利用激光光热技术研究钛酸钡材料的导热性能

利用激光光热偏转技术测量了钛酸钡材料的热扩散率。根据所测量材料的光热光偏转信号,通过最小二乘法中的非线性拟合,直接拟合出了材料的热扩散率,克服了光热偏转技术中“Mirage effect”步骤多、计算复杂、误差大的缺点。测量了在不同成型压力和不同烧结温度下钛酸钡材料的热扩散率,得到了热扩散率随成型压力和烧结温度的变化规律。对实验结果进行了分析和讨论。     

利用Mirage效应确定非均匀材料厚度方向的热扩散率分布

在热导率沿试样厚度按指数规律渐变的假设下，利用两种基本数学变换，求解了非均匀材料的热传导方程，得到了试样内及与其相邻媒质内的温度场解析解。再根据光热光偏转理论，确定了检测光束切向偏转分量的位相与调制频率之间的函数关系，如果利用熟知的由检测光束法向偏转分量测定试样热扩散率的技术，测定试样两表面的热扩散率，这样就可以由Mirage效应的两个偏转分量来测定试样热扩散率沿厚度方向的分布。本文给出有关的理论推导，同时也给出了人造金刚石试样内热扩散率分布的实验结果。     

横向激光光热偏转相位法测量金刚石薄片的热扩散率

本文介绍横向激光光热偏转装置的优化设计及其利用相位信息测量CVD金刚石薄片的热扩散率,并和脉冲激光光热辐射方法测量的结果相比较.     

光热偏转检测技术自动测量的研究

介绍了光热偏转技术自动测量材料热物性的原理及实验方法。根据光热偏转检测理论建立了一套自动检测系统,从自动控制、数据采集和数据处理等方面实现了光热偏转检测技术的自动化测量。设计出了步进电机自动控制和数据处理软件。利用该系统对钛酸锶钡材料的热扩散率进行了测量,发现随着掺杂量铈的增加,钛酸锶钡的热扩散率逐渐减小,当掺杂量铈增加到一定值时,其热扩散率又开始增加。     

光声技术在固体材料热扩散率测量中的应用

光声（光热）效应是由于物质吸收一强度随时间变化的光束而被时变加热时所引起的一系列热效应和声效应,研究了这些热效应和声效应,可以获得物质的热学和学学性质,光声技术正是探测由于吸收光辐射后样品的微小温度变化所引起的周围气体压力变化,具有灵敏度高、操作方便、应用广泛等独特的优点,已成为研究物质光谱特性、热学性质等的独特有力手段,文章主要介绍了光声技术在固体热扩散率测量中的原理及常规应用方法。     

反射式液晶空间光调制器电控光束偏转

为获得较大的光束电控偏转范围,使用空间分辨力高达8 m的反射式液晶空间光调制器实现了对入射632 nm激光的电控偏转。利用双光束共焦干涉方法测量了液晶空间光调制器的电控相位延迟特性,最大相移量可达3。根据二元光学理论和器件的电控相位延迟特性,设计了周期台阶相位模式和相应的加载灰度图,以最大衍射效率实现对入射光束的闪耀电控偏转。结果表明:相位模式台阶数为8时,可以实现10 mrad的光束偏转,闪耀级次衍射效率可达46%。利用二元光学的衍射模型对影响衍射效率的关键因素进行了分析,认为器件较低的填充因子和周期台阶模式相位重置点诱导的指向矢回程区是限制光束衍射效率的主要因素。     

光束偏转信号灵敏度的分析

激光光束编转法是一种非接触的探测技术。本文从理论上分析了光速偏转信号的灵敏度的基本限制。并给出了一种提高信号对光速偏转灵敏度的方法。     

基于Wollaston棱镜的大角度液晶光束偏转系统

设计了一种能够应用于空间光通信的大角度高精度光束偏转系统。系统采用液晶空间光调制器(LCSLM)实现小角度光束偏转,采用多Wollaston棱镜级联实现角度放大。介绍了LCSLM和Wollaston棱镜的光束偏转原理,并对大角度高精度光束偏转系统进行了仿真分析。仿真结果表明系统能够实现角度范围为±13.25°的光束偏转。国内首次提出运用Wollaston棱镜来实现大角度的光束偏转。     

自然双折射晶体中热致双折射效应的研究

激光振荡器和激光放大器中激光晶体的热效应对光束特性有着重要的影响,不仅改变了光束的波前,还影响了光束的偏振态。基于激光晶体内的弹光效应,通过对光率体的主轴化,研究了自然双折射晶体中的热致双折射效应。结果表明,弹光效应对自然双折射晶体光率体的影响主要表现为横截面内椭圆主轴的偏转,主轴偏转角度小于0.01°。在激光振荡器和放大器中,一束线偏振激光经过具有热效应的自然双折射晶体之后退偏率小于1.8×10-8,这种条件下热致双折射效应的影响可以忽略,这与光学各项同性晶体完全不同。     

基于空间光调制器的光束大角度扫描技术研究

为实现一束激光在90°锥形范围内的扫描,利用液晶空间光调制器在光束偏转控制时精度高、无机械惯性等优点,研究并建立了基于液晶空间光调制器的光束偏转和角放大光路系统。提出了空间光调制器的可编程相位调制算法和角放大光路结构,推导了空间光调制器光束偏转角度与相位灰度驱动图的关系,设计了角度放大倍率高于22倍的角放大光路系统。在此基础上,建立了光束扫描控制实验系统,对该装置角度出射范围进行了测量,将实际的角放大倍率与设计值进行对比。实验结果表明:研制系统的出射视场角可达91.22°,并可通过畸变校正实现出射视场角范围内的规则形状扫描。该研究在光束敏捷控制、无线激光通信、目标搜索与追踪等领域具有重要的研究价值和应用前景。     

Sagnac interferometer for photothermal deflection spectroscopy

Photothermal deflection spectroscopy is combined with a Sagnac interferometer to enhance the sensitivity of the absorption measurement by converting the photothermal beam deflection effect into the light intensity change by the interference effect. Because of stable light interference due to the common path, the signal intensity can be amplified without increasing the noise by extending the optical path length between a sample and a photodetector. The sensitivity is further improved by the use of focusing optics and double-pass geometry. This makes photothermal deflection spectroscopy applicable to any kind of material in the whole visible region with a xenon lamp for excitation and water or air as a deflection medium.     

Parallel Plate Interferometer with a Reflecting Mirror for Measuring Angular Displacement

A parallel plate interferometer with a reflecting mirror for measuring angular displacement is proposed. A deflection angle of a beam caused by an angular displacement is amplified by use of a reflecting mirror to increase the optical path difference (OPD) in the plane-parallel plate, which provides high sensitivity of the phase measurement. Detection of light transmitted through the plane-parallel plate with a position sensitive detector (PSD) enables high accurate measurement of the initial angle of incidence to the plane-parallel plate with insensitivity to stray light. The improved parallel plate interferometer achieves a measurement repeatability of 10⁻⁸ rad.     

Photothermal techniques with a top-hat beam excitation

A flatly topped circular beam (“top-hat beam”) is employed as the excitation beam for photothermal deflection and surface thermal lens techniques. The Fresnel diffraction model is applied to describe the photothermal signals. The theoretical comparison between a Gaussian beam and a top-hat beam excited photothermal signal amplitudes shows that the use of the top-hat beam excitation improves the measurement sensitivity of the photothermal techniques. Experimental results for both photothermal deflection and surface thermal lens are presented. The potential applications of the top-hat beam excited photothermal techniques are highlighted.     

光热偏转光谱法的研究

为了建立棱镜型光热偏转光谱法的理论框架,采用棱镜的光色散特性研究了激励光源对待测样品表面周期性照射情况下的探测光偏转角与光热信号之间的解析关系。得到了棱镜型样品表面周期性变化的偏转角表达式。实现结果表明,该方法比传统型光谱法具有理论模型简单、实验容易实现、分辨率高、灵敏度高等优点。     

All Optical Light Deflection and Displacement Using Nonlinear Slab Waveguide

The possibility of all optical control of light deflection and displacement through a planar nonlinear waveguide has been discussed in this article. In this scheme a strong command beam controls the propagation characteristics of a weak signal beam in a nonlinear waveguide. Employing variational approach, we have established a set of coupled nonlinear equations for the displacement of the center of gravity, beam size, deflection angle, and beam divergence of the signal beam. These equations have been solved numerically to confirm the possibility of all optical control of deflection and displacement of a signal beam by a command beam.     

Multi-beam method to increase the stability of bridge deflection measurement

The main limitation to the accuracy of the detection of a bridge deflection using laser-based optical solutions is atmospheric turbulence because of the laser beam propagation in ground proximity. The multi-beam method is presented to increase the stability of bridge deflection measurement. It is based on the use of a four-beam optical system and a subpixel resolution algorithm for the measurement of the deflection of a laser beam that propagates through the system. To obtain accurate results, different algorithms for measuring the position of the deflected beam in different optical systems are tested and compared. Based on this comparison, the four-beam method based on the macropixels iteration centroid and four-beam optical system is selected, and an accuracy of 0.16 pixels is obtained by the determination of the beam position in our setup. The proposed method is adopted to detect the bridge deflection and an accuracy of 0.01 mm is gained when the scintillation index C_n² is 3×10⁻⁴ m^−2/3.     

Detection sensitivity of the optical beam deflection method characterized with the optical spot size on the detector

Here we describe the effect of the incident optical spot size upon the quadrant photodetector on the displacement detection sensitivity of the optical beam deflection method. By varying the size of the beam spot reaching the photodetector and measuring the optical responsivity, we have determined the optical detection sensitivity as a function of the optical spot size on the photodetector. Also, we have calculated the numerical value of the detection sensitivity with the Gaussian optical spot profile and compared with the experimental data. Both experimental and analytic studies show that the optical displacement detection sensitivity increases with the decrease in the width of the Gaussian optical spot. The study presented here will be beneficial in developing the nanomechanical displacement detection techniques based on the beam deflection method with a position-sensitive detector.     

Photothermal deflection microscopy for imaging sub-micronic defects in optical materials

Photothermal deflection is widely used to study defects in optical coatings and role of these defects in laser damage. Because defects responsible for laser damage are assumed to be nanometer-sized and lowly absorbing, both high spatial resolution and high sensitivity are required to detect them. In this work we theoretically and experimentally explore the capability of collinear photothermal deflection to give micronic resolution by reduction of the pump beam diameter. Thanks to a model describing temperature distribution and photothermal deflection, we have studied the effects of pump beam focusing on photothermal deflection. Then, we have developed a high resolution, high sensitivity microscope based on the photothermal deflection of a transmitted probe beam. The setup is characterized and the theoretical predictions are checked. We present a test of lateral spatial resolution obtained on specially prepared absorbing resolution targets and show that a lateral spatial resolution of 1 μm is reached on non-isolated defects. In case of single defects, we expect that 10 nm sized defects could be detected.