Characteristic energy losses on carbon contaminated layers correlated with secondary electron,auger electron emission and contrasts in scanning microscope

The secondary electron (SE) spectrum (0 < E < 50 eV) has been analysed by means of a CMA. Samples were clean aluminum, aluminum becoming carbon contaminated, sintered graphite powder, electro chemically deposited polymer on platinum and monocrystals of silicon carbon contaminated. When the clean Al surface is becoming carbon contaminated a quick decrease of surface plasmon and bulk plasmon losses is observed whereas a main characteristic energy loss peak (ELS) at 20 eV and a secondary electron peak at 20 eV appear simultaneously. Both peaks are very sensitive general features of carbon contaminated surfaces. The main loss peak is attributed to the excitation of the carbon-carbon bounds (σ → σ¹) as already proposed in the transmission ELS. The few eV change of the loss peak energy of various carbon compounds may correspond to slightly different carbon-carbon distances. The 20 eV secondary electrons could be produced by the relaxation of the excited state (σ¹ → σ transition) via an Auger process. The cross section for molecular electronic excitation is higher than that of atomic ionization for inner level. The loss peak is as intense as the SE peak and higher by more than two orders of magnitude than the C KLL Auger peak. The modification of secondary emission under carbon contamination has been observed on a silicon sample by Scanning Electron Microscopy (SEM) in the Secondary Electron Image (SEI) mode.     

Secondary electron emission from solid HD and a solid H2-D2 mixture

Secondary electron emission from solid HD and a solid 0.6 H₂ + 0.4 D₂ mixture has been studied for electron and hydrogen ion bombardment at primary energies from 0.5 to 3 keV and 2 to 10 keV/amu, respectively. The yield for solid HD is well explained by a simple stoichiometric model of the low-energy stopping power for the internal secondaries. The secondary electron yield from the mixture is somewhat larger than the expected value, but lies between the values for pure solid H₂ and D₂. The secondary electron emission coefficient for solid tritium may be determined from a linear extrapolation of the present data.     

Electron energy loss spectroscopic investigation of palladium metal and palladium(II) oxide

Electron energy loss spectra (ELS) obtained from polycrystalline Pd metal and PdO powder using primary electron energies ranging from 100 to 1150 eV have been obtained and examined in an attempt to gain a better understanding of the origins of the loss features and to assess the utility of ELS in investigations of Pd catalysts. The two sets of ELS spectra differ significantly. The ELS spectra from Pd metal exhibit a predominant peak at 6.5 eV, shown to arise from a surface plasmon excitation, and two broad features at 25.1 and 31.9 eV, which originate from bulk loss processes. The broad features consist of several overlapping losses due mainly to interband transitions from the d-band, though a bulk plasmon excitation is believed to produce a feature near 24 eV. Two distinct peaks are present at 3.7 and 7.6 eV in the ELS spectra obtained from PdO, while a broad region of intensity appears over the range from 20 to 40 eV. The peak at 3.7 eV is attributed to a transition between the top of the valence band and the bottom of the conduction band. The feature at 7.6 eV is broad and arises from several overlapping features that are most likely caused by interband transitions rather than collective excitations. Furthermore, the ELS spectra obtained from PdO and oxidized Pd are also quite different indicating that ELS can provide useful information for determining the bonding states of oxygen on Pd-containing catalysts.     

Electron energy loss spectroscopy of A {111} oriented aluminum single crystal

Recently, the electron energy loss spectroscopy (ELS) and secondary electron spectroscopy (SES) of the interaction of oxygen with polycrystalline aluminum were reported for primary energies in the range 30 ? E_p ? 250 eV. Two new transitions were resolved in the ELS spectra (one at 4 eV for clean aluminum and the other at 12 eV for oxide-covered aluminum) for low primary energies (E_p ~ 30 eV). In this paper we report on experiments utilizing a {111} oriented single crystal of aluminum that confirm the existence of these loss peaks for low primary energies and show that the 4 eV peak position for pure aluminum depends on the primary beam energy. This suggests that this low energy loss peak is due to direct nonvertical inter- and intraband transitions which differs from the previous assignment.     

The electron energy loss spectrum of tin at low primary beam energies

The electron energy loss spectra of clean and oxidised tin have been measured for primary energies in the range 100–1000 eV. The structure found for clean tin is similar to published spectra recorded with low primary energies except for the presence of a small peak at 4.7 eV. Differences between the reported volume plasmon energy recorded with low and high primary beam energies were noted and a model is presented to explain these differences in terms of plasmon dispersion.     

The role of the plasmon mechanism in the secondary electron emission in LiF

Energy distributions of secondary electrons emitted by LiF monocrystals were measured for various energies and angles of incidence of the primary electron beam. The analysis has shown the dominating role of the plasmon mechanism of secondary electron generation. On this base a simple model to calculate the secondary electron yield has been developed. This model made it possible to estimate the contribution of each mechanism of secondary electron generation to the total yield. Good agreement between experimental and calculated data was found. It has been also shown that in LiF the plasmon mechanism can produce up to 90 percent of the total number of escaped secondary electrons.     

Electron spectroscopic studies of tin surface segregation on iron single crystal surfaces

AES, ELS, LEED and XPS investigations of the surface segregation of tin dissolved in a Fe-4wt%Sn alloy were performed in ultra-high vacuum at elevated temperatures. The three low indexed surface orientations (100), (110) and (111) were studied. In all cases, no dependence of the maximum tin surface coverage on temperature was detected within the temperature range from 450 to 650°C. An order-disorder transition was observed by LEED, AES and XPS for the (100) oriented surface during tin segregation. The binding state for the segregated tin atoms abruptly changes at the order-disorder transition as determined by XPS. Similar results were obtained for the (111) surface. A deviating behaviour was observed for the (110) surface orientation, where two different ordered hexagonal surface structures were detected by LEED during tin surface enrichment. The first structure is similar to the diamond structure of pure tin, and the second one corresponds to the formation of a thin layer of the intermetallic compound FeSn on the (110) surface. The electron binding energies of the segregated tin atoms determined by XPS increase with increasing tin coverage on the (110) oriented surface. ELS studies on (100) and (111) oriented surfaces saturated with segregated tin show in comparison with literature data of pure tin a surface plasmon loss peak but no signal for the corresponding bulk loss. An energy loss signal found only for the (110) surface at Sn saturation coverage seems to be characteristic of an intermetallic FeSn surface phase.     

Secondary electron emission of sputtered alumina films

Secondary electron emission yieldδ was measured for thin films of alumina prepared byrf sputtering technique. Single pulse method was used along with 4-gridleed optics system to determineδ. Maximum value of 4·3 was obtained at primary energy of 350 eV. The Dionne’s theory was used to analyse the results and the emission probability escape depth and absorption coefficient of secondaries were also estimated. Fairly good correlation is observed between experimental and theoretical values ofδ for beam energies upto 1 keV.     

A study of the orientation dependence of the electron energy loss spectra for single crystal films of copper and silver

Apart from two peaks caused by bulk and surface plasmons, four or five peaks (depending on the crystal type) of electron energy losses due to inter- and intraband electron transitions are observed in the investigation of the electron energy loss spectra for metals (Cu, Ag). A comparative analysis of the spectra for Cu or Ag films reveals a shift of bulk plasmon loss peaks to higher values for polycrystals, as in the case of transition metals and semiconductors. In a study concerning the orientation dependence of the energy loss spectra (ELS) for electrons scattered from the copper and silver surface, the anisotropy of the bulk plasmon peak is found when the incident beam’s polar angle or the sample’s azimuthal angle are altered. The anisotropy of the primary electron energy loss for plasmon excitation is also observed, depending on the sample orientation relative to the direction incident electrons. The energy losses are found to increase with an increasing atomic packing density of planes and crystal transparency relative to the incident beam.     

加速器束流脉冲化及氢二次离子发射研究

详细介绍了快速高压晶体管开关在加速器束流脉冲化和用于二次离子测量的加速器飞行时间谱仪上的应用. 利用飞行时间法研究了碳纳米管在不同能量的Si和Si2团簇离子轰击下氢二次离子的发射. 实验结果表明， 在每个原子质量单位的速度为2.5×108 cm/s以上， Si和Si2离子引起的氢二次离子的发射主要受电子阻止过程控制； 在每个原子质量单位的速度为2.5×108 cm/s以下和Si2团簇离子轰击的情况下， 氢二次离子的发射产额明显增加， 团簇离子在靶表面的核能损增强效应起主要作用. The application of Fast High Voltage Transistor Switches (HTS) in pulsed ion beam and the time of flight(TOF ) setup is described. Secondary ion emissions from carbon nanotubes under bombardments of MeV Si and Si2 clusters are measured by using TOF. The measurements indicate that the yield of the secondary ion emissions of hydrogen increases with increasing energy of Si and it is attributed to the electronic processes. The yield of the secondary ions of hydrogen decreases with increasing energy of Si2 clusters and the enhancement of nuclear energy loss of cluster constituents at the surface of sample plays a more significant role in the secondary ion emission of hydrogen at the low energies.     

Monte Carlo simulation of absolute secondary electron yield of Cu

A Monte Carlo simulation model of electron interaction with solids that includes cascade secondary electron production has been used to study secondary electron emission from Cu. An optical dielectric function was used to describe electron energy loss and the associated secondary electron excitation. From the simulation, the absolute primary energy dependence of the secondary yield and the energy distribution of secondary electrons has been obtained. We have compared the calculated true secondary yield and total secondary yield curves with experiment. Good agreement has been found only for those experiment data obtained in ultrahigh vacuum. PACS 79.20.Hx; 79.20.Ap; 02.70.Uu     

Low energy electron spectroscopy of Pt (100) and Pt (100)/CO

Fine structure in the n_vi, _VIIVV spectrum of clean Pt (100) has been observed, and interpreted as “band like” in origin rather than quasi-atomic. Differences in the dependence of the Auger yield on primary beam energy are observed between the N_VI, _VIIVV and O_IIIVV peaks, and are associated with anomalies in the dependence of the inner shell ionization crossection of the 4f level. Low energy electron loss spectra on the clean surface have been investigated at primary energies in the range 71–774 eV and at angles of incidence of the beam 0–60°. The results are related to high energy loss and optical data, and assignments are given for inter-band and plasmon losses. With approximately $\text{3}\text{4}$ of a monolayer of CO on the surface there is a prominent additional loss at around 13.5 eV, which is interpreted as a one electron transition from a σ state below the d band to available states several electron volts above the Fermi level.     

Surface oxidation of ytterbium

The initial stages of the oxidation of Yb have been investigated by electron energy loss spectrsocopy (ELS), Auger spectroscopy and work function measurements. The electron loss and Auger spectra of clean and oxygen covered Yb are analysed in some detail to obtain suitable diagnostic means for the oxidation reaction: the valence change of Yb atoms upon oxidation is reflected in pronounced shifts of plasmon energies and in the appearance of the 4d→4f giant resonance in ELS. These spectral changes were used to monitor the oxidation process. We find metal and oxide plasmons coexisting at moderate oxygen exposures, and differences in uptake curves derived from O KLL Auger signals and Yb³⁺ giant resonance signals; the formation of Yb³⁺ is somewhat delayed with respect to the oxygen uptake. Together with work function data these results provide complementary evidence for an island growth mechanism at the initial stages of the oxidation of Yb.     

An electronic and structural interpretation of tin oxide ELS spectra

In this study electron energy-loss spectroscopy (ELS) is used to examine polycrystalline tin oxide films which have been annealed, ion sputtered and oxygen treated. The major features in the N(E) loss spectrum are interpreted as due to collections of optically allowed interband transitions. It is demonstrated that depth profile information may be obtained by varying the primary electron beam energy. Combined ELS and valence-band XPS results indicate that a significant amount of structural information may be inferred from the size, shape and/or position of the N(E) ELS features. Core-level features are found to be quite sensitive to the presence of defects in an SnO₂ lattice with some specificity as to the type of defect.     

Angle- and energy-dependent core-level photoelectron energy loss studies in Al and In

Electron energy loss structures of Al and In core-level photoemission spectra, in particular surface and bulk plasmon losses, have been investigated as functions of photon energy (i.e., photoelectron kinetic energy). These studies utilized synchrotron radiation to provide a variable photon source in the ultra-soft X-ray region, thus allowing these loss processes to be studied at photoelectron kinetic energies for which the mean free path of the electrons is minimal. The Al plasmon loss structure was also studied with soft X-ray radiation in an angle-resolved mode, allowing the variation of effective photoelectron sampling depth with different electron take-off (collection) angles. These results for the relative intensity of the bulk and surface plasmons as a function of electron kinetic energy and electron exit angle are in qualitative agreement with the predictions of ?unji? and ?ok?evi?. The core-level binding energies of surface atoms have also been studied with the result that no significant shift has been observed with respect to bulk-atom core levels.     

Electron loss spectra from a W(001)surface

A high resolution energy dispersion analysis of the electron loss spectra (ELS) from a W(001) surface has been done with a specular reflexion geometry. The non-dispersive ELS correlates well with a combination of the bulk and surface loss functions determined from recent optical data whereas the dispersive ELS showed significant differences. Multiple plasmon losses were demonstrated while for the interband losses a momentum selection method has been demonstrated to separate scattering in the surface region from that in the bulk.     

Electron energy loss processes in X-ray photoelectron spectroscopy

A technique is established in X-ray photoelectron spectroscopy (XPS), using spectra emitted from successively evaporated metallic films, to distinguish between electron energy loss mechanisms identified as, respectively, extrinsic and intrinsic to the photoelectron excitation process. It is demonstrated that tailing on the high kinetic energy side of many XPS peaks is due to intrinsic processes, while the background emission at energies generally some 30 eV below the peaks arises from extrinsic processes. Plasmon energy-loss peaks are believed to contain contributions from both intrinsic and extrinsic processes.     

Effect of focusing of primary electrons on their reflection from a crystal and on the associated Auger emission

The orientational dependence for different groups of secondary electrons — quasi-elastically scattered, inelastically reflected with excitation of a plasmon and with ionization of the core level M _4.5, and the Auger electrons M _4.5 VV — are measured in the primary electron energy range 0.6–1.5 keV. The data are obtained for a Nb (100) single crystal by varying the azimuthal angle of incidence of the primary beam, with complete collection of secondaries. A relationship is established between the processes of focusing and defocusing of the electrons that have penetrated into the crystal in the 〈110〉 and 〈133〉 directions, which differ substantially in the atomic packing density. Specific details of the Auger orientation effect, due to the focusinginduced variation of the flux density of the reflected electrons, are identified and explained. The contributions, both of anisotropy of ionization of the core level and of variation of the backscattering intensity, to the angular dependence of Auger emission and reflection with ionization loss are estimated. The possibilities of using such orientational dependences for an element-sensitive analysis of the local atomic structure of surfaces are assessed. Zh. Tekh. Fiz. 67, 117–123 (August 1997)     

O~(2+)离子穿过碳膜引起的前后表面电子发射

测量了入射能为1.9~11.3 keV/u的O~(2+)离子穿过碳膜诱导的前向、后向(分别对应出射表面和入射表面)电子发射产额。实验中,通过改变入射离子的能量和流强,系统地研究了电子能损和离子束流强度对前向、后向电子发射产额的影响。结果表明,在本实验的能量范围内,前向、后向电子发射产额与对应表面的电子能损有近似的正比关系,而与束流强度无关。分析还发现引起后向电子发射的动能阈值约为0.2 keV/u,势能电子发射产额约为1 e~-/ion。