Cover Picture: Cryst. Res. Technol. 5/2009

The cover picture shows a secondary electron microscopy (SEM) image of a forsterite monocrystal grown by flux growth technique doped with Ni. (see pages 463 – 468). (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 10/2009

The cover picture shows a single crystal of K₂La(NO₃)₅ · 2 H₂O grown at 38 °C from diluted HNO₃. View approximately along the polar –<$>\vec a_3<$> axis of the crystal. (see pages 1131 – 1138) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 3/2009

The cover picture shows the microstructural diversity of a benzoic acid‐salicylic acid eutectic composite material by different modes of solidification. Morphology of eutectic composite material in isotropic growth at room temperature (left) and random growth at 310 K (right). (see pages 258 – 268) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 7/2009

The cover picture shows a secondary electron microscopy (SEM) image of a CuS nanoplate‐based architecture. (see pages 729–735) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 12/2009

The cover picture shows a secondary electron microscopy (SEM) image of sheet‐like Cu dendrites. (see pages 1293–1296) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 4/2009

The cover picture shows simulated columnar dendritic grain morphologies at different times in a weld pool of Al‐Cu alloy (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 1/2009

The cover picture shows a SEM image of as‐prepared ZnO nanotubes at low magnification (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 11/2009

The cover picture shows a lyotropic nematic texture of a liqid crystal near the biaxial nematic – calamitic nematic phase transition. (see pages 1255–1258) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 9/2009

The cover picture shows several layers of hexagons growing on the top of each other during the growth of AlN doped SiC films by physical vapor transport. (see pages 903 – 907) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 8/2009

The cover picture shows as grown garnet Y₃Al₅O₁₂ (YAG): Co, Si single crystals obtained by then Czochralski method with a diameter of 2 cm. From left till right: – YAG: 0.4 at.%Co, – YAG: 0.4 at.%Co, 0.2 at.%Si, – YAG: 0.8 at.%Co, 0.4 at.%Si. (see pages 823–833) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 6/2009

The cover picture shows a projection of a part of the melilite structure approximately along the c‐axis of the structure of Sr₂ZnGe₂O₇, showing thermal displacement ellipsoids (50% probability level). Coordination polyhedra [SrO₈] (grey), [ZnO₄] (red) and groups [Ge₂O₇] (green) are indicated. (see pages 603 – 612) (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 2/2011

The cover picture shows rhombohedral monoclinic insulin crystals; interference contrasting. Objective 12.5x, magnification 20x. (see pages 119–126) (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 2/2010

The cover picture shows secondary electron microscopy (SEM) images of In2O3 nanocrystals. (see pages 173–177).     

Cover Picture: Cryst. Res. Technol. 2/2012

The cover picture shows the 3‐D morphology of a Sapphire crystal grown under the condition of T_H = 2500‐3t K, u = U2. (see pages 175–182) (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 5/2012

The cover picture shows doped europium tetrakis dibenzoylmethide triethylammonium crystals illuminated with: (left) Standard room light, and (right) Ultraviolet light. (see pages 573–578) (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 4/2010

The cover picture shows schematics of the fabrication process of a two‐dimensional photonic crystal of ZnO pillars on silicon substrate. (see pages 393–397).     

Cover Picture: Cryst. Res. Technol. 9/2010

The cover picture shows contours of the turbulent kinetic energy dissipation rate on a propeller surface computed by the FLUENT simulation for a 10 cm diameter propeller rotating at 600 rpm. This simulation is used to investigate the contact secondary nucleation rate of sodium bicarbonate crystallization in a stirred tank crystallizer. (see pages 929–938). (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 9/2011

The cover picture shows a photograph of KDP crystals grown with various concentrations of WO₄². (see pages 939–943) (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Cover Picture: Cryst. Res. Technol. 1/2010

The cover picture shows a photograph of NaBi(WO₄)₂ crystals grown from a sintered charge in resistive furnace (left), a sintered charge in inductive furnace (middle) and a re‐crystallized charge in inductive furnace (right). (see pages 18–24). (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)