The effect of surface cleanness of thin defects on the reflection of ultrasound

In a previous paper, the authors described experiments in which simulated defects of thickness 20–200 nm were detected ultrasonically. The defects were produced by creating thin gaps between the surfaces of optical flats. A relation between reflectivity and cleanness of the surfaces was noted.This paper describes new experiments and some theoretical considerations which further explore the relation between cleanness and reflectivity. It is concluded that the surface properties of the thin defects tested affect the reflectivity. In particular, it appears that the surface energy of the defect attracts additional material, which provides a mechanism for transmission of sound across the defect.     

Comparison of the effect of PLT and PZT buffer layers on PZT thin films for ferroelectric materials applications

In order to study the effect of different buffer layers on the Pb(Zr_0.52Ti_0.48)O₃ (PZT) thin films, 10-nm thick (Pb_0.72La_0.28)Ti_0.93O₃ (PLT) and Pb(Zr_0.52Ti_0.48)O₃ buffer layers have been deposited on the Pt(1 1 1)/Ti/SiO₂/Si substrates by pulsed laser deposition, respectively. The top buffer layers were also deposited on PZT thin films with the same thickness of the seed layers in order to enhance the fatigue characteristics of PZT thin films. We compared the results of dielectric constant, hysteresis loops and fatigue resistance characteristics. It was found that the dielectric properties of PZT thin films with PLT buffer layers were improved by comparing with PZT thin films with PZT buffer layers. The polarization characteristics of PZT thin films with PLT buffer layers were observed to be superior to those of PZT thin films using PZT buffer layers. The remanent polarization of PZT thin films showed 36.3 μC/cm² and 2.6 μC/cm² each in the case of use PLT and PZT buffer layers. For the switching polarization endurance analysis, PZT thin films with PLT buffer layers showed more excellent result than that of PZT thin films with PZT buffer layers.     

Beta-gradient isochron dating of thin tooth enamel layers using ESR

The theoretical and experimental basis for the development of a new dating technique using beta-gradient isochrons and ESR is presented. For uranium-free portions of enamel adjacent to sediment, we can determine a beta-dose gradient due to sources in the nearest 2 mm layer of the sediment. If the equivalent dose to successive layers of enamel is plotted against the beta dose rate to each layer, an estimate of the age (equal to the slope of the line) that depends only on the environmental beta dose rate can be determined. Experimental methods and results for four teeth are discussed. The significance of this approach lies in its ability to isolate an age estimate that is independent of the uranium uptake model, since only portions of the enamel which are far away enough from internal sources of uranium, such as dentine, are used. In addition, this technique provides a time-averaged estimate of the actual gamma plus cosmic dose rate provided that a reasonable estimate of the average moisture content is used to calculate the environmental beta dose rate.     

Measurement of the thickness of thin polymer layers by infrared frustrated total internal reflection spectroscopy

A method is proposed for determining the thickness of thin (0.1–5.0 μm) polymer layers and coatings by means of infrared frustrated total internal reflection (FTIR) spectroscopy. This method is based on an analytic expression derived for the dependence of the intensities of absorption bands in IR FTIR spectra on the thickness of a polymer layer. The method is tested on model samples consisting of a thick film of polyethylene terephthalate with a layer of different thicknesses of polystyrene deposited on it. The advantage of this method is the ability to determine the thickness of thin polymer layers deposited on bulk or opaque polymer substrates. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 75, No. 6, pp. 881–885, November–December, 2008.     

Investigation of diffusion and crystallization processes in thin ITO films by temperature and time resolved grazing incidence X-ray diffractometry

Oxygen diffusion into metallic In/Sn films and crystallite growth of thin indium tin oxide (ITO) films were investigated by in situ high temperature grazing incidence X-ray diffractometry (HT-GIXRD) at temperatures ranging from 100 to 300 °C. The investigated films were deposited by dc magnetron sputtering from a metallic target at different oxygen flows and bias voltages. The deposition process influences not only the film properties but also the film reactions during the post-deposition annealing process.

The ITO formation is determined by two processes: the diffusion of oxygen into the metallic grains and a fast crystallization process. Kinetic parameters for both processes were derived. A model was developed which allows the determination of the diffusion coefficient D from the time dependence of the integral intensity of the ITO X-ray reflection. Diffusion coefficients as well as the activation energies are influenced by the bias voltage but not by the oxygen flow.

According to the Johnson–Mehl–Avrami theory, the crystallization can be described as a two-dimensional process.     

Determination of the parameters of a linear-viscoelastic thin layer using the normally-incident ultrasonic waves

This paper proposes a method of simultaneous determination of the four layer parameters (mass density,longitudinal velocity,the thickness and attenuation) of an immersed linear-viscoelastic thin layer by using the normally-incident reflected and transmitted ultrasonic waves.The analytical formula of the layer thickness related to the measured transmitted transfer functions is derived.The two determination steps of the four layer parameters are developed,in which acoustic impedance,time-of-flight and attenuation are first determined by the reflected transfer functions.Using the derived formula,it successively calculates and determines the layer thickness,longitudinal velocity and mass density by the measured transmitted transfer functions.According to the two determination steps,a more feasible and simplified measurement setups is described.It is found that only three signals (the reference waves,the reflected and transmitted waves) need to be recorded in the whole measurement for the determination of the four layer parameters.A study of the stability of the determination method against the experimental noises and the error analysis of the four layer parameters are made.This study lays the theoretical foundation of the practical measurement of a linear-viscoelastic thin layer.     

Mössbauer and XRD study of pulse plated Fe–P and Fe–Ni thin layers

⁵⁷Fe conversion electron Mössbauer spectroscopy, X-ray diffraction, electrochemical and magnetic measurements were used to study pulse electroplated Fe–P and Ni–Fe coatings. XRD and ⁵⁷Fe CEMS measurements revealed the amorphous character of the novel pulse plated Fe–P alloys. CEM spectra indicated significant differences in the short range order and in the magnetic anisotropy between the Fe–P deposits pulse plated at medium long deposition time (t _on?=?2 ms), with short relaxation time (t _off?=?9 ms) and low current density (I _p?=?0.05 Acm^?2) or at short deposition time (t _on?=?1 ms) with long relaxation time (t _off?=?250 ms) and high current density (I _p?=?1.0 Acm^?2). The broad peaks centred around the fcc reflections in XRD of the pulse plated Ni-22 wt.% Fe deposit reflected a microcrystalline Ni–Fe alloy with a very fine, 5–8 nm, grain size. The CEM spectrum of the pulse plated Ni-22 wt.% Fe coating corresponded to a highly disordered solid solution alloy containing a minute amount of ferrihydrite. Extreme favourable soft magnetic properties were observed with these Ni–Fe and Fe–P pulse plated thin layers.     

Optical characteristics of a multilayer photovoltaic cell for oblique incidence of light

Taking into account the contributions of interference and incoherent multiple reflections of light in the substrate, we have determined the distribution of the absorbed energy density Q in layers of a multilayer photovoltaic cell in the general case of oblique incidence of light on the cell. The relations obtained are expressed in terms of the Fresnel reflection and transmission coefficients for interfaces between media, which for oblique incidence are different for s and p polarization of the incident light. The energy absorbed by an active layer of the cell varies very slightly with the angle of incidence if the maximum in the Q distribution is located at a heterojunction. We carried out a numerical analysis for a five-layer cell based on a copper phthalocyanine-fullerene heterojunction. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 6, pp. 795–800, November–December, 2007.     

基底上覆分层薄膜超声Scholte波特性与薄膜定征

分层薄膜--基底结构广泛应用于微电子器件等诸多领域,但薄膜材料参数超声测量尤其是横波速度的定征是一个困难的问题。本文对液固界面Scholte界面波的频散特性和脉冲激励的声压响应进行了理论分析。结果表明,液固界面Scholte波频散与分层膜--基底结构的速度分布密切相关。薄膜材料各层的厚度和横波速度对界面波频散特性有显著影响。基于Scholte界面波的频散特性,提出了一种多层膜的多参数反演定征方法。首先针对理论信号进行薄膜参数反演,验证了该方法的可行性。后续对不同类型的多层膜材料样品进行了液固界面波激发与采集实验,实验信号的薄膜参数反演结果进一步验证了该方法的可行性和有效性。     

Structural and electronic properties of thin Ni layers on Cu(1 1 1) as investigated by ARPES, STM and GIXD

The growth and the crystalline and electronic structure of Ni deposited on single crystalline Cu(1 1 1) were studied by scanning tunnelling microscopy (STM), grazing incidence X-ray diffraction (GIXD) and angle-resolved photoemission spectroscopy (ARPES). In the early stages of growth monoatomic-high flat Ni islands, partially covered by Cu migrating from the surface, are observed. Starting from a pseudomorphic epitaxial relationship the in-plane lattice parameter progressively relaxes with increasing coverage. For a 20 monolayer (ML) thick deposit the in-plane lattice parameter is still found halfway between the bulk Ni and Cu lattice parameters. ARPES data also rule out the layer-by-layer growth and provide the values of the Ni exchange splitting.     

Ratiometric FRET-based detection of DNA and micro-RNA on the surface using TIRF detection

A new FRET-based method for the ratiometric detection of DNA oligomers on a surface using TIRF detection mode is reported. The dual-labeled system consisting of two hybridized oligomers, Cy3oligoY:Cy5oligoX was immobilized on the surface, and the total internal reflection fluorescence (TIRF) was used to detect emission signals from the surface. Two signals, green and red, which originated from the green donor Cy3 and the red acceptor Cy5, have been simultaneously detected. When the target single-stranded complimentary oligomer was present in the solution, this oligomer replaced the Cy3oligoY in the donor:acceptor complex on the surface and the ratio of red-to-green signal was dramatically changed. This detection scheme is generally applicable to the detection of DNA or RNA on a surface.     

Internal stresses and stability of the tetragonal phase in zirconia thin layers deposited by OMCVD

Zirconia thin films were deposited by OMCVD (organo-metallic chemical vapour deposition) at various temperatures and oxygen partial pressures on a AISI 301 stainless steel substrate with Zr(thd)₄ as precursor. The as deposited 250 nm thin zirconia films presented a structure consisting of two phases: the expected monoclinic one and also an unexpected tetragonal phase. According to the literature, the stabilization of the tetragonal phase (metastable in massive zirconia) can be related to the crystallite size and/or to the generated internal compressive stresses.To analyze the effect of internal and external stresses on the thin film behaviour, in-situ tensile experiments were performed at room temperature and at high temperature (500 °C).Depending on the process parameters, phase transformations and damage evolution of the films were observed. Our results, associated to XRD (X-ray diffraction) analyses, used to determine phase ratios and residual stresses within the films, before and after the mechanical experiments, are discussed with respect to their microstructural changes.     

基于反射式脉冲红外热成像法的定量测量方法研究

本文提出了一种利用反射式脉冲热成像法测量缺陷深度、热扩散系数或缺陷界面热波反射系数的方法. 首先,介绍了脉冲热成像法的基本原理以及定量测量算法.其次,利用304不锈钢制作了平底孔试件 并预埋了四种不同物质并进行了实验,给出在不同条件下对缺陷深度、热扩散系数或缺陷界面热波 反射系数测量的结果.实验结果显示实际测量值与其他方法测量值基本符合, 误差范围在±5%以内, 并讨论了影响测量精度的原因.     

利用偏振干涉成像光谱仪进行偏振检测的最佳角度分析

利用偏振干涉成像光谱仪进行偏振探测,这一方法将偏振测量与干涉成像光谱技术相结合,一方面能提供辐射测量所不能提供的物体偏振信息,另一方面又可获取目标的空间图像和光谱,具有比辐射测量更高的准确度.在简要分析了利用偏振干涉成像光谱仪进行偏振检测的理论基础上,深入研究了偏振检测的方法,分析比较了目前常用的偏振探测角度（45°,60°）对偏振度探测的影响.进一步计算推导出偏振测量的最优探测角度,将之与以往常用的探测角度进行了分析比较,证明了此最佳探测角度可以有效地减小偏振误差、提高偏振探测的精度.这将极大地提高偏振干涉成像光谱仪的应用范围,为新型偏振干涉成像光谱技术的研究以及仪器研制提供重要的理论依据. 关键词： 偏振检测 偏振干涉成像光谱仪 探测角 Savart偏光镜     

有机半导体薄膜生长原位实时测量方法的研究

针对原位实时监测有机半导体薄膜生长情况的需求, 提出了差分反射光谱法与场效应晶体管法结合的光电联合测量方法, 设计研制了测量系统. 以并五苯有机分子为例, 通过自制底栅底接触式场效应管微结构, 实验测试了热蒸发法生长导电膜层过程中光电信号的演变与相互关联. 光谱信号显示, 并五苯以薄膜态结构进行生长, 光谱随生长进程变化显著. 实验数据与四相结构模型仿真结果的良好吻合, 表明因薄膜增厚引起干涉条件的改变是光谱变化的主因, 由此推算出薄膜生长速率为0.23 nm/min. 当薄膜等效厚度达到28 nm时, 场效应管的导电性显著增强, 标志着并五苯有效传输层的形成. 此后, 薄膜厚度持续增加, 但测试电流增长缓慢, 说明该结构进入电学特性饱和区. 光电联合法不仅有助于研究有机半导体薄膜的光谱信息、电学特性和薄膜结构之间的相互对应关系, 也为发展原位监测有机半导体薄膜制备过程, 探索最佳工艺提供了新的研究手段.     

The measurement of residual stress in textured steel using an ultrasonic velocity combinations technique

A new ultrasonic technique for the determination of residual stresses in steel, intended to correct for the effects of variable texture and microstructure, is proposed. The method is based upon the use of the compressional wave time delay in addition to the time delays of two orthogonally polarized shear waves used in the shear wave birefringence technique. This method is justified theoretically using expressions for the ultrasonic velocities in an aggregate of orthorhombic symmetry composed of cubic crystallites.Measurements of the three time delays for propagation in the through thickness direction have been made on a large number of steel plates selected at random. The measurements are found to fall on two lines, and reveal that two types of texture are present in rolled steel plates. In the presence of a stress, the measured points deviate from the lines and this effect is quantified theoretically using elastic constants obtained by applying a uniaxial compressive stress to one of the samples.The usefulness of the technique to determine a residual stress distribution is demonstrated by measurements near the tip of a crack in a compact tension specimen.     

基于分布式超声无损检测方法的零件内部缺陷检测

超声检测广泛应用于工业检测,比如超声相控阵检测法和超声A扫应用于零件内部缺陷检测。然而,这些方法可以检测出缺陷位置却很难精确地检测缺陷尺寸,缺陷定量成了急需解决并且很有意义的问题。本文提出了一种分布式超声无损检测方法,将超声探头均匀布置在检测表面,每一个超声探头可以同时发射和接收超声信号,通过对接收到的信号进行处理来重构缺陷轮廓。基于分布式超声无损检测方法,重构零件的人造缺陷并建立相应的声学仿真模型。通过多项式拟合法和聚类法分别处理实验和仿真所获得的数据并重构缺陷轮廓。实验结果和仿真结果显示重构的椭圆形缺陷和正方形缺陷具有一定的精度。结果表明分布式超声无损检测方法有潜在的应用价值和理论意义。     

Grazing‐incidence synchrotron‐radiation 57Fe‐Mössbauer spectroscopy using a nuclear Bragg monochromator and its application to the study of magnetic thin films

Energy‐domain grazing‐incidence ⁵⁷Fe‐Mössbauer spectroscopy (E‐GIMS) with synchrotron radiation (SR) has been developed to study surface and interface structures of thin films. Highly brilliant ⁵⁷Fe‐Mössbauer radiation, filtered from SR by a ⁵⁷FeBO₃ single‐crystal nuclear Bragg monochromator, allows conventional Mössbauer spectroscopy to be performed for dilute ⁵⁷Fe in a mirror‐like film in any bunch‐mode operation of SR. A theoretical and experimental study of the specular reflections from isotope‐enriched (⁵⁷Fe: 95%) and natural‐abundance (⁵⁷Fe: ～2%) iron thin films has been carried out to clarify the basic features of the coherent interference between electronic and nuclear resonant scattering of ⁵⁷Fe‐Mössbauer radiation in thin films. Moreover, a new surface‐ and interface‐sensitive method has been developed by the combination of SR‐based E‐GIMS and the ⁵⁷Fe‐probe layer technique, which enables us to probe interfacial complex magnetic structures in thin films with atomic‐scale depth resolution.     

Physical properties of Pb doped ZnS thin films prepared by ultrasonic spray technique

In the present work, high quality Pb doped ZnS thin films were deposited on glass substrates at 450°C using spray ultrasonic technique. The dependence of the structural, morphological and optical properties of the films on the lead (Pb) doping amount was investigated by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), UV–vis–NIR spectrophotometry, and four-point method. The improvement of the obtained Pb:ZnS thin films properties were discussed as a function of Pb concentration (0.5 to 2 at.%). The average crystallite size of Pb:ZnS was found in the range of 25–37 nm. The scanning electron microscopy (SEM) reveals that the films are continuous, homogeneous and dense. The UV–vis–NIR spectroscopy characterizations demonstrated that all the films exhibit good transmittance (60–70%) in the visible region and their optical band gap energy ($E_{\mathrm{g}}$) changes from 3.92 to 3.6 eV. The films electrical resistivity showed an apparent dependence on Pb content.     

Electrospray-assisted fabrication of porous platinum-carbon composite thin layers for enhancing the electrochemical performance of proton-exchange membrane fuel cells

Membrane electrode assembly (MEA) in proton-exchange membrane fuel cells (PEMFCs) have been fabricated using electrospray-assisted deposition of platinum-carbon composites on carbon-fiber-based paper substrate, because the technique is versatile, operated in atmospheric pressure, and easy to scale up for commercialization. In this study, we investigate the effects of electrospray-assisted platinum loadings from 0.1 to 0.5 mg cm⁻² on the electrochemical performance of PEMFCs. The PEMFCs with platinum loading of 0.3 mg cm⁻² generate the highest power density, which is ∼35% higher than that of PEMFCs fabricated by traditional brush-deposited catalyst layers. Relatively high platinum loading (>0.3 mg cm⁻²) enhances the pressure drop in MEA; therefore, the resulting power density is decreased due to low-reacting gas permeability. We also examine the effect of porous structures on the electrochemical performance of PEMFCs. Brij 58-based surfactant templates create micro- and nano-porous structures in the platinum-carbon composite thin layers via thermal removal. These porous structures in the platinum-carbon composite thin layers increase the reacting gas permeability and simultaneously lower the cell resistance, significantly enhancing the electrochemical performance of PEMFCs with porous structures.