Improvement of peak‐to‐background ratio in PIXE and XRF methods using thin Si‐PIN detectors

This paper describes the peak‐to‐background ratio improvement that can be achieved in PIXE and XRF applications by the use of thin crystal detectors. This improvement becomes apparent in the presence of an intense γ‐ray source, which can be produced either during proton irradiation of a sample (PIXE) or in the deexcitation of the radionuclide in radioisotope‐induced XRF analysis (RIXRF). In order to study theoretically the energy response of a silicon crystal in the x‐ray energy region with respect to its thickness and the energy of the incident γ‐radiation, a Monte Carlo simulation was performed. Experimentally, two detectors having crystal thicknesses of 300 µm and 3 mm were employed in specific analytical applications of PIXE, PIXE‐induced XRF and RIXRF techniques. The peak‐to‐background ratios obtained for various characteristic x‐rays were compared between the two detectors. The performances of the two detectors were also compared in the monochromatic XRF analysis of samples with low average atomic number matrix content. Copyright © 2003 John Wiley & Sons, Ltd.     

Size‐resolved analysis of fine and ultrafine fractions of indoor particulate matter using energy dispersive X‐ray fluorescence and electron microscopy

We used a multistage PIXE inertial impactor with nine different aerodynamic diameter ranges (between 16 and 0.06 μm) to sample indoor particulate matter (PM). X‐ray fluorescence (XRF) measurements performed at cutoff diameters (CoDs) of 0.25, 0.5, 1, 2, 4, and 8 μm were used to identify elements in various size fractions. Anthropogenic sources were the dominant sources for fine and ultrafine particle sizes. The XRF results show that natural sources also contribute to the fine and ultrafine fractions of pollutants. Scanning electron microscopy and energy‐dispersive system analysis were performed on membranes having PM CoDs of 4, 2, 1, 0.5, and 0.25 μm. Elemental mappings show the membranes with PM of CoDs 0.25 and 0.5 μm having S as a dominant element, confirming the results obtained with XRF. Strong correlation among maps of S, N, and O show that ammonium sulfate is the major constituent at these size fractions. Other elements such as Si, Ca, Fe, Al, and Mg show up in smaller amounts at these size fractions but increase for membranes with larger particles. For size fractions larger than 0.5 μm, there is a good correlation between the elemental maps of these elements and oxygen, indicating that these elements exist mostly in oxide forms. The absence of clear N signals and the correlation between the Ca and S maps indicate that S in these size fractions is not due to ammonium sulfate. The presence of Mg, K, Cl, and Na at these CoDs shows that these elements are due to salts originating from sea breeze.     

Elemental analysis of particulate matter in a metal workshop and of biological samples from exposed workers

During metal welding and cutting, large amounts of particulate matter (PM) are produced that might represent a significant health risk for the exposed workers. In the present pilot study, we performed an elemental analysis of fine PM collected in a metal workshop. Also, elemental analysis of the hair and nail samples collected from workers exposed to the workshop dust and control group was done. Concentrations of 15 elements in PM were measured with X‐Ray Fluorescence (XRF) and Particle Induced X‐ray Emission (PIXE), whereas inductively coupled plasma mass spectrometry (ICP‐MS) was used to determine 12 elements in hair and nail samples. Mean 8‐hr concentrations of PM_2.5, Fe, and Mn in the vicinity of welders were up to 1803, 860, and 30 μg/m³, respectively, whereas in the nearby city, daily PM_2.5 concentrations are on average 11 μg/m³. We found that several elements, especially Fe and Mn, had substantially higher concentrations in hair and nail samples of exposed workers than in the control group, which indicates the accumulation of metals in workers' tissues, although limit values were not exceeded.     

Comparison of the detection limits in the analysis of some medium atomic number elements measured with a portable XRF and an external proton beam PIXE spectrometer system

A portable X‐ray fluorescence (XRF) spectrometer system was constructed using an Amptek Mini‐X X‐ray tube and an X‐123 compact spectrometer. The spectrometer is optimised for the best limits of detection. Its analytic properties are tested and compared with an analogous laboratory‐based instrument, an external beam proton‐induced X‐ray emission spectrometry (PIXE) setup. Depending on elements in question the thick target detection limits of this portable XRF device are comparable or even lower than the PIXE setup. Copyright © 2011 John Wiley & Sons, Ltd.     

Approaches to solid sample preparation based on analytical depth for reliable X‐ray fluorescence analysis

In this paper, we discuss approaches to prepare solid samples for X‐ray fluorescence spectrometry (XRF). Although XRF can be used to analyze major and minor elements in various solid samples including powders and grains without dissolution techniques, to obtain reliable XRF results, the prepared sample must meet certain criteria related to homogeneity, particle size, flatness, and thickness. The conditions are defined by the analytical depth of fluorescent X‐rays from analytes, and the analytical depth can be estimated from the X‐ray absorption related to the energy of each X‐ray and the composition and density of the sample. For example, when the sample flatness and particle size are less than the analytical depth and the sample possesses homogeneity within a depth less than the analytical depth, the XRF results are representative of the entire sample. Furthermore, an appropriate sample thickness that is larger than the analytical depth or constant can prevent changes in fluorescent X‐ray intensity with variations in sample thickness. To obtain accurate and reproducible measurements, inhomogeneous solid samples must be pulverized, homogenized, and prepared as loose powder, powder pellets, or glass beads. This paper explains the approaches used to prepare solid samples for XRF analysis based on the analytical depths of fluorescent X‐rays. Copyright © 2016 John Wiley & Sons, Ltd.     

Preparation of arsenic‐containing white rice grains as calibration standards for X‐ray fluorescence analysis of total arsenic in cereals

A preparation method of arsenic‐containing white rice grains as calibration standards was developed for the X‐ray fluorescence (XRF) analysis of arsenic in rice grains. Calibration standards were prepared by adding 10 g of white rice grains (from Japan) to 100 ml methanol‐containing dimethylarsinic acid corresponding to 2–100 µg arsenic. The mixture was heated, dried at 150 °C, cooled to room temperature, and then stored in a silica gel desiccator. A total of 5.0 g of each calibration standard was packed into a polyethylene cup (32 mm internal diameter and 23 mm height) covered with a 6‐µm‐thick polypropylene film and then analyzed by wavelength‐dispersive XRF spectrometry. The calibration curve for arsenic obtained from the white rice grains containing arsenic showed good linearity over a concentration range of 0.21–5.00 mg kg^?1 arsenic. The limit of detection of arsenic was 0.080 mg kg^?1. To check the reliability of the XRF method, the concentrations of arsenic in six samples of grain cereals and two samples of flour were compared with those obtained by atomic absorption spectrometry after acid decomposition. The values obtained by both analytical methods showed good agreement. Copyright © 2016 John Wiley & Sons, Ltd.     

A simple calibration procedure of polycapillary based portable micro‐XRF spectrometers for reliable quantitative analysis of cultural heritage materials

Portable micro‐X‐ray fluorescence (micro‐XRF) spectrometers mostly utilize a polycapillary X‐ray lens along the excitation channel to collect, propagate and focus down to few tens of micrometers the X‐ray tube radiation. However, the polycapillary X‐ray lens increases the complexity of the quantification of micro‐XRF data because its transmission efficiency is strongly dependent on the lens specifications and the propagated X‐ray energy. This feature results to a significant and not easily predicted modification of the energy distribution of the primary X‐ray tube spectrum. In the present work, we propose a simple calibration procedure of the X‐ray lens transmission efficiency based on the fundamental parameters approach in XRF analysis. This analytical methodology is best suited for compact commercial and portable micro‐XRF spectrometers. The developed calibration procedure is validated through the quantitative analysis of a broad range of samples with archeological relevance such as glasses, historical copper alloys, silver and gold alloys offering an overall accuracy of less than 10%–15%. Copyright © 2015 John Wiley & Sons, Ltd.     

Multielement analysis of lichen samples using XRF methods. Comparison with ICP‐AES and FAAS

This research presents the contents of Ca, Fe, Zn, Br, Rb, Sr and Pb in lichen samples used as biomonitors of air pollution collected in Havana. Statistical comparisons were made among the results obtained in three campaigns during three years. Two X‐Ray Fluorescence (XRF) methods were used, employing for excitation an annular ¹⁰⁹Cd source and a Mo X‐ray tube with a molybdenum secondary target. In both cases, matrix effects were corrected by the use of normalization for the Compton scattered peak; in this way the determination is more efficient. For quality control of the results, biological Certified Reference Materials were analyzed and were made comparisons between XRF, Inductively Coupled Plasma‐Atomic Emission Spectrometry and Flame Atomic Absorption Spectrophotometry. No significant differences were found between the different techniques. The elemental distribution patterns obtained for each metal were associated with different pollution sources, thus contributing to the assessment of air pollution in Havana. Copyright © 2015 John Wiley & Sons, Ltd.     

Quantitative or semi‐quantitative?–laboratory‐based WD‐XRF versus portable ED‐XRF spectrometer: results obtained from measurements on nickel‐base alloys

‘Semi‐quantitative’ analytical procedures are becoming more and more popular. Using such procedures, the question of the accuracy of results arises. The accuracy of an analytical procedure depends to a great extent on spectral resolution, counting statistics and matrix correction. Two ‘semi‐quantitative’ procedures are compared with a quantitative analytical program. Using a laboratory‐based wavelength‐dispersive x‐ray fluorescence (WD‐XRF) spectrometer and a portable energy‐dispersive x‐ray fluorescence (ED‐XRF) spectrometer, 28 different nickel‐base alloy Certified Reference Materials (CRMs) were analyzed. Line interferences and inaccurate matrix correction are reasons for deviations from the reference value. As the comparison shows, ‘semi‐quantitative’ analyses on the WD‐XRF spectrometer can be accepted as quantitative determinations. The investigations show that the results obtained with the portable ED‐XRF spectrometer do not meet the quality requirements of laboratory analysis, but they are good enough for field investigations. Copyright © 2004 John Wiley & Sons, Ltd.     

Accurate standard‐based quantification of X‐ray fluorescence data using metal‐contaminated plant tissue

Quantitative X‐ray fluorescence (XRF) measurements have been conducted on naturally lead‐contaminated samples. The calibration procedure using the ratio of fluorescence to Compton scattered radiation was investigated using Monte Carlo simulation. Experimental results with low‐energy photons (14 keV) and simulations show a very good linearity of the fluorescence to Compton ratio as a function of metal concentration. Lead (Pb), iron (Fe) and zinc (Zn) are measured in samples of Phaseolus vulgaris (bean seeds) that have been grown using a nutritive solution with different Pb dopings. Naturally contaminated samples are thus obtained. The calibration must be done for fixed conditions of X‐ray energy and scattering angle, while X‐ray beam intensity and detector to sample distance can change from one sample to another. Simulation allows to evaluate the matrix effect on the calibration curve, and shows that linearity is preserved even in the presence of other heavy elements in the fluorescence spectrum. However, calibration must be done using samples with similar matrix as it affects the slope of the curve. Copyright © 2010 John Wiley & Sons, Ltd.     

Use of the CEARXRF GUI‐Based Monte Carlo–Library Least‐Squares (MCLLS) Code for the Micro‐Focused EDXRF analyzer

The CEARXRF GUI‐Based Monte Carlo–Library Least‐Squares (MCLLS) Code is demonstrated with results from a micro‐focused EDXRF analyzer, which can be used to calculate elemental weight fractions in metal alloys or rock samples accurately by library least‐squares regression of the measured X‐ray spectrum with computer‐generated elemental library spectra. An elemental stratified sampling variance reduction technique has been implemented in the CEARXRF5 code, which equalizes the statistical precision of the elemental libraries within the measured sample independent of the relative elemental amounts that are present. Also, an improved Si(Li) detector response function (DRF) has been obtained for micro‐focused X‐ray fluorescence (XRF) analyzers, and the DRF parameters are obtained based on regression from pure elemental experimental spectra. It is demonstrated that the resulting MCLLS approach can greatly improve the accuracy of elemental XRF analysis results. Copyright © 2011 John Wiley & Sons, Ltd.     

A multi‐technique approach for the characterization of decorative stones and non‐destructive method for the discrimination of similar rocks

In this paper, a multi‐technique approach, at different scale of observation, is used to characterize a group of decorative stones and to permit to distinguish rocks with similar aspect but coming from different areas. In particular, the samples under study are sedimentary and metamorphic rocks, widely used as building blocks of modern and historical constructions and sculptures. The petrographic and mineralogical features of such rocks were performed by optical microscopy and Raman and Fourier transform infrared absorbance spectroscopies. These techniques permitted to obtain a complete structural, textural, and mineralogical characterization. At elemental level, the investigation was carried out by X‐ray fluorescence (XRF). In particular, XRF and Raman measurements were collected using portable instrumentations, whose advantages for the in situ analysis have been pointed out. The obtained results evidenced the high discriminant capability of the portable XRF for the decorative stones especially when this method is coupled with mineralogical and petrographic information. In this context, we propose to create a database for precious ornamental stones, which could be a starting point for a non‐destructive characterization, even useful for provenance study and/or certification of origin. Copyright © 2013 John Wiley & Sons, Ltd.     

Quantitative elemental analysis of individual particles with the use of micro‐beam X‐ray fluorescence method and Monte Carlo simulation

The aim of the work was to develop a Monte Carlo (MC) method and combine it with micro‐beam X‐ray fluorescence (XRF) technique for determination of chemical composition of individual particles. A collection of glass micro‐spheres, made of NIST (National Institute of Standards and Technoly) K3089 material of known chemical composition, with diameters in the range of 25–45 µm was investigated. The micro‐spheres were measured in a scanning micro‐beam XRF spectrometer utilising X‐ray tube as a source of primary radiation. Results obtained for low Z elements showed high dependence on particle size. It was found that the root mean square of concentration uncertainty, for the all elements present in the particle, increases with growing sample size. More accurate results were obtained for high Z elements such as Fe–Pb, as compared to others. The elemental percentage uncertainty did not exceed 14% for any particular sample and 6% for the whole group of the measured micro‐spheres as an average. Results obtained by the Monte Carlo method were compared with other analytical approaches. Copyright © 2009 John Wiley & Sons, Ltd.     

A sample carrier for measuring discrete powdered samples with an ITRAX XRF core scanner

The elemental composition of discrete powdered sediment samples can be measured by the energy‐dispersive X‐ray fluorescence (XRF) system that is installed in XRF core scanners. Because an appropriate sample carrier for powdered samples is currently not available, for example, for the ITRAX XRF core scanner, such a carrier is presented in this technical note. The designed sample carrier can hold 30 sample cups with a volume of 0.88 cm³ each. A maximum of 5 sample carriers, that is, 150 samples, can be measured in one run. The sample cups and carriers are optimized for a measurement procedure with a step size of 5 mm and variable count times up to 100 s per sample. With this setting, data are collected from an area of 100 mm² in the center of the sample thereby ensuring a good representativeness of the signal because potential sample inhomogeneity is accounted for. Because the described sample carrier system allows rapid element analyses of discrete powdered environmental samples with an XRF core scanner, it may in some cases represent a time‐ and cost‐efficient alternative to conventional XRF analyses.     

Monitoring the polyamide 11 degradation by thermal properties and X‐ray fluorescence spectrometry allied to chemometric methods

The influence of temperature (110 and 120 °C) on the ageing of piping made from polyamide 11 (PA‐11) containing 10–12% of plasticizer was studied using deionized water (pH ≈ 7.0). A clean analytical methodology has been employed for quality control of polymeric materials: energy‐dispersive X‐ray fluorescence spectrometry (ED‐XRF). It provides a fast and suitable technique to characterize chemical elements because of its multielemental capability, good sensitivity, high precision, short analytical time, and nondestructive nature. Herein, the content of additive in PA‐11 was monitored from ED‐XRF measurements where the abundance of the S line is directly related to the ageing time, agreeing with the thermogravimetric analysis. The XRF data were allied to chemometric treatment to classify PA‐11 samples according to the amount of additive and weight average molar mass change, predicting the ageing time, and viscosity values of PA‐11. Therefore, the XRF can be used as a clean analytical methodology to monitor the PA‐11 degradation, thus eliminating the use of toxic organic solvents (necessary to viscosity measurements) and reducing the working time. Also, the effect of hydrolysis on the structure over time and the material morphology were monitored through measurements of dynamic mechanical analysis and differential scanning calorimetry. Copyright © 2012 John Wiley & Sons, Ltd.     

X‐ray excited optical luminescence from crystalline silicon

Synchrotron based X‐ray excited optical luminescence (XEOL) has been measured with many direct bandgap semiconductors. We present XEOL measurements on crystalline silicon (Si), obtained despite of its indirect bandgap and the consequently low luminescence efficiency. Spectra of monocrystalline and multicrystalline (mc) Si at room temperature are compared to theoretical spectra. A possible application in the synchrotron‐based research on mc‐Si is exemplified by combining XEOL, X‐ray fluorescence (XRF) spectroscopy, photoluminescence (PL) spectroscopy, and microscope images of grain boundaries. This approach can be utilized to investigate the recombination activity of metal precipitates, to analyze areas of different lifetimes on mc‐Si samples and to correlate additional material parameters to XRF measurements. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Preparation of sulfur reference materials that reproduce atmospheric particulate matter sample characteristics for XRF calibration

Energy‐dispersive X‐ray fluorescence (XRF) is an important tool used in routine elemental analysis of atmospheric particulate matter (PM) samples collected on polytetrafluoroethylene (PTFE) membrane filters. The method requires calibration against thin‐film standards of known elemental masses commonly obtained from commercial suppliers. These standards serve as a convenient and widely accepted interlaboratory reference but can differ significantly from samples in their chemical composition, substrate, and geometry. These differences can introduce uncertainties regarding the absolute accuracy of the calibration for atmospheric samples. Continuous elemental records of the US Interagency Monitoring of Protected Visual Environments (IMPROVE) PM monitoring network extend back to 1988. Evaluation of long‐term concentration trends and comparison with other networks demand a calibration that is accurate and precise compared with the uncertainty of the XRF measurement itself. We describe a method to prepare sulfur reference materials that are optimized for calibration of XRF instruments used to analyze IMPROVE PM samples. The reference materials are prepared by using the atmospheric form of the element, by reproducing the sample geometry, and by using the same substrate as in samples. Our results show that stable, pure, anhydrous, and stoichiometric deposits are collected onto the filter substrates, and furthermore, that the reference material masses are accurate and have acceptable uncertainty in the measurement range. The XRF response of the sulfur reference materials is similar to other commercial standards and is linear in the measurement range, and the slope of the multipoint calibration curve has very low uncertainty. These reference materials are valid for the calibration of XRF systems, and they bring improved transparency and credibility to the IMPROVE calibration. Copyright © 2013 John Wiley & Sons, Ltd.     

Comparison of trace elements analysis of nephrite samples from different deposits by PIXE and ICP‐AES

Comparing values of trace elements determined by external‐beam proton‐induced X‐ray emission (PIXE) and inductively coupled plasma atomic emission spectrometry (ICP‐AES) is important to find the provenience of raw materials of ancient nephrite artifacts, because most previous elemental characterizations of nephrite minerals were obtained by ICP‐AES, but PIXE presents the possibility of nondestructive analysis for largely and integrally ancient nephrite artifacts. In this work based on 12 nephrite minerals, it shows that the distribution of trace elements of nephrite samples both in PIXE and ICP‐AES data are generally consistent, although large differences exist in some elements. According to the trace elements, the two types of nephrite mineralization origins can be distinguished, determined by PIXE and ICP‐AES, respectively. Moreover, depending on the PIXE and ICP‐AES data, Sr can be regarded as fingerprint element of Xiaomeiling nephrite minerals, and the differentiation of Sr content between Xiaomeiling nephrite minerals and ancient nephrite artifacts from Liangzhu culture (3300–2300 bc ) is clear evidence that the raw materials of the artifacts are not from Xiaomeiling deposit. The nephrite minerals from Wenchuan deposit can be distinguished from other samples because of their high values of Mn/Fe. Therefore, the PIXE can be used with ICP‐AES to judge mineralization mechanism and find fingerprint elements of raw materials of ancient nephrite artifacts. Copyright © 2012 John Wiley & Sons, Ltd.     

Methodological challenges of optical tweezers‐based X‐ray fluorescence imaging of biological model organisms at synchrotron facilities

Recently, a radically new synchrotron radiation‐based elemental imaging approach for the analysis of biological model organisms and single cells in their natural in vivo state was introduced. The methodology combines optical tweezers (OT) technology for non‐contact laser‐based sample manipulation with synchrotron radiation confocal X‐ray fluorescence (XRF) microimaging for the first time at ESRF‐ID13. The optical manipulation possibilities and limitations of biological model organisms, the OT setup developments for XRF imaging and the confocal XRF‐related challenges are reported. In general, the applicability of the OT‐based setup is extended with the aim of introducing the OT XRF methodology in all research fields where highly sensitive in vivo multi‐elemental analysis is of relevance at the (sub)micrometre spatial resolution level.     

Monte Carlo simulation code for confocal 3D micro‐beam X‐ray fluorescence analysis of stratified materials

Stratified materials are of great importance for many branches of modern industry, e.g. electronics or optics and for biomedical applications. Examination of chemical composition of individual layers and determination of their thickness helps to get information on their properties and function. A confocal 3D micro X‐ray fluorescence (3D µXRF) spectroscopy is an analytical method giving the possibility to investigate 3D distribution of chemical elements in a sample with spatial resolution in the micrometer regime in a non‐destructive way. Thin foils of Ti, Cu and Au, a bulk sample of Cu and a three‐layered sandwich sample, made of two thin Fe/Ni alloy foils, separated by polypropylene, were used as test samples. A Monte Carlo (MC) simulation code for the determination of elemental concentrations and thickness of individual layers in stratified materials with the use of confocal 3D µXRF spectroscopy was developed. The X‐ray intensity profiles versus the depth below surface, obtained from 3D µXRF experiments, MC simulation and an analytical approach were compared. Correlation coefficients between experimental versus simulated, and experimental versus analytical model X‐ray profiles were calculated. The correlation coefficients were comparable for both methods and exceeded 99%. The experimental X‐ray intensity profiles were deconvoluted with iterative MC simulation and by using analytical expression. The MC method produced slightly more accurate elemental concentrations and thickness of successive layers as compared to the results of the analytical approach. This MC code is a robust tool for simulation of scanning confocal 3D µXRF experiments on stratified materials and for quantitative interpretation of experimental results. Copyright © 2011 John Wiley & Sons, Ltd.