高应变率下U-Nb合金的断裂组织特征

利用内部爆炸加载方法对U-Nb合金进行爆破试验，对爆破试验产生的破片进行回收，并对U-Nb合金破片进行一些微观检测分析，从而初步研究在爆炸加载下U-Nb合金的微观断裂机制。     

镨钕氧化物(或合金)中稀土杂质元素的测定

用岛津ICPS-7500发射光谱仪测定镨钕氧化物(或合金)中的La、Ce、Sm、Y.试样经盐酸低温分解,制备成含0.6mol/L盐酸的待测试液,La、Sm、Y用直接法测量,Ce用固定法测量.回收率为98.20%-102.32%.     

等离子体喷涂Sn和ZrO2涂层／U-Nb合金摩擦副的摩擦性能

探讨用等离子体喷涂方法制备降低较高强度材料与U-Nb合金之间的摩擦性能的减磨层的可行性以及这些减磨层的摩擦特性。选用Sn为软涂层，ZrO2为硬涂层。采用Sulzer METCO9M等离子体喷涂机制备了Sn单层、ZrO2单层、Sn／ZrO2双层、Sn ZrO2混合层等4种涂层。利用CSEM型销盘型摩擦磨损试验机分析了半径为3mm的U-Nb合金对偶销在涂层上滑动时的干摩擦特性，滑动速度分别为0．42，6．4，26．16cm／s。涂层为典型的等离子体喷涂涂层形貌。表面为Sn的涂层颗粒熔合状况和致密性比ZrO2单层好，其粗糙度低，Sn ZrO2混合涂层表面形貌与ZrO2单层相近。Sn和ZrO2分别以bcc结构的Sn和四方结构ZrO2结构存在。     

XRFA聚脂薄膜-滤纸试样制备方法的改进

介绍了用于X射线荧光光谱分析（XRFA）的聚脂薄膜-滤纸试样制备改进方法及其效果实验。改进方法制备的试样具有基体效应小、样品用量少、元素分布均匀、试样反复使用不变形和便于保存等优点，特别适用于轻元素测量的试样制备。     

熔融制样-X射线荧光光谱法测定重晶石中的主要组分

采用熔融片制样法,X射线荧光光谱仪（XRF）同时测定防辐射用重晶石中氧化钡和二氧化硅等主次组分的含量,用基本参数法校正基体效应,并进行了方法的精密度和准确度试验,各组分相对标准偏差RSD（n=10）均小于6.0%。用标准物质进行验证,测量值与之基本一致。     

X射线荧光光谱成型滤纸片法测定生油岩抽提物中的钒和镍

本文提出以成型滤纸片作为标样与试样的支撑材料，点滴法制备样片，用钒和镍的有机金属标准试剂配制标准样品，以透空照射法直接测定生油岩抽提物中的钒和镍，方法检出限较低，制样与测量精度好于５％。方法简单、快速和实用。     

ICP－AES法测定钨合金中镍、钴、铁、锰时酸度的影响

本文研究了用电感耦合等离子体发射光谱技术测定钨合金中镍、钴、铁、锰含量的方法及酸度对测量结果的影响。用氢氟酸及硝酸处理试样，并加入适量盐酸。实验研究了测量值随氯离子浓度增大而下降的变化曲线，找出了测量不同元素的最佳测定条件，测量结果同标准值比较，误差较小。     

锰锌铁氧体纳米粒子制备与热磁性研究

采用化学共沉淀法制备锰锌铁氧体磁性颗粒并进行了表征,用X射线荧光光谱仪（XRF）、X射线衍射（XRD）测试分析了颗粒组成、结构、平均粒径,表明制备的样品为锰锌铁氧体纳米粒子,平均粒径约为17nm.用振动样品磁强计（VSM）测量了颗粒的磁滞回线和热磁特性.     

XRF和LA-ICPMS测定硫化物熔片中的主次量元素

采用高纯HNO₃为氧化剂代替传统的氧化剂,以GeO₂为玻璃化试剂,建立了一种简单、高效的硫化物熔融玻璃片的前处理方法。XRF和LA-ICPMS分析结果表明,相对于粉末压片法,熔片法制备的样品具有更好的均一性和可靠性。3种硫化物国家一级标准物质的XRF和LA-ICPMS主次量元素(Si,Al,Fe,Mg,K,Ca,Na,Mn,Cu,Zn)分析测试结果均与推荐值相吻合(Ti缺少推荐值),测定误差都在允许范围内,XRF三次熔片测试结果的精密度RSD<5.6%;LA-ICPMS 15次测试结果精密度RSD<3%。表明建立的硫化物熔融玻璃片的前处理方法可较好的应用于XRF和LA-ICPMS分析硫化物中的主次量元素。     

XRF玻璃熔片法测定介电陶瓷材料锆钛酸钡的成分

试样经熔融制成玻璃片,用X射线荧光光谱法（XRF）测定介电陶瓷材料锆钛酸钡中BaO、TiO2、ZrO2成分含量,同时自制一套参考标样。方法快速、准确、稳定,可以满足生产及研发定量分析要求。     

样品厚度对薄膜法X射线荧光光谱测量的影响研究

分别以富集有Cr,Pb和Cd三种元素的尼龙薄膜样品及玻璃纤维滤膜为研究对象,采用滤膜叠加的方式,通过XRF光谱仪测量不同样品厚度下薄膜样品的XRF光谱,根据测得的尼龙薄膜样品中Cr,Pb,Cd元素及玻璃纤维滤膜中Ca,As和Sr元素特征XRF性质的变化,研究样品厚度对薄膜法XRF光谱测量的影响。结果表明：薄膜样品厚度对不同能量区间上元素特征谱线荧光性质的影响并不相同。元素特征谱线能量越大,元素特征X射线荧光穿透滤膜到达探测器的过程中损失越少;但由薄膜样品厚度增加引起的基体效应却越强,相应特征谱线位置处的背景荧光强度就越大,因此样品厚度增加所引起的基体效应对薄膜法XRF光谱测量的灵敏度影响就越大。对于特征谱线能量较低(能量小于7 keV)的元素,以增加薄膜样品厚度的方式来增加待测组分的质量厚度浓度,并不能有效地提高薄膜法XRF光谱测量的灵敏度;对于特征谱线能量较高的元素(能量＞7 keV),可以通过适当增加样品厚度以增加被测组分的质量厚度浓度的方式来提高XRF光谱测量的灵敏度,薄膜样品厚度在0.96～2.24 mm内,更有利于XRF光谱的测量与分析。该研究为大气及水体重金属薄膜法XRF光谱分析中薄样制备及富集技术提供了重要的理论依据。     

Choice of optimal conditions for X‐ray fluorescence analysis of milk products with varying fat content

The design of experiments was used to study sources of errors in the sample preparation and to choose optimal conditions for X‐ray fluorescence (XRF) analysis of milk products of varying fat content. The measurements were performed using the conventional wavelength‐dispersive XRF (WDXRF) and the total reflection XRF (TXRF) techniques. For WDXRF, the dried milk samples were pelletized, and the mathematical models were constructed, which described the dependence of XRF intensity on the pelletizing pressure, the pellet weight and the milk fat content. The effect of radiation time on the stability of pressed milk powder samples was also estimated. When applying TXRF, the sample preparation involved diluting milk samples with the ultrapure water, adding the internal standard (Ga) and drying of a sample aliquot on a quartz glass sample carrier. The mathematical models were designed, which described the dependence of the sample preparation error on the dilution ratio and sample aliquot pipetted on the carrier. A physical interpretation of the obtained mathematical models was proposed. Copyright © 2013 John Wiley & Sons, Ltd.     

Ab initio study of dynamical properties of U-Nb alloy melt

The U-Nb alloy, as a kind of nuclear material with good corrosion resistance and mechanical properties, plays an important role in the nuclear industry. However, the experimental measurements and theoretical calculations of many parameters which are essential in describing the dynamical properties of this alloy melt, including density, diffusivity, and viscosity, have not been carried out yet. The lack of data on the dynamical properties of nuclear materials seriously hinders the high-performance nuclear materials from being developed and applied. In this work, the dynamical properties of the U-Nb alloy melt are systematically studied by means of ab initio molecular dynamics simulations and their corresponding mathematical models are established, thereby being able to rapidly calculate the densities, diffusion coefficients, viscosities, and their activation energies in the whole U-Nb liquid region. This work provides a new idea for investigating the dynamical properties of binary alloy melts, thereby promoting the development of melt research.     

Analytical Study of Raw Materials of Zinc Oxide Used for Enamels on Industrial Ceramics: Quantitative Analysis of Zinc,Lead, and Sulfur in These Samples by X‐ray Fluorescence and Flame Atomic Absorption Spectrometry

An analytical study is carried out to optimize X‐ray fluorescence (XRF) and flame atomic absorption spectrometry (FAAS) quantitative analysis of Zn, Pb, and S in ZnO samples commonly used to obtain industrial ceramic enamels. Pb and S in the raw materials often contaminate ZnO and are very detrimental in industrial applications. Thus, very accurate analytical determination of these elements in ceramic samples is extremely important. First of all, a mineralogical study by X‐ray diffraction (XRD) on the different components in these raw materials and the materials produced during the firing process is performed in order to establish the mineral forms in a reference sample for analysis by XRF spectrometry. The working conditions are optimized for XRF multielemental analysis, using the sample in the form of pellets, due to high loss on ignition (LOI) values. The preparation of suitable standards and working conditions for FAAS analysis have also been optimized. The content of these elements was determined by FAAS for the reference sample and several samples for industrial use, and the results were compared with those obtained by XRF. Comparison of the results obtained from XRF and FAAS analysis of Pb and Zn show more accurate values for FAAS. For ZnO, an accuracy of 0.11% with ±0.1% precision by FAAS and 0.46% accuracy with ±0.2% precision by XRF are found. For PbO, 1.06% accuracy and ±0.06% precision using FAAS and 5.6% accuracy and ±0.35% precision by XRF were found. For SO₃ determined only by XRF, accuracy was 4.76% with ±0.25% precision. These values are highly satisfactory given that these two elements are only found in small proportions.     

Direct chemical characterisation of clay suspensions by WD‐XRF

This study was performed to develop a method for directly controlling the chemical composition of clay slurries used in preparing ceramic floor and wall tile bodies by wavelength‐dispersive X‐ray fluorescence (WD‐XRF) spectrometry, without the prior need to dry and prepare the samples as fused beads or pellets for WD‐XRF measurement, owing to the importance of knowing the suspension chemical composition in real time for appropriate control of the industrial process. The study was conducted on a wide range of ceramic floor and wall tile bodies, which are used to prepare different suspensions. The influence of suspension viscosity (from 300 to 7000 cp), of suspension solids content (between 66 and 69%), and of the type of body composition (floor or wall tile) on the WD‐XRF measurement was determined. In these viscosity and solid content ranges, no appreciable differences were observed in the WD‐XRF measurement results, indicating that the possibly arising variations in viscosity and solids content in such clay suspensions in industrial practice do not influence the WD‐XRF measurement. In contrast, the type of body composition did influence the WD‐XRF measurement. The developed method is rapid, reproducible, and accurate, which was verified by analysis of the materials using the customary method of WD‐XRF measurement on fused beads. In addition, this method is cheaper and more harmless to the environment; it minimises waste generation, since no sample preparation is required and the plastic sample holders can be reused, thanks to the reusable sample holder system designed at the Instituto de Tecnología Cerámica laboratories. Copyright © 2011 John Wiley & Sons, Ltd.     

Monte Carlo simulation code for confocal 3D micro‐beam X‐ray fluorescence analysis of stratified materials

Stratified materials are of great importance for many branches of modern industry, e.g. electronics or optics and for biomedical applications. Examination of chemical composition of individual layers and determination of their thickness helps to get information on their properties and function. A confocal 3D micro X‐ray fluorescence (3D µXRF) spectroscopy is an analytical method giving the possibility to investigate 3D distribution of chemical elements in a sample with spatial resolution in the micrometer regime in a non‐destructive way. Thin foils of Ti, Cu and Au, a bulk sample of Cu and a three‐layered sandwich sample, made of two thin Fe/Ni alloy foils, separated by polypropylene, were used as test samples. A Monte Carlo (MC) simulation code for the determination of elemental concentrations and thickness of individual layers in stratified materials with the use of confocal 3D µXRF spectroscopy was developed. The X‐ray intensity profiles versus the depth below surface, obtained from 3D µXRF experiments, MC simulation and an analytical approach were compared. Correlation coefficients between experimental versus simulated, and experimental versus analytical model X‐ray profiles were calculated. The correlation coefficients were comparable for both methods and exceeded 99%. The experimental X‐ray intensity profiles were deconvoluted with iterative MC simulation and by using analytical expression. The MC method produced slightly more accurate elemental concentrations and thickness of successive layers as compared to the results of the analytical approach. This MC code is a robust tool for simulation of scanning confocal 3D µXRF experiments on stratified materials and for quantitative interpretation of experimental results. Copyright © 2011 John Wiley & Sons, Ltd.     

Methodology for the determination of minor and trace elements in petroleum cokes by wavelength‐dispersive X‐ray fluorescence (WD‐XRF)

This article describes a methodology for the analysis of minor and trace elements in petroleum cokes by wavelength‐dispersive X‐ray fluorescence (WD‐XRF) spectrometry. The methodology was developed in order to have a rapid and reliable control method of these elements, because they determine coke end uses. There are a number of standard methods of chemical analysis by WD‐XRF or inductively coupled plasma atomic emission spectrometry (ICP‐OES) techniques. However, the standards that use WD‐XRF measurement give detection limits (L_D) above 10 mg·kg^?1 and only analyse a few elements of interest, whereas the ICP‐OES method requires extensive sample handling and long sample preparation times, with the ensuing errors. In order to improve the method described in the standard ASTM D6376 and reach the L_D and quantification limits (L_Q) required, the different stages of the process, ranging from sample preparation to measurement conditions: analytical line, detector, crystal, tube power, use of primary beam filters, and measurement time, were optimised. The samples were prepared in the form of pressed pellets, under conditions of high cleanliness of the mills, crushers, presses, and dies, and of the laboratory itself. The following reference materials were used in measurement calibration and validation: SRM 1632c, SRM 2718, SRM 2719, SRM 2685b, AR 2771, AR 2772, SARM 18, SARM 19, and CLB‐1. In addition, a series of materials were analysed by WD‐XRF and ICP‐OES, and the results were compared. The developed methodology, which uses WD‐XRF, is rapid and accurate, and very low L_D and measurement uncertainties were obtained for the following elements: Al, Ba, Ca, Cr, Cu, Fe, Ge, K, Mg, Mn, Mo, Na, Ni, P, Pb, S, Sb, Se, Si, Sn, Sr, Ti, V, and Zn. Copyright © 2010 John Wiley & Sons, Ltd.     

Microfluidic sample preparation for elemental analysis in liquid samples using micro X‐ray fluorescence spectrometry

The integration of microfluidic devices with micro X‐ray fluorescence (micro‐XRF) spectrometry offers a new approach for the direct characterization of liquid materials. A sample presentation method based on use of small volumes (<5 µl) of liquid contained in an XRF‐compatible device has been developed. In this feasibility study, a prototype chip was constructed, and its suitability for XRF analysis of liquids was evaluated, along with that of a commercially produced microfluidic device. Each of the chips had an analytical chamber which contained approximately 1 µl of sample when the device was filled using a pipette. The performance of the chips was assessed using micro‐XRF and high resolution monochromatic wavelength dispersive X‐ray fluorescence, a method that provides highly selective and sensitive detection of actinides. The intended application of the device developed in this study is for measurement of Pu in spent nuclear fuel. Aqueous solutions and a synthetic spent fuel matrix were used to evaluate the devices. Sr, which has its Kα line energy close to the Pu Lα line at 14.2 keV, was utilized as a surrogate for Pu because of reduced handling risks. Between and within chip repeatability were studied, along with linearity of response and accuracy. The limit of detection for Sr determination in the chip is estimated at 5 ng/µl (ppm). This work demonstrates the applicability of microfluidic sample preparation to liquid characterization by XRF, and provides a basis for further development of this approach for elemental analysis within a range of sample types. Copyright © 2014 John Wiley & Sons, Ltd.     

A sample carrier for measuring discrete powdered samples with an ITRAX XRF core scanner

The elemental composition of discrete powdered sediment samples can be measured by the energy‐dispersive X‐ray fluorescence (XRF) system that is installed in XRF core scanners. Because an appropriate sample carrier for powdered samples is currently not available, for example, for the ITRAX XRF core scanner, such a carrier is presented in this technical note. The designed sample carrier can hold 30 sample cups with a volume of 0.88 cm³ each. A maximum of 5 sample carriers, that is, 150 samples, can be measured in one run. The sample cups and carriers are optimized for a measurement procedure with a step size of 5 mm and variable count times up to 100 s per sample. With this setting, data are collected from an area of 100 mm² in the center of the sample thereby ensuring a good representativeness of the signal because potential sample inhomogeneity is accounted for. Because the described sample carrier system allows rapid element analyses of discrete powdered environmental samples with an XRF core scanner, it may in some cases represent a time‐ and cost‐efficient alternative to conventional XRF analyses.