Field-effect transistor based on a combination of nanometer film and undoped semiconductor

The metal oxide nanometer film semiconductor field-effect transistor (MONSFET) is reported. In this device, a combination of undoped semiconductor and nanometer film serves as the active layer. When a negative gate-source voltage is applied, electrons from the nanometer film enter into the semiconductor layer to form the conducting channel, and the drain current increases without saturation. This structure makes more materials available for the active layer, and thus suggests a new route to enrich the applications as well as to enhance the performances.     

Current collapse and reliability of III‐N heterostructure field effect transistors

Measurements of GaN HFET lifetime as a function of temperature show that different degradation mechanisms are involved at low temperatures (close to room temperature) and high temperatures (above 150 °C). The degradation at low temperatures is linked to the trap generation and can be explained using the current collapse model. At higher tempe‐ ratures, other degradation mechanisms become important or even dominant. The current collapse related degradation can be diminished by using improved device design, which will greatly increase the overall lifetime (up to long lifetimes obtained by extrapolating high temperature data to room temperature). (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Dependence of band structures on stacking and field in layered graphene

Novel systems of layered graphene are attracting interest for theories and applications. The stability, band structures of few-layer graphite films, and their dependence on electric field applied along the c-axis are examined within the density functional theory. We predict that those of Bernal type and also rhombohedral type tri- and tetra-layer graphite films exhibit stability. Rhombohedral-type systems, including AB-bilayer, show variable band gap induced by perpendicular electric fields, whereas the other systems, such as the Bernal-type films, stay semi-metallic.     

Density functional theory prediction for oxidation and exfoliation of graphite to graphene

A density functional theory (DFT) study of graphene synthesis from graphite oxidation and exfoliation is presented. The calculated DFT results for O adsorption predict CO as a most stable bond on the graphene oxide (GO) sheet. The obtained exfoliation energy for the graphene and the GO are 143 and ∼70 mJ/m² that verify easier exfoliation of the graphite oxide compared with the graphite. Furthermore, the DFT results show that for decreasing the exfoliation energy of the GO at least two layers of the graphite should be oxidized during the oxidation process.     

Comparing the weak and strong gate‐coupling regimes for nanotube and graphene transistors

We present an experimental and theoretical comparison of the weak and strong gate‐coupling regimes that arise for carbon nanotube (CNT) and graphene field‐effect transistors (FETs) in back‐gated and liquid‐gated configuration, respectively. We find that whereas the back‐gate efficiency is suppressed for a liquid‐gated CNT FET, the back gate is still effective in case of a liquid‐gated graphene FET. We calculate the gate‐induced Fermi‐level shifts and induced charge densities. In both strong and weak coupling regimes, nonlinearities occur in the gate dependence of these parameters, which can significantly influence the electronic transport. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Membrane transistor with giant lipid vesicle touching a silicon chip

Lipid bilayers on silicon may become the matrix of future bioelectronic devices if the junction is sufficiently insulating. We touched the open gate of a field-effect transistor with a preformed giant lipid vesicle and bound the membrane by means of polyelectrolyte interaction. The sheet resistance along the junction was 100 GΩ and the membrane resistance was above 100 GΩ at a contact area of 1000 μm². The bilayer was fluid and smoothly followed the surface profile of the chip. The compound lipid–silicon structure is suitable to couple semiconductor and electroactive proteins. Received: 12 August 1999 / Accepted: 16 August 1999 / Published online: 6 October 1999     

Fabrication of an Integrated Pixel with an Organic Light-Emitting Diode Driven by Copper Phthalocyanine Organic Thin Film Transistors

An organic integrated pixel with organic light-emitting diodes （OLEDs） driven by organic thin film transistors （OTFTs） is fabricated by a greatly simplified processing. The OTFTs are based on copper phthalocyanine as the active medium and fabricated on indium-tin-oxide （ITO） glass with top-gate structure, thus an organic integrated pixel is easily made by integrating OLED with OTFT. The OTFTs show field-effect mobility of 0.4cm^2/Vs and on/off ratio of 10^3 order. The OLED is driven well and emits the brightness as large as 2100cd/m^2 at a current density of 14.6 μA /cm^2 at -19.7 V gate voltage. This simple device structure is promising in the future large-area flexible OLED displays.     

Symmetry constraints on phonon dispersion in graphene

We calculate the phonon dispersion for graphene with interactions between the first, second, and third nearest neighbors in the framework of the Born-von Karman model taking into account the constraints imposed by the lattice symmetry. Analytical expressions give the nonzero sound velocity for the out-of-plane (bending) mode. The dispersion of four in-plane modes is determined by coupled equations. Values of the force constants are found in fitting with frequencies at critical points and elastic constants measured on graphite.     

Numerical Study on a Lateral Double-Gate Tunnelling Field Effect Transistor

A novel lateral double-gate tunnelling field effect transistor （DG-TFET） is studied and its performance is presented by a two-dimensional device simulation with code ISE. The result demonstrates that this new tunnelling transistor allows for the steeper sub-threshold swing below 60mV/dec, the super low supply voltage （operable at VDD 〈 0.3 V） and the rail-to-rail logic （significant on-state current at the drain-source voltage VDS = 50mV） for the aggressive technology assumptions of the availability of high-k/metal stack with equivalent gate oxide thickness EOT =0.24 nm and the work function difference 4.5 eV of materials.     

Resonant transport and quantum bound states in Z-shaped graphene nanoribbons

We study the transport properties of a Z-shaped graphene nanoribbon (GNR). It is found that the quasibound states in the Z-shaped junction induce resonant peaks around the Dirac point in the conductance profile. The resonant transmission via the quantum bound state is very sensitive to the size of the junction. The number and also the lifetimes of the quasibound states increase with the size of the Z-shaped junction. Long lifetime bound states which do not induce obvious resonant peaks exist in the junction with a wider or longer zigzag edged GNR. The resonant characteristics of the Z-shaped GNR can be tuned by the variation of the geometrical size.     

Enhancement of carrier mobility in pentacene thin-film transistor on SiO2 by controlling the initial film growth modes

Pentacene thin-film transistors (TFTs) were fabricated on thermally grown SiO₂ gate insulator under the conditions of various pre-cleaning treatments. Initial nucleation and growth of the material films on treated substrates were observed by atomic force microscope. The performance of fabricated TFT devices with different surface cleaning approaches was found to be highly related to the initial film morphologies. In contrast to the three-dimensional island-like growth mode on SiO₂ under an organic cleaning process, a layer-by-layer initial growth occurred on the SiO₂ insulator cleaned with ammonia solution, which was believed to be the origination of the excellent electrical properties of the TFT device. Field effect mobility of the TFT device could achieve as high as 1.0 cm²/Vs on the bared SiO₂/Si substrate and the on/off ratio was over 10⁶.     

Electronic properties of graphene with a topological defect

Various types of topological defects in graphene are considered in the framework of the continuum model for long-wavelength electronic excitations, which is based on the Dirac–Weyl equation. The condition for the electronic wave function is specified, and we show that a topological defect can be presented as a pseudomagnetic vortex at the apex of a graphitic nanocone; the flux of the vortex is related to the deficit angle of the cone. The cases of all possible types of pentagonal defects, as well as several types of heptagonal defects (with the numbers of heptagons up to three, and six) are analyzed. The density of states and the ground state charge are determined.     

Multi-band pairing of ultrarelativistic electrons and holes in graphene bilayer

Multi-band pairing of effectively ultrarelativistic electrons and holes in asymmetrically biased graphene bilayer in strong coupling regime is considered. In this regime, the pairing affects both conduction and valence bands of the both graphene layers, and the order parameter is a matrix, which indices correspond to the bands. For band-diagonal s-wave pairing, we derive the system of multi-band gap equations for the gaps in the valence and conduction bands and solve it in the approximation of constant gaps and in the approximation of separable pairing potential. For a characteristic width of the pairing region of order of magnitude of the chemical potential, the gap values are not much different from single-band BCS estimations. However, if the pairing region is wider, then the gaps can be much larger and depend exponentially on its energy width. We also predict gapped and soliton-like oscillations of a relative phase of the gaps and unpairing of quarter-vortices at Kosterlitz-Thouless transition.     

Schottky diode based on porous GaN for hydrogen gas sensing application

This article reports the study of Pd Schottky contact on porous n-GaN for hydrogen gas sensing. Upon exposure to 2% H₂ in N₂, porous GaN sensor exhibited significant change of current. Morphological studies revealed that Pd contact deposited on porous GaN has ridge-trench-like morphology, a dense porous network was found in between the ridges. The dramatic change of current was attributed to the unique microstructure at Pd/porous GaN interface, which allowed higher accumulation of hydrogen; this resulted in a stronger effect of H-induced dipole layer and led to a significant change in the electrical characteristics of the porous sensor.     

Synthesis, field emission and glucose-sensing characteristics of nanostructural ZnO on free-standing carbon nanotubes films

Free-standing multiwall carbon nanotubes (MWNTs) films were coated, using chemical vapor deposition method, with a thin layer of nanostructural ZnO. The morphology and crystal structure of the as-grown products were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD) and Raman scattering analyses. Field emission (FE) results demonstrated that the needle-like and spherical ZnO-MWNTs composite structure films possessed good performance with a turn-on field of 1.3, 2.2 V μm⁻¹ and a threshold field of 2.6, 4.5 V μm⁻¹, respectively. The glucose-sensing characteristic has also been studied. The multi-layer electrode (PDDA/GOx/ZnO/MWNTs) exhibited significant electrocatalysis to the oxidation and reduction of H₂O₂ than the PDDA/GOx/MWNTs electrode, which provided wide potential applications in clinical, environmental, and food analysis.     

Room temperature fabrication Oxide TFT with Y2O3 as a gate oxide and Mo contact

In this investigation, an operating voltage as low as 5 V has been achieved for Oxide TFT with Y₂O₃ as a gate oxide and a-IGZO as an active layer. The OTFT has been fabricated at room temperature using RF sputter. The mobility and threshold voltages are 11.3 cm²/V s and 3.4 V for the device with W/L = 0.8, respectively. The annealing at 400 °C in N₂ containing 5% H₂ ambient has been utilized to improve the electrical performance of TFT. The on-off current which is determined by gate dielectric has been observed to be 10⁴. It has also been observed that the dielectric properties of gate oxide deteriorate on annealing. The dielectric constant of Y₂O₃ is observed in the range between 5.1 and 5.4 measured on various devices.     

Large oscillating tunnel magnetoresistance in ferromagnetic graphene single tunnel junction

Spin-polarized transports of relativistic electrons through graphene-based ferromagnet/insulator/ferromagnet (FG/IG/FG) single junctions have been investigated theoretically. Large oscillating tunnel magnetoresistance (TMR) has been found in monolayer and bilayer FG/IG/FG junctions. The oscillating amplitudes of TMR do not decrease with the increase of the thickness and the height of barrier, in contrast to the exponential decay in conventional ferromagnet/insulator/ferromagnet single junction. The physical origin for such a phenomenon has also been analyzed. It is anticipated to apply such a phenomenon to design the spin-polarized electron device based on the graphene materials.     

Fine-structured field emission images originating from coherently scattering of electrons within a multi-walled carbon nanotube

High resolution field emission image of a single multi-walled carbon nanotube was studied by field emission microscopy. The images contain patterns consisting of rather ordered bright fringes. We propose a model based on coherent electron scattering to explain the observed field emission image. The emitted electrons will undergo coherent scattering within the cap region of a multi-wall carbon nanotube, which may be viewed as elastic scattering by a polycrystalline structure with an infinite size. This study is helpful for understanding the physical mechanism of field emission of carbon nanotube.     

Quantum modulation effect in a graphene-based magnetic tunnel junction

The electronic (quantum) transport in a NG/F_B/FG tunnel junction (where NG, F_B and FG are a normal graphene layer, a ferromagnetic barrier connected to a gate and a ferromagnetic graphene layer, respectively) is investigated. The motions of the electrons in the graphene layers are taken to be governed by the Dirac Equation. Parallel (P) and antiparallel alignment (AP) of the magnetizations in the barrier and in the ferromagnetic graphene are considered. Our work focuses on the oscillation of the electrical conductance (Gq), of the spin conductance (Gs) and of the tunneling magneto resistance (TMR) of this magnetic tunnel junction. We find that, the quantum modulation due to the effect of the exchange field in F_B will be seen in the plots the conductance and of the TMR as functions of the thickness of ferromagnetic barrier (L). The period of two multiplied sinusoidal terms of the modulation are seen to be controlled by varying the gate potential and the exchange field of the F_B layer. The phenomenon, a quantum beating, is built up with two oscillating spin conductance components which have different periods of oscillation related to the splitting of Dirac's energies in the F_B region. The amplitudes of oscillations of Gq, Gs and TMR are not seen to decrease as the thickness increases. The decaying behaviors seen in the conventional transport through an insulator do not appear.     

Stability of polymer thin-film transistors based on poly(2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene)

Polymer thin-film transistors (PTFTs) based on poly(2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene) (MEH-PPV) semiconductor are fabricated by spin-coating process and characterized. In the experiments, solution preparation, deposition and device measurements are all performed in air for large-area applications. Hysteresis effect and gate-bias stress effect are observed for the devices at room temperature. The saturation current decreases and the threshold voltage shifts toward the negative direction upon gate-bias stress, but carrier mobility hardly changes. By using quasi-static C-V analysis for MOS capacitor structure, it can be deduced that the origin of threshold-voltage shift upon negative gate-bias stress is predominantly associated with hole trapping within the SiO₂ gate dielectric near the SiO₂/MEH-PPV interface due to hot-carrier emission.