X射线二极管的灵敏度标定和应用

阐述了Ｘ射线二极管铝阴极光电转换量子效率，并在单色亚千Ｘ射线光源装置上对铝阴极的灵敏度进行了绝对标定，最后介绍了采用Ｘ射线二极管探头来测量激光－等离子体相互作用中产生的亚千Ｘ射线能量。     

垂直腔面发射激光器低温光电特性

垂直腔面发射激光器通常被用作常温下850 nm波段短波长短距离光互连领域的激光光源,多在室温下进行测试和使用.在低温环境下垂直腔面发射激光器工作状态的表征是本文的研究重点.我们表征了在不同温度下直流驱动垂直腔面发射激光器的发光光谱和10%占空比脉冲电流驱动垂直腔面发射激光器的发光光谱和功率-电流-电压曲线.通过测试激光器在室温和10 K温度下性能的变化,证明了现有的垂直腔面发射激光器在低温下仍能工作,激光器在10 K低温环境下仍可以作为光互连的光源使用,这一特点使得该激光器的应用范围可拓展至低温领域,预示着垂直腔面发射激光器在低温光互连系统中具有应用价值.     

飞秒和纳秒脉冲作用下等离子体X射线辐射特性

对飞秒和纳秒激光作用下的Ａｌ和Ｃｕ等离子体的Ｘ射线辐射进行了测量，分析和比较。实验结果表明在飞秒激光脉冲下等离子体Ｘ射线峰值向短波方向移动。     

短波长辐射及其应用

近年来,许多科学技术领域对远紫外辐射和真空紫外辐射这类短波长光辐射的需求有了较大的增长.而传统的这类光源,如氢灯、氘灯、无窗惰性气体放电管、氮弧及BRV源(一种在高真空环境中高Z电极间的低电感快脉冲放电光源)等强度较弱,用单色仪分光和检测时的光谱分辨率亦嫌不足.而在可见和近紫外光谱区中,各种脉冲和连续波染料激光器的发展日趋成熟,有商品出售,并已应用于许多领域中.染料激光器的可调谐范围宽、线宽窄、输出波长(或频率)稳定和输出功率大.用准分子激光泵浦的染料激光,还可以在近紫外区调谐.但是,向更短波长区延伸,染料激光的效…     

无碎屑激光等离子体软X射线源的研究及应用前景

分析了常规金属靶激光等离子体源产生固体碎屑的原因及其对软Ｘ射线光学元件的危害，介绍了近年来发展起来的无碎屑激光等离子体软Ｘ射线源，归纳了无碎屑激光等离子体软Ｘ射线源的几种形式和特点，并且描述了这种新型光源在软Ｘ射线显微术及光刻术中的应用．     

利用X射线激光器更精确地控制超快过程和化学反应

一种新型激光器以1．4613113的X射线短波长发射出相干脉冲——在能源方面,这就是干电子伏系统。德国电子加速器公司自由电子激光科学中心的Nina Rohringer与其它研究人员在报道中称已发明了利用粒子数反转增益的高能激光器,     

高重复频率激光等离子体软X光脉冲探测

研制了一种高重复频率小型激光等离子体软Ｘ光脉冲探测装置，给出其设计原理和性能参量，采用光谱学诊断方法研究了光源的软Ｘ射线辐射特性，得到了一些新的实验结果     

改型摆动器光学速调管谐波自由电子激光器

提出了一种光学速调管自由电子激光器的新方案，并用Ｍａｄｅｙ定理这种新型的谐波自由电子激光器进行了分析和计算。结果表明，这种新型结构的自由电子激光器可以增大高次谐波的辐强度和增益，从而可望使自由电子激光工作在高次谐波上，提供短波长的光输出。     

X射线胶片的脉冲光源响应标定

用ＬＦ－１１激光装置的１．０６μｍ脉冲激光加热Ｃｕ靶产生的Ｌ－壳层线辐射作脉冲Ｘ射线源，在曝光量为（０．０１～１０）－７Ｊ·ｃｍ－２范围内，标定了ＫＯＤＡＫＡＡ－５，ＫＯＤＡＫＳＷＲ和ＵＦＳＨ－Ｏ软Ｘ射线胶片的响应曲线，并与用连续光源标定的进行了对比．结果表明，这三种ｘ射线胶片，在强脉冲光源曝光条件下，都存在着胶片响应互易律失效问题，过去用连续光源标定的响应曲线，在激光等离子体诊断实验中，已经不能采用．     

0．53μm激光与等离子体相互作用实验研究

利用神光－Ⅰ激光装置的南路光束经ＫＤＰ晶体倍频后的０．５３μｍ激光与金盘靶相互作用，重点研究了吸收、Ｘ光转换、ＳＲＳ、超热电子和离子发射行为。结果表明，采用短波长激光，吸收和Ｘ－光转换率明显提高。     

Silicon nitride transmission X‐ray mirrors

Transmission X‐ray mirrors have been fabricated from 300–400 nm‐thick low‐stress silicon nitride windows of size 0.6 mm × 85 mm. The windows act as a high‐pass energy filter at grazing incidence in an X‐ray beam for the beam transmitted through the window. The energy cut‐off can be selected by adjusting the incidence angle of the transmission mirror, because the energy cut‐off is a function of the angle of the window with respect to the beam. With the transmission mirror at the target angle of 0.22°, a 0.3 mm × 0.3 mm X‐ray beam was allowed to pass through the mirror with a cut‐off energy of 10 keV at the Cornell High Energy Synchrotron Source. The energy cut‐off can be adjusted from 8 to 12 keV at an angle of 0.26° to 0.18°, respectively. The observed mirror transmittance was above 80% for a 300 nm‐thick film.     

Characterization of X‐ray gas attenuator plasmas by optical emission and tunable laser absorption spectroscopies

X‐ray gas attenuators are used in high‐energy synchrotron beamlines as high‐pass filters to reduce the incident power on downstream optical elements. The absorption of the X‐ray beam ionizes and heats up the gas, creating plasma around the beam path and hence temperature and density gradients between the center and the walls of the attenuator vessel. The objective of this work is to demonstrate experimentally the generation of plasma by the X‐ray beam and to investigate its spatial distribution by measuring some of its parameters, simultaneously with the X‐ray power absorption. The gases used in this study were argon and krypton between 13 and 530 mbar. The distribution of the 2p excited states of both gases was measured using optical emission spectroscopy, and the density of argon metastable atoms in the 1s₅ state was deduced using tunable laser absorption spectroscopy. The amount of power absorbed was measured using calorimetry and X‐ray transmission. The results showed a plasma confined around the X‐ray beam path, its size determined mainly by the spatial dimensions of the X‐ray beam and not by the absorbed power or the gas pressure. In addition, the X‐ray absorption showed a hot central region at a temperature varying between 400 and 1100 K, depending on the incident beam power and on the gas used. The results show that the plasma generated by the X‐ray beam plays an essential role in the X‐ray absorption. Therefore, plasma processes must be taken into account in the design and modeling of gas attenuators.     

A video camera system for coaxial observation of a sample with an incident soft X‐ray beam

A video camera system for observing a sample from the direction of an incident soft X‐ray beam has been developed. The sample is seen via two reflecting mirrors. The first mirror, which has a hole to allow the soft X‐ray beam to pass through, is set on the beam axis in a vacuum. The second mirror is used to cancel out the mirror inversion of the image. This camera system is used for efficient positioning of samples in a soft X‐ray beam.     

Focused ion beam preparation of samples for X‐ray nanotomography

The preparation of hard material samples with the necessary size and shape is critical to successful material analysis. X‐ray nanotomography requires that samples are sufficiently thin for X‐rays to pass through the sample during rotation for tomography. One method for producing samples that fit the criteria for X‐ray nanotomography is focused ion beam/scanning electron microscopy (FIB/SEM) which uses a focused beam of ions to selectively mill around a region of interest and then utilizes a micromanipulator to remove the milled‐out sample from the bulk material and mount it on a sample holder. In this article the process for preparing X‐ray nanotomography samples in multiple shapes and sizes is discussed. Additionally, solid‐oxide fuel cell anode samples prepared through the FIB/SEM technique underwent volume‐independence studies for multiple properties such as volume fraction, average particle size, tortuosity and contiguity to observe the characteristics of FIB/SEM samples in X‐ray nanotomography.     

Windowless transition between atmospheric pressure and high vacuum via differential pumping for synchrotron radiation applications

A differential pump assembly is introduced which can provide a windowless transition between the full atmospheric pressure of an in‐air sample environment and the high‐vacuum region of a synchrotron radiation beamline, while providing a clear aperture of approximately 1 mm to pass through the X‐ray beam from a modern third‐generation synchrotron radiation source. This novel pump assembly is meant to be used as a substitute for an exit vacuum window on synchrotron beamlines, where the existence of such a window would negatively impact the coherent nature of the X‐ray beam or would introduce parasitic scattering, distorting weak scattering signals from samples under study. It is found that the length of beam pipe necessary to reduce atmospheric pressure to below 10 mbar is only about 130 mm, making the expected photon transmission for hard X‐rays through this pipe competitive with that of a regular Be beamline window. This result is due to turbulent flow dominating the first pumping stage, providing a mechanism of strong gas conductance limitation, which is further enhanced by introducing artificial surface roughness in the pipe. Successive reduction of pressure through the transitional flow regime into the high‐vacuum region is accomplished over a length of several meters, using beam pipes of increasing diameter. While the pump assembly has not been tested with X‐rays, possible applications are discussed in the context of coherent and small‐angle scattering.     

X‐ray spectromicroscopy in soil and environmental sciences

X‐ray microscopy is capable of imaging particles in the nanometer size range directly with sub‐micrometer spatial resolution and can be combined with high spectral resolution for spectromicroscopy studies. Two types of microscopes are common in X‐ray microscopy: the transmission X‐ray microscope and the scanning transmission X‐ray microscope; their set‐ups are explained in this paper. While the former takes high‐resolution images from an object with exposure times of seconds or faster, the latter is very well suited as an analytical instrument for spectromicroscopy. The morphology of clusters or particles from soil and sediment samples has been visualized using a transmission X‐ray microscope. Images are shown from a cryo‐tomography experiment based on X‐ray microscopy images to obtain information about the three‐dimensional structure of clusters of humic substances. The analysis of a stack of images taken with a scanning transmission X‐ray microscope to combine morphology and chemistry within a soil sample is shown. X‐ray fluorescence is a method ideally applicable to the study of elemental distributions and binding states of elements even on a trace level using X‐ray energies above 1 keV.     

Hard X‐ray microbeam lithography using a Fresnel zone plate with a long focal length

Focused hard X‐ray microbeams for use in X‐ray nanolithography have been investigated. A 7.5 keV X‐ray beam generated at an undulator was focused to about 3 µm using a Fresnel zone plate fabricated on silicon. The focused X‐ray beam retains a high degree of collimation owing to the long focal length of the zone plate, which greatly facilitates hard X‐ray nanoscale lithography. The focused X‐ray microbeam was successfully utilized to fabricate patterns with features as small as 100 nm on a photoresist.     

强脉冲X射线辐照Si-SiO2界面对C-V 和I-V特性曲线的影响

 利用强脉冲X射线对Si-SiO₂界面进行了辐照，测量了C-V曲线和I-V曲线。实验发现，经过强脉冲X射线对Si-SiO₂界面进行的辐照，使C-V曲线产生了正向漂移，这一点与低剂量率辐射结果不同；辐射后，感生I-V曲线产生畸变；特别地，从I-V曲线上还反映出强脉冲X射线辐照的总剂量效应造成电特性 参数明显退化，最后甚至失效。讨论了强脉冲X射线辐照对Si-SiO₂界面产生损伤的机理，并对实验结果进行了解释。     

0.5 mm金刚石X射线相位延迟板及偏振度的标定

在利用步辐射光源的偏振特性进行自旋相关X射线散射及吸收谱实验来研究材料的磁学性质时，需要应用圆偏振光，这就提出了对具有高通量、高偏振度' 长连续可调的圆偏振X射线的需求；另一方面标定实验所用X射线的圆偏振度也成为这一研究领域的关键技术。由于X射线多光束衍射强度与σ场和π场的光程差δ相关，通过测量圆偏振分析晶体的多光束衍射的强度分布，可以获得入射X射线的圆偏振度。实验在美国国家同步辐射光源实验室X25光束线实验站进行，光子能量为7．1keV的圆偏振X射线由线偏振X射线经过一厚度为0．5mm、晶面为[111]的金刚石晶体产生。通过测量多光束衍射强度，确定了斯托克斯参量。实验值与X射线动力学理论计算结果能较好地吻合。