基于BCB键合的MEMS加速度计圆片级封装工艺

对基于BCB的圆片级封装工艺进行了研究,该工艺代表了MEMS加速度计传感器封装的发展趋势,是MEMS加速度计产业化的关键。选用3000系列BCB材料进行MENS传感器的粘结键合工艺试验,解决了圆片级封装问题,在低温250℃和适当压力辅助下≤2．5bar（1bar=100kPa）实现了加速度计的圆片级封装,并对相关的旋涂、键合、气氛、压力等诸多工艺参数进行了优化。     

一种基于BCB键合技术的新型MEMS圆片级封装工艺

苯并环丁烯(BCB)键合技术通过光刻工艺可以直接实现图形化,相对于其他工艺途径具有工艺简单、容易实现图形化的优点。选用4000系列BCB材料进行MEMS传感器的粘接键合工艺试验,解决了圆片级封装问题,采用该技术成功加工出具有三层结构的圆片级封装某种惯性压阻类传感器。依据标准GJB548A对其进行了剪切强度和检漏测试,测得封装样品漏率小于5×10-3Pa.cm3/s,键合强度大于49N,满足考核要求。     

圆片级封装散热问题

本文结合低功率和高功率应用中不同散热要求,对圆片级封装系统散热特性进行分析。     

圆片级封装及带凸点倒装芯片简介

介绍了圆片级封装的定义、状况及支撑技术。     

圆片级封装时代已经到来

所谓圆片级封装,是指封装和测试是在未分离的圆片上进行的,并且能在世界范围内被投入生产,主要是建立在薄膜凸点和再分布技术的基础上。采用这些技术的低引线数的硅器件和无源射频集成元件在今天的手持式电信产品中正在兴起。要使这项极具希望的技术获得很好的应用,圆片级老化和测试是必需的。     

圆片级封装技术及其应用

介绍圆片级封装的设计考虑、基础技术、可靠性、应用情况及发展趋势。     

声表面波滤波器圆片级互连封装技术研究

射频前端模块是无线通信的核心,滤波器作为射频前端的关键器件,可将带外干扰和噪声滤除以保留特定频段内的信号,满足射频系统的通讯要求.本文总结了声表面波滤波器工作原理及其传统封装技术,提出了一种圆片级互连封装技术,采用曝光显影、电镀及印刷等工艺实现了芯片焊盘上铜金属层和焊球的形成,避免了芯片核心功能区IDT的损伤.对封装前...     

一种新颖的微电子封装:圆片级封装

本文介绍了一种当前正在快速发展的微电子器件的新颖封装－圆片级封装（WLP）的定义，主要优缺点，焊盘再分布和植球等主要工艺过程等。     

MEMS圆片级真空封装金硅键合工艺研究

提出一种适用于微机电系统(MEMS)圆片级真空封装的键合结构,通过比较分析各种键合工艺的优缺点后,选择符合本试验要求的金硅键合工艺.根据所提出键合结构和金硅键合的特点设计键合工艺流程,在多次试验后优化工艺条件.在此工艺条件下,选用三组不同结构参数完成键合试验.之后对比不同的结构参数分别测试其键合质量(包括键合腔体泄漏率...     

A wafer-level 3D packaging structure with Benzocyclobutene as a dielectric for multichip module fabrication

A new wafer-level 3D packaging structure with Benzocyclobutene (BCB) as interlayer dielectrics (ELDs) for multichip module fabrication is proposed for application in the Ku-band wave. The packaging structure consists of two layers of BCB films and three layers of metallized films, in which the monolithic microwave IC (MMIC), thin film resistors, striplines and microstrip lines are integrated. Wet etched cavities fabricated on the silicon substrate are used for mounting active and passive components. BCB layers cover the components and serve as ILDs for interconnections. Gold bumps are used as electric interconnections between different layers, which eliminates the need to prepare vias by costly dry etching and deposition processes. In order to get high-quality BCB films for the subsequent chemical mechanical planarization (CMP) and multilayer metallization processes, the BCB curing profile is optimized and the roughness of the BCB film after the CMP process is kept lower than 10 nm. The thermal, mechanical and electrical properties of the packaging structure are investigated. The thermal resistance can be controlled below 2 ℃/W. The average shear strength of the gold bumps on the BCB surface is around 70 N/mm~2. The performances of MMIC and interconnection structure at high frequencies are optimized and tested. The 5 -parameters curves of the packaged MMIC shift slightly showing perfect transmission character. The insertion loss change after the packaging process is less than 1 dB range at the operating frequency and the return loss is less than -8 dB from 10 to 15 GHz.     

A Novel Electroless Process for Embedding a Thin Film Resistor on the Benzocyclobutene Dielectric

To realize embedded resistors on multilayer benzocyclobutene (BCB) either on-chip or on-board, a low-cost large format electroless process for deposition of NiP and NiWP thin-film resistors using both low-temperature (25°C) and high-temperature (90°C) baths has been developed. The electroless process exhibits uniform resistor thickness in the submicron range and offers low profile and excellent adhesion to the BCB dielectric layer. The resistor films also act as a seed layer for direct electroplating of copper traces. The NiP alloys can also be tailored to a variable temperature coefficient of resistance (TCR) with different alloy compositions. The electroless process can be adopted in the PCB manufacturing industries with no additional investment. This article is the first report on electroless plated thin film resistors on low loss BCB dielectric.