聚3-羟基丁酸酯薄膜结晶的ATR-FTIR研究

使用匀胶机(spincoater),通过溶液铸膜的方法,在铝箔基板上制备出具有不同厚度的聚3羟基丁酸酯(PHB)薄膜.20℃室温条件下,通过衰减全反射傅立叶红外光谱(ATRFTIR)原位观测了不同厚度薄膜的结晶过程,并通过偏光ATRFTIR对薄膜中PHB分子的取向进行了研究.ATRFTIR原位观测结果显示,PHB在薄膜中的结晶速率以及结晶度均随着薄膜厚度的减小而逐渐降低;同时,偏光ATRFTIR测试结果表明,随膜厚减小,薄膜中结晶部分的PHB分子逐渐倾向于沿垂直于基板表面方向取向,膜越薄,倾向越明显.可以认为,PHB分子与基板间的相互作用以及扩散控制结晶导致了上述现象的产生.     

聚合物受限结晶的研究进展

随着纳米材料研究的迅速发展,聚合物由于其分子固有的纳米尺度结构,无论作为纳米器件或在模板应用方面都受到广泛瞩目.在微纳领域的应用中,特定受限环境下,结晶聚合物的结晶行为也因此受到广泛关注.本文从均聚物(及无规共聚物)和半晶型嵌段聚合物两方面总结了近年来聚合物受限结晶领域的研究进展.对于均聚物和无规共聚物,人们主要关注其在薄膜、超薄膜条件下的受限结晶性能,关注点为随着膜厚减小而引入的空间效应和界面效应对聚合物结晶性能的影响.而对于半晶型嵌段共聚物受限结晶的研究则多从本体出发,来研究纳米相分离与结晶的竞争过程、纳米相分离区域对于可结晶嵌段结晶生长的几何限制(空间效应)以及嵌段连接点(结晶嵌段的末端)对于结晶嵌段结晶行为的影响.     

聚氧乙烯超薄膜中构象变化的红外光谱研究

近年来 ,有关聚合物薄膜的研究受到了广泛关注 .低维数高分子超薄膜的各种行为由于涉及到高分子运动的动力学、热力学本质而逐渐成为高分子科学研究中的一大热点 .实验结果表明[1～ 3] ,几何受限条件和基板对于聚合物薄膜结晶的形态及性能都会产生显著影响 .广角 X射线衍射实验和自由表面的掠入射 X射线实验 [4 ]表明 ,有些在本体中呈现液晶有序的聚酰亚胺在靠近基板附近变得更加有序 .Despotopoulou等 [5] 对聚二正己基硅烷在超薄膜中构象扰动的观察发现 ,当膜厚小于 2 0 0 nm时 ,聚二正己基硅烷的侧链变得无序 ,傅里叶变换红外光谱测试…     

聚(ε-己内酯)薄膜结晶形貌及分子取向研究

用匀胶机通过溶液铸膜方法在硅片和铝箔基板上分别制备具有不同厚度的聚(ε-己内酯)(PCL)薄膜. 通过原子力显微镜(AFM)和偏光衰减全反射傅里叶红外光谱(ATR-FTIR)对薄膜中PCL的结晶形貌、 片晶生长方式及分子链取向进行了研究. AFM结果表明, 在200 nm或更厚的薄膜中, PCL主要以侧立(edge-on)片晶的方式生长; 对于厚度小于200 nm的薄膜, PCL片晶更倾向于以平躺(flat-on)的方式生长. 这种片晶生长方式的改变在硅片和铝箔基板上都表现出同样的倾向. 此外, 在15 nm或更薄的薄膜中, PCL结晶由通常的球晶结构变为树枝状晶体. 偏光ATR-FTIR结果表明, 当膜厚小于200 nm时, 薄膜结晶中PCL分子链沿垂直于基板表面方向取向, 并且膜越薄, 取向程度越高, 与AFM的观测结果一致.     

聚ε-己内酯薄膜的受限结晶行为研究

利用原子力显微镜(AFM)系统地研究了聚ε-己内酯(PCL)在物理受限空间,即在薄膜、超薄膜中的结晶行为.结果表明,PCL的结晶形态与薄膜的厚度有关.当薄膜的厚度大于2Rg(Rg为回转半径)时,高分子结晶形态呈现球晶;当厚度介于Rg~2Rg之间时,高分子结晶生成枝蔓或树枝状结构;当厚度小于Rg时,其结晶形态为“岛”状结构.讨论了结晶温度、分子量与基底等对高分子结晶形态的影响.PCL在薄膜中的结晶是一个扩散控制的动力学过程,其生长机理可以用有限扩散凝聚(DLA)来解释.     

纤维素芳族酯热致液晶对PET结晶成核作用的研究

用自制的热致液晶性纤维素芳族酯(CAE)作聚对苯二甲酸乙二醇酯(PET)的成核剂,研究了PET/CAE体系(CAE含量≤1%)在110～200℃温度范围内的等温结晶动力学特性.结果表明,CAE能显著加快PET结晶速率(Z),Z随结晶温度和CAE含量变化均有极大值Z_max(T_C)和Z_max(W_CAE),Z_max(T_C)对应的温度T_max随CAE含量增加而降低,CAE促进PET结晶的作用机理与普通成核剂不同.     

基板界面对PS/PMMA共混物薄膜相逆转组成比的影响

近年来高分子共混体系中的界面、表面效应逐渐引起了越来越多研究者的兴趣 .人们发现 ,当共混物薄膜厚度减至一定程度时 ,聚合物共混物薄膜中的相形态、相容性及相分离动力学与本体中有较大的不同[1～ 3] .基板界面作用对共混薄膜体系的热力学、动力学行为产生很大的影响 .我们以往的研究 [4 ,5]也发现 ,PP/EVAc(70 /30 )共混体系退火过程中 ,基板界面 (如玻璃 )作用可大大加速分散相(EVAc)粒子的粗化凝聚过程 .本研究用聚甲基丙烯酸甲酯和聚苯乙烯共混物的四氢呋喃溶液在不同基板介质 (如玻璃基板 ,PP基板 )上成膜 ,用相差显微镜观测了…     

一种新的绝缘膜——聚对苯二甲酸对氧代苯甲酸乙二酯

聚对苯二甲酸乙二酯（匹T）膜已广泛用于绝缘和包装行业，其耐热温度不超过12O℃，熔点较高（260“C），结晶速率较快，难以拉制成电机槽绝缘和相绝缘所需厚度大于020mm的柔软薄膜．在PET的分子链中引人4，4’一氧代二次苯基能降低共聚酯的熔点［’j，但对共聚酯的热稳定性和结晶速率有无影响未曾提及．我们以4，4’一二苯醚二甲酸（OBBA）为改性组分，合成了一系列聚对苯二甲酸对氧代苯甲酸乙二酯（PETO）并制成薄膜，该膜不仅比PET膜的熔点低，结晶速率慢，而且热稳定性也有所提高，有可能制得0．2mm厚的薄膜．1实验部分1．l原料对…     

呼吸图法制备聚亚甲基-b-聚甲基丙烯酸甲酯多孔薄膜

首先利用叶立德活性聚合和原子转移活性自由基聚合(ATRP)相结合制备了三个不同链段比的聚亚甲基-b-聚甲基丙烯酸甲酯(PM-b-PMMA)两嵌段聚合物. 接着以它们为原料, 利用静态呼吸图方法在四种不同溶剂中制备了一系列的具有蜂窝状表面的多孔薄膜, 用扫描电子显微镜(SEM)观察了多孔薄膜的形貌. 研究了溶剂、溶液浓度、聚合物链段长度及链段比等因素对多孔薄膜表面孔的大小和分布的影响. 结果表明: 当PM_2k-b-PMMA_2k嵌段聚合物浓度为3 wt%、溶剂为二硫化碳(CS₂)和二氯甲烷(CH₂Cl₂)时, 可以通过静态呼吸图方法制备出孔径为纳米级(520 nm)和微米级(1.1 μm)的较为规整的多孔薄膜. 多孔薄膜表面的孔径随PM-b-PMMA浓度的减小而增大|两嵌段聚合物中两个链段的长度及其链段比的变化对多孔膜表面孔径均产生较大的影响.     

溶液成膜的温度对聚对苯二甲酸乙二酯结晶度的影响

<正> 用溶液成膜是制备聚合物薄膜的常用方法之一。但是溶液成膜的条件,如成膜温度,溶液浓度等对半结晶聚合物结晶度的影响研究报道较少。制备聚对苯二甲酸乙二酯(PET)非晶态薄膜通常使用熔融热压其后淬火的方法。由于PET在熔点附近易于降解,在薄膜中产生气泡,因而很难制备较大面积的均一厚度的薄膜,如在拉伸试验中所需     

IN SITU OBSERVATION OF MELTING AND CRYSTALLIZATION BEHAVIORS OF POLY(ε-CAPROLACTONE) ULTRA-THIN FILMS BY AFM TECHNIQUE

The melting and crystallization behaviors of poly(ε-caprolactone) (PCL) ultra-thin films with thickness from 15 nm to 8 nm were studied by AFM technique equipped with a hot-stage in real-time. It was found that melting can erase the spherulitic structure for polymer film with high thickness. However, annealing above the melting point can not completely erase the tree-like structure for the thinner polymer film. Generally, the structure formation of thin polymer films of PCL is controlled not only by melting and crystallization but also by dewetting during thermal annealing procedures, and dewetting predominates in the structure formation of ultra-thin films. However, the presence of tree-like morphology at 75 °C may be due to the strong interaction between PCL and mica surface, which may stick the PCL chains onto the mica surface during thermal annealing process. Moreover, the growth of the dendrites was investigated and it was found that crystallization is followed from a dewetted sample, and the branches did not grow with the stems. The crystallization of polymer in the ultra-thin films is a diffusion-controlled process. Both melting and crystallization behaviors of PCL in thin films are influenced by film thickness.     

Thickness dependence of the structural,mechanical and electrical properties of Ni films deposited on polyimide by ion beam‐assisted deposition (IBAD)

Ni thin films with different thicknesses were deposited on pre‐treated polyimide substrates by ion beam‐assisted deposition. Dependence of structural, mechanical and electrical properties of the Ni films on their thickness was investigated. The results showed a clear correlation between film properties and film thickness. The inter‐diffusion at the interface regions of the films with different deposition time were demonstrated by transmission electron microscopy and X‐ray photoelectron spectroscopy. With increasing film thickness, surface roughness of the Ni films firstly decreased and then increased, while the grain size gradually increased. Residual stress of the Ni thin films decreased with increasing Ni film thickness up to 202 nm and then slightly increased as the film thickness further increased. Resistivity decreased, and temperature coefficient of resistivity (TCR) increased with increasing film thickness due to the enhancement of crystallization degree and the increase in grain size. The decrease in surface roughness and residual stress also contributed to the decrease of resistivity and the increase of TCR of the films. An optimal film thickness is suggested, which yielded a relatively high TCR value and low levels of both surface roughness and residual stress. Copyright © 2012 John Wiley & Sons, Ltd.     

Effect of thickness on the thermal properties of hydrogen-bonded LbL assemblies

Layer-by-layer (LbL) assemblies have attracted much attention for their functional versatility and ease of fabrication. However, characterizing their thermal properties in relation to the film thickness has remained a challenging topic. We have investigated the role of film thickness on the glass transition temperature (T(g)) and coeffecient of thermal expansion for poly(ethylene oxide)/poly(acrylic acid) (PEO/PAA) and PEO/poly(methacrylic acid) (PEO/PMAA) hydrogen-bonded LbL assemblies in both bulk and ultrathin films using modulated differential scanning calorimetry (modulated DSC) and temperature-controlled ellipsometry. In PEO/PAA LbL films, a single, well-defined T(g) was observed regardless of film thickness. The T(g) increased by 9 °C relative to the bulk T(g) as film thickness decreased to 30 nm because of interactions between the film and its substrate. In contrast, PEO/PMAA LbL films show a single glass transition only after a thermal cross-linking step, which results in anhydride bonds between PMAA groups. The T(g), within error, was unaffected by film thickness, but PEO/PMAA LbL films of thicknesses below ~2.7 μm exhibited a small amount of PEO crystallization and phase separation for the thermally cross-linked films. The coefficients of thermal expansion of both types of film increased with decreasing film thickness.     

有机小分子染料和聚阳离子分子超薄膜的制备及其摩擦学性能研究

制备了以有机小分子染料酸性红 1 8为阴离子、以聚烯丙基氯化铵和聚乙烯亚胺为聚阳离子的分子沉积膜 ,用紫外可见分光光度计、接触角测定仪和椭圆偏振光测厚仪对所制备的超薄膜进行了表征 .用DF PM型动 静摩擦系数精密测定装置考察了超薄膜的摩擦学性能 ,采用扫描电子显微镜对薄膜的磨痕表面进行了观察 .结果表明 ,所制备的超薄复合沉积膜具有良好的减摩和耐磨性能     

Thermal change of organic light-emitting ALQ3 thin films

A series of Alq3 thin films with the thicknesses of 50, 100, and 200 nm was deposited on Si substrates at room temperature using the thermal evaporation method. The thermal crystallization process of Alq3 thin films, especially 50 nm thick films, was successfully examined using high-temperature X-ray diffraction (HT-XRD) with the in-plane scan mode. Film thickness, density, and changes in surface roughness while heating were determined using X-ray reflectometry (XRR). The decreased density and increased surface roughness, which were accompanied by sublimation, indicate the instability of the Alq3 film. Thus, thermal instability is a major factor for device failure.     

Reflection–absorption infrared spectroscopy investigation of the crystallization kinetics of poly(ethylene terephthalate) ultrathin films

Reflection–absorption infrared spectroscopy was used to study the crystallization behavior of poly(ethylene terephthalate) (PET) ultrathin films. The crystallinity of ultrathin films was estimated by the fraction of trans conformers of PET. The isothermal and nonisothermal crystallization kinetics of ultrathin films with different thicknesses were investigated. The thinner PET film showed slower kinetics during isothermal crystallization than the thicker film. Moreover, the final crystallinity of films with various thicknesses were reduced with decreasing thickness. An Avrami equation was used to fit the acquired results. The Avrami exponents decreased with the film thickness. As for the nonisothermal crystallization, the cold‐crystallization starting temperature shifted to a lower temperature as the film thickness increased. The influence of the substrate on the crystallization kinetics of the films was also studied. The half‐crystallization times and final crystallinities of ultrathin films adsorbed onto a self‐assembled‐monolayer‐treated surface and an untreated substrate were clearly different, although their thickness dependence was similar. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 4440–4447, 2004     

Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces

The effect of roughness on the dewetting behavior of polyethylene thin films on silicon dioxide substrates is presented. Smooth and rough silicon dioxide substrates of 0.3 and 3.2-3.9 nm root-mean-square roughness were prepared by thermal oxidation of silicon wafers and plasma-enhanced chemical vapor deposition on silicon wafers, respectively. Polymer thin films of approximately 80 nm thickness were deposited by spin-coating on these substrates. Subsequent dewetting and crystallization of the polyethylene were observed by hot-stage optical microscopy in reflection mode. During heating, the polymer films melt and dewet on both substrates. Further observations after cooling indicate that, whereas complete dewetting occurs on the smooth substrate surface, partial dewetting occurs for the polymer film on the rough surface. The average thickness of the residual film on the rough surface was determined by ellipsometry to be a few nanometers, and the spatial distribution of the polymer in the cavities of the rough surface could be obtained by X-ray reflectometry. The residual film originates from the impregnation of the porous surface by the polymer fluid, leading to the observed partial dewetting behavior. This new type of partial dewetting should have important practical consequences, as most real surfaces exhibit significant roughness.     

Polymer crystallization of ultrathin films on solid substrates

Recently, polymer crystallization in ultrathin films (thickness less than 100 nm) on solid substrates has attracted increased attention. As it can be considered to be a quasi-two-dimensional (2D) system with one-dimensional (1D) confinement along the substrate normal, ultrathin polymer film offers unique possibilities for testing the theories of crystallization and for studying the effects of confinement and interface which may invoke new mechanisms other than those applied in bulk crystallization of polymers. In this article, we will summarize the important results of ultrathin film crystallization of polymers obtained in the past decades. The morphologies, the crystallization kinetics, and the transformation between monolayer crystals with various metastabilities are reviewed in depth, with an attempt at discussing the ultrathin polymer film crystallization in the general framework of thermodynamics and kinetics of crystallization.     

热诱导金属/聚合物膜系图案化控制的研究

近年来 ,在简单体系上形成复杂规则的图案已引起诸多学者的注意 ,其中以聚合物为母体的体系发展了模板、局部紫外照射和激光诱导等一系列技术 ,从而得到可控的表面图案[1～ 6] .本文用激光刻蚀法对溅射在聚合物膜上的金属薄膜进行处理 ,在热诱导情况下使金属 /聚合物膜系表面产生了规则的图案 .薄膜热应力的可控释放作用和激光刻蚀造成的区域局限作用被认为是诱导这种可控图案产生的两种基本要素 .通过控制激光刻蚀区域 ,可控制薄膜表面形貌变化 ,从而实现可控的图案化设计 .1　实验部分1.1　原料及仪器　聚苯乙烯 (PS) :北京燕山石油化工…     

Collapse transition in thin films of poly(methoxydiethylenglycol acrylate)

The thermal behavior of poly(methoxydiethylenglycol acrylate) (PMDEGA) is studied in thin hydrogel films on solid supports and is compared with the behavior in aqueous solution. The PMDEGA hydrogel film thickness is varied from 2 to 422?nm. Initially, these films are homogenous, as measured with optical microscopy, atomic force microscopy, X-ray reflectivity, and grazing-incidence small-angle X-ray scattering (GISAXS). However, they tend to de-wet when stored under ambient conditions. Along the surface normal, no long-ranged correlations between substrate and film surface are detected with GISAXS, due to the high mobility of the polymer at room temperature. The swelling of the hydrogel films as a function of the water vapor pressure and the temperature are probed for saturated water vapor pressures between 2,380 and 3,170?Pa. While the swelling capability is found to increase with water vapor pressure, swelling in dependence on the temperature revealed a collapse phase transition of a lower critical solution temperature type. The transition temperature decreases from 40.6?°C to 36.6?°C with increasing film thickness, but is independent of the thickness for very thin films below a thickness of 40?nm. The observed transition temperature range compares well with the cloud points observed in dilute (0.1?wt.%) and semi-dilute (5?wt.%) solution which decrease from 45?°C to 39?°C with increasing concentration.