A comparative study on the total reflection X‐ray fluorescence determination of low Z elements using X‐ray tube and synchrotron radiation as excitation sources

Detailed total reflection X‐ray fluorescence (TXRF) studies for the detection and quantification of low atomic number elements were carried out by using a laboratory dual source TXRF spectrometer equipped with a vacuum chamber and at the International Atomic Energy Agency multi‐purpose end‐station facility, operated at the XRF beamline of Elettra Sincrotrone Trieste, Italy. Multi‐elemental standard aqueous solutions of low Z elements (F, Na, Al, S, K, Sc, and Ti) with different elemental concentrations of 2, 10, 20, and 30 µg/ml were prepared and measured in both setups. The measurements at the synchrotron setup were performed in a scanning mode across the sample residue and perpendicular to the incident beam in order to account properly for a possible non‐uniform deposition of certain elements. The accuracy and the detection limits obtained from the TXRF measurements in both setups were determined and comparatively evaluated and assessed. Significant improvement in the TXRF detection limits at the synchrotron beamline end‐station was obtained for the elements with Z ≤ 13 (Al). Copyright © 2017 John Wiley & Sons, Ltd.     

A setup for synchrotron‐radiation‐induced total reflection X‐ray fluorescence and X‐ray absorption near‐edge structure recently commissioned at BESSY II BAMline

An automatic sample changer chamber for total reflection X‐ray fluorescence (TXRF) and X‐ray absorption near‐edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF‐XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (<1 mg) and concentrations are low (ng ml^?1 to µg ml^?1). TXRF requires a well defined geometry regarding the reflecting surface of a sample carrier and the synchrotron beam. The newly installed chamber allows for reliable sample positioning, remote sample changing and evacuation of the fluorescence beam path. The chamber was successfully used showing accurate determination of elemental amounts in the certified reference material NIST water 1640. Low limits of detection of less than 100 fg absolute (10 pg ml^?1) for Ni were found. TXRF‐XANES on different Re species was applied. An unknown species of Re was found to be Re in the +7 oxidation state.     

Study of factors affecting the results of natural water analyses by total reflection X‐ray fluorescence

The study aims to choose the conditions for the direct analysis of different types of natural water samples by total reflection X‐Ray fluorescence spectrometry (TXRF). The effect of some factors on TXRF results was studied such as the surface density of dried water residue on the sample carrier, the dilution ratio of high‐mineralized samples with ultrapure water and the solution of the detergent Triton X‐100, the salt contents, the internal standard concentration, and repeated pipetting of an aliquot of fresh water. The influence of self‐absorption phenomena on quantification results was demonstrated by using brine samples. The TXRF results for natural waters of varying salinity (brines, fresh waters, and ground waters) and model solutions are presented. For a number of analytes, the data obtained by TXRF were compared to those obtained by ‘wet’ chemistry and inductively coupled plasma mass spectrometry. Copyright © 2013 John Wiley & Sons, Ltd.     

Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection x‐ray fluorescence

Conditions for the total reflection x‐ray fluorescence (TXRF) analysis of real uranium samples for low atomic number elements using vacuum chamber TXRF spectrometer were optimized. It was observed that for analysis of low atomic number elements, almost complete removal of uranium matrix is required. Two certified reference materials of uranium containing trace elements in different concentrations were dissolved in minimum amount of high purity nitric acid. The uranium matrix from these solutions was separated by solvent extraction using tri‐n‐butyl phosphate as extracting reagent. Low atomic number elements in TXRF spectrum of the aqueous phase could be seen only after six tri‐n‐butyl phosphate equilibrations in extraction. The TXRF determinations of the certified low atomic number elements Mg and Al were made in these aqueous solutions after addition of Sc as an internal standard. The TXRF determined values for Mg were in good agreement with the certified values, whereas TXRF determined Al values differed from the certified values appreciably, probably due to the interference of Al Kα peak with escape peak of U Mα and the neighboring Si Kα peak. Copyright © 2013 John Wiley & Sons, Ltd.     

X‐ray fluorescence spectrometry in Dar es Salaam

Energy‐dispersive x‐ray fluorescence (EDXRF) analysis has been established at the University of Dar es Salaam, Faculty of Science, Department of Physics. Calibration was conducted using thin films from Micromatter (USA) for secondary target XRF. We report on the performance of the spectrometer including the detection limits attained, which range from 0.01 to 10 ng cm^?2 using collimators of 6 and 8 mm diameter under excitation conditions of 50 kV, 35 mA. The accuracy of the measurements was checked using IAEA SOIL‐7 and NIST 3087a Certified Reference Materials. The experimental values differed by <5% from the certified values. The total reflection x‐ray fluorescence (TXRF) facility added as a module to the existing XRF system provides detection limits between 0.1 and 100 pg for most of the elements measured. Copyright © 2005 John Wiley & Sons, Ltd.     

A total reflection X‐ray fluorescence method for the determination of chlorine at trace levels in nuclear materials without sample dissolution

A total reflection X‐ray fluorescence (TXRF) method for the determination of chlorine at trace levels in nuclear fuel samples is described. Chlorine present in trace concentrations in nuclear fuel materials such as U₃O₈, (U,Pu)C, PuO₂ and Pu‐alloys was first separated from the solid matrix by pyrohydrolysis as HCl and was collected in 5 mM NaOH solution. This solution was analyzed for chlorine by TXRF spectrometry using Cl Kα analytical line excited by W Lα. Cobalt was used as internal standard. The precision for such chlorine determination was found to be within 27% (n = 4) when the analysis was carried out in air atmosphere. This could be improved to 8% by making TXRF measurement in flowing helium atmosphere. The results obtained from TXRF determinations were also compared with those obtained from ion chromatography (IC) and were in good agreement. The collection of distillate during pyrohydrolysis in NaOH helped in counterchecking loss of chlorine during TXRF sample preparation. The average deviation of TXRF‐determined values in helium‐purged TXRF measurements with IC determined values (as chloride) was 15% at a chlorine concentration level in the range of 1–70 µg/mL. Copyright © 2012 John Wiley & Sons, Ltd.     

L‐series X‐ray emission spectra of 3d‐metal compounds with various excitation conditions

L‐series emissions of manganese, iron, and zinc oxides were studied using electron beam excitation and highly brilliant synchrotron radiation excitation. We showed that manganese and iron oxides show different Lβ/Lα intensity ratio because of their oxidation states and excitation electron voltages. On the other hand, we could not get any L‐series emissions from those bulk samples when excited by normal incident high‐energy monochromatic X‐rays, while samples of thin films and samples excited by grazing incident monochromatic X‐rays showed clear emissions. It is suggested that the difference of Lβ/Lα intensity ratio due to the oxidized states mainly concerns with the Coster–Kronig transition ratio of the samples, while self‐absorption effects should also deeply contribute the ratio, considering the experimental results. Copyright © 2016 John Wiley & Sons, Ltd.     

Combined X‐ray diffraction and alpha particle X‐ray spectrometer analysis of geologic materials

The shallow interrogation depth of the lightest elements (Na, Mg, Al, and Si) detected by the particle‐induced X‐ray emission branch of the Curiosity Rover's alpha particle X‐ray spectrometer suggests that the X‐rays of these elements very likely emerge from a single mineral grain. This reality violates the assumption of atomic homogeneity at the micron scale made in both existing spectrum‐reduction approaches for the alpha particle X‐ray spectrometer. Consequently, analytical results for these elements in igneous geochemical reference materials exhibit deviations from certified concentrations in a manner that can be related to the total alkali‐silica diagram. A computer code is introduced here to provide quantitative prediction of these deviations using the mineral abundances determined from X‐ray diffraction. The latter are converted to area coverage fractions to represent the sample surface, and a fundamental parameters computation predicts the elemental X‐ray yields from each mineral and sums these. In this process, the chemistry of each individual mineral has to be varied by an iterative simplex approach; X‐ray yields are computed and compared with the peak areas from the fit of the bulk sample. When the difference between mineral yields and peak areas for each element are minimized, the mineral formulae are set and elemental X‐ray yields provided. The ratio between the summed mineral X‐ray yields and the corresponding yields based on the homogeneity assumption may then be compared directly with the concentration deviations measured in our earlier work. For several rock types, good agreement is found, thereby consolidating our understanding of the effects of sample mineralogy on alpha particle X‐ray spectrometer results. Copyright © 2017 John Wiley & Sons, Ltd.     

Total reflection x‐ray fluorescence analysis—a review

Total reflection x‐ray fluorescence analysis (TXRF) is a special energy‐dispersive x‐ray analytical technique extending XRF down to the ultra trace element range. Detection limits of picograms or nanograms per gram levels are reached with x‐ray tube excitation. Using synchrotron radiation as excitation source, femtogram levels are detectable, particularly important for Si wafer surface analysis. TXRF is specially suited for applications in which only a very small amount of sample is available, as only a few micrograms are required for the analysis. In this review, an overview of theoretical principles, advantages, instrumentation, quantification and application is given. Chemical analysis as well as surface analysis including depth profiling and thin‐film characterization is described. Special research results on extension to low‐Z elements, excitation with synchrotron radiation and x‐ray absorption spectroscopy (XAS) for chemical speciation at trace levels are reviewed. Copyright © 2007 John Wiley & Sons, Ltd.     

Utilizing broadband X‐rays in a Bragg coherent X‐ray diffraction imaging experiment

A method is presented to simplify Bragg coherent X‐ray diffraction imaging studies of complex heterogeneous crystalline materials with a two‐stage screening/imaging process that utilizes polychromatic and monochromatic coherent X‐rays and is compatible with in situ sample environments. Coherent white‐beam diffraction is used to identify an individual crystal particle or grain that displays desired properties within a larger population. A three‐dimensional reciprocal‐space map suitable for diffraction imaging is then measured for the Bragg peak of interest using a monochromatic beam energy scan that requires no sample motion, thus simplifying in situ chamber design. This approach was demonstrated with Au nanoparticles and will enable, for example, individual grains in a polycrystalline material of specific orientation to be selected, then imaged in three dimensions while under load.     

Synchrotron‐based spectroscopy of X‐ray channeling through hollow capillary microchannels inside glass plates

Here, soft X‐ray synchrotron radiation transmitted through microchannel plates is studied experimentally. Fine structures of reflection and XANES Si L‐edge spectra detected on the exit of silicon glass microcapillary structures under conditions of total X‐ray reflection are presented and analyzed. The phenomenon of the interaction of channeling radiation with unoccupied electronic states and propagation of X‐ray fluorescence excited in the microchannels is revealed. Investigations of the interaction of monochromatic radiation with the inner‐shell capillary surface and propagation of fluorescence radiation through hollow glass capillary waveguides contribute to the development of novel X‐ray focusing devices in the future.     

Trace determination of uranium preconcentrated using graphene oxide by total reflection X-ray fluorescence spectrometry

A new method based on dispersive microsolid phase extraction using graphene oxide (GO) as a solid adsorbent and total reflection X-ray fluorescence (TXRF) spectrometry is proposed for trace determination of uranium. In the developed methodology, a suspension of GO was injected into uranium-spiked multielement solutions including rubidium; after filtration, the membrane filter with collected GO was placed in a small volume of internal standard acid solution and the eluent containing uranium was deposited onto a fluorine resin-coated slide glass, which is a disposable sample stage. Using GO was effective for removal of rubidium from the measurement solution to avoid interference between Rb Kα peak and U Lα peak. The high enrichment factor of 150 enables obtaining uranium detection limits of 0.042, 0.087, and 0.12 μg L⁻¹ for ionic strength of 0.01, 0.1, and 1 mol L⁻¹, respectively. Such low detection limits were obtained by using a benchtop TXRF spectrometer with 5-min measurement. The proposed method is suitable for trace uranium determination in water, including high salinity samples.     

Choice of optimal conditions for X‐ray fluorescence analysis of milk products with varying fat content

The design of experiments was used to study sources of errors in the sample preparation and to choose optimal conditions for X‐ray fluorescence (XRF) analysis of milk products of varying fat content. The measurements were performed using the conventional wavelength‐dispersive XRF (WDXRF) and the total reflection XRF (TXRF) techniques. For WDXRF, the dried milk samples were pelletized, and the mathematical models were constructed, which described the dependence of XRF intensity on the pelletizing pressure, the pellet weight and the milk fat content. The effect of radiation time on the stability of pressed milk powder samples was also estimated. When applying TXRF, the sample preparation involved diluting milk samples with the ultrapure water, adding the internal standard (Ga) and drying of a sample aliquot on a quartz glass sample carrier. The mathematical models were designed, which described the dependence of the sample preparation error on the dilution ratio and sample aliquot pipetted on the carrier. A physical interpretation of the obtained mathematical models was proposed. Copyright © 2013 John Wiley & Sons, Ltd.     

The capabilities of an electrically cooled energy‐dispersive x‐ray detector for quantitative x‐ray fluorescence analysis

The capabilities of the Si PIN diode x‐ray detector were determined and compared with those of a standard Si(Li) detector. The x‐ray fluorescence (XRF) analysis systems assembled with these two detectors included annular radioisotope excitation sources of Cd‐109 and Fe‐55. The systems were calibrated for sensitivity and quantification was performed with fundamental parameters software. Based on the analysis of the standard reference material NIST 2710 (Montana soil), the elemental sensitivities and the limits of detection of both systems were obtained. The elemental sensitivities of the Si PIN detector for fluorescence x‐rays in the energy range up to 10 keV were comparable to those of the Si(Li) detector. At higher fluorescence x‐ray energies the sensitivity of the Si PIN detector gradually decreased and was smaller by a factor of ～4 at 20 keV. The reason was mainly the small thickness of the sensitive volume of the Si PIN diode (0.2 mm) and therefore the smaller relative efficiency of this detector. The assessed limits of detection (LODs) were comparable for the two detectors, which was mainly due to the lower spectral background of the Si PIN detector in excitation with the Cd‐109 source as a result of its smaller sensitive thickness. The accuracy of elemental determinations for the two detectors was comparable and within the limits of the assessed uncertainties, which were calculated considering all the steps of the analysis, i.e. spectrum measurement and analysis, sensitivity calibration and quantification. Copyright © 2004 John Wiley & Sons, Ltd.     

Sapphire hard X‐ray Fabry–Perot resonators for synchrotron experiments

Hard X‐ray Fabry–Perot resonators (FPRs) made from sapphire crystals were constructed and characterized. The FPRs consisted of two crystal plates, part of a monolithic crystal structure of Al₂O₃, acting as a pair of mirrors, for the backward reflection (0 0 0 30) of hard X‐rays at 14.3147 keV. The dimensional accuracy during manufacturing and the defect density in the crystal in relation to the resonance efficiency of sapphire FPRs were analyzed from a theoretical standpoint based on X‐ray cavity resonance and measurements using scanning electron microscopic and X‐ray topographic techniques for crystal defects. Well defined resonance spectra of sapphire FPRs were successfully obtained, and were comparable with the theoretical predictions.     

Recent Advances in TXRF

Abstract

Total reflection X‐ray fluorescence analysis (TXRF) is a special method of energy‐dispersive X‐ray fluorescence analysis extending EDXRF to the ultra trace element level. The achievable detection limits depend on the excitation source and are in the range of picograms to femtograms. Only small amounts of sample are required and the quantification by adding one element as an internal standard is easy as thin film approximation is valid. In this article, the recent advances in TXRF are reviewed with over 80 references. The principles, advantages, instrumentation, improvements with X‐ray optics, synchrotron radiation as excitation sources as well as various fields of application, wafer surface analysis, depth profiling, absorption spectroscopy, medical samples, biological samples, environmental monitoring, archeological and polymer samples are described. Related techniques are also mentioned and discussed.     

Variation of trace elements in snow during starting and ending of snowfall in Kyoto city measured by low power total reflection X‐ray fluorescence spectrometry

This paper reports the variation of trace element concentrations in snow samples during the starting and ending of snowfalls in Kyoto, Japan, using a low power total reflection X‐ray fluorescence spectrometer to analyze trace elements (having atomic numbers from 13 to 28) in a sample with detection limits of ppb to ppm in concentration. The difference in concentrations indicates how much the urban air is refreshed due to falling snow. Cl, K, Ca, and Fe were determined in the snow samples, and their concentrations during snow starting were higher than at snow ending.     

Characterization of x‐rays emerging from between reflector and sample carrier in reflector‐assisted TXRF analysis

The possible application of an Si reflector, which is placed just above the sample carrier in total reflection x‐ray fluorescence (TXRF) analysis, was investigated. The x‐rays that were emitted from an Mo tube and passed between the Si reflector and the Si sample carrier were analyzed with an Si drift detector. In our experimental setup, the angle between the reflector and the sample carrier can be changed by adjusting the inclination of the reflector. The intensity of the x‐rays that emerged from between the two Si surfaces drastically changed depending on the reflector angle. At a proper reflector angle, this intensity showed a maximum and, in addition, the Compton peak in the x‐ray spectrum was suppressed. When this x‐ray beam was used for excitation of TXRF signals, the highest intensity of x‐ray fluorescence emitted from the sample was detected, indicating that these experimental conditions are useful for the enhancement of TXRF intensities. Copyright © 2004 John Wiley & Sons, Ltd.     

Adaption of a diffractometer for time‐resolved X‐ray resonant magnetic scattering

A new set‐up is presented to measure element‐selective magnetization dynamics using the ALICE chamber [Grabis et al. (2003), Rev. Sci. Instrum. 74 , 4048–4051] at the BESSY II synchrotron at the Helmholtz‐Zentrum Berlin. A magnetic‐field pulse serves as excitation, and the magnetization precession is probed by element‐selective X‐ray resonant magnetic scattering. With the use of single‐bunch‐generated X‐rays a temporal resolution well below 100 ps is reached. The ALICE diffractometer environment enables investigations of thin films, described here, multilayers and laterally structured samples in reflection or diffuse scattering geometry. The combination of the time‐resolved set‐up with a cryostat in the ALICE chamber will allow temperature‐dependent studies of precessional magnetization dynamics and of damping constants to be conducted over a large temperature range and for a large variety of systems in reflection geometry.     

Microfluidic sample preparation for elemental analysis in liquid samples using micro X‐ray fluorescence spectrometry

The integration of microfluidic devices with micro X‐ray fluorescence (micro‐XRF) spectrometry offers a new approach for the direct characterization of liquid materials. A sample presentation method based on use of small volumes (<5 µl) of liquid contained in an XRF‐compatible device has been developed. In this feasibility study, a prototype chip was constructed, and its suitability for XRF analysis of liquids was evaluated, along with that of a commercially produced microfluidic device. Each of the chips had an analytical chamber which contained approximately 1 µl of sample when the device was filled using a pipette. The performance of the chips was assessed using micro‐XRF and high resolution monochromatic wavelength dispersive X‐ray fluorescence, a method that provides highly selective and sensitive detection of actinides. The intended application of the device developed in this study is for measurement of Pu in spent nuclear fuel. Aqueous solutions and a synthetic spent fuel matrix were used to evaluate the devices. Sr, which has its Kα line energy close to the Pu Lα line at 14.2 keV, was utilized as a surrogate for Pu because of reduced handling risks. Between and within chip repeatability were studied, along with linearity of response and accuracy. The limit of detection for Sr determination in the chip is estimated at 5 ng/µl (ppm). This work demonstrates the applicability of microfluidic sample preparation to liquid characterization by XRF, and provides a basis for further development of this approach for elemental analysis within a range of sample types. Copyright © 2014 John Wiley & Sons, Ltd.