A spectroscopic method for determining thickness of quartz wave plate

A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS)curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.     

椭偏法测量云母波片相位延迟量及双折射率(英文)

为了得到云母波片的相位延迟量和双折射率随波长的变化关系,利用椭偏光谱仪连续测量了云母波片在400～770nm光谱范围内的延迟量.在对云母波片进行校准后,测量的数据被光电探测器收集并输送到计算机,根据输出的数据可以得到云母波片的相位延迟量随波长的变化.利用测得的延迟量计算出了云母波片在一定光谱范围内的双折射率,得到了云母波片的双折射率色散曲线,并通过拟合得到了双折射率色散公式.该方法能测量任意波片的相位延迟量,并且具有测量方便、周期短、精度高等特点.     

Determining the retardation of a wave plate by using spectroscopic method

A method for determining the retardation of a wave plate is presented. The method is based on polychromatic polarization interference technique. Through accurate judgment of the intersection points' wavelengths of the two orthogonal polarization transmittance spectrum curves, the apparent retardation, the absolute retardation values and the physical thickness of a wave plate can be measured at a wide spectral range from 400 nm to 800 nm. Experimental results show that the proposed method has very high precision. In addition, the method has a significant advantage that has high misalignment tolerance. The method reported here should have applications in fabrication and measurement of a wave plate.     

石英波片偏光干涉谱的研究

根据石英晶体双折射率的色散特性,对石英波片的偏光干涉谱进行了理论分析和数值模拟,提出了一种石英波片延迟量和厚度的偏光干涉标定法。即由偏光干涉谱,可以得出石英波片在200~2000 nm宽光谱范围内的延迟量;通过对长波段的偏光干涉谱极值波长的精确判断,可以准确地计算出该石英波片的厚度。利用Lambda900紫外-可见-近红外分光光度计对一片石英波片的偏光干涉谱进行了测量。在波长精度为0.1 nm的情况下,测量的厚度精度为0.1μm。误差分析结果表明,通过提高光谱的最小分辨力及选择较长的光谱波段进行测量计算,可以有效地降低误差。     

光学差拍方法测量波片的相位延迟

本文提出了用双频激光器测量波片的相位延迟方法:光学差拍方法,其测量精度为激光波长的1/6000,优于其他的波片测量方法的测量精度。     

二元复合波片延迟相位方位效应探讨

在多级波片方位效应的基础上，探讨了复合波片的方位效应问题。通过对多级波片的设计与测量，论证了入射光方位是影响波片延迟量的关键因素。     

四区域法消除偏振棱镜缺陷对波片相位延迟测量的影响

在起偏器-待测波片-检偏器系统基础卜提出一种四区域测量波片相位延迟量的方法.调整待测波片和检偏器的方位角,获得相应的四组光强值,通过线性运算得到待测波片的相位延迟量,完全消除了起偏器和检偏器不完全消光带来的误差.由于测量系统中不存在标准波片或其他相位调制元件,允许测量波长仅受偏振棱镜和探测器的限制,因此四区域法可适用于很大波长范围内的波片测量.以λ/4波片为例,理论分析了测量系统利用四区域测量法后的仪器误差为σφ≤士3.49065×10-3rad(约0.2°),精度比原算法提高约1个数量级.实验验证了四区域法能有效提高系统精度.     

基于光弹调制技术的波片相位延迟量测量方法

提出了一种基于光弹调制技术的波片相位延迟量测量方法,利用米勒矩阵对其进行了理论推导和误差分析。测量光路包括激光器、起偏器、光弹调制器、被测波片、检偏器和光电探测器,利用探测信号的归一化基频分量和二次谐波分量精确计算出被测波片的相位延迟量。该方法能测量紫外到红外光谱范围内任意相位延迟量的波片,误差分析表明其误差小于0.05°。实验验证了该测量方法的有效性,波片相位延迟量的重复测量精度为0.0048°。     

Wavelength dependence of the phase retardation of a quarter-wave plate

We describe an optical heterodyne polarization interferometer that can be efficiently used for the precision measurement of the change in the state of polarization of a light wave induced by polarizing optical devices. This technique is used to measure the change with wavelength of the phase retardation of a quarter-wave plate. A theoretical derivation is presented to permit computation of the wavelength dependence of the phase shift induced by a quarter-wave plate.     

Double-pass self-spectral-calibration of a polarization state analyzer

We present a new method that allows efficient spectral calibration for a polarization state analyzer. The procedure does not require any additional polarization optical element other than the polarization state analyzer itself. It uses a double-pass technique that can be achieved up to a very good precision. The method is illustrated using real measurements done at several wavelengths with a rotating wave plate polarization state analyzer. Alignment of axis as well as true retardation at a specific wavelength are easily obtained by a standard function fitting.     

Simple method for simultaneous determination of the phase retardation and fast axis of a wave plate

A simple method for simultaneous determination of the phase retardation and fast axis of a wave plate is presented. In this method, double light path compare system is adopted to achieve better accuracy. In the main optical path, laser beam passes successively through a polarizer, a wave plate to be measured, an analyzer, and then is incident on a detector. In the reference optical path, another detector is used to monitor the fluctuation of the light source. With rotation of the wave plate, the maximum and minimum output light intensity, rotation angle of the wave plate are detected in the main light path; corresponding light intensity are simultaneously detected in the reference light path. Based on the light intensity and the rotation angle, the phase retardation and fast axis of the wave plate can be determined simultaneously. The main advantage of this method is its simplicity of apparatus, easy operation, low cost, and high accuracy. We believe that the method reported in this paper should be a useful approach to measure a wave plate without requiring any complex and expensive components.     

1/4波片相位延迟分布的动态测量

通过密勒矩阵和斯托克斯参量法对一种1/4波片的相位延迟分布的测量模型进行了推导,并设计出一种空间分光移相器,取代一般测量系统中的检偏器,使得系统能于瞬间同时采集四幅具有90°移相步长的干涉图,避免了环境振动对测量的影响,从而可以对1/4波片的相位延迟分布进行动态在线测量.对一个实际标称波长632.8 nm的1/4波片进行了测量,结果显示其平均延迟量为149.36 nm,且接近75%部分其相位延迟误差在5 nm之内,显示出较好的延迟均匀性.     

菱体型消色差相位延迟器延迟相位的方位效应

菱体型相位延迟器是高度消色差的λ/4相位延迟器.由于材料折射率色散的影响,在可见光范围内,仍存在2°的延迟偏差.为满足精确应用和测量的需求,从相位延迟的全反射相变理论出发,阐述了斜入射相位延迟原理,以菲涅耳菱体为例,分析了菱体型相位延迟器相位延迟随其入射角变化的规律性,结果表明:当光线非严格准直时,光的入射角对相位延迟量有明显的影响,延迟量不但对入射角变化敏感,而且还与入射光线的入射方位密切相关,呈不对称形式.当入射光的波长改变时,只需改变菱体延迟器的方位,让光线在菱体的前端面上斜入射,适当选取入射角,就可以补偿相位延迟的色散偏差,使同一菱体达到对不同波长都满足λ/4相位延迟.当角度调整精度Δi=±0.01°时,引入的延迟偏差不超过±0.009°,这一精度是其它石英波片或云母波片所不能比的.     

激光回馈波片位相延迟测量的误差源及消除方法

激光回馈法是一种新型的波片位相延迟测量方法。将波片放置在激光器与回馈镜之间,可使激光回馈波形产生偏振90°旋转（即跳变）现象,而两偏振态所占的周期比（占空比）与波片的位相延迟相关。通过测量占空比即可由计算机自动给出波片位相延迟。采用双向扫描回馈镜,2次获得并测出占空比,这样可以很好地消除两偏振态损耗的波动造成的测量误差,提高了该方法长期测量的稳定性。测量的重复性达到0.5°。该方法结构简单,在线测量精度高,满足工业化生产的需要。     

Alternative method for measuring the phase retardation and fast axis of a wave plate

Optical Review - An alternative method is proposed for simultaneously measuring the phase retardation and fast axis angle of a wave plate by utilizing a radially polarized symmetric light beam. A...     

基于弹性波超表面的Lamb波透射调控

根据广义Snell定律,该文提出了一种新型曲梁型弹性波超表面结构。通过该结构对入射波进行相位调制,实现了板中Lamb波(A0模态)的异常透射调控,从而实现了波的负折射、非对称传输、声聚焦等功能。进一步的研究结果显示,若将该类超表面结构贴置在完整的铝板表面,通过引入吸声材料(阻尼),在保证薄板完整性的同时,可以起到显著消除薄板和超表面透射波场叠加的作用。该方法实现了对完整板结构Lamb波透射方向的有效调控,也为弹性波超表面提供了新的研究思路。     

Phase retardation measurement by analyzing flipping points of polarization states in laser with an anisotropy feedback cavity

Phase retardation of wave plate is measured by analyzing flipping points of polarization states. Measured result and system error are analyzed. Nonlinearity of piezoelectric ceramic is an important error source. The nonlinearity is measured with an interferometer based on microchip Nd:YAG laser feedback phenomenon. The measured system of phase retardation, in this paper, is calibrated to the frequency splitting system. The accuracy of the system is improved. The measurement repeatability is better than 0.12° and the accuracy is better than 0.22°. This paper has a very important significance for wave plate high precision manufacture.     

Method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component

A method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component is proposed, and the measuring principle is analyzed. The optical measuring system is composed of a laser, a polarizer, a phase modulator, the quarter-wave plate to be measured, an analyzer and a detector. The azimuths of the transmission axes of the polarizer and the analyzer with respect to the modulating axis of the phase modulator are +45°, 0°, respectively. The retardation of the quarter-wave plate is calculated precisely using the normalized secondary harmonic components prior to and after 22.5° rotation of the quarter-wave plate. In this method, the major axis position of the quarter-wave plate is not required to be known in advance, and the measured retardation is independent of the intensity fluctuation of the light source. The feasibility of the method is verified by the experiments.     

Zeeman双频激光器频率分裂与纵模间隔变动一致性分析

激光谐振腔内相位各向异性会引起频率分裂,两分裂模的频差大小由表现出的相位延迟所决定.对于腔内相位延迟较小的He-Ne激光器,两分裂模很接近,处于烧孔重叠区,存在模式竞争而不能同时振荡,形成隐频率分裂.同时,使得激光器两正交偏振方向上的相邻级纵模产生固定的变动量,其大小等于隐频率分裂量的2倍.如果沿激光偏振方向施加横向磁场,Ne原子谱线发生横向Zeeman分裂,增益原子分成两群,分别为平行于磁场和垂直于磁场方向偏振的光提供增益,大大减弱模竞争,使得激光器的两分裂模可同时振荡并测得频差.在谐振腔内放入倾斜的石英晶体片或半波片,由两种方法分别测量频率分裂量并进行比较.实验表明两种方法测量的结果均与理论计算相符,平均相对偏差不超过1%.据此可以准确得到Zeeman双频激光器的频差大小,并为半波片测量提供了新方法.     

Measurement of surface figure of plane optical surfaces with polarization phase-shifting Fizeau interferometer

A Fizeau interferometer based set up for measurement of surface forms of plane optical surfaces has been discussed. Phase shifting interferometry has been applied using polarization phase shifter. A linearly polarized (632.8 nm) He–Ne laser has been used as the source. Light reflected from the object and the reference/master surfaces are made circularly polarized in opposite senses by means of two properly oriented quarter wave retardation plates placed at appropriate positions, one inside and other outside the interference cavity of the interferometer, and phase shifts are introduced between the object and the reference/master waves by varying angular orientation of a polarizer/analyzer. Final result is made free from any residual wave-front aberrations introduced by the (intra-cavity) wave plate by subtracting phase values obtained by PSI technique between a high optical quality master surface and the reference surface from that obtained for the test object surface with respect to the same reference surface for each point of the interference field. Results are shown for a plane surface.Advantages of the technique presented are linearity and high accuracy in phase stepping, no perturbation of the interference cavity during the phase shifting and possibility of real time or dynamic interferometry.