type domain walls, the equations obtained by different methods coincide for proper ferroelastics and differ for improper ferroelastics.     

Generation of crystal structures of heteromolecular compounds by the method of discrete modeling of packings

Within the method of discrete modeling of packings, an algorithm of generation of possible crystal structures of heteromolecular compounds containing two or three molecules in the primitive unit cell, one of which has an arbitrary shape and the other (two others) has a shape close to spherical, is proposed. On the basis of this algorithm, a software package for personal computers is developed. This package has been approved for a number of compounds, investigated previously by X-ray diffraction analysis. The results of generation of structures of five compounds—four organic salts (with one or two spherical anions) and one solvate—are represented.