Growth Rates of Edge-on Lamellar Crystals Confined in Polymer Thin Films

The growth rates of edge-on lamellar polymer crystals in variable thickness films were investigated in terms of dynamic Monte Carlo (MC) simulations. The growth rates linearly decreased with decreasing film thickness for the thinner films and were nearly constant for the thicker films. The mean stem lengths (crystal thickness) were also constant in different thickness films. The crystal widths parallel to the film thickness increased more slowly with increasing film thickness in the thinner films than that in the thicker films, indicating they were restrained by the film thickness. We propose that the growth rate of edge-on lamellar crystals in thin films is dominanted by the crystal width in the thinner films and by the crystal thickness in the thicker films; the variation of the film thickness can change the three-dimensional shape of the crystal growth front, also affecting the growth rate of the edge-on lamellar crystal.     

Crystallization of Poly(Ethylene Oxide) in Thin Films

Crystallization of poly(ethylene oxide) (PEO) in thin films was studied using hot-stage polarized optical microscopy. Isothermal linear crystal growth rates were measured for various film thicknesses at various degrees of undercooling. At a given crystallization temperature, the linear crystal growth rate decreased exponentially with decreasing film thickness below a film thickness of 80 nm. Films showed similar spherulitic morphology down to a film thickness of 30 nm. Control experiments on hydrophilic and hydrophobic surfaces showed that surface chemistry affects stability of the polymer films and causes a competition between crystallization and dewetting.     

Morphology,Growth Rate,and Lamellar Thickness of Polymer Crystals

At high supercoolings, isotactic polystyrene and polybutene-1 have a rounded crystal shape, suggesting kinetic roughening. Still, the growth rates of these polymer crystals show the supercooling dependence derived for nucleation controlled growth. On the other hand, isotactic poly-4-methylpentene-1 1,4 trans-polybutadiene at higher crystallization temperatures and polyethylene at high pressures show a rounded crystal shape: thermal roughening. Again, the growth rate is described by the nucleation theory. On the basis of these observations, we propose a crystallization kinetics taking account of the entropic barrier that was originally proposed by Sadler.     

聚合物LB膜定向铁电液晶的特性

利用新近合成的聚酰亚胺ＬＢ膜定向铁电液晶分子,通过原子力显微镜对经不同亚胺化温度处理的聚酰亚胺ＬＢ膜进行扫描探测,发现相应的ＬＢ膜具有不同的形貌结构,认为高温亚胺化的ＬＢ膜可以提高较高的势垒,这为铁电液晶双稳记忆性的出现提供了可能,而ＬＢ膜的超薄特性有利于开关过程中表面聚积电荷的中和与释放,保证了器件优良的双稳记忆性的最终获得以及微秒量级快速响应的实现。     

多晶氧化物薄膜及复合膜系应力模型

基于膜层结构的弛豫现象,建立了一个多晶膜的应力演化模型,并通过线性组合给出了复合膜的生长应力模型。利用双光束基底曲率测量装置实时测量了电子束蒸发氧化铪、氧化硅多晶膜及其复合膜的应力演化过程,并对测量结果进行了拟合分析。     

Grain Growth in Polycrystalline Thin Films of Semiconductors

Grain growth in thin films is usually abnormal, leading not only to an increase in the average grain size, but also to an evolution in the shape of the grain size distribution and to an evolution in the distribution of grain orientations. The latter can be driven by surface, interface or strain energy minimization, depending on film and substrate properties and on deposition conditions, and can lead to different final textures depending on which energy dominates.In semiconductor films, as in other materials, grain growth stagnation coupled with texture-selective driving forces leads to secondary grain growth, the rate of which is higher in thinner films. Self ion-bombardment enhances the rate of pre-stagnation grain growth, and doping of Si with electron donor leads to enhanced pre-stagnation grain growth as well as surface-energy-driven secondary grain growth. The effects of ion-bombardment and dopants on grain growth in Si can be understood in terms of associated increases in point defect concentrations and the effects of point defects on grain boundary mobilities.     

Spectral-Luminescent and Lasing Properties of Aminocoumarin Derivatives in Thin Polymer Films

The absorption and fluorescence spectra and the lasing ability of aminocoumarin derivatives in thin polymer layers (0.5–0.8 μm) based on the copolymer methylmethacrylate with a methacrylic acid and the copolymer methylmethacrylate with glycidylmethacrylate formed by coating of optically transparent glass substrates have been studied. It is found that the intensity of absorption and luminescence as well as the lasing resource of coumarins are determined by the structure of the latter and by the nature of the polymer medium. Compositions based on the copolymer methylmethacrylate with glycidylmethacrylate and aminocoumarin derivatives with a fluorized methyl group at the 4th molecular position can be of interest in optical technologies (light transformers, amplifiers). __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 72, No. 4, pp. 464–467, July–August, 2005.     

用于电响应红外反射窗的液晶聚合物薄膜特性研究

提出了一种红外反射器件,通过载体液晶在电场下的转向控制胆甾型液晶聚合物粒子在器件中的排布方向,实现红外反射与透射之间切换.其中,胆甾型液晶聚合物粒子是实现红外反射关键.介绍了胆甾型液晶聚合物薄膜的制备方法,并采用超声波破碎的方法制备液晶粒子.研究了液晶混合物中不同比例的交联剂液晶1对液晶聚合物薄膜脆性和反射波段的影响,发现当液晶1占100%时,液晶聚合物薄膜的脆性最大,且其清亮点最高,并且薄膜的反射波段随着液晶1比例的增加而向短波方向偏移.同时,研究了薄膜厚度对液晶聚合物粒子的影响,发现液晶薄膜厚度越小,制备的液晶聚合物粒子越小且越均匀,其制成的器件电驱动性更好.该研究有利于帮助电响应红外反射窗的性能优化.     

ZrO2薄膜残余应力实验研究

采用ZYGO MarkⅢ-GPI数字波面干涉仪对电子束蒸发方法制备的ZrO2薄膜中的残余应力进行了研究,讨论了沉积温度、沉积速率等工艺参量对ZrO2薄膜残余应力的影响。实验结果表明：随着沉积温度及沉积速率的升高,ZrO2薄膜中残余应力状态由张应力变为压应力,且压应力值随着沉积温度升高而增大。同时用X射线衍射技术测量分析了不同沉积条件下ZrO2薄膜的微结构组织,探讨了ZrO2薄膜微结构与其应力的对应关系。     

高反射率硅基薄膜一维光子晶体的研究制备

采用射频等离子体增强化学气相沉积的方法,研究制备了一种基于硅基薄膜的高反射一维光子晶体。通过交替改变反应气体组分实现低折射率Si Ox层和高折射率a-Si层的交替层叠沉积,具有两种膜层介质折射率比大、反射率高、沉积时间短、工艺窗口宽等优点。采用5周期的Si Ox层与a-Si层构成的一维光子晶体(厚度分别为155 nm和55 nm),其禁带范围内(650~1 100 nm)的平均反射率达到99.1%,高于相同波长范围内Ag的平均反射率(96.3%)。     

Isothermal Crystallization Kinetics and Melting Behavior of a Luminescent Conjugated Polymer,Poly(9,9-Dihexylfluorene-Alt-2,5-Didodecyloxybenzene)

A study of the isothermal crystallization behaviors of poly(9,9-dihexylfluorene-alt-2,5-didodecyloxybenzene) (PF6OC12) was carried out using differential scanning calorimetry (DSC). The crystallization kinetics under isothermal conditions could be described by the Avrami equation. The Avrami exponent n ranges from 3.43 to 3.71 for PF6OC12 at crystallization temperatures between 100.0°C and 90.0°C, indicating a three-dimensional spherical crystal growth with homogeneous nucleation in the primary crystallization stage for the isothermal melt crystallization process. In the DSC scan, after the isothermal crystallization, multiple melting behavior was found. The multiple endotherms could be attributed to melting of recrystallized materials produced originally during different crystallization processes. According to the Arrhenius equation, the activation energy was determined to be 211.29 kJmol^?1 for the isothermal melt crystallization of PF6OC12.     

纳米TiO_2薄膜的拉曼光谱

本文测量了纳米TiO2 薄膜的Raman散射谱 ,并用B1g模计算了不同厚度的纳米TiO2薄膜的粒度。结果表明 ,随着膜厚的增加 ,粒度也在增加 ,膜厚达到一定程度后 ,粒度的增加量减少     

钒氧化物薄膜的拉曼散射

用射频磁控溅射以纯金属钒做靶材在氩氧混合气体中制备了钒氧化物 (VO2 (B)、V6O1 3、V2 O5)薄膜。报导了钒氧化物薄膜的拉曼光谱 ,结合这些钒氧化物不同的结构特点 ,对它们的拉曼光谱进行了分类讨论     

Photoluminescence Properties of Conjugated Phenylacetylene Monodendrons in Thin Films

We report the absorption, photoluminescence (PL), and time-dependent PL of thin films of conjugated phenylacetylene monodendrons at both room temperature and at cryogenic temperature. We find that the PL properties of the monodendron thin films are significantly different from their fluorescence in dilute solution due to the presence of interactions between monodendrons in the thin film. These interactions lead to aggregate species in the thin films, which result in broader PL spectra and lower PL quantum yields than for monodendrons in dilute solution. Evidence for excimer-like aggregates in the monodendron thin films is found from time-resolved PL spectra.     

光学薄膜及其进展

对光学薄膜的性能及制备技术等方面进行了简要的评述,并指出随着科学技术的进步,光学薄膜及相关技术不论从广度还是深度来看都得到了显著发展.     

制成完全取向的D相准晶薄膜

用磁控溅射和后期退火的方法，首次制成了完全取向的Ｄ相准晶薄膜。这种薄膜对准晶的基础研究和应用研究都有重要意义。     

纳米晶聚合物复合薄膜PbTiO3-PEK-c的电光特性及其弛豫过程的研究

制备了掺杂型纳米晶聚合物钛酸铅聚醚醚酮 (PbTiO3 PEK c)复合薄膜 ,采用简单透射技术测量了该复合薄膜的线性电光系数 ,并研究了该复合薄膜的电光特性的弛豫过程     

AgInSbTe薄膜的短波长记录性能分析

采用自制的装置研究了Ag5In5Sb47Te33薄膜的静态记录性能与记录激光的功率和脉冲宽度的关系，并对其记录畴形貌特点进行了直接观察。结果表明只有记录激光的功率和脉冲宽度在一定范围之内才能起到信息记录的作用，所得的记录畴形貌十分清晰，基本为非晶态Ag5In5Sb47Te33；小于该范围的激光能量不能使材料结构发生较大的变化，所得的记录畴形貌模糊，反射率对比度低于2％；大于该范围所得的记录畴由烧蚀区和其周围的非晶态Ag5In5Sb47Te33组成。另外，得到了记录激光功率为12mW、脉冲宽度为90ns的Ag5In5Sb47Te33薄膜的短波长最佳记录条件，其记录畴的反射率对比度为22％，直径为380nm-400nm。     

Wetting and Phase Separation in Polymer Blend Films: Identification of Four Thickness Regimes with Distinct Morphological Pathways

Using forward recoil spectrometry and atomic force microscopy, the phase evolution of a critical blend thin film of deuterated poly(methyl methacrylate) (dPMMA) and poly(styrene-ran-acrylonitrile) (SAN) is found to depend on film thickness. Four regimes are identified as film thickness l ₀ decreases from semi-infinite to below the radius of gyration, R _g. In the semi-infinite limit or regime IV (l ₀ R _g), surface directed spinodal decomposition is observed and found to agree with cell dynamic simulations. In regime III (10 R _g < l ₀ < 150 R _g), three stages of evolution are observed. During the early stage, wetting dominates and produces a dPMMA-rich/SAN-rich/dPMMA-rich structure. During the intermediate stage, the surface phase flows back into the middle layer inducing lateral phase coarsening. During the late stage, capillary fluctuations rupture the middle layer by spinodal dewetting, resulting in a final morphology with SAN-rich droplets encapsulated by dPMMA-rich wetting layers. Although regime II (R _g < l ₀ < 10 R _g) films also exhibit a tri-layer early stage, correlated holes in the middle layer spontaneously grow suggesting that this layer is too thin to support fully developed capillary fluctuations. Three stages of roughening are observed with a final morphology similar to regime III. In regime I (l ₀ < R _g), films roughen almost immediately after annealing in contrast to the other regimes. Initially, the surface roughness increases logarithmically with time before reaching a constant value of 2 R _g. The final average droplet height, 29.5 nm, is in good agreement with a simple interfacial energy model. Whereas the final morphology for regimes I, II and III are identical, the pathways by which films roughen are distinct suggesting that erroneous conclusions can be made by simply analyzing the final morphology.     

基于差分反射光谱的真空环境有机薄膜生长在线监测方法

有机薄膜器件是微电子和光电子领域的重点研究方向。薄膜制备过程的在线监测作为研究成膜机理和优化工艺参数最直接的测量手段,对薄膜器件的高质量制备具有重要意义。为实现真空环境有机薄膜制备过程的实时在线监测,提出了一种基于差分反射光谱术的高精度测量方法。采用离轴抛物面反射镜、光学平板和光纤等基本光学元器件构建紧凑型光路系统,运用差分算法分析光谱信号,具有较高的测量性能。测试了不同实验环境下光谱信号的波动,得出在控温条件下,系统的长时间测量重复性优于2‰。还研究了并五苯分子通过分子束外延制膜法在Au基底成膜初始阶段的生长过程。通过与膜厚仪和原子力显微镜测试结果比对,光谱信号精确反映出超薄膜在生长中引起的细微光学演变,其测量精度优于亚单分子层。实验结果表明,该差分反射光谱测量系统具有宽光谱(300～820 nm)、高稳定性(重复性优于2×10-3)、高测量精度(亚单分子层)等特点,并有效地抑制了光路装配误差、光学器件缺陷和环境干扰等对光信号的影响,作为一种高精度表面表征方法,适合于薄膜制备过程的实时在线监测。