共查询到20条相似文献,搜索用时 62 毫秒
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对退火前后氧化锌薄膜的结构特性、化学组分及化学价态,以及缺陷特性进行了详尽的研究,结果表明,低温热退火是改善氧化锌薄膜结构特性、化学组分及化学价态,并且减少缺陷的良好方法。 相似文献
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ZHONGHuai-zhen HEXiao-yun LIGuo-qiang CHENZhen 《半导体光子学与技术》2004,10(4):260-264
Nanosize CdS semiconductor particles were synthesized using the solvothermal technique. The structure was characterized by means of XRD,TEM and ED techniques. PANI film was prepared by electro—chemistry method onto the indium—tin oxide glass. The nanoparticles were doped on PANI film by the dipping process, and the self—assembled nanoparticles—PANI composite film was acquired. The photoelec tricproperties of the self—assembled film were studied by PL and Z—scan method. 相似文献
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ElectroluminescentExcitationMechanismofErbium-activatedZincSulfideSemiconductorThinFilmDevices¥LIUZhaohong;WANGYujiang;CHENZh... 相似文献
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SnO2/Si的光伏特性 总被引:1,自引:0,他引:1
采用CVD方法在硅单晶上制备SnO2薄膜,对不同硅衬底及在不同温度下淀积SnO2制得SnO2/Si进行光电压谱的测量,得出最佳的制备温度;采用类金属半导体接触模型,推导出有关计算公式,计算得出其介面复合速度和异质结势垒宽度等参数。 相似文献
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A novel horizontal push-pull multi-substrate epitaxy boat with three separate cells is introduced in this article, with multi-substrate LPE processing is feasible in horizontal LPE furnace. The processes of LPE Alx Ga1-xAs/GaAs solar cells are studied and the efficiency of the solar cells achieved 19.8%(AM0,25℃,120mW/cm^2). 相似文献
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用电流控制液相外延(CCLPE)方法首次在(100)InP衬底上成功地生长出In1-xGaxAsyP1-y(0.30<x<0.47,0.70<y<0.96)外延层,并对外延层特性进行了详细研究,提出在InP衬底上生长电外延层的机理,推导出生长动力学的理论模型,该模型与上述实验结果十分吻合。 相似文献
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A novel horizontal push-pull multi-substrate epitaxy boat with three separate cells is introduced in this article, with which multi-substrate LPE processing is feasible in horizontal LPE furnace. The processes of LPE Al_xGa_(1-x))As/ GaAs solar cells are studied and the efficiency of the solar cells achieved 19.8% (AMO, 25℃, 120 mW/cm~2). 相似文献
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本文介绍了薄膜晶体生长的最新技术--化学束外延(CBE),通过与分子束外延(MBE)和金属有机化学汽相沉积(MOCVD)技术的比较,说明了这一新技术的基本概念,生长动力学以及在半导体材料和激光器件方面的应用. 相似文献
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The electrical and structural properties of nickel-chrome (NiCr) thin film resistors were studied for the effect of post-deposition
annealing on stability. The temperature coefficient of resistance (TCR) of sheet resistivities in the range of 100 to 200
Ω/□ could be improved by both air and vacuum annealing to achieve 5 ± 5 ppm/°C over the temperature range of -180° C to +100°
C. With stability tests, air annealing proved to be more favorable for stable TCR. Studies via SIMS and ESCA identified surface
segregation of Cr whereas TEM micrographs revealed correlating structural transformation of the films upon annealing. An intentional
impurity, Si, played an important role in achieving a low TCR. 相似文献