Epitaxial growth of YSZ buffer layer for YBa2Cu3O7−δ coated conductor by reel-to-reel pulsed laser deposition

Yttria-stabilized zirconia (YSZ) buffer layers were deposited on CeO₂ buffered biaxially textured Ni-W substrate by reel-to-reel pulsed laser deposition (PLD) for the application of YBa₂Cu₃O_7−δ (YBCO) coated conductor and the influence of substrate temperature and laser energy on their crystallinity and microstructure were studied. YSZ thin films were prepared with substrate temperature ranging from 600 to 800 °C and laser energy ranging from 120 to 350 mJ. X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM) were used to investigate how thin film structure and surface morphology depend on these parameters. It was found that the YSZ films grown at substrate temperature below 600 °C or laser energy above 300 mJ showed amorphous phase, the (0 0 1) preferred orientation and the crystallinity of the YSZ films were improved with increasing the temperature, but the surface roughness increased simultaneously, the SEM images of YSZ films on CeO₂/NiW tapes showed surface morphologies without micro-cracks. Based on these results, we developed the epitaxial PLD-YSZ buffer layer process at the tape transfer speed of 3-4 m/h by the reel-to-reel system for 100 m class long YBCO tapes.     

Meter-long CeO2/YSZ/Y2O3 buffer layers for YBCO coated conductors using DC reactive sputtering

This paper reports CeO₂/YSZ/Y₂O₃ buffer layers deposited on biaxially textured NiW substrates by DC reactive sputtering in a reel-to-reel system. The effect of partial pressure of water vapor (P_H2O) on surface morphology and orientation of the Y₂O₃ films was examined. The obtained CeO₂/YSZ/Y₂O₃ buffer layers exhibit a highly biaxial texture, with in- and out-of-plane FWHM values respectively in the range of 6.0–7.0° and 4.5–5.5°. Crystallographic consistency of CeO₂/YSZ/Y₂O₃ along meter length is excellent. Atomic force microscope observation (AFM) reveals a smooth, continuous and crack-free surface with a Root-mean-square roughness (RMS) lower than 10 nm.     

The effect of BZO doping concentration and thickness dependent properties of YBCO films grown by PLD on buffered NiW substrates

The effect of BaZrO₃ (BZO) doping is systematically studied in YBa₂Cu₃O_6+x (YBCO) thin films deposited by pulsed laser deposition (PLD) on buffered NiW substrates. Based on the structural and magnetic properties, the optimal BZO doping concentration is obtained to vary between 4 and 7.5 wt.%, depending mainly on applied magnetic field. This relatively high optimal concentration is linked to the nanograined target material and metal substrate that cause low-angle grain-boundaries and in-plane spread of YBCO crystals on NiW. Thickness dependent analysis of undoped and BZO-doped YBCO films predicts differences in growth mechanisms where early growth next to the substrate interface is 2D-type in BZO-doped films. This leads to the situation where crystallographic structure as well as superconducting properties are improved when the film develops and the thickness is increased. Therefore from the resistivity measurements a threshold thicknesses where reasonable properties occur are determined for both set of films. Measurements in thermally activated flux-flow regime (TAFF) indicate that above the threshold thickness relatively strong and isotropic vortex pinning is realized in BZO-doped YBCO films. Generally, this paper demonstrates that especially for thin film applications on NiW substrates even more compatible buffer layer structures should be utilized.     

YBCO films buffered by pyrochlore Nd2Mo2O7 layer on YSZ substrates by chemical solution deposition

A chemical solution deposition process was used to grow epitaxial Nd₂Mo₂O₇ (NMO) buffer layers on YSZ substrates to produce YBa₂Cu₃O_7?δ (YBCO) coated conductors. The NMO precursor solution prepared using metal acetylacetonates was spin-coated onto single crystal YSZ substrate of 10 mm × 10 mm in size at 3000 rpm for 30 s and heat-treated at 1000 °C for 2 h in Ar after calcinated at 550 °C for 1 h. The YBCO film was deposited by TFA-MOD route on top of the NMO/YSZ architecture. The phase purity and the crystalline orientation of NMO and YBCO films were evaluated by X-ray diffraction (XRD). Scanning electron microscopy (SEM) and atomic force microscopy (AFM) were used to observe their microstructure and their surface roughness. The critical current density (J_c) of YBCO film on NMO/YSZ is 1.8 MA/cm² at 77 K in self-field, which indicates that the Nd₂Mo₂O₇ is a potential buffer for YBCO coated conductor.     

Effect of CeO2 buffer layer thickness on the structures and properties of YBCO coated conductors

Biaxially textured YBa₂Cu₃O_7−x (YBCO) films were grown on inclined-substrate-deposited (ISD) MgO-textured metal substrates by pulsed laser deposition. CeO₂ was deposited as a buffer layer prior to YBCO growth. CeO₂ layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The biaxial alignment features of the films were examined by X-ray diffraction 2θ-scans, pole-figure, ?-scans and rocking curves of Ω angles. The significant influence of the CeO₂ thickness on the structure and properties of the YBCO films were demonstrated and the optimal thickness was found to be about 10 nm. High values of T_c = 91 K and J_c = 5.5 × 10⁵ A/cm² were obtained on YBCO films with optimal CeO₂ thickness at 77 K in zero field. The possible mechanisms responsible for the dependence of the structure and the properties of the YBCO films on the thickness of the CeO₂ buffer layers are discussed.     

Reel-to-reel fabrication of meter-long YBCO coated conductor

YBa₂Cu₃O_7?δ (YBCO) superconductors were coated on the CeO₂/YSZ/Y₂O₃ buffered Ni-5at%W tapes by a reel-to-reel pulsed laser deposition (PLD). The process of a multi-layer deposition of YBCO film was explored. X-ray diffraction texture measurements showed good both in-plane and out of plane crystalline orientations in YBCO films. The average values calculated at a full width at half maximum (FWHM) of the peaks from phi-scans (φ) and omega (ω) scans for one meter-long YBCO tape were 7.49° and 4.71°, respectively. The critical current (I_c) was over 200 A/cm-width at 77 K and under self-field for meter-long YBCO tape. The critical transition temperature of the YBCO tape was typically as 90.1 K with 0.5 K transition widths.     

Texture analysis of RF-sputtered CeO2 buffer layers and superconducting MOD-YBCO films

CeO₂ buffer layers were deposited on YSZ single-crystal substrates using an RF-sputtering method. The development of crystalline textures of sputtered CeO₂ films at different sputtering pressure and their effects on YBCO films, deposited by Metal Organic Deposition (MOD), were investigated. Both CeO₂ and subsequent YBCO films grew well epitaxially. The relative XRD peak intensities of CeO₂ (2 0 0) to substrate YSZ (2 0 0) increased with deposition pressure in the range of 3–5 mTorr and were inversely proportional to the θ–2θ scan FWHM values of CeO₂ (2 0 0). Also, the reaction layers of BaCeO₃ were thicker in the samples with lower CeO₂ (2 0 0) intensities and poor out-of-plane alignment when CeO₂ were deposited at the lower pressure of 3.3 mTorr. It is noted, however, that the superconducting layer grew well epitaxially on these BaCeO₃ layers, possibly due to the epitaxial relation between CeO₂ and YBCO. The superconducting critical currents of MOD-YBCO films showed an increasing tendency as both the Δ2θ (CeO₂) and BaCeO₃ peak intensities decreased.     

IBAD技术制备涂层导体用YSZ缓冲层长带的研究

在钇钡铜氧(YBCO)高温超导涂层导体制备路线中,离子束辅助沉积技术(IBAD)是两大主流技术路线之一,取得了最为突出的研究成果.本文简要介绍了IBAD技术制备YBCO涂层导体的最新研究进展;并采用离子束辅助沉积技术在哈氏合金(Hastelloy)基底上成功制备了1米长具有钇稳定氧化锆(YSZ)缓冲层的金属基带.采用X射线衍射仪(XRD)分析YSZ缓冲层的取向;利用原子力显微镜(AFM)和扫描电镜(FESEM)观察其表面形貌.获得了可以实际应用的IBAD-YSZ/Hastelloy缓冲层长基带,可以在该基带上研制其他缓冲层以制备YBCO高温超导涂层导体带材.     

Strain evolution and morphological transition of magnetron-sputtered CeO2 thin films induced by deposition parameters

Cerium dioxide (CeO₂) films were fabricated on yttria-stabilized zirconia (YSZ) single crystals using unbalanced radio frequency (RF) magnetron sputtering. X-ray diffraction measurements revealed film strain discrepancies under different deposition parameters. Strain evolution was induced by varying sputtering pressure, RF power, and sputtering gas. A distinct morphological transition from a granular surface to an interwoven surface was also realized by varying the above parameters. On the basis of the “atomic peening” mechanism, the influence of different parameters on film strain was discussed. The film surface characteristics were revealed to be highly correlated with film strain. YBa₂Cu₃O_7−δ (YBCO) films were post-deposited on the as-grown CeO₂/YSZ(001) stack by using the trifluoroacetate metal-organic deposition (TFA-MOD) method. The superconducting property of the YBCO layer varied significantly with the morphology of the CeO₂ buffer films.     

Epitaxial growth of Ce2Y2O7 buffer layers for YBa2Cu3O7−δ coated conductors using reel-to-reel DC reactive sputtering

Biaxially textured Ce₂Y₂O₇ (CYO) films were deposited on Ni–5at.%W (Ni–5W) tapes by a DC reactive sputtering technique in a reel-to-reel system. Subsequent YBa₂Cu₃O_7?δ (YBCO) films were prepared using pulsed laser deposition leading to a simplified coated conductor architecture of YBCO/CYO/Ni–5W. X-ray diffraction measurements revealed an epitaxial growth of the CYO buffer layer with a texture spread down to 2.2° and 4.7° for the out-of-plane and in-plane alignment, respectively. Microstructural investigations showed a dense, smooth and crack-free surface morphology for CYO film up to a thickness of 350 nm, implying an effective suppression of cracks due to the incorporation of Y in CeO₂. The superconducting transition temperature T_c of about 90 K with a narrow transition of 0.8 K and the inductively measured critical current density J_c of about 0.7 MA/cm² indicate the potential of the single CYO buffer layer.     

Epitaxial growth of La2Zr2O7 buffer layers for YBa2Cu3O7−δ coated conductors on metallic substrates using pulsed laser deposition

In the present work, La₂Zr₂O₇ (LZO) buffer layers were deposited using pulsed laser deposition (PLD) on various metallic substrates including epitaxial pure Ni on a LaAlO₃ (LAO) substrate as well as highly textured Ni–5 at.%W tapes. It is shown that the LZO deposited on pure Ni-buffered LAO exhibits a mixed orientation while LZO on Ni–5 at.%W grows epitaxially. This difference may be explained by the existence of a sulphur superstructure on the surface of Ni–5 at.%W tapes, promoting the epitaxial (0 0 l) nucleation of seed layers. Highly textured YBa₂Cu₃O_7?δ layers were prepared either by using a single buffer layer of LZO or bilayer buffers of CeO₂/LZO on Ni–5 at.%W. The superconducting transition temperature (T_c) increases with the LZO thickness, reaching a value of 90 K with a very narrow transition width (1.5 K) for 240 nm thick LZO layers. Inductive J_c measurements at 77 K in self-field show a value of about 0.96 MA/cm² for the thickest LZO layers, which is comparable to the value observed on standard buffer architectures such as CeO₂/YSZ/Y₂O₃.     

Preparation of YBCO film for microwave filter using a hybrid route

Pure (0 0 l)-textured CeO₂ buffer layers were deposited on single crystal r-plane Al₂O₃ (1–102) substrate by a hybrid process which was combined with magnetron sputtering for the seed layer and metal–organic deposition for the subsequent layer. Strongly c-axis oriented YBCO films were deposited on the CeO₂ buffered r-cut Al₂O₃ (1–102) substrates. Atomic force microscope and scanning electronic microscopy results show that the prepared buffers and YBCO films are relatively dense and smooth. The critical current of the YBCO films exceeds 1.5 MA/cm² at 77 K with the superconducting transition temperature of 90 K. The surface resistivity is as below as 14 μΩ at 1 GHz frequency. The results demonstrate that the hybrid route is a very promising method to prepare YBCO films for microwave application, which can combine the sputtering advantage for preparing of highly c-axis oriented CeO₂ buffer layers and the advantages of metal–organic deposition with rapid processing, low cost and easy preparation of large-area YBCO films.     

Microstructure of YBCO thin films prepared by TFA-MOD method

The microstructure of the recently developed coated conductors was investigated by using electron back scatter diffraction pattern (EBSP). We prepared TFA (trifluoroacetates)-MOD (metal organic deposition) derived YBa₂Cu₃O_7−x (YBCO) films on CeO₂/LaMnO₃/IBAD-MgO/Gd₂Zr₂O₇/Hastelloy C276 substrates of 1 cm-width. The EBSP observation showed that there was a difference of surface microstructure between the midsection and the end of TFA-MOD YBCO film layer in the direction of width. This is attributed not to the local difference of the biaxial texture of CeO₂ top layer but to the local difference of growth condition during TFA-MOD process.     

Some aspects of interactions between HTSC-films and substrates

Different aspects of the interaction between YBa₂Cu₂O_y(YBCO) films and (100) ZrO₂〈Y〉 (YSZ) substrates have been investigated. It was determined using X-ray diffraction methods that the structural mismatch between the film and the substrate leads to a film deformation throughout its thickness. At the same time a strained layer appears in the substrate, whose thickness is proportional to the film thickness. The surface morphology changes of YBCO films which take place with variation of the growth temperaturet_sin the vicinity of the optimum temperature lead to changes of the film grain structure probably connected with nucleation centers. Tl₂Ba₂CaCu₂O_y(TBCCO) films on YSZ substrates were also synthesized. It was found that the dependence of the TBCCO film surface morphology changes with annealing temperature and the dependence of YBCO film surface morphology changes ont_sare similar.     

Large-area pulsed laser deposition of YBCO thin films: homogeneity and surface

YBCO thin films and buffer layers are deposited by a special PLD setup with an 8-cm line focus on cylindrical targets and substrate scanning perpendicular to it. Different kinds of substrates (SrTiO₃, MgO, LaAlO₃, Y-ZrO₂and sapphire) as large as 7᎜ cm² were coated with YBCO. Two important aspects of the presented PLD setup will be discussed in detail: the method of substrate heating and the variation of the angle between the incident laser beam and the target surface ("wobbling"). The surface of the target material has been investigated by SEM. The influence of target "wobbling" on the time stability of the plasma will be discussed. The homogeneity of the deposited YBCO films with respect to structural and electrical properties has been investigated by XRD, RBS/channeling, and spatially resolved inductive measurements of T_c and j_c. The values of j_c on 7᎜ cm²in situ buffered sapphire substrates are 2.0 MA/cm² at (77 K, 0 T) with a j_c variation of less than ᆨ%.     

The epitaxial growth of BaSnO3 buffer layer on IBAD-MgO template and its effects on GdBa2Cu3O7−δ film: A preliminary study

We report a successful fabrication of c-axis oriented GdBa₂Cu₃O_7−δ (GdBCO) films on the BaSnO₃ (BSO) buffer layers on ion-beam assisted deposition (IBAD)-MgO template by pulsed-laser deposition (PLD). The (0 0 l) growth and in-plane textures of BSO buffer layers were found sensitive to the substrate temperature (T_s). With increasing the BSO layer thickness up to ∼165 nm, in-plane texture (Δ? ∼ 6.2°) of BSO layers was almost unaltered while completely c-axis oriented BSO layers were obtainable from samples with the thickness below ∼45 nm. On the BSO buffer layers showing in-plane texture of 6.2° and RMS surface roughness of ∼8.6 nm, GdBCO films were deposited at 780–800 °C. All GdBCO films exhibited Δ? values of 4.6–4.7°, T_c,zero of ∼91 K, and critical current density (J_c) over 1 MA/cm² at 77 K in a self-field. The highest J_c value of 1.82 MA/cm² (I_c of 51 A/cm-width) was achieved from the GdBCO film deposited at T_s of 790 °C. These results support that BSO can be a promising buffer layer on the IBAD-MgO template for obtaining high-J_c GdBCO coated conductors.     

X-ray photoelectron spectra and composition of YBa2Cu3O7 − δ films prepared by laser ablation

The Y3d, Ba3d _5/2, Cu2p _3/2, and O1s X-ray photoelectron spectra of thick (600 nm) superconducting YBa₂Cu₃O_{7 ? δ} films deposited on textured Ni-W substrates with Y₂O₃ + ZrO₂ and CeO₂ buffer layers have been studied. It has been established that, after the mechanical removal of surface layers with a diamond scraper (and as the analyzed region of the film approaches the interface), a decrease in the oxygen content leads to a decrease of the orthophase fraction and an increase of the tetraphase and Cu⁺ ion fractions. This is caused by the presence of elastic stresses in the superconducting film due to the lattice misfit between the phases making up a composite sample. These stresses prevent oxygen diffusion involved in oxidizing annealing. The spectra of the superconducting film have not revealed signals generated by elements of the substrate and buffer layers.     

The influence of impurity on the critical thickness of the CeO<Subscript>2</Subscript> buffer layer for coated conductors

The lattice parameters, band structure, density of state and elastic constant of RE-doped CeO₂ (RE=Sm, Gd, Dy), the buffer material for coated HTS conductors, are calculated using the plane-wave method with pseudopotentials based on the density functional theory (DFT) of first-principle. The rule and mechanism of the effect of rare earth impurity on the critical thickness of the CeO₂ buffer layer are investigated. It is found that, in the range of the calculation, the changes of the lattice volume V and elastic constant E* of CeO₂ with the impurity are mainly determined by the increased electrons δn _e of the system. The relationship of the elastic constant E* and increased electrons δn _e is established. It is indicated that the critical thickness of the CeO₂ single buffer layer doped with Sm, Gd, and Dy may be enhanced by 22%, 43% and 33%, respectively. Supported by the Youth Scientific Research Project of Southwest Jiaotong University (Grant No. 2007Q017), the National Natural Science Foundation of China (Grant No. 50588201), and the Ministry of Science and Technology of China (Grant No. 2007CB616906)     

Mechanical and electrical characteristics of silver stabilizer layer prepared by using nano silver paste for coated conductor

Mechanical and electrical properties of silver stabilizer layer of coated conductor, which was prepared using nano silver paste as starting materials, have been investigated. Nano silver paste was coated on YBCO (Y₁Ba₂Cu₃O_7−δ) film by a dip coating method with a speed of 25 mm/min. Coated film was dried in air and heat treated at 400–700 °C in a flowing oxygen atmosphere. Adhesion strength between YBCO and silver layer was measured by Tape test (ASTM D 3359). The hardness and electrical conductivity of the sample were measured by pencil hardness test (ASTM D 3363). Surface and volume resistance were measured by using LORESTA-GP (MITSUBISHI). The sample heat treated at 500 °C showed poor adhesiveness of 1B but it is clearly enhanced to 5B when samples were heat treated at higher than 600 °C. The silver layer heat treated at 700 °C showed a high hardness value of higher than 9H and a volume resistance of 1.417 × 10⁻⁷ Ω mm at room temperature. SEM observations showed that a dense silver layer was formed with a thickness of about 2 μm. Dip coated silver layer prepared by using nano silver paste showed superior electrical and mechanical characteristics which is comparable to those that sputter deposited Ag layer.     

Microstructure, hardness, and electrical behavior of Y-doped CaZrO3 films prepared by chemical solution deposition

CaZr_0.9Y_0.1O_3???δ films were fabricated by chemical solution deposition on single-crystalline YSZ (ZrO₂ doped by 10 mol% of Y₂O₃) substrates. Mechanical hardness and morphology of the films were studied using nano-indentation and atomic force microscopy techniques. Grain microstructure of the films has been shown to depend upon thermal treatment duration and film thickness. Thin films with grains a few times greater than the film thickness have been obtained. It has been shown that thickness of films can be evaluated by comparing of the indentation curves for the clean and coated by the film substrates. Mechanical hardness of the film has been found to be sensitive to the film grain microstructure. Electrical behavior of CaZr_0.9Y_0.1O_3???δ films studied by impedance spectroscopy strongly depends on the film microstructure.