Pseudo-non-contact AFM imaging?

Recent non-contact atomic force microscopy studies have demonstrated that imaging of single atom defects is possible. However, the imaging mechanism was unclear. Long-range forces of attraction, which are normally associated with non-contact mode, are not known to produce sufficient lateral resolution to image atoms. In this study, we suggest a mechanism that could be responsible for the resolution achieved. We use realistic interatomic interaction parameters to do numerical simulations. These simulations are in good agreement with experimental data. As a result, we are able to ‘separate' the attractive and repulsive forces acting between the AFM tip and the sample surface. Calculations indicate that the force responsible for image contrast in the experimental studies mentioned above, is in most cases the repulsive contact force, and not the long-range attractive force. We check our conclusions against a variety of interatomic interaction parameters and our results remain valid for any reasonable set of such parameters, including the power law of the attractive potential N<9.     

Kinetic effects in the self-assembly of pure and mixed tetradecyl and octadecylamine molecules on mica

The self-assembly of tetradecylamine (C14) and of mixtures of tetradecyl and octadecylamine (C18) molecules from chloroform solutions on mica has been studied using atomic force microscopy (AFM). For pure components self-assembly proceeds more slowly for C14 than for C18. In both cases after equilibrium is reached islands of tilted molecules cover a similar fraction of the surface. Images of films formed by mixtures of molecules acquired before equilibrium is reached (short ripening time at room temperature) show only islands with the height corresponding to C18 with many pores. After a long ripening time, when equilibrium is reached, islands of segregated pure components are formed.     

Quantitative measurement of tip-sample forces by dynamic force spectroscopy in ambient conditions

We introduce a dynamic force spectroscopy technique enabling the quantitative measurement of conservative and dissipative tip-sample forces in ambient conditions. In difference to the commonly detected force-vs-distance curves dynamic force microscopy allows to measure the full range of tip-sample forces without hysteresis effects caused by a jump-to-contact. The approach is based on the specific behavior of a self-driven cantilever (frequency-modulation technique). Experimental applications on different samples (Fischer-sample, silicon wafer) are presented.     

Lateral force microscopy in low normal force limit

We have studied frictional force between SiN tip and Si surface by using lateral force microscopy. The cantilever we have used has very low stiffness of 0.006 N/m, and the normal force acting on the surface was much lower than the attractive force such as van der Waals force. In this low normal force limit, it was found that the frictional force did not depend on the normal force. We suggest a calibration method to estimate the attractive force from the lateral force data in this limit. The estimated attractive force between Si sample and SiN tip with radius of 10 nm was 0.4 nN in flat region and 0.65 nN at the corner of a rectangular hole.     

Monitoring of mechanical properties of serially passaged bovine articular chondrocytes by atomic force microscopy

Atomic force microscopy (AFM) is a powerful tool in imaging cells and tissues and probing their mechanical properties. Articular chondrocytes, the cells responsible for the production and maintenance of cartilaginous extracellular matrix in the knee joint, change their morphology and dedifferentiate during in vitro expansion culture. It was unclear if the mechanical properties of chondrocytes change accompanying phenotype variation. The elasticity of in vitro serially cultured bovine articular chondrocytes was investigated using AFM. The chondrocytes changed their morphology from round to spindle-like. The freeze-dried P0 chondrocytes showed significantly higher modulus than did the serially passaged (P1–P4) chondrocytes. The change of chondrocyte morphology was accompanied with a decrease of elastic modulus.     

Relationship between the non linear dynamic behaviour of an oscillating tip–microlever system and the contrast at the atomic scale

In this paper, the dynamic behaviour of an oscillating tip–microlever system at the proximity of a surface is discussed. The attractive tip–surface interaction is simply described with a Van der Waals dispersive term and a sphere–plane geometry. We show that the non linear behaviour of the oscillator is able to explain the observed shifts of the resonance frequency as a function of the tip–surface distance without the need of introducing a particular short range force.     

Chemical effects during ripple formation with isobaric ion beams

The formation of nanostructures on SiGe surfaces by erosion using mixed beams of isobaric species (Cs/Xe) is shown to depend on the Cs/Xe ratio. The nanostructures exhibit different wavelengths (longer wavelengths for higher Cs concentrations) contrary to the present theoretical understanding. Moreover, experiments with pure Cs and Xe beams also demonstrate that such differences are enhanced at lower bombarding energies. Such effects are primarily due to the fact that the retentivity and mobility of cesium at the sample surface gets enhanced at lower bombarding energies. The phenomenon could be explained theoretically by including an additional diffusion term in the growth equation describing the mobility of the primary ions on the irradiated surface. Semi-empirical calculations done in this direction also confirm this phenomenon.     

I-V curve oscillation observed by atomic force microscopy

Oscillation on the current-voltage curve measured by atomic force microscopy is observed when the distance between the tip and sample is large enough and beyond a critical value. The appearance of the oscillation is attributed to the excitation of electron standing waves between the tip and sample. From the first peak position and the voltage difference between the first two peaks on the current-voltage curve, the value of the work function at the detected point on silver film surface and the distance between the tip and the detected point can be calculated.     

AFM of Metallic Nano-Particles and Nano-Structures in Heavily Irradiated NaCl

AFM investigations are reported for heavily, electron irradiated NaCl crystals in ultra high vacuum (UHV) in the non-contact mode with an UHV AFM/STM Omicron system. To avoid chemical reactions between the radiolytic Na and oxygen and water, the irradiated samples were cleaved and prepared for the experiments in UHV. At the surface of freshly cleaved samples, we have observed sodium nano-precipitates with shapes, which depend on the irradiation dose and the volume fraction of the radiolytic Na. It appears that the nano-struchires consist of (i) isolated nano-particles, (ii) more or less random aggregates of these particles, (iii) fractally shaped networks and (iv) “fabrics” consisting of bundles of Quasi-1D arrays forming polymeric networks of nano-particles. Almost independent of the concentration of the metallic Na in the samples the size of the individual nano-particles is in the range 1–3nm. Our new AFM results are fully in line with our CESR and previous Raman scattering results.     

Investigations of C60 molecules deposited on Si(111) by noncontact atomic force microscopy

We demonstrated the high resolution imaging of the organic molecules using noncontact atomic force microscopy in ultrahigh vacuum. The sample was C₆₀ molecules deposited on the Si(111)-7×7 reconstructed surface. When the thickness of the C₆₀ film was submonolayer, we could image some isolated C₆₀ molecules and the reconstructed Si surface simultaneously. However, the imaging was highly unstable not only because of the large structure but also due to the large difference between the interaction forces on the molecules and on the Si surface. On the other hand, when the thickness of the C₆₀ molecules was almost monolayer, individual molecules could be stably imaged.     

Doping in poly(o-ethoxyaniline) nanostructured films studied with atomic force spectroscopy (AFS)

The study of intermolecular interactions at interfaces is essential for a number of applications, in addition to the understanding of mechanisms involved in sensing and biosensing with liquid samples. There are, however, only a few methods to probe such interfacial phenomena, one of which is the atomic force spectroscopy (AFS) where the force between an atomic force microscope tip and the sample surface is measured. In this study, we used AFS to estimate adhesion forces for a nanostructured film of poly(o-ethoxyaniline) (POEA) doped with various acids, in measurements performed in air. The adhesion force was lower for POEA doped with inorganic acids, such as HCl and H₂SO₄, than with organic acids, because the counterions were screened by the ethoxy groups. Significantly, the morphology of POEA both in the film and in solution depends on the doping acid. Using small-angle X-ray scattering (SAXS) we observed that POEA dissolved in a mixture of dimethyl acetamide exhibits a more extended coil-like conformation, with smaller radius of gyration, than for POEA in water, as in the latter POEA solubility is lower. In AFS measurements in a liquid cell, the force curves for a POEA layer displayed an attractive region for pH ≥ 5 due to van der Waals interactions, with no contribution from a double-layer since POEA was dedoped. In contrast, for pH ≤ 3, POEA was doped and the repulsive double-layer force dominated. With AFS one is therefore able to correlate molecular-level interactions with doping and morphology of semiconducting polymers.     

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal set of parameters from first principles as a function of the tip–sample system. The result shows that the either the acquisition rate or the signal-to-noise ratio could be increased by up to two orders of magnitude by using stiffer cantilevers and smaller amplitudes than are in use today.     

Growth instability and surface phase transition of Ti thin film on Si(1 1 1): An atomic force microscopy study

Evolution of surface structure during the annealing of e-beam evaporated Ti films is studied by means of atomic force microscopy (AFM). Image variography and power spectral density analysis are used to study scaling properties of the films, ranging from 50 nm to 20 μm length scale. No particular grain size is observed up to 473 K. At 673 K, grain size of ∼250 nm are formed and coalesced to form bigger grain size upon further annealing. At 473 K, RMS roughness dropped at all length scale and became rougher at 673 K with an increasing trend up to 873 K. Clustering at 673 K indicates Kosterlitz-Thaouless [J.M. Kosterlitz, D.J. Thaouless, J. Phys. Chem. 6 (1973) 1181] type phase transition at the surface. The observed transition is also consistent with existing scaling laws.     

AFM analysis of MgB2 films and nanostructures

For the fabrication of superconducting devices based on nanostructured thin films, the quality of the starting surface is often of crucial importance. For example, the transport properties of superconducting nanobridges are strongly affected by the geometry and the edge definition of the nanostructures. In this work, we report about AFM characterization of magnesium diboride films and nanobridges fabricated in view of application in superconducting electronics. MgB₂ films, obtained by co-deposition method followed by annealing in situ on silicon nitride substrate, have been nanostructured by electron beam lithography and ion milling. The analysis of the AFM images by the height-height correlation function shows that the films have a self-affine smooth textured surface with a RMS roughness of 20 nm. Furthermore, the nanobridges are continuous, with a well-defined geometry and a rounded profile, and the nanostructuration process does not significantly affect the film morphology.     

Nanoindentation characterization of GaN epilayers on A-plane sapphire substrates

Gallium nitride (GaN) epilayers was deposited on a-axis sapphire substrate by means of metal-organic chemical vapor deposition (MOCVD) method. The GaN epilayers has been investigated in their repetition pressure-induced impairment events from nanoindentation technique and, the relative deformation effect was observed from atomic force microscopy (AFM). From the morphological studies, it is revealed that none of crack and particle was found even after the indentation beyond the critical depth on the residual indentation impression. The ‘pop-in’ event was explained by the interaction of the deformed region, produced by the indenter tip, with the inner threading dislocations in the GaN films. Pop-in events indicate the generation and motion of individual dislocation, which is measured under critical depth and, no residual deformation of the GaN films is observed.     

Atomic force microscopy evidence for K domains on freshly cleaved mica

The unit cell height in the c-direction of muscovite mica is well established at 10 Å. However, we have observed steps much lower than this whilst imaging freshly cleaved mica surfaces in an atomic force microscope. The steps, 1.0±0.05 Å high, are unstable and disappear in a period of minutes after cleavage. We propose that they are due to the presence of domains of residual K⁺ ions that form two matching patchworks on the cleaved faces. Upon cleavage, they relax inwards from the bulk equilibrium position 1.6 Å above the oxygen atoms of the tetrahedral silicate. Possible mechanisms for the disappearance of the steps are discussed.