Growth and characterization of magneto‐optical YFeO3 crystals

The floating zone growth of magneto‐optical crystal YFeO₃ has been investigated. The polycrystalline feed rod was prepared by a pressure of 250MPa and sintering at about 1500°C. A crack‐ free YFeO₃ single crystal has been successfully grown. The crystal preferred to crystallize along <100> direction with about 10° deviation. The X‐ray rocking curve of the crystal has a FWHM of 24 arcsec, confirming the high crystal quality of the sample. The (100) plane was etched by hot phosphoric acid and the dislocation density was about 10⁴/cm². A thin outer layer with Y₂O₃‐rich composition was found at the periphery of as‐grown crystals, which was attributed to the Fe₂O₃ evaporation during growth. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

热交换法生长c面取向大尺寸蓝宝石晶体的研究

本文使用热交换法直接生长c面取向,尺寸为φ170 mm× 160 mm,重12 kg的蓝宝石晶体.晶体无色透明,内部无散射颗粒.沿c面(0001)方向的晶棒锥光图可观察到同心圆簇的干涉条纹,仅中心较小区域因内应力存在,干涉条纹发生扭曲.将抛光的晶片进行化学腐蚀后,通过金相显微镜检测位错腐蚀坑形貌图,结果显示,腐蚀坑呈三角形,平均位错密度较低,为1.98 × 103 Pits/cm2,X射线衍射半峰宽较小,晶体结构完整.     

Effect of γ‐irradiation on spectral properties of undoped Y2SiO5 crystals

The absorption spectra of undoped Y₂SiO₅ crystals were studied before and after γ‐irradiation. After γ‐irradiation, the additional absorption peaks at 260‐270 and 320nm were observed in as‐grown and H₂‐annealed Y₂SiO₅ crystal, but it did not occur in air‐annealed Y₂SiO₅ crystal. These absorption peaks were attributed to F color centers and O^– hole centers, respectively. Owing to more oxygen vacancies and color centers in H₂‐annealed Y₂SiO₅ crystal than that in as‐grown Y₂SiO₅ crystal after γ‐irradiation, the additional absorption peaks were more intense in the former than that in the latter. With the irradiation dose increasing from 20 to 220kGy, the intensity of additional absorption peaks increased. © 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim     

Etching Figures in Neodymium Gallate and Yttrium Aluminate Crystals

The dislocations existing in single crystals of neodymium gallate and yttrium aluminate grown by the Czochralski technique have been studied by means of etch pits. The data concerning their solubility in cases of different directions of a face orientation, various treatment temperatures and several enchant types are reported. The investigation of etch pits in the twinned YAlO₃ and NdGaO₃ crystals showed that twins are formed during a growth process. In the [110]‐pulled NdGaO₃ crystals the discrepancy between the twin and matrix parts of a crystal is accommodated by the dislocation congestion and the dislocation low‐angle boundaries whereas in [010]‐pulled YAlO₃ crystals the microcracks perform this function.     

Sub-boundaries on (002) cleavages of Li2CO3 single crystals

Linear arrays of dislocations (straight, terminating and curved) are observed on etching with 2% citric acid (002) cleavages of lithium carbonate (Li₂CO₃) single crystals, grown by zone melting technique. As the dislocations are non-uniformly spaced and disappear on successive etching, they may not be revealing low-angle grain boundary, nor slip traces as they are terminating and curved meaning crystallographically non-oriented. On the observation of experiments on successive etching and etching of matched pairs, it is concluded that the arrays of etch pits reveal dislocation walls (dislocation density 1.1 × 10⁶ — 1.5 × 10⁷ pits cm⁻²) probably created due to the localized thermal stresses released as a result of high temperature annealing of the crystal during growth. The implications are discussed.     

Growth of Li2CO3 Single Crystals by Zone Melting Technique

Li₂CO₃ single crystals have been grown by zone melting technique in carbondioxide atmosphere. The diameter of the grown crystal depends on the growth rate. The quality of the crystal depends on the growth rate, temperature of the molten zone, choice of the seed and the temperature of the auxiliary furnace. The crystal shows cleavage plane. The etch studies on cleavage planes show that the etch pits are always triangular in character.     

Dislocation etching of tin iodide single crystals

Single crystals of tin-iodide (SnI₂) have been grown using the controlled reaction between SnCl₂ and KI by diffusion process in gel medium. As grown (010) surfaces of the crystals have been optically studied. Characteristic etch pits have been observed on them. This suggests that SnI₂ crystals might go into dissolution in the acid-set gel. By successively etching (010) surfaces in a mixture of ammonia, acetic acid, and CdCl₂ solution, it is established that the pits indicate the site of dislocations in the crystals. This is further confirmed by comparing the etch patterns before and after chemically polishing (010) surfaces. The average dislocation density in the crystals have been evaluated and found to be 3.2 × 10³ cm⁻² and the implications are discussed.     

Defect reduction of laterally regrown GaN on GaN/patterned sapphire substrates

Structural properties of GaN epilayers on wet-etched protruding and recess-patterned sapphire substrates (PSSs) have been investigated in detail using high-resolution double-crystal X-ray diffraction (DCXRD) and etch-pit density methods. The DCXRD results reveal various dislocation configurations on both types of PSSs. The etch pits of GaN on the recess PSS exhibit a regular distribution, i.e. less etch pits or threading dislocation density (TDD) onto the recess area than those onto the sapphire mesas. On the contrary, an irregular distribution is observed for the etch pits of GaN on the protruding PSS. A higher crystal quality of the GaN epilayer grown onto the recess PSS can be achieved as compared with that onto the protruding PSS. These data reflect that the GaN epilayer on the recess PSS could be a better template for the second epitaxial lateral overgrowth (ELOG) of GaN. As a result, the GaN epilayers after the ELOG process display the TDDs of around ∼10⁶ cm⁻².     

Crystal growth and dislocation structure of gallium antimonide

Single crystals of GaSb have been grown by the Czochralski method under reducing conditions. Crystals were grown in the 〈100〉, 〈111〉, and 〈112〉 directions. The 〈111〉 growth direction was found to be the most suitable for the successful and reliable crystal growth. Dislocation densities in 〈111〉 oriented crystals were examined by chemical etching. The etch pits density in these crystals didn't exceed the value of 1 × 10² cm⁻².     

Growth defects in a PZNT93/7 crystal prepared by directional solidification

Novel relaxor ferroelectric crystal 0.93Pb(Zn_1/3Nb_2/3)O₃‐0.07PbTiO₃ (PZNT93/7) with dimensions about Ø40× 70 mm³ was obtained by directional solidification technique. The growth defects of the crystal were investigated. Rocking curve analysis revealed the crystalline quality of PZNT93/7 crystal was not perfect and the FWHM value was measured to be about 0.7°. Some pits and oxide particles in micro‐size were formed in the crystal due to the growth conditions. A series of growth steps parallel to (001) face were observed which were attributed to the growth behavior. Moreover, it was found the average chemical composition of the crystal was deviated slightly to the stoichiometric value of PZNT93/7. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Growth and characterization of a PbI2 single crystal used for gamma ray detectors

Lead iodide (PbI₂) is an important material for room temperature radiation detectors. In this paper, we have grown PbI₂ single crystal through a special craft, from which γ‐ray detector has also been fabricated. X‐ray diffraction analysis indicates structure of the grown crystal is 2H with hexagonal space group P3m1. Infrared transmission measurement shows transmission rate of the grown crystal sample (10×10×1mm³) reaches 40% averagely in range of 400∼4000cm^‐1. Ultraviolet absorbing test indicates cut‐off wavelength of the sample is 547.6nm, corresponding band gap of 2.27eV. Room temperature detector fabricated from the grown crystal is sensitive to ²⁴¹Am 59.5KeV γ‐ray. Full width at half maximum (FWHM) of the obtained energy spectrum is 26.7KeV. All the results indicate the PbI₂ crystal grown through the special craft is of good characteristics and can be used for γ‐ray detector. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Dislocation studies by chemical etching on solution-grown NaSbF4 and Na3Sb4F15 single crystals

An attempt has been made to study the etch pit dislocations of isolated as well as matched pairs of cleavage planes of solution grown NaSbF₄ and Na₃Sb₄F₁₅ single crystals when etched with analar grade methyl alcohol and ethyl alcohol. On etching of cleavage faces the pits nucleate at the intersection sites of dislocations with the cleavage face. On successive etching of a cleavage face, arrays of triangular shape etch pits are observed. After prolonged etching some of the etch pits disappear. These pits are curved and terminated indicating that they are crystallographically non-oriented. One-to-one correspondence with respect to number, shape, position and structure of the pits has been established by etching of a matched cleavage face. The etch pit densities of both NaSbF₄ and Na₃Sb₄F₁₅ crystals are found to be 10³ per cm².     

Growth and properties of ferroelectric potassium ferrocyanide trihydrate single crystals

Single crystals of potassium ferrocyanide trihydrate, K₄[Fe(CN)₆·3H₂O (KFCT), a ferroelectric material with Curie temperature 251K were grown in silica gel at room temperature for the first time by the solubility reduction method. Resorcinol and ethyl alcohol were used for the purpose of gel setting and supernatant liquid respectively. Optical and mechanical properties were studied for the grown crystal. The structure of the grown crystal was confirmed by X‐ray diffraction analysis. Fourier Transform Infrared (FTIR) and FT Raman spectral analysis of the crystalline samples reveal that the crystalline sample consist consists of all functional groups. Thermal analysis of the crystalline sample was performed by TGA and DTA methods. The Vicker's micro hardness value was measured for KFCT crystals. The square etch pits with a hopper‐like structure is an indicative of 2D nucleation mechanism. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Doping Properties of Pr2O3 Associate InP Liquid Phase Epitaxy

InP epilayers were grown on semi-insulating InP substrates by liquid phase epitaxy with Pr₂O₃-doping. Most grown layers yield mirror-like surfaces and good crystal quality. Hall measurements indicate that n-type background concentration of those grown InP layers will decrease from a value of 2.8 × 10¹⁷ to 3.0 × 10¹⁶ cm⁻³. Their correspondent 77 K mobility also varied from a value of 1326 to 3775 cm²/V s. The photoluminescence (PL) spectra of Pr₂O₃-doped InP epilayers display narrower FWHM and stronger intensity ratios (for band peak to the impurity peak). These PL spectra also demonstrate that the grown layers exhibit a pure crystal quality.     

Growth of bulk zinc chalcogenide single crystals from the vapour phase and their use for laser screens of projection colour television

Results on ZnSe, ZnSe_xS_1−x and ZnS crystal growing from the vapour phase up to 7.5 cm³ in volume are described. Crystals were grown on sapphire, ZnS, ZnSe_xS_1−x and quartz glass substrates without a contact of the growing crystal with a growth ampoule and using the molten tin as a heating medium. Large high-purity crystals with a density of etch pits of 10³ cm⁻² were obtained They exhibited an effective exciton luminescence and rather high radiation efficiency (30 ± 10% for ZnSe at T = 77 K). This made it possible to use these crystals for fabricating laser screens for a cathode ray tube. The main laser parameters obtained on a ZnSe screen at T = 80 and 300 K using a 75 keV electron beam excitation are presented. The light power output reached 0.8 W at T = 80 K; this allowed to obtain a 10 cd · m⁻² TV image of 1.5 × 2 m² in area.     

Growth and characterization of highly c‐axis textured SrTiO3 thin films directly grown on Si(001) substrates by ion beam sputter deposition

Highly c‐axis textured SrTiO₃ (STO) thin films have been directly grown on Si(001) substrates using ion beam sputter deposition technique without any buffer layer. The substrate temperature was varied, while other parameters were fixed in order to study effect of substrate temperature on morphology and texture evolution of STO films. X‐ray diffraction, pole figure analysis, atomic force microscope, and high‐resolution electron microscopy were used to characterize and confirm quality and texture of the STO films. The experimental results show that optimum substrate temperature to achieve highly c‐axis textured films is at 700 °C. The full width at half maximum (FWHM) of 002_STO was found to be 2° and fraction of (011) orientation was as low as 1%. The surface morphology was Volmer‐Weber growth mode with a small roughness ∼1 nm. The lowest leakage current density (5.8 μA/cm² at 2 V) and the highest dielectric constant (ε_STO ∼ 98) were found for highly c‐axis textured films grown at 700 °C. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Growth and etching of calcite crystals

Single crystals of calcite (CaCO₃) have been grown by the method employed by GRUZENSKY , using an aquoeus solution of CaCl₂ and a solid (NH₄)₂SO₃, The chemical reaction takes place according to the following equation: CaCl₂ + (NH₄)₂SO₃ CaCO₃ + 2 NH₄Cl The crystals grown by this method are about 0.2 to 0.8 mm in edge dimensions. Synthetic calcite crystals have been cleaved along (100) planes and the cleavage surfaces have been studied by multiple beam interferometry. The interferograms have revealed that the cleavages are quite flat. The cleavage faces have also been chemically etched and the etch patterns studied optically. By etching a cleavage successively for three different periods it was found that the bottoms of the point-bottomed pits follow a linear etch path. By etching a cleavage pair, one face in one etchant and the other face in a different etchant and by comparing the etch patterns produced, before and after polishing a cleavage face it has been shown that the etch pits nucleate at the sites of dislocations in the crystal. The etch patterns have also been compared with those produced on the cleavage faces of natural crystals. The density of dislocations in the syntheitc calctie crystals was generally less than the density of dislocations in the natural calcite crystals. The implications have been discussed.     

Growth and characterization of near stoichiometric LiNbO3 single crystal

A near stoichiometric LiNbO₃ single crystal has been grown by the Czochralski method from a 58.5% Li melt hold in a large platinum crucible. High resolution X‐ray rocking curves of 30 0 and 0006 reflections indicated that the near stoichiometric LiNbO₃ crystal possesses the high structural quality. Compared with the congruent LiNbO₃, the near stoichiometric LiNbO₃ possesses shorter ultraviolet absorption edge, thus higher Li concentration. The OH^– infrared absorption band analyses showed that the Li concentration in the near stoichiometric LiNbO₃ crystal is higher than that in the congruent LiNbO₃ crystal. This result is in good agreement with that of the ultraviolet absorption edge. The electro‐optic (EO) coefficient γ₂₂ of the near stoichiometric LiNbO₃ crystal was measured to be 6.75 pm/V higher than that of congruent LiNbO₃ crystal. It also proves the near stoichiometric LiNbO₃ electro‐optic Q‐switched requires a low driving voltage and it is advantageous for the device performance. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Selective etching of ZnTe in HF:H2O2:H2O solution: Interpretation of extended defect‐related etch figures

HF:H₂O₂:H₂O solution (40%wt.HF: 30wt.%H₂O₂: H₂O, 3:2:1 by volume) was used to reveal extended defects (line, face and volume defects) in bulk ZnTe crystals grown from Te solution. The etch patterns were analyzed based on their size, shape and distribution. The etch figures, both in the shape of pits and hillocks with high resolution, show forms controlled by the symmetries of the respective faces were produced. Two different sizes of pits were observed, the larger‐size pits correspond to dislocations penetrating the surface, however, the smaller‐size texture pits are produced on the defect‐free region, which serve as standard pits on respect faces. The face defects, such as grain boundaries, sub‐grain boundaries, dislocation walls, twins and stacking faults, can be all displayed clearly. Another essential feature of the etchant is that, it can effectively dissolve Te‐rich phase (Te inclusion/precipitates), which makes it promising to reveal the shape of this volume defect.     

Crystal growth and spectral properties of Nd:Ca5(BO3)3F

A neodymium doped Ca₅(BO₃)₃F single crystal with size up to 51×48×8 mm³ has been grown by the top seeded solution growth (TSSG) technique with a Li₂O‐B₂O₃‐LiF flux. The spectra of absorption and fluorescence were measured at room temperature. According to Judd‐Ofelt (J‐O) theory, the spectroscopic parameters were calculated and the J‐O parameters Ω₂, Ω₄, Ω₆ were obtained as follows: Ω₂ = 1.41×10⁻²⁰cm², Ω₄ = 3.18×10⁻²⁰cm², Ω₆ = 2.11×10⁻²⁰cm². The room temperature fluorescence lifetime of NCBF was measured to be 51.8 μs. According to the J‐O paramenters, the emission probabilities of transitions, branching ratios, the radiative lifetime and the quantum efficiency from the Nd^{3+ 4}F_3/2 metastable state to lower lying J manifolds were also obtained. In comparasion with other Nd‐doped borate crystals, the calculated and experimental parameters show that NCBF is a promising SFD crystal.