GaN基蓝光发光二极管正向电压温度特性研究

对GaN基蓝光发光二极管（LED）正向电压温度特性进行了研究,发现在温度较高时,正向电压随温度的变化系数逐渐减小,直至出现拐点,正向电压随温度的变化系数由负数变为正数.此时若继续升高温度,则正向电压随温度升高迅速增加,并常常伴随有器件失效的现象发生.在小电流情况下,这种现象不很明显,随着电流的增加,现象表现得越来越明显,拐点出现的温度也越来越低,而且温度超过拐点之后,正向电压值增加得更快.通过与相同封装的另一组器件测试结果对比,排除了封装材料玻璃转换温度的影响.分析认为,这一现象的出现是由器件等效串联电阻 关键词： 发光二极管 氮化镓 正向电压 温度系数     

氮化镓基发光二极管结构中粗化 p型氮化镓层的新型生长方法

提出了一种新型p型氮化镓粗化外延生长方法,这种生长方法的本质特征是利用低温生长的p型氮化镓作为粗化层的"晶籽"层,然后在这一层的基础上高温快速生长p型氮化镓,使粗化程度得到放大. 经实际制作尺寸为12 mil×10 mil的蓝光发光二极管器件并进行验证测试,与未进行p型氮化镓粗化的结果相比,通过这种方法粗化的发光二极管光通量可提升45%;结果同时表明,该方法有效解决了低温生长p型氮化镓带来的漏电流大,及预通镁源带来的前置电压高的问题. 关键词： 粗化 氮化镓 p型氮化镓 发光二极管     

牺牲Ni退火对硅衬底GaN基发光二极管p型接触影响的研究

本文通过在硅衬底发光二极管(LED)薄膜p-GaN表面蒸发不同厚度的Ni覆盖层,将其在N₂ ∶O₂=4 ∶1的气氛中、400℃—750℃的温度范围内进行退火,在去掉薄膜表面Ni覆盖层之后制备Pt/p-GaN欧姆接触层.实验结果表明:退火温度和Ni覆盖层厚度均对硅衬底GaN基LED薄膜p型欧姆接触有重要影响,Ni覆盖退火能够显著降低p型层中Mg受主的激活温度.经牺牲Ni退火后,p型比接触电阻率随退火温度的升高呈先变小后变大的规律,随Ni覆盖层厚度的增加呈先变小后变 关键词： 氮化镓 发光二极管 牺牲Ni退火 p型接触     

基于电致发光效应的光学电压传感器

本文综述了基于电致发光效应的光学电压传感器机理、分类及其主要特性,分析总结了此类传感器的研究现状及其存在的主要问题,同时提出未来研究课题的建议。电致发光型电压传感器的主要优点在于不需要载波光源,因而可以有效避免以往光学电压器中工作光源性能不稳定所引起的传感器性能变化;此外,此类电压传感器结构简单、体积小、重量轻、成本低,可以实现较高的性能价格比。今后研究的主要问题包括合理选择电压传感材料与器件、提高传感器的温度和湿度稳定性等。电致发光型电压传感器在电力工业和航空航天等领域的科学研究与实验中将具有广泛的应用前景。     

p型氮化镓的低温生长及发光二极管器件的研究

采用金属有机物化学气相淀积技术(MOCVD)在蓝宝石衬底上低温(870—980℃)生长p型氮化镓 (p-GaN).用Hall测试仪测量材料的电学性能，发现当温度低于900℃时，材料的电阻率较高 ；在900—980℃均可获得导电性能良好的p-GaN.另外，电导性能除与掺杂浓度有关，还与p- GaN生长条件有关，氮镓摩尔比过低导电性能就较差，过高则会引起表面粗糙.采用优化后的 p-GaN制作了绿光发光二极管器件，发现生长温度越低器件发光强度越高，反向电压也越高 ，但正向电压只是略有升高. 关键词： Ⅲ-Ⅴ族半导体 氮化镓 发光二极管 金属有机物化学气相淀积     

温度和电压对双层有机发光二极管复合效率的影响

提出了双层有机电致发光二极管ITO/PPV/PBD/Ca复合的理论模型。计算并讨论了温度和电压对其复合效率的影响：在电压为6～7.5 V时,复合效率随温度变化出现两个峰值,但随着电压升高,两峰值相互靠拢,当电压达到9 V时,峰值位置重叠,我们认为这一现象除了浅缺陷能级和深缺陷能级贡献的结果以外,还由于复合区域发生变化引起的。该模型较好地解释了有关实验现象。     

基于LiF修饰层的喷墨打印钙钛矿发光二极管

金属卤化物钙钛矿材料由于具有高光致发光量子产率、高色纯度、带隙可调等优良光学性能,作为发光材料广泛用于制备钙钛矿电致发光二极管(PeLEDs).虽然已经取得了较好的研究进展,但是其大面积商业化的进程还比较缓慢,尚需进一步研究.为了实现钙钛矿薄膜发光二极管的大面积制备,本文使用喷墨打印技术,研究了不同基板结构对于钙钛矿前...     

p型GaN低温粗化提高发光二极管特性

利用金属有机物化学气相沉积技术在蓝宝石衬底上低温生长GaN:Mg薄膜,对不同源流量的GaN:Mg材料特性进行优化研究.研究表明二茂镁(CP2Mg)和三甲基镓(TMGa)物质的量比([CP2Mg]/[TMGa])在1.4×10-3—2.5×10-3范围内,随[CP2Mg]/[TMGa]增加,晶体质量提高,空穴浓度线性增加.当[CP2Mg]/[TMGa]为2.5×10-3时获得空穴浓度与在较高温度生长获得的空穴浓度相当,且薄膜表面较粗糙.采用[CP2Mg]/[TMGa]为2.5×10-3的p型GaN层制备的发光二极管,在注入电流为20mA时,输出光强提高了17.2%.     

激光诱导p-GaN掺杂对发光二极管性能改善的分析

采用激光诱导掺锌的方法提高了常规GaN基外延片p-GaN层的空穴浓度,并将它制备成小功率白光发光二极管(LED).对其光电性能做了详细的测量并进行了加速老化实验和分析.结果表明,与常规LED相比,经过激光诱导p-GaN层掺锌LED的光电性能获得了明显改善:正向工作电压VF从3.33V降到3.13V,串联电阻从30.27Ω降到20.27Ω,室温下衰退系数从1.68×10-4降到1.34×10-4,老化1600h后的反向漏电流从超过0.2μA降为不超过0.025μA,器件的预测寿命延长了41%.器件光电性能改善的主要原因是激光诱导掺锌使LED的p-型欧姆接触改善和热阻降低所致.     

Invariable optical properties of phosphor-free white light-emitting diode under electrical stress

This paper reports that a dual-wavelength white light-emitting diode is fabricated by using a metal-organic chemical vapor deposition method. Through a 200-hours’ current stress, the reverse leakage current of this light-emitting diode increases with the aging time, but the optical properties remained unchanged despite the enhanced reverse leakage current. Transmission electron microscopy and cathodeluminescence images show that indium atoms were assembled in and around V-shape pits with various compositions, which can be ascribed to the emitted white light. Evolution of cathodeluminescence intensities under electron irradiation is also performed. Combining cathodeluminescence intensi- ties under electron irradiation and above results, the increase of leakage channels and crystalline quality degradation are realized. Although leakage channels increase with aging, potential fluctuation caused by indium aggregation can effectively avoid the impact of leakage channels. Indium aggregation can be attributed to the mechanism of preventing optical degradation in phosphor-free white light-emitting diode.     

Improvement of characteristics of InGaN light-emitting diode by using a staggered AlGaN electron-blocking layer

The optical and physical properties of InGaN light-emitting diode (LED) with a specific design of staggered AlGaN electron-blocking layer (EBL) are investigated numerically in detail. The electrostatic field distribution, energy band, carrier concentration, electroluminescence (EL) intensity, internal quantum efficiency (IQE), and the output power are simulated. The results reveal that this specific design has a remarkable improvement of optical performance compared with the design of conventional LED. The lower electron leakage current, higher hole injection efficiency, and consequently mitigated efficiency droop are achieved. The significant decrease of electrostatic field at the interface between the last barrier and the EBL of LED could be one of the main reasons for these improvements.     

Improvement of characteristics of an InGaN light-emitting diode by using a staggered AlGaN electron-blocking layer

The optical and physical properties of an InGaN light-emitting diode (LED) with a specific design of a staggered AlGaN electron-blocking layer (EBL) are investigated numerically in detail. The electrostatic field distribution, energy band, carrier concentration, electroluminescence (EL) intensity, internal quantum efficiency (IQE), and the output power are simulated. The results reveal that this specific design has a remarkable improvement in optical performance compared with the design of a conventional LED. The lower electron leakage current, higher hole injection efficiency, and consequently mitigated efficiency droop are achieved. The significant decrease of electrostatic field at the interface between the last barrier and the EBL of the LED could be one of the main reasons for these improvements.     

White organic light-emitting diodes based on electroplex from polyvinyl carbazole and carbazole oligomers blends

White organic light-emitting diodes with a blue emitting material fluorene-centred ethylene-liked carbazole oligomer (Cz6F) doped into polyvinyl carbazole (PVK) as the single light-emitting layer are reported. The optical properties of Cz6F, PVK, and PVK:Cz6F blends are studied. Single and double layer devices are fabricated by using PVK: Cz6F blends, and the device with the configuration of indium tin oxide (ITO)/PVK:Cz6F/ tris(8-hydroxyquinolinate)aluminium (Alq₃)/LiF/Al exhibits white light emission with Commission Internationale de l'éclairage chromaticity coordinates of (0.30, 0.33) and a brightness of 402~cd/m². The investigation reveals that the white light is composed of a blue--green emission originating from the excimer of Cz6F molecules and a red emission from an electroplex from the PVK:Cz6F blend films.     

Low driving voltage in organic light-emitting diode using MoO3/NPB multiple quantum well structure in hole transport layer

Driving voltage of organic light-emitting diode (OLED) is lowered by employing molybdenum trioxide (MoO₃)/N, N'-bis(naphthalene-1-yl)-N,N'-bis(phe-nyl)-benzidine (NPB) multiple quantum well (MQW) structure in hole transport layer. For the device with double quantum well (DQW) structure of ITO/ [MoO₃ (2.5 nm)/NPB (20 nm)]₂/Alq₃(50 nm)/LiF (0.8 nm)/Al (120 nm)], the turn-on voltage is reduced to 2.8 V, which is lowered by 0.4 V compared with that of the control device (without MQW structures), the driving voltage is 5.6 V, which is reduced by 1 V compared with that of the control device at the 1000 cd/m². In this work, the enhancement of the injection and transport ability for holes could reduce the driving voltage for the device with MQW structure, which is attributed not only to the reducing energy barrier between ITO and NPB, but also to the forming charge transfer complex between MoO₃ and NPB induced by the interfacial doping effect of MoO₃.     

The beneficial effects of a p-type GaInN spacer layer on the efficiency of GaInN/GaN light-emitting diodes

Light-emitting diodes (LEDs) with a Mg-doped p-type Ga_1−xIn_xN (0 ≤ x ≤ 0.07) spacer layer located between an undoped GaN spacer layer and the electron blocking layer are investigated. The LEDs are found to have comparable peak efficiency but less efficiency droop when the crystal quality of the p-type Ga_1−xIn_xN spacer layer is well-controlled by lowering the growth temperature and by using a suitable In composition and Mg doping concentration. All LED samples with the p-type spacer layer show a smaller efficiency droop compared to a reference LED having an undoped GaN spacer. Among the sample sets investigated, an optical power enhancement of 12% at 111 A/cm² is obtained when inserting a 5 nm-thick p-type Ga_0.97In_0.03N spacer layer. The results support that carrier transport is the key factor in the efficiency droop observed in GaN-based LEDs.     

Effects of the microstructure slab with pillars on light extraction of GaN light-emitting diode

The positive z direction relative light extraction efficiency of GaN light-emitting diodes with microstructure slab is calculated by three-dimensional finite-difference time-domain method, where the microstructure slab consists of a graphite lattice of pillars. The results show that the two-dimensional graphite-arranged pillars suppress light extraction. When there is a thick pillar in the middle of the pillars, the structure can enhance light extraction of the light-emitting diodes. The tower-like pillars, which are thin on the top of the pillars and thick on the bottom of the pillars, benefit the light extraction when the angle of the tower-like pillars is proper.     

Efficient bright white organic light-emitting diode based on non-doped ultrathin 5,6,11,12-tetraphenylnaphthacene layer

High-performance undoped white organic light-emitting diode (OLED) has been fabricated using an ultrathin yellow-emitting layer of 5,6,11,12-tetraphenylnaphthacene (rubrene) inserted at two sides of interface between two N,N′-bis-(1-naphthyl)-N,N′- biphenyl-1,1′-biphenyl-4,4′- diamine (NPB) layers as a hole transporting and blue emissive layer, respectively. The results showed that a maximum luminance of the device reached to as high as 21,500 cd/m² at 15 V. The power efficiencies of 2.5 and 1.6 lm/W at a luminance of 1000 and 10000 cd/m², respectively, were obtained. The peaks of electroluminescent (EL) spectra locate at 429 and 560 nm corresponding to the Commissions Internationale De L’Eclairage (CIE) coordinates of (0.32, 0.33), which is independent of bias voltage. The performance enhancement of the device may result from direct charge carrier trapping in rubrene. Energy transfer mechanism was also found in the EL process.     

Performance enhancement of an InGaN light-emitting diode with an AlGaN/InGaN superlattice electron-blocking layer

The efficiency enhancement of an InGaN light-emitting diode(LED) with an AlGaN/InGaN superlattice(SL)electron-blocking layer(EBL) is studied numerically,which involves the light-current performance curve,internal quantum efficiency electrostatic field band wavefunction,energy band diagram carrier concentration,electron current density,and radiative recombination rate.The simulation results indicate that the LED with an AlGaN/InGaN SL EBL has better optical performance than the LED with a conventional rectangular AlGaN EBL or a normal AlGaN/GaN SL EBL because of the appropriately modified energy band diagram,which is favorable for the injection of holes and confinement of electrons.Additionally,the efficiency droop of the LED with an AlGaN/InGaN SL EBL is markedly improved by reducing the polarization field in the active region.