极化子比率变化对自旋注入有机半导体性质的影响

从自旋扩散方程和欧姆定律出发研究了铁磁层到有机半导体的自旋注入,得到了系统的电流自旋极化率。有机半导体中的载流子为自旋极化子和不带自旋的双极化子,极化子比率在有机半导体内随输运距离变化。通过计算发现匹配的铁磁和有机半导体电导率有利于自旋注入;通过调节界面电阻自旋相关性,电流自旋极化率可获得很大程度提高;极化子比率衰减速率对有机半导体电流自旋极化率具有非常重要的影响。     

铁磁/有机半导体/铁磁系统的电流自旋极化性质研究

根据有机半导体中的电流自旋极化注入和输运实验现象，理论上研究了铁磁/有机半导体/铁磁系统的电流自旋极化性质.考虑到有机半导体的具体特性，从自旋扩散理论和欧姆定律出发，得到了系统的电流自旋极化率.假设自旋极化子和不带自旋的双极化子为有机半导体中的载流子.通过计算发现，极化子为实现有机半导体中电流极化注入和输运的有效自旋载流子，即使它只占总载流子很少一部分.还进一步研究了自旋相关界面电阻和电导率匹配以及有机半导体长度等因素对系统电流自旋极化的影响. 关键词： 自旋电子学 自旋注入 有机半导体 极化子     

有机器件电流自旋极化放大性质研究

基于自旋扩散漂移方程,考虑到电场的影响及有机半导体中特殊的载流子电荷自旋关系, 对一个简单的T型结构有机自旋器件模型进行了理论研究,得出了此有机器件的电流自旋 极化放大率表达式.研究表明,器件中极化子比率、电场和电流密度都会影响器件的电流 自旋极化放大率,通过调节此有机器件的电场和极化子比率可以获得较大的电流自旋 极化放大率.     

自旋注入有机物的扩散理论

根据自旋注入半导体的相关理论， 考虑到有机体内可能同时含有带自旋的单极化子和不带自旋的双极化子两种载流子，从扩散 理论和欧姆定律出发，建立了自旋注入有机体的唯象模型.通过计算发现，适当选择铁磁层极化率或两层的电导率可以使得有机层内电流具有高的自旋极化.进一步研究了单极化子浓度等因素对注入电流极化的影响. 关键词： 自旋电子学 自旋注入 有机聚合物 极化子     

磁台阶势垒结构中二维电子气的自旋极化输运

运用散射矩阵方法,研究了台阶磁势垒量子结构中二维电子气的隧穿输运性质.结果表明：在零偏压下,电子传输概率的自旋极化曲线随入射能量的增加而振荡衰减;随着磁台阶数的增加,电子传输概率的自旋极化度最大值减小,同时电子传输概率的自旋极化度振荡衰减也越来越慢;随着磁台阶的总宽度增加,电子传输概率的自旋极化曲线出现更明显的振荡,电子隧穿磁台阶势垒表现出明显的量子尺寸效应;在偏置电压的作用下,电子传输概率的自旋极化度在宽广的入射能量区出现明显的振荡增大,电子隧穿磁台阶势垒表现出更明显的自旋过滤效应. 关键词： 磁台阶势垒 自旋极化 自旋过滤     

一维铁磁/有机系统的基态与自旋分布研究

文中用一维紧束缚模型描述铁磁金属,用一维非简并的Su-Schrieffer -Heeger (SSH)模型描述共轭聚合物,研究了在一维铁磁/共轭聚合物系统和一维CMR材料/ 聚合物系统中的电子转移和自旋转移.发现在聚合物部分没有自旋的双极化子比有自旋的极化子具有较低的能量而容易产生.然而在铁磁CMR材料/聚合物系统中极化子的产生能低于聚合物中极化子的产生能,增加了有机物中自旋极化输运的可能性.     

自旋极化电子从铁磁金属注入半导体时自旋极化的计算

对自旋极化电子从铁磁金属通过绝缘层薄膜注入半导体时的自旋极化率与绝缘层厚度以及所加偏压的关系等作了计算.所得结果与最新实验结果相符，并发现偏压适中、绝缘层较厚时 有较大的电流自旋极化率，偏压很小时电流自旋极化率几乎为零. 关键词： 自旋极化电子注入 Slonczewski模型 隧道磁电阻 非零偏压     

肖特基结的制备与势垒测量

采用磁控溅射方法在Nb07％-SrTiO3基片上制作Au薄膜接触,并在氧气气氛下750℃退火30 min,在室温环境下测量电流电压和电容电压等特性曲线,观测整流特性,根据相应实验数据采用饱和电流法、电容C-2与反偏电压V成线性关系计算肖特基势垒的大小.     

InAs量子点在肖特基势垒二极管输运特性中的影响

在77到292K的范围内,系统研究了含InAs自组装量子点的金属-半导体-金属双肖特基势垒二极管的输运特性.随着温度上升,量子点的存储效应引起的电流回路逐渐减小.在测试温度范围内,通过量子点的共振隧穿过程在电流电压(I-V)曲线中造成台阶结构,且使电流回路随温度的上升急剧减小.根据肖特基势垒的反向I-V曲线,计算了势垒的反向饱和电流密度和平均理想因子.发现共振随穿效应使肖特基势垒在更大的程度上偏离了理想情况,而量子点的电子存储效应主要改变了肖特基势垒的有效势垒高度,从而影响了势垒的反向饱和电流密度 关键词： 自组装量子点 肖特基势垒 电流-电压特性     

GaN基肖特基势垒二极管结构优化研究进展

作为宽禁带半导体器件,GaN基肖特基势垒二极管(SBD)有耐高压、耐高温、导通电阻小等优良特性,这使得它在电力电子等领域有广泛应用。本文首先综述了SBD发展要解决的问题;然后,介绍了GaN SBD结构、工作原理及结构优化研究进展;接下来,总结了AlGaN/GaN SBD结构、工作原理及结构优化研究进展,并着重从AlGaN/GaN SBD的外延片结构、肖特基电极结构以及边缘终端结构等角度,阐述了这些结构的优化对AlGaN/GaN SBD性能的影响;最后,对器件进一步的发展方向进行了展望。     

The effects of electric and magnetic fields on the current spin polarization and magnetoresistance in a ferromagnetic/organic semiconductor/ferromagnetic（FM/OSC/FM） system

From experimental results of spin polarized injection and transport in organic semiconductors(OSCs),we theoretically study the current spin polarization and magnetoresistance under an electric and a magnetic field in a ferromagnetic/organic semiconductor/ferromagnetic(FM/OSC/FM) sandwich structure according to the spin drift-diffusion theory and Ohm’s law.From the calculations,it is found that the interfacial current spin polarization is enhanced by several orders of magnitude through tuning the magnetic and electric fields by taking into account the specific characteristics of OSC.Furthermore,the effects of the electric and magnetic fields on the magnetoresistance are also discussed in the sandwich structure.     

Schottky barrier MOSFET structure with silicide source/drain on buried metal

In this paper, we propose a novel Schottky barrier MOSFET structure, in which the silicide source/drain is designed on the buried metal (SSDOM). The source/drain region consists of two layers of silicide materials. Two Schottky barriers are formed between the silicide layers and the silicon channel. In the device design, the top barrier is lower and the bottom is higher. The lower top contact barrier is to provide higher {on-state} current, and the higher bottom contact barrier to reduce the off-state current. To achieve this, ErSi is proposed for the top silicide and CoSi₂ for the bottom in the n-channel case. The 50~nm n-channel SSDOM is thus simulated to analyse the performance of the SSDOM device. In the simulations, the top contact barrier is 0.2e~V (for ErSi) and the bottom barrier is 0.6eV (for CoSi₂. Compared with the corresponding conventional Schottky barrier MOSFET structures (CSB), the high on-state current of the SSDOM is maintained, and the off-state current is efficiently reduced. Thus, the high drive ability (1.2mA/μm at V_ds=1V, V_gs=2V) and the high I_on/I_min ratio (10⁶) are both achieved by applying the SSDOM structure.     

扰动对有机磁体器件自旋极化输运特性的影响

基于紧束缚模型和格林函数方法,研究了有机磁体晶格扰动和侧基自旋取向扰动对金属/有机磁体/金属三明治结构有机自旋器件自旋极化输运特性的影响.计算结果表明:晶格扰动的存在降低了器件的起始偏压,减小了导通电流,并使得电流-电压曲线的量子台阶效应不再显著,扰动不太强时电流仍呈现较高的自旋极化率;而侧基自旋取向扰动减小了体系的自旋劈裂,增加了器件的起始偏压,低偏压下随着扰动的增强器件电流及其自旋极化率明显降低.进一步模拟了温度对器件自旋极化输运的影响. 关键词： 有机自旋电子学 有机磁体 自旋极化输运 自旋过滤     

有机自旋器件磁性渗透层中双极化子对自旋极化输运的影响

根据实验发现的有机器件如Co/有机半导体/La_0.7Sr_0.3MnO₃中磁性原子渗透现象, 利用自旋漂移-扩散方程, 理论研究了磁性渗透层中极化子-双极化子的转化对自旋极化输运的影响. 研究发现: 磁性渗透层具有不同于纯净有机层的迁移率和自旋反转时间, 都将影响极化子-双极化子的转化, 进而影响自旋极化的输运; 在磁性渗透层中极化子自旋反转时间的劈裂是引起自旋弛豫的主要因素, 而极化子和双极化子之间的转化是重要因素.     

Laterally inhomogeneous barrier analysis of the methyl violet/p-Si organic/inorganic hybrid Schottky structures

In this work, we have investigated the electrical characteristics, such as current-voltage (I-V) and capacitance-voltage (C-V) measurements, of identically prepared crystal violet/p-Si Organic/Inorganic (OI) Schottky structures formed by evaporation of organic compound solution to directly p-Si semiconductor substrate. It has been seen that the crystal violet organic dye thin film on the p-Si substrate has exhibited a good rectifying behavior. The barrier heights (BHs) and ideality factors of all devices have been calculated from the electrical characteristics. Although the diodes were all identically prepared, there was a diode-to-diode variation: the effective barrier heights ranged from 0.6 ± 0.1 to 0.8 ± 0.1 eV, and the ideality factor from 1.6 ± 0.4 to 3.5 ± 0.4. The barrier height versus ideality factor plot has been plotted for the OI devices. Lateral homogeneous BH was calculated as a value of 0.7 eV from the observed linear correlation between BH and ideality factor, which can be explained by laterally inhomogeneities of BHs. The values of barrier height and acceptor doping concentration yielded from the reverse bias C-V measurements ranged from 0.7 ± 0.1 to 1.3 ± 0.1 eV and from (4.7 ± 0.8) × 10¹⁴ to (8.1 ± 0.8) × 10¹⁴ cm⁻³, respectively. The mean barrier height and mean acceptor doping concentration from C-V characteristics has been calculated 1.0 eV and 5.9 × 10¹⁴ cm⁻³, respectively. It has been seen that the mean BH value of 0.7 eV obtained for the Al/methyl violet/p-Si contact is significantly larger than BH values of the conventional Al/p-Si Schottky diodes. Thus, modification of the interfacial potential barrier for metal/Si diodes has been achieved using a thin interlayer of the methyl violet organic semiconductor; this has been ascribed to the fact that the methyl violet interlayer increases the effective barrier height by influencing the space charge region of Si.     

Demonstration of electrical spin injection into a semiconductor using a semimagnetic spin aligner

Spin injection into semiconductors has been a field of growing interest during recent years, because of the large possibilities in basic physics and for device applications that a controlled manipulation of the electrons spin would enable. However, it has proven very difficult to realize such a spin injector experimentally. Here we demonstrate electrical spin injection and detection in a GaAs/AlGaAs p-i-n diode using a semimagnetic II–VI semiconductor (Zn_{1 − x − y}Be_xMn_ySe) as a spin aligner. The degree of circular polarization of the electroluminescence from the diode is related to the spin polarization of the conduction electrons. Thus, it may be used as a detector for injected spin-polarized carriers. Our experimental results indicate a spin polarization of the injected electrons of up to 90% and are reproduced for several samples. The degree of optical polarization depends strongly on the Mn concentration and the thickness of the spin aligner. Electroluminescence from a reference sample without spin aligner as well as photoluminescence after unpolarized excitation in the spin aligner sample show only the intrinsic polarization in an external magnetic field due to the GaAs bandstructure. We can thus exclude side effects from Faraday effect or magnetic circular dichroism in the semimagnetic layer as the origin of the observed circularly polarized electroluminescence.