高衍射效率的X射线分光晶体—m-NA

间-硝基苯胺(m-NA)C_6H_6N_2O_2晶体解理面(040)有很高的衍射强度,其衍射峰值强度是常用的X射线分光晶体季戊四醇(PET)峰强的2～3倍,预计m-NA晶体可能是一种优良的X射线分光晶体。     

软X射线分光晶体马来酸氢十八酯

马来酸氢十八酯(OHM)是一种大晶面间距(2d=63.5A)X射线分光晶体,在适用的波长范围内。其X射线衍射性能优于硬酯酸铅皂膜假晶体(STE),晶体的物理化学性能稳定、机械强度好、易于加工。业已证明OHM晶体是一种软X射线理想的单色器。     

KTP(001)晶体分光性能研究

根据同步辐射光源对软X射线分光晶体的性能要求,分析了软X射线能区常用分光晶体的性能优劣,指出对于晶格常数值大的分光晶体,KTP(KTiOPO₄)(011)是该能区比较理想的分光晶体. 同时提出了一种利用同步辐射光源测量晶体衍射效率的实验方法,指出光源的发散度与晶体的衍射效率密切相关. 测量了KTP(011)晶体的晶格常数,给出了KTP(011)晶体的实测衍射效率. 关键词： 同步辐射 KTP(011)晶体 衍射效率 光源发散度     

基于X射线同轴相衬成像的炸药缺陷准静态扩展过程诊断

由于炸药具有弱吸收特性,利用传统的X射线成像技术难以获得质量较好的图像,因而无法对炸药内部的微小缺陷进行诊断。为提高炸药的X射线成像质量,采用X射线同轴相衬成像方法,获得了不同压力作用下高聚物粘结炸药(PBX)内部缺陷的一系列X射线相衬图像,从中清楚地观察到炸药内部缺陷从无到有、从小到大的准静态扩展过程,为研究高能炸药的热点形成机制提供技术支持。     

基于X射线同轴相衬成像的炸药缺陷准静态扩展过程诊断北大核心CSCD

由于炸药具有弱吸收特性,利用传统的X射线成像技术难以获得质量较好的图像,因而无法对炸药内部的微小缺陷进行诊断。为提高炸药的X射线成像质量,采用X射线同轴相衬成像方法,获得了不同压力作用下高聚物粘结炸药(PBX)内部缺陷的一系列X射线相衬图像,从中清楚地观察到炸药内部缺陷从无到有、从小到大的准静态扩展过程,为研究高能炸药的热点形成机制提供技术支持。     

分光晶体LiF质量的X射线检测

氟化锂晶体具有较好的机械性能,容易加工,解理面具有高的X射线衍射强度和良好的色散本领,所以是电子探针微区x射线谱仪和荧光X射线谱仪的主要分光晶体之一.分光晶体质量的好坏直接影响仪器的性能.因此对分光晶体的质量进行检测是十分必要的. 氟化锂作为一种典型的晶体许多人进行过研究.很早 Gilman和Johston[1]等曾用化学浸蚀法.Yoshimatsu Newkirk等[2,5]曾用X射线形貌术研究过位错和亚晶界.Birks和 Seal[6]曾用X射线方法研究过研磨、淬火和弯曲等工艺对LiF分光晶体衍射峰值强度和半高宽的影响. 本文提出用X射线衍射形貌技术和X射线…     

用软刻蚀方法制备PbS纳米晶复合聚丙烯酸微图形

利用软刻蚀方法制备了包裹有硫化铅纳米颗粒的聚丙烯酸微图形 .首先通过毛细微模塑法制备了丙烯酸铅的微条纹 ,并使之在γ射线引发下固态聚合 ,最后用硫化钠溶液处理聚合物微条纹 ,将铅离子转化为包埋在聚合物体系中的硫化铅颗粒 ,得到了包裹有硫化铅纳米颗粒的高清晰度的聚丙烯酸微图形 .利用X射线衍射(XRD)、X射线光电子能谱仪 (XPS)、透射电镜 (TEM)对其结构和性质进行了表征 .结果表明包埋在聚合物体系中的PbS颗粒直径小于 2 0nm .     

BeAl_2O_4:Cr晶体的缺陷研究

用化学腐蚀、光学显微镜、X射线形貌术以及电子显微分析等方法研究了引上法生长的BeAl_2O_4:Cr晶体中的缺陷.其结果如下:1)获得了对低指数面(100)、(010)及(001)面位错的理想腐蚀剂,2)晶体中的位错分布不均匀,位错产生的来源有二:一是从晶种中,另一是由包裹物引起.大多数位错是刃型位错,其柏格氏矢量为〈100〉方向、滑移面为(010)面.3)在晶体中常出现的包裹物如气泡,管状物及第二相沉积物,它们是由于原料中的杂质及生长过程中的组分过冷引起的.     

X射线吸收谱研究碳与硅的纳米线/管

由于X射线吸收谱中的总电子产额(TEY)和荧光产额(FLY)具有不同的取样探测深度,分别对样品的表面和体内敏感,因而两者的综合应用为纳米材料的整体分析提供了有力的依据,是透射电子显微镜(TEM)、X射线衍射(XRD)等传统方法分析纳米材料时的补充。同时,通过对TEY和FLY记录的X射线吸收谱的评述,作者认为X射线吸收谱可以准确、可靠地用来进行纳米线和纳米管的生长及其机理、取向、化学键合、缺陷与螺旋性等方面的研究。因此X射线吸收谱具有传统方法无法比拟的优势,是纳米材料研究领域强有力的表征工具。     

X射线激光干涉对晶体精密测量

基于X射线激光脉冲短、单色性好、能量高而且相干程度高的优点,本文从理论上提出X射线激光干涉用于对晶体结构及缺陷的测量。由于X射线激光波长量级为10~(-10) m,因此可实现高精密测量。此外,本文给出了X射线激光测量晶体的装置、缺陷晶体的测量模型和晶体参量的测量模型。     

Monazite (monoclinic LaPO4) slip systems at room temperature

Polycrystalline monazite (monoclinic LaPO₄) was deformed by spherical indentation at room temperature. Slip systems were identified using TEM of thin sections prepared parallel and close to the indented surface. Dislocation Burgers vectors (b) were identified by Burgers circuit closure in high resolution TEM images, supplemented by diffraction contrast where possible. A total of 441 b determinations were made in 97 grains. The most common slip systems were [001]/(010), [100]/(010) and [010]/(100). Slip on (001) was less common. Many other less common slip systems and Burgers vectors were also identified, including b = [101], [101], [011], [110] and [111]. b = [101] dislocations dissociate into ½[101] partials, and b = [101] dislocations are inferred to dissociate to ½[101] partials, with a low energy stacking fault of ～30 mJ/m². b = [100] dislocations may dissociate into ¼[210] + ¼[210] partials. b = [010] may sometimes dissociate to ½[010] + ½[010] partials. Other types of partial dislocations were also observed and discussed. All partial dislocations were climb dissociated. The line energies of monazite dislocations and their partials were calculated, and stacking fault structures for partial dislocations are analyzed. Satisfaction of the Von Mises criterion for full ductility most likely involves [101]/(111) and ?011?/{011} or {111} slip, but other combinations that require both b = [101] and ?011? or ?110? are possible. If deformation twinning is active, slip systems with b = ?011? or ?110? may not be necessary for full ductility.     

冷轧铜板再结晶織构的形成

电解纯铜经88.7％冷轧后,所形成的轧制织构除稳定的(110)[112]舆(112)[111]外,还存在着一种(3,6,11)[533]织构。在较低温度下退火时,再结晶织构主要为(100)[001]、(358)[352]和舆(100)[001]成孪生取向的(122)[212]织构。随着退火温度的增加,(358)[352]织构逐渐减弱,立方织构(100)[001]则逐渐加强;当退火温度达到900℃时,开成了集中的(100)[001]织构。冷轧铜板在退火的过程中,具有(100)[001]再结晶晶粒首先形成,然后普遍地发生同位再结晶。其中具有(100)[001]取向的晶粒,继续发生选择性的生长,最后形成了集中的立方织构。本支中对轧制织构舆其再结晶织构取向间的关系也进行了分析,再结晶织构一般可认为是原有织构沿某一个[111]轴旋转45°,22°或38°的结果。同时,根据上述几何关系所绘出的理想极图舆实际测定的结果也是符合的。试验结果指出,不同加热速度和不同加热程序对形成最终的再结晶织构,不发生显著的影响,而退火温度对再结晶织构的形成起着主要的作用。     

POLYMERIZATION,MORPHOLOGY, AND CRYSTAL STRUCTURE OF POLY(p-BENZAMIDE)*

Isothermal polymerization of acetaminobenzoic acid at various temperatures in bulk and solution was monitored by acetic acid evolution. The polymerization took place initially in a homogeneous phase, but it soon changed to heterogeneous as the polymer precipitated from the melt or solution. The reaction course consisted of a short induction period, followed by a fast second-order reaction and a third slow, also second-order, reaction. The different polymerization rates in the second and third stage were due to polymer precipitation. The degree of polymerization of the resulting polymer was generally low, usually less than 5. The polymer was highly crystalline and prone to decarboxylation at temperatures above 300°C. Sample structure and morphology were characterized by various lamellar formations similar to those seen previously in many aromatic polyesters. Epitaxial solution polymerization/crystallization on mica resulted in three different morphologies, the most unique being shish kebab–type structures. Polybenzamide [poly(p-aminobenzoate)] is polymorphic; the most frequently seen hk0 electron diffraction patterns were similar to those from phase I of aromatic polyesters. Phase II of polybenzamide was seen only rarely. Simulation, using Cerius², suggested equal agreement with [001], [100], and fiber electron diffraction (ED) patterns and X-ray powder patterns for two different orthorhombic unit cells (a = 7.71, b = 5.35, c = 12.94 Å, ρ = 1.55 g/cm³); both have a parallel packing of adjacent molecules, but in one, successive phenyl rings along a given chain are parallel, while in the other they are twisted at ±30°. For both unit cells, neighboring molecules were displaced by ±0.14 Å along c to obtain better agreement with the observed patterns. The [010] patterns could distinguish between the two cells, but were not obtainable.

     

High-resolution identification of ½⟨110⟩ stacking faults in epitaxial Ba0.3Sr0.7TiO3 thin films

The near-interface region of an epitaxial Ba_0.3Sr_0.7TiO₃ thin film grown on LaAlO₃ (001) was found to consist of a high density of ½?110? stacking faults bounded by partial dislocations. The stacking faults can extend over large distances (greater than 50 nm). Various possible atomic configurations of the faults were considered. The atomic structures of the faults were identified using high-resolution electron microscopy and simulation as well as energy-filtered imaging. The ½[101] and faults (where [001] is normal to the film plane) were found to lie predominately on the {100} and {110} planes. The ½lsqb;101] faults on (010), (110) or (1&1tilde;0) have never been observed before in perovskites. The stacking faults on [100] have a structure consisting of a double layer of edge-sharing TiO₆ octahedra. The excess of Ti was detected by energy-filtered imaging. The formation of the extended stacking faults is probably related to a small amount of excess Ti during the film deposition, which may originate from the non-stoichiometry of the ceramic targets BaTiO₃ and SrTiO₃. It is also enhanced by the misfit-induced compressive strain in the early stages of the film growth.     

Al表面的"类液"结构及其自扩散通道

应用分子动力学方法,采用嵌入势模型在熔点下和熔点上对Al(001),(110)和(111)表面的原子结构和自扩散现象进行研究.发现这些表面的第一层原子在低于熔点时,Al(110)面在700±10 K,Al(001)面在 860±10 K,Al(111)面在 930±10 K呈现明显自扩散且最终转变为"类液"结构,而其余各层仍保留有序状态.对这种"类液"结构进行均方位移、结构有序参数、径向分布函数和z向粒子密度分析,发现其结构和扩散行为与熔化的Al表面不同,并能在一定温度区间稳定存在.在"类液 关键词： 表面结构 分子动力学 自扩散     

Time constants of radiative transitions from the 5<Emphasis Type="Italic">d</Emphasis>[3/2]<Subscript>1</Subscript> level of a xenon atom

Integral yields of spontaneous emission at wavelengths of 1.73, 2.03, and 2.65 μm have been measured upon excitation of pure xenon by a pulsed electron beam. These yields have been analyzed and experimental data have been obtained on time constants of radiative transitions 5d[3/2]₁ → 6p[5/2]₂, 5d[3/2]₁ → 6p[3/2]₁, and 5d[3/2]₁ → 6p[1/2]₀ of XeI, which appeared to be equal to (2300 ± 400) × 10^?9, (300 ± 40) × 10^?9, and (1300 ± 200) × 10^?9 s, respectively. It is shown that the experimental data are in a qualitative agreement with the results of computational and theoretical investigations. The results of averaging the experimental and calculated data are proposed for use as recommended values of the corresponding constants.     

X-ray crystallographic study of solid-state polymerization of trioxane and tetraoxymethylene

An X-ray study has been applied to clarify the relationship between crystal structures and crystal orientations of tetraoxymethylene and polyoxymethylene obtained by solid- state polymerization of tetraoxymethylene. The polyoxymethylene crystal obtained by the solidstate polymerization of a tetraoxymethylene single crystal was found to be definitely oriented with respect to the original tetraoxymethylene single crystal without any aftertreatment; i.e., the polymer chain (the c-axis) is parallel to the b-axis of tetraoxymethylene and the a-axis of polyoxymethylene coincides to the c-axis of tetraoxymethylene.

In addition to the main orientation, other preferred crystalline orientations (“twin structure”) of polyoxymethylene were observed in polymers polymerized at lower temperatures (60-80°C); i.e., the polymer chains are parallel to either the [100], [001], or [101] direction of the original tetraoxymethylene crystal, though the amount of such oriented crystallites is small. The twin structure is different from that of polyoxymethylene obtained from trioxane. This difference is due to the crystal structures of these original materials; tetraoxymethylene occurs in the monoclinic system, while trioxane belongs to the trigonal system, as does polyoxymethylene. These characteristic orientations are explained in terms of the molecular arrangements in the crystals of the original materials.     

Half-life measurements of intrinsic states in deformed odd-mass nuclei

The half-lives of the following intrinsic states in deformed odd-mass nuclei has been measured by delayed coincidences with a time-to-amplitude converter:

1. 5/2 5/2⁺[642] at 86.5 keV in¹⁵⁵Gd:T _1/2=6.7±0.3 ns, which results in the determination of theE1,ΔK=1 transition probability to the ground state 3/2 3/2^?[521] and first rotational state 5/2 3/2^?[521], yielding hindrance factors ofF _N ≈5.5 and ≈1.8 (F _W =3.1×10⁴ and 2.3×10⁴) respectively.
2. (3) 5/2 5/2^?[512] at 191.4 keV in¹⁶⁹Yb:T _1/2=3.35±0.15 ns and at 122.39 keV in¹⁷¹Yb:T _1/2=265±20 ns which results in the determination of the transition probabilities of theE1,ΔK=1 transitions to the ground states 7/2 7/2⁺[633], of theK-forbiddenM1 transitions to the 5/2 and 3/2 1/2^?[521] and of theE2 transitions to the 5/2, 3/2 and 1/2 1/2^?[521] states in both nuclei.

TheE1 transition probabilities are compared to the transitions between the same Nilsson states in¹⁷³Yb and¹⁷⁵Hf discussing the influence of the position of the Fermi surface — obtained from recent stripping and pick-up reactions — on these transition probabilities. Additional information on the decay scheme of¹⁷¹Lu→¹⁷¹Yb is obtained by delayed coincidence measurements. For testing the used time-to-amplitude converter the well known half-lives of the 482 keV level in¹⁸¹Ta (T _1/2=10.4±0.3 ns) and of the 279 keV level in²⁰³Tl (T _1/2=0.285 ±0.015 ns) were measured, in good agreement with other measurements.     

Structure determination of ethylene adsorbed on Ag(100) surface by multiple-scattering cluster method

The carbon K-shell near edge X-ray absorption fine structure (NEXAFS) spectra of gas-phase ethylene molecules and ethylene adsorbed on Ag(100) have been calculated by the multiple scattering cluster method (MSC) for the first time. The calculated results show that carbon-hydrogen scattering resonances exist in the carbon K-shell NEXAFS spectra for both gas-phase ethylene molecules and ethylene adsorbed on the metal surface. By a comparison between the theoretical results and experimental spectra, we have found that ethylene molecules are adsorbed on the Ag(100) surface taking a four-fold hollow-site with the direction of the CC bond parallel to the [001] or [010] direction, the bond lengths of CC and AgC are equal to 1.40 ± 0.02 and 1.96 ± 0.03 Å, respectively. These results can be compared with that of the C₂H₄-Cu(100) system.     

Transition of crystalline orientation of yttria-stabilized zirconia films grown by pulsed laser deposition

We have synthesized 5 wt. %-yttria-stabilized zirconia (YSZ) films on stainless steel and glass substrates by pulsed laser deposition (PLD) at substrate temperatures between 60 and 600 °C and oxygen pressures from 0.1 to 1000 mTorr. While highly (101)-oriented tetragonal YSZ films are obtained at intermediate oxygen pressures, near complete (001)-oriented tetragonal films are achieved at lower oxygen pressures, with a full width at half maximum X-ray peak of only 0.4°. The results can be attributed to surface energy-induced orientation; that is, the lowest surface energy plane of the YSZ films changes from (101) plane at intermediate pressures to the (001) plane at lower oxygen pressures due to surface relaxation. PACS 81.15.Fg; 83.85.Hf; 68.55.jm