Histamine detection using functionalized porphyrin as electrochemical mediator

This study reports on deposition of asymmetrical substituted meso-phenyl porphyrin, 5-(4-carboxyphenyl)-10,15,20-triphenylporphyrin (CPTPP) thin films by matrix-assisted pulsed laser evaporation (MAPLE) on screen-printed electrodes, aiming for histamine detection. Raman spectrometry confirmed that CPTPP chemical structure was preserved in MAPLE-deposited thin films at 200 mJ/cm² laser fluence. Atomic force microscopy topography revealed that MAPLE-deposited thin films have a better coverage on the working electrode made of carbon compared to the ones obtained by dropcasting. Cyclic voltammetry demonstrated that CPTPP is an appropriate mediator for histamine detection in trichloroacetic acid solution. We proved that MAPLE serves as a soft technique in fabrication of porphyrin thin films and patterns.     

A comparative study of the polyaniline thin films produced by the cluster beam deposition and laser ablation methods

Polyaniline (PANI) thin films have been prepared by applying the novel neutral and ionized cluster beam deposition (NCBD and ICBD) methods and the pulsed laser deposition (PLD) technique to the PANI samples of half-oxidized emeraldine base (EB-PANI) and protoemeraldine base forms in a high-vacuum condition. Characterization of the oxidation states and structural changes of pristine and doped thin films has been performed by Fourier transform infrared spectroscopy, ultraviolet-visible spectroscopy, and x-ray photoelectron spectroscopy. Spectroscopic measurements demonstrate that the dominant structure of NCBD and ICBD thin films corresponds to the reduced leucoemeraldine base state, whereas the chemical composition of PLD thin films depends critically on the laser fluence and the molecular weight of PANI target. The congruent deposition is only obtained for the PLD films deposited by the laser-induced decomposition of the low-molecular-weight targets in the low to intermediate fluence regime (below 100 mJ/cm2 with a pulse duration of 7 ns). The surface morphology examined by atomic force microscopy measurements shows that the cluster and laser beams are effective in producing smooth, uniform polymeric thin films. After I2 and HCl doping, the electrical conductivities of the NCBD, ICBD, and particularly PLD thin films are increased significantly. The higher conductivity of PLD films is ascribed to higher amounts of quinoid di-imine doping sites in the EB-PANI state, and the overall structure-conductivity characteristics are consistent with the spectroscopic observations.     

KrF pulsed laser ablation of thin films made from fluorinated heterocyclic poly(naphthyl-imide)s

Among the many aspects of laser ablation, development of conical structures induced by excimer laser radiation on polyimide surfaces has been thoroughly investigated. Because the mechanisms that produce these surface textures are not fully understood, two theories, photochemical bond breaking and thermal reaction, have been introduced. Here we present the first study of ultraviolet laser ablation behavior of thin films made from fluorinated poly(naphthyl-imide)s containing oxadiazole rings and the investigation of the mechanism of cone-like structure formation at two laser fluences, 57 and 240 mJ/cm(2). The morphology of thin films before and after laser ablation was studied by using various spectroscopy techniques such as Fourier transform infrared spectroscopy, time-resolved emission and X-ray photoelectron spectroscopy, atomic force microscopy, and contact angle measurements. All of the data suggest impurities shielded at low fluence radiation (57 mJ/cm(2)) and a radiation hardening process at high value fluence (240 mJ/cm(2)), which are proposed as the main mechanisms for laser ablation of our polyimide films, and we bring evidence to support them.     

Molecular weight dependent structure and charge transport in MAPLE‐deposited poly(3‐hexylthiophene) thin films

In this work, poly(3‐hexylthiophene) (P3HT) films prepared using the matrix‐assisted pulsed laser evaporation (MAPLE) technique are shown to possess morphological structures that are dependent on molecular weight (MW). Specifically, the structures of low MW samples of MAPLE‐deposited film are composed of crystallites/aggregates embedded within highly disordered environments, whereas those of high MW samples are composed of aggregated domains connected by long polymer chains. Additionally, the crystallite size along the side‐chain (100) direction decreases, whereas the conjugation length increases with increasing molecular weight. This is qualitatively similar to the structure of spin‐cast films, though the MAPLE‐deposited films are more disordered. In‐plane carrier mobilities in the MAPLE‐deposited samples increase with MW, consistent with the notion that longer chains bridge adjacent aggregated domains thereby facilitating more effective charge transport. The carrier mobilities in the MAPLE‐deposited simples are consistently lower than those in the solvent‐cast samples for all molecular weights, consistent with the shorter conjugation length in samples prepared by this deposition technique. © 2018 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2018 , 56, 652–662     

Ru cyclooctatetraene precursors for MOCVD

A series of Ru(0) cyclooctatetraene complexes are presented with optimal properties for MOCVD (metal organic chemical vapour deposition) applications, including combinations of the two lowest melting points and lowest decomposition temperatures yet reported for such materials. The compounds are easy to handle and lead to highly conformal thin films of Ru on SiO(2) features; even within holes with aspect ratios of 40?:?1. SEM, AFM and XPS studies confirm the near ideal nature of the resulting conformal thin film.     

Interfacial interaction between ZnO thin film and polyimide substrate investigated by XPS and DFT calculation

The interfacial interaction between the ZnO film and the polyimide substrate was investigated by XPS and density functional theory (DFT) calculation, for the ZnO thin films deposited on polyimide (PI) substrates using cathodic vacuum arc deposition technique. The XPS results showed that a shoulder peak was present for the ZnO film with the thickness of about 15 nm, used for depth profiling, at the binding energy 1 eV higher than that of the Zn2p3 core level for bulk ZnO. Such a shoulder peak is attributed to the interaction between the ZnO and the polyimide. This agrees with the results of DFT calculation. Furthermore, the difference in adsorption energy between the polyimide monomer and the ZnO molecule at different adsorption sites showed that the carbonyl (C?O) plays an important role in the interfacial strength. Copyright © 2011 John Wiley & Sons, Ltd.     

Plasma polymerization and deposition of glycidyl methacrylate on Si(100) surface for adhesion improvement with polyimide

Thin polymer films were deposited on Si(100) surfaces by plasma polymerization of glycidyl methacrylate (GMA) under different glow discharge conditions. The FT‐IR, X‐ray photoelectron spectroscopy (XPS), and amine treatment results suggested that the epoxide functional groups of the deposited films had been preserved to various extents, depending on the plasma deposition conditions. The use of a low radio frequency power (～ 5 W) and a relatively high system pressure (100–400 Pa) readily resulted in the deposition of thin films having nearly the same composition of the epoxide functional groups as that of the GMA homopolymer. The plasma‐polymerized GMA (PP‐GMA) thin films deposited on the Ar plasma‐pretreated Si(100) surfaces were retained to a large extent after acetone extraction, suggesting the presence of covalent bonding between the PP‐GMA layer and the Si surface. Thermal imidization of the poly(amic acid) precursor of polyimide on the GMA plasma‐polymerized Si(100) surface resulted in a strongly adhered polyimide film. The adhesion results further suggested that the GMA polymer had been grafted on the Si(100) surface and the epoxide functional groups had undergone reactive interaction (curing) with the carboxylic and amine groups of the poly(amic acid) during thermal imidization. Copyright © 2001 John Wiley & Sons, Ltd.     

A study on dielectric characteristics of fluorinated polyimide thin film

In this work, the effects of fluorination of polyimide thin films on surface and dielectric characteristics were studied using X-ray photoelectron spectroscopy (XPS) and dielectric spectrometry, respectively. The thermal and mechanical properties of the film were characterized by thermogravimetric analysis (TGA) and tensile strengths, respectively. The fluorine content of the polyimide thin film was increased with increasing treatment concentration, resulting in decreasing dielectric constant of the film. It was found that the replacement of fluorine led to the decrease of the local electronic polarizability of polyimide, or to the increase of the free volume, which can be attributed to the relatively large size of fluorine. Nevertheless, the fluorination did not significantly affect thermal or mechanical properties of the polyimide film under mild conditions in this system.     

喷墨打印图案化高分子薄膜及其在有机电子器件加工中的应用

喷墨打印技术由于在图案化加工方面的高效、低成本、非接触形式及柔性的加工过程等特点而被应用于有机电子器件的加工中.通过打印功能性高分子溶液,喷墨打印实现了功能高分子薄膜的沉积和图案化,并实现了有机发光二极管、有机薄膜晶体管及其集成器件的加工.对喷墨打印在有机电子器件加工中取得的成果进行了总结,同时综述了高分子溶液喷墨打印过程中存在的基本科学问题和研究现状.     

Thermal properties of tetraethylammonium tetrachloro-, bromotrichloro-and tribromochloroferrates(III)

A new synthesized 4CN type azomonoether, exhibiting dying properties, crystalline nature and generating interest as a material for non-linear optical applications was investigated. Modern devices incorporating liquid crystals tend to use thin films of such materials because of their special characteristics. Thermal stability studies are indispensable before attempting any deposition experiment. We have investigated the thermal behaviour of 4-[(4-chlorobenzyl)oxy]-4′-cyano-azobenzene (TG, DTG, DTA and DSC) in inert flow atmosphere, under non-isothermal conditions. The phase transitions were studied by repeated heating-cooling regimes, with intercalated isothermal steps. The thin films were deposited on silicon and quartz substrates by matrix assisted pulsed laser evaporation (MAPLE) using a Nd:YAG laser working at 266 nm. FTIR spectroscopy of the obtained thin films confirmed the preservation of the compound’s structure.     

Molecular organization in MAPLE‐deposited conjugated polymer thin films and the implications for carrier transport characteristics

The morphological structure of poly(3‐hexylthiophene) (P3HT) thin films deposited by both Matrix Assisted Pulsed Laser Evaporation (MAPLE) and solution spin‐casting methods are investigated. The MAPLE samples possessed a higher degree of disorder, with random orientations of polymer crystallites along the side‐chain stacking, π–π stacking, and conjugated backbone directions. Moreover, the average molecular orientations and relative degrees of crystallinity of MAPLE‐deposited polymer films are insensitive to the chemistries of the substrates onto which they were deposited; this is in stark contrast to the films prepared by the conventional spin‐casting technique. Despite the seemingly unfavorable molecular orientations and the highly disordered morphologies, the in‐plane charge carrier transport characteristics of the MAPLE samples are comparable to those of spin‐cast samples, exhibiting similar transport activation energies (56 vs. 54 meV) to those reported in the literature for high mobility polymers. © 2016 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2017 , 55, 39–48     

Evaporated thin films of insulating poly-(tetrabromo-p-phenylenediselenide)

It has been shown that thin insulating film at the interface transparent conductive oxide/organic electroluminescent film could improve the performance of organic electroluminescent diodes (OLED). Such insulating film can be inorganic or organic. Poly-(tetrabromo-p-phenylenediselenide) (PBrPDSe) has been proved to be an efficient insulating film in OLED. The properties of these evaporated PBrPDSe thin films have been systematically studied by IR absorption, X-ray diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy, electron spin resonance and optical transmission measurements. It is shown that, when the deposition temperature is kept below the decomposition temperature of the polymer, tetrabromo-p-phenylenediselenide molecule is preserved during the deposition process. However the polymer, which is insoluble in powder form, becomes soluble after deposition. It can be concluded that films are mainly composed of oligomers of tetrabromo-p-phenylenediselenide.The electrical properties of SnO₂/PBrPDSe/Al thin films structures have been studied. The current-voltage characteristics exhibit a rectifying behaviour with a forward direction corresponding to a positive bias of the transparent conductive oxide film, the SnO₂.     

Substrate temperature effects on film chemistry in plasma depositions of organics. II. Polymerizable precursors

The influence of substrate temperature during plasma deposition on the chemistry of the organic films formed was examined. Plasma ionization of precursor gases that are polymerizable by conventional mechanisms was studied. Film chemistry was analyzed by x-ray photoelectron spectroscopy (XPS). Monomers that polymerize by a free radical mechanism [2-hydroxyethyl methacrylate (HEMA) and hexafluorobutadiene (HFB)] form more regular polymers (i.e. with less molecular rearrangement) by plasma deposition at low substrate temperatures than monomers that polymerize by ionic mechanisms [ethylene oxide (EO) and tetrahydrofuran (THF)]. In all cases, lowering the substrate temperature during deposition produces films with elemental composition virtually identical to that of the precursor gas. Comparison of high-resolution XPS spectra of the deposited films with those for model polymers suggests that functional groups in the monomers used to generate the plasma are incorporated to a greater extent at low substrate temperatures. The effect of plasma power on the degree of precursor structure retention obtained when reduced substrate temperatures are employed was also examined. Plasma deposition of HEMA at low substrate temperatures and low plasma power produces thin films which are, by core level XPS, indistinguishable from HEMA polymerized by conventional methods. EO and THF films coated at low substrate temperatures on glass, polyethylene, or polytetrafluoroethylene varied widely in surface chemistry due to differences in film uniformity. Film quality (uniformity) is enhanced for these low reactivity precursors by pretreating substrates with an argon plasma. © 1992 John Wiley & Sons, Inc.     

Molecular adsorption and the chemistry of plasma-deposited thin organic films: Deposition of oligomers of ethylene glycol

Weakly ionized, radio-frequency, glow-discharge plasmas formed from methyl ether or the vapors of a series of dimethyl oligo(ethylene glycol) precursors (general formula: H-(CH₂OCH₂)_n-H;n=1 to 4) were used to deposit organic thin films on polytetrafluoroethylene. X-ray photoelecton spectroscopy (XPS) and static secondary ion mass spectrometry (SIMS) of the thin films were used to infer the importance of adsorption of molecular species from the plasma onto the surface of the growing, organic film during deposition. Films were prepared by plasma deposition of each precursor at similar deposition conditions (i.e., equal plasma power (W), precursor flow rate (F), and deposition duration), and at conditions such that the specific energy (energy/mass) of the discharge (assumed to be constrained byW/FM, whereM=molecular weight of the precursor) was constant. At constantW/FM conditions, two levels of plasma power (and, hence, twoFM levels) and three substrate temperatures were examined. By controlling the energy of the discharge (W/FM) and the substrate temperature, these experiments enabled the study of effects of the size and the vapor pressure of the precursor on the film chemistry. The atomic % of oxygen in the film surface, estimated by XPS, and the intensity of theC-O peak in the XPS C_ls spectra of the films, were used as indicators of the degree of incorporation of precursor moieties into the plasma-deposited films. Analysis of films by SIMS suggested that these two measures obtained from XPS were good indicators of the degree of retention in the deposited films of functional groups from the precursors. The XPS and SIMS data suggest that adsorption of intact precursor molecules or fragments of precursor molecules during deposition can have a significant effect on film chemistry. Plasma deposition of low vapor pressure precursors provides a convenient way of producing thin films with predictable chemistry and a high level of retention of functional groups from the precursor.     

Mechanical properties degradation of polyimide films irradiated by atomic oxygen

Mechanical properties of polyimide films are degraded by exposure to a low earth orbit environment. The main environmental factor for that degradation is atomic oxygen (AO). Using tensile tests, AO-irradiated surface topography observations, and fracture surface analyses, this study investigated the degradation behavior of polyimide films’ mechanical properties by increased AO fluence and its accompanying degradation mechanisms. Tensile strength and elongation of polyimide films were reduced concomitantly with increased AO fluence. Furthermore, AO-irradiated polyimide films fractured from the AO-irradiated surfaces, of which roughness became marked as AO fluence increased. These results reflect that reduction of mechanical properties is attributable to the roughness increase in AO-irradiated surfaces. Polyimide films coated with indium tin oxide (ITO) were also evaluated to confirm the degradation behavior of AO protective films. Surfaces of ITO-coated polyimide films remained smooth even after AO irradiation. However, undercut cavities were formed at ITO coating defect sites. Rupture of ITO-coated polyimide films initiates from the undercut cavities, engendering large reduction of tensile strength and elongation. The degradation of the mechanical properties of ITO-coated polyimide films increased substantially until the undercut cavities fully penetrated the film.     

Electroless plating of honeycomb and pincushion polymer films prepared by self-organization

This report describes the fabrication and electroless plating of regular porous and pincushion-like polymer structures prepared by self-organization. Honeycomb-patterned films were prepared by simple casting of polymer solution under applied humid air and pincushion structures by peeling off the top layer of the former films. Silver-deposited honeycomb-patterned films and pincushion films were obtained by simple electroless plating of the respective original structures. XPS revealed Ag deposition on the honeycomb-patterned film. After thermal decomposition or solvent elution of the template polymer, unique metal mesoscopic structures were obtained.     

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

We demonstrate depth profiling of polymer materials by using large argon (Ar) cluster ion beams. In general, depth profiling with secondary ion mass spectrometry (SIMS) presents serious problems in organic materials, because the primary keV atomic ion beams often damage them and the molecular ion yields decrease with increasing incident ion fluence. Recently, we have found reduced damage of organic materials during sputtering with large gas cluster ions, and reported on the unique secondary ion emission of organic materials. Secondary ions from the polymer films were measured with a linear type time‐of‐flight (TOF) technique; the films were also etched with large Ar cluster ion beams. The mean cluster size of the primary ion beams was Ar₇₀₀ and incident energy was 5.5 keV. Although the primary ion fluence exceeded the static SIMS limit, the molecular ion intensities from the polymer films remained constant, indicating that irradiation with large Ar cluster ion beams rarely leads to damage accumulation on the surface of the films, and this characteristic is excellently suitable for SIMS depth profiling of organic materials. Copyright © 2009 John Wiley & Sons, Ltd.     

Quantitative analysis of an organic thin film by XPS,AFM and FT‐IR

We report the characterization of Firpic (iridium(III)bis[4,6‐di‐fluorophenyl]‐pyridinato‐N,C²,]picolinate) organic thin film prepared by vacuum deposition to provide a systematic route to organic film quantification. To analyze the characteristics of thin Firpic films on a Si substrate, various techniques such as XPS, Fourier transform infra‐red (FT‐IR) spectrometer, and atomic force microscopy (AFM) are utilized. The Firpic films remain stable without surface morphological or compositional change during deposition and after exposure to X‐ray irradiation or atmospheric environment, for which qualities these films are believed to be an ideal platform as a pure organic thin film. The monotonic increases in FT‐IR and XPS intensities with film thickness are matching well with each other. In particular, from the XPS intensity analysis, the relative atomic sensitivity factors of the present system, electron attenuation length, and molecular density in the organic thin film can be evaluated. Copyright © 2011 John Wiley & Sons, Ltd.     

Dual capacitor technique for measurement of through‐plane modulus of thin polymer films

Polymer thin films are widely used as coatings and interlevel dielectrics in microelectronic applications. In thin‐film structures, stresses are generated due to interaction with adjacent layers and film shrinkage due to solvent evaporation or curing. This causes polymer chain orientation resulting in anisotropic (direction dependent) film properties. The dual capacitor technique has been developed to measure in situ, the through‐plane (z) stress‐strain behavior of thin polymer films. A parallel plate capacitor device and an interdigitated electrode structure were used as sensors to detect changes in dielectric permittivity and thickness of thin polymer films under compression. The analytical and finite element models used to interpret the capacitance measurements have been presented. The Clausius–Mossotti equation was used to determine the volume change in the film from the permittivity measurements. Results have been reported for 10–14 μm thick, Cyclotene 4026‐46 benzocyclobutene films and 10–12 μm thick films of polyimide PI‐2611. The Cyclotene 4026‐46 films were found to be mechanically isotropic, whereas the PI‐2611 films were highly anisotropic. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 38: 1634–1644, 2000     

Controlled deposition of structured polymer films: chemical and rheological factors in chitosan film formation

The technique of "spread coating" has been used to create thin films from solutions of deacetylated and butyl-modified chitosan polymer, and the effect of deposition rate on film thickness has been characterized. Results show that films of controlled thickness can be reproducibly produced and that hydrophobic modification of the polymer can extend the range over which a linear response between film thickness and deposition rate is achieved. Viscometry and fluorescence spectroscopy were also employed to characterize the micellar characteristics of solutions of both deacetylated and butyl-modified chitosan polymer. Although both deacetylated and butyl-modified chitosan solutions were found to have inter- and intramolecular interactions, as well as hydrophobic domains able to incorporate fluorophores, deacetylated chitosan was found to be more interconnected via intermolecular interactions at higher concentrations. These results are important as having the ability to understand how the introduction of hydrophobic modification, a technique shown to introduce solution-based micelle structure and micellar aggregates that support enzyme immobilization, affects film thickness and morphology of spread coated thin films will aid the long-term development and deployment of chitosan-based biofuel cell electrodes.